| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 07/18/2012 | CN1637953B Semiconductor memory device having advanced test mode and test method |
| 07/18/2012 | CN102592683A Method for entering chip test mode and related device |
| 07/18/2012 | CN102592682A Test data encoding compression method |
| 07/18/2012 | CN102592681A Data management in flash memory using probability of charge disturbances |
| 07/18/2012 | CN102592680A Restoration device and restoration method for storage chip |
| 07/18/2012 | CN102592679A Flash memory chip and testing method thereof |
| 07/18/2012 | CN102592678A Dynamic window management-based wear equilibrium method and device |
| 07/18/2012 | CN102592647A Semiconductor apparatus, method for assigning chip IDs therein, and method for setting chip IDs |
| 07/18/2012 | CN102592420A Wireless sensor network testing node with microdrive and data synchronizing capacity |
| 07/18/2012 | CN101290806B 半导体存储器件 The semiconductor memory device |
| 07/18/2012 | CN101114527B Semiconductor device |
| 07/17/2012 | US8225181 Efficient re-read operations from memory devices |
| 07/17/2012 | US8225180 Error correcting codes for rank modulation |
| 07/17/2012 | US8225179 Method of generating error detection codes |
| 07/17/2012 | US8225178 Semiconductor memory device |
| 07/17/2012 | US8225177 Progressively programming flash memory while maintaining constant error correction codes |
| 07/17/2012 | US8225154 Low power design using a scan bypass multiplexer as an isolation cell |
| 07/17/2012 | US8225151 Integrated circuit and test method |
| 07/17/2012 | US8225150 Semiconductor memory device |
| 07/17/2012 | US8225149 Semiconductor testing apparatus and method |
| 07/17/2012 | US8223577 Semiconductor memory circuit |
| 07/17/2012 | US8223563 Nonvolatile memory |
| 07/12/2012 | WO2012094214A1 A redundancy memory storage system and a method for controlling a redundancy memory storage system |
| 07/12/2012 | US20120179943 Method for information transfer in a voltage-driven intelligent characterization bench for semiconductor |
| 07/12/2012 | US20120179412 Circuits and Methods for Characterizing Random Variations in Device Characteristics in Semiconductor Integrated Circuits |
| 07/12/2012 | US20120176852 Semiconductor memory device and method of testing the same |
| 07/12/2012 | US20120176851 Methods and memory devices for repairing memory cells |
| 07/11/2012 | CN202332305U 测试程序优化的内存ic检测分类机 Ic optimized memory test program to detect sorter |
| 07/11/2012 | CN202332304U Memory signal testing plate |
| 07/11/2012 | CN1577605B Integrated circuit memory devices including programmed memory cells and programmable and erasable memory cells |
| 07/11/2012 | CN102576570A Simple nonautonomous peering media clone detection |
| 07/11/2012 | CN102568614A High-speed erasing test system for phase change memory unit |
| 07/11/2012 | CN102568613A Automatic installation device with memory grain clamp |
| 07/11/2012 | CN102568612A Semiconductor memory device,test circuit,and test operation method thereof |
| 07/11/2012 | CN102568611A Method, device and system for detecting moveable storage medium |
| 07/11/2012 | CN102568610A Early detection of degradation in nor flash memory |
| 07/11/2012 | CN102568609A Systems and methods for autonomous nand refresh |
| 07/11/2012 | CN102568608A Improved method for strengthening QR (Quick Response) code error correcting capability |
| 07/11/2012 | CN102568607A Optimized BCH (Bose-Chaudhuri-Hocquenghem) decoder |
| 07/11/2012 | CN102568606A Systems, methods, and apparatuses for using the same memory type to support an error check mode and a non-error check mode |
| 07/11/2012 | CN102568605A System bus error detection and error correction method and NAND FLASH controller |
| 07/11/2012 | CN102568604A BCH (Broadcast Channel) encoder and decoder |
| 07/11/2012 | CN102568603A Data transmission device, memory control device, and memory system |
| 07/11/2012 | CN102568602A Flash memory development system |
| 07/11/2012 | CN102568601A Multi-chip package and operating method thereof |
| 07/11/2012 | CN102568600A Method and system for testing semiconductor device |
| 07/11/2012 | CN102568599A Method for judging data retention characteristic of flash memory |
| 07/11/2012 | CN102568591A Pipeline control mode and device for carrying out data reading on Flash |
| 07/11/2012 | CN102568578A Semiconductor storing apparatus, testing method thereof, and controlling method thereof |
| 07/11/2012 | CN101211656B Semiconductor memory device and programming method thereof |
| 07/10/2012 | US8219887 Parallel Reed-Solomon RAID (RS-RAID) architecture, device, and method |
| 07/10/2012 | US8219883 Data accessing method, controller and storage system using the same |
| 07/10/2012 | US8219882 Memory card and memory controller |
| 07/10/2012 | US8219881 Memory controlling method, program and device |
| 07/10/2012 | US8219879 Method for arranging memories of low-complexity LDPC decoder and low-complexity LDPC decoder using the same |
| 07/10/2012 | US8219876 Method, apparatus, computer program product and device providing semi-parallel low density parity check decoding using a block structured parity check matrix |
| 07/10/2012 | US8219861 Semiconductor storage device |
| 07/10/2012 | US8217304 Methods and systems for thermal-based laser processing a multi-material device |
| 07/05/2012 | WO2012089334A2 Method and system for controlling loss of reliability of non-volatile memory |
| 07/05/2012 | US20120173955 Data writing and reading method, and memory controller and memory storage apparatus using the same |
| 07/05/2012 | US20120173937 Semiconductor memory device, test circuit, and test operation method thereof |
| 07/05/2012 | US20120170394 Column address circuit of semiconductor memory device and method of generating column addresses |
| 07/05/2012 | US20120170382 Semiconductor memory device, test circuit, and test operation method thereof |
| 07/04/2012 | CN102543216A Test method for flash memory |
| 07/04/2012 | CN102543215A Nand FLASH intelligent detection method based on ARM controller |
| 07/04/2012 | CN102543214A Method for on-line monitoring of quality of ONO (Oxide-Nitride-Oxide) film in SONOS (Silicon Oxide Nitride Oxide Semiconductor) memory process |
| 07/04/2012 | CN102543213A Data error-detecting method for EEPROM chip |
| 07/04/2012 | CN102543212A Data management in flash memory using probability of charge disturbances |
| 07/04/2012 | CN102543211A Early detection of degradation in NAND flash memory |
| 07/04/2012 | CN102543210A Error check and correction repairing method of flash memory |
| 07/04/2012 | CN102543209A Error correction device and method of multichannel flash memory controller and multichannel flash memory controller |
| 07/04/2012 | CN102543208A Method and device for quickly determining distribution of flash errors |
| 07/04/2012 | CN102543207A Method for efficiently utilizing Reed-Solomon (RS) error detection and correction algorithm in flash memory controller |
| 07/04/2012 | CN102543206A Semiconductor memory device, test circuit, and test operation method thereof |
| 07/04/2012 | CN102543205A Semiconductor memory device, test circuit, and test operation method thereof |
| 07/04/2012 | CN102543204A Memory system and method of operating the same |
| 07/04/2012 | CN102543203A Multi-chip package and method of operating the same |
| 07/04/2012 | CN102543182A Randomization circuit, memory control unit, memory, communicating system and method |
| 07/04/2012 | CN102543170A Method for realizing low power consumption of phase change memory |
| 07/04/2012 | CN102543161A Semiconductor memory device and method of testing same |
| 07/04/2012 | CN102540059A Testing device and method for digital semiconductor device |
| 07/04/2012 | CN102129873B Data compression device and method for improving last-stage high-speed caching reliability of computer |
| 07/04/2012 | CN101617242B Input/output compression and pin reduction in an integrated circuit |
| 07/04/2012 | CN101572124B Emptying signal test circuit for optical storage unit |
| 07/04/2012 | CN101533673B Method of testing a non-volatile memory device |
| 07/04/2012 | CN101405817B Semi-conductor memory device |
| 07/04/2012 | CN101051525B Semiconductor storage device |
| 07/03/2012 | US8214855 Delivery of streams to repair errored media streams in periods of unrecoverable errors |
| 07/03/2012 | US8214729 Error detecting/correcting scheme for memories |
| 07/03/2012 | US8214720 Bit error prevention method and information processing apparatus |
| 07/03/2012 | US8214699 Circuit structure and method for digital integrated circuit performance screening |
| 07/03/2012 | US8214698 Solid state storage system with improved data merging efficiency and control method thereof |
| 07/03/2012 | US8214697 Deinterleaver for a communication device |
| 07/03/2012 | US8214616 Memory controller device having timing offset capability |
| 07/03/2012 | US8214169 Circuits and methods for characterizing random variations in device characteristics in semiconductor integrated circuits |
| 07/03/2012 | US8213247 Memory device with test mechanism |
| 07/03/2012 | US8213246 Semiconductor device |
| 06/28/2012 | US20120166909 Method and apparatus for increasing data reliability for raid operations |
| 06/28/2012 | US20120163108 Non-volatile memory device and electronic apparatus |
| 06/28/2012 | US20120163107 Memory device capable of operation in a burn in stress mode, method for performing burn in stress on a memory device, and method for detecting leakage current of a memory device |