Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
05/2012
05/29/2012US8190951 Handling of errors in a data processing apparatus having a cache storage and a replicated address storage
05/29/2012US8190950 Dynamic column redundancy replacement
05/29/2012US8189423 256 Meg dynamic random access memory
05/29/2012US8189413 Semiconductor memory device, test method thereof and semiconductor device
05/29/2012US8189412 Storage device and method for controlling storage device
05/29/2012US8189411 Circuit for controlling an enabling time of an internal control signal according to an operating frequency of a memory device and the method thereof
05/29/2012US8189389 Nonvolatile semiconductor memory device with a voltage setting circuit for a step-up shift test
05/24/2012US20120131418 Memory device
05/24/2012US20120131399 Apparatus and methods for testing memory cells
05/24/2012US20120131397 Semiconductor device having test mode and method of controlling the same
05/24/2012US20120131396 Device and method for repair analysis
05/24/2012US20120127814 Semiconductor device performing stress test
05/24/2012US20120127813 Device and method for storing error information of memory
05/24/2012US20120127797 System and method for testing for defects in a semiconductor memory array
05/24/2012DE102011086806A1 Halbleiterbauelement mit Bondhügeln und Prüfkontaktstellen Semiconductor device with bumps and probe pads
05/23/2012EP2455771A1 Measurement device and measurement method
05/23/2012EP2454736A1 Simple nonautonomous peering media clone detection
05/23/2012EP1594140B1 Semiconductor device and method for controlling semiconductor device
05/23/2012CN1930636B Method for detecting resistive bridge defects in the global data bus of semiconductor memories
05/23/2012CN1726560B Two dimensional data eye centering for source synchronous data transfers
05/23/2012CN102473462A Computer memory test structure
05/23/2012CN102473141A Non-volatile storage device and memory controller
05/23/2012CN102473126A 提供闪存系统中的读状态和空闲块管理信息的控制器和方法 Flash memory controller and method provide a read system status and free block management information
05/23/2012CN102467978A Input/output circuit and method of semiconductor apparatus and system with the same
05/23/2012CN102467977A 芯片固定基座和芯片固定连接方式 Fixed base chip and chip fixed connections
05/23/2012CN102467976A Memory write error correction circuit
05/23/2012CN102467975A 数据错误检查方法、数据传输方法和半导体存储装置 Data error checking method, a data transmission method and a semiconductor memory device
05/23/2012CN102467974A Embedded testing module and testing method thereof
05/23/2012CN102467973A 一种存储器测试方法及装置 A memory test method and apparatus
05/23/2012CN101567218B Method for generating flash memory identification code
05/23/2012CN101527171B Method for controlling flash memory of multichannel parallel error correction and device
05/23/2012CN101399087B Built-in self-testing circuit and clock switching circuit of programmable memory
05/23/2012CN101266840B A life prediction method for flash memory electronic products
05/22/2012US8185802 Data memory system
05/22/2012US8185800 System for error control coding for memories of different types and associated methods
05/22/2012US8185787 Blind and decision directed multi-level channel estimation
05/22/2012US8184494 Cell inferiority test circuit
05/22/2012US8184493 Semiconductor memory device and system
05/18/2012WO2012065018A2 Estimating wear of non-volatile, solid state memory
05/17/2012US20120120749 Jtag controlled self-repair after packaging
05/17/2012US20120120748 Test apparatus and repair analysis method
05/17/2012US20120120737 Repair circuit and control method thereof
05/17/2012US20120120735 Semiconductor device having electrical fuse and control method thereof
05/17/2012US20120120733 Semiconductor device including fuse array and method of operation the same
05/16/2012CN102456416A 电子组件的直立式测试设备 Electronic component test equipment upright
05/16/2012CN102456415A 半导体存储器件及其操作方法 Semiconductor memory device and method of operation
05/16/2012CN102456414A 具有备援行的存储器装置及其修复方法 A memory device and method for repairing redundant row
05/16/2012CN102456397A Read distribution management for phase change memory
05/15/2012US8181090 Triple parity technique for enabling efficient recovery from triple failures in a storage array
05/15/2012US8181088 Apparatus and method for recording and/or reproducing data on an information storage medium using padding information, and the information storage medium
05/15/2012US8181087 Apparatus and method for recording and/or reproducing data on an information storage medium using padding information, and the information storage medium
05/15/2012US8181072 Memory testing using multiple processor unit, DMA, and SIMD instruction
05/15/2012US8180981 Cache coherent support for flash in a memory hierarchy
05/15/2012US8179734 Semiconductor device
05/10/2012US20120117445 Data protection method for damaged memory cells
05/10/2012US20120117434 Probeless testing of pad buffers on wafer
05/10/2012US20120117432 Test apparatus
05/10/2012US20120117431 Efficient detection of errors in associative memory
05/10/2012US20120117430 Memory card
05/10/2012US20120117429 Baseboard management controller and memory error detection method of computing device utilized thereby
05/10/2012US20120113734 Semiconductor device
05/10/2012US20120113552 Semiconductor integrated circuit
05/09/2012EP2449557A1 Computer memory test structure
05/09/2012EP2449556A2 System and method responsive to a rate of change of a performance parameter of a memory
05/09/2012CN102446560A Analysis device of embedded memory in panel driving circuit and method thereof
05/09/2012CN102446559A Fault injection method based on dual-port SRAM (system random access memory)
05/09/2012CN102446558A Solid state disc capable of being automatically tested and method of automatically testing the solid state disc
05/09/2012CN102446557A Chip and chip parallel test method
05/09/2012CN101236789B Method and apparatus for detecting static data area, wear-leveling, and merging data units
05/08/2012US8176404 Systems and methods for stepped data retry in a storage system
05/08/2012US8176389 Decoder device and method for decoding data stored in storage medium
05/08/2012US8176388 System and method for soft error scrubbing
05/08/2012US8176387 Error detection control system
05/08/2012US8176386 Systems and methods for processing streaming data
05/08/2012US8176373 Pre-code device, and pre-code system and pre-coding method thereof
05/08/2012US8176372 Semiconductor integrated circuit
05/08/2012US8176371 Embedded processor
05/08/2012US8176370 Method and system for direct access memory testing of an integrated circuit
05/08/2012US8176250 System and method for testing a memory
05/03/2012US20120110415 Decoding apparatus, method, and program
05/03/2012US20120110411 Content Addressable Memory (CAM) Parity And Error Correction Code (ECC) Protection
05/03/2012US20120110401 System and method of sensing data in a semiconductor device
05/03/2012US20120110400 Method and Apparatus for Performing Memory Interface Calibration
05/03/2012US20120110398 Data error check circuit, data error check method, data transmission method using data error check function, semiconductor memory apparatus and memory system using data error check function
05/03/2012US20120106279 Semiconductor memory apparatus, memory system, and programming method thereof
05/03/2012US20120106270 Semiconductor memory device and method of operating the same
05/03/2012US20120106227 Integrated circuit
05/03/2012US20120106224 Nonvolatile memory apparatus, repair circuit for the same, and method for reading code addressable memory data
05/02/2012EP2447849A2 Memory system
05/02/2012CN102436853A Design method of memory capacity variable SAS-RAID (Serial Attached SCSI (Small Computer System Interface)-Redundant Array of Independent Disk) card
05/02/2012CN102436852A Data checking and correcting method for correcting fixed errors
05/02/2012CN102436851A Apparatus and method for correction of a 1-bit error in a coded bit sequence
05/02/2012CN102436850A Method for detecting interference of reading operation on neighboring cell
05/02/2012CN102436842A Memory storage device, memory controller and method for generating log likelihood ratio
05/02/2012CN102436841A Memory and redundancy replacement method thereof
05/02/2012CN101533670B Method and memory device realizing loss balance of memory device
05/02/2012CN101517656B Memory with cell population distribution assisted read margining
05/02/2012CN101383191B Bus signal analysis tool for Flash storage chip
05/02/2012CN101127243B Memory controller and method of controlling memory
05/01/2012US8171385 Load balancing service for servers of a web farm
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