Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
08/2012
08/22/2012CN101859594B Self-timing write tracking type static random memory integrated with weak write test function and calibration method thereof
08/22/2012CN101833998B Memory bank testing device
08/22/2012CN101783183B Current-limiting circuit for testing performance indexes of resistive random access memory (RRAM)
08/22/2012CN101740137B Method for testing memory
08/22/2012CN101689858B Semiconductor device
08/22/2012CN101562050B Phase change memory dynamic resistance test and manufacturing methods
08/21/2012US8250440 Address generation checking
08/21/2012US8250439 ECC bits used as additional register file storage
08/21/2012US8250438 Method and apparatus for iterative error-erasure decoding
08/21/2012US8250437 Memory system and control method for the same
08/21/2012US8250436 Memory-module controller, memory controller and corresponding memory arrangement and also method for error correction
08/21/2012US8250418 Test mode for parallel load of address dependent data to enable loading of desired data backgrounds
08/21/2012US8250417 Method for detecting flash program failures
08/21/2012US8250415 Optical disk reproduction apparatus, optical disk reproduction method, reproduction processing device and reproduction processing method
08/21/2012US8248874 Semiconductor memory apparatus and probe test control circuit therefor
08/21/2012US8248873 Semiconductor memory device with high-speed data transmission capability, system having the same, and method for operating the same
08/21/2012US8248871 Redundancy circuits and semiconductor memory devices
08/16/2012WO2012027291A3 System and method of reference cell testing
08/16/2012US20120210180 Blind and decision directed multi-level channel estimation
08/16/2012US20120210179 Memory interface with selectable evaluation modes
08/16/2012US20120206985 Static random access memory (sram) and test method of the sram having precharge circuit to prepcharge bit line
08/16/2012US20120206982 Semiconductor device and method
08/16/2012DE102011010946A1 Halbleitervorrichtung und Verfahren zum Identifizieren und Korrigieren eines Bitfehlers in einer FRAM-Speichereinheit einer Halbleitervorrichtung A semiconductor device and method of identifying and correcting a bit error in a FRAM memory unit of a semiconductor device
08/15/2012EP2487689A1 Digital method to obtain the I-V curves of NVM bitcells
08/15/2012CN102640229A Tamper resistant fuse design
08/15/2012CN102637461A Start method supporting bad block flash memory scanning
08/14/2012US8245113 Convolution-encoded RAID with trellis-decode-rebuild
08/14/2012US8245112 Flash memory organization
08/14/2012US8245109 Error checking and correction (ECC) system and method
08/14/2012US8245090 Apparatus for formatting information storage medium
08/14/2012US8243538 Small unit internal verify read in a memory device
08/14/2012US8243509 Nonvolatile memory cell operating by increasing order in polycrystalline semiconductor material
08/09/2012WO2012106079A1 Advanced converters for memory cell sensing and methods
08/09/2012US20120204071 Wear-leveling and bad block management of limited lifetime memory devices
08/09/2012US20120204070 Semiconductor memory apparatus and method of testing the same
08/09/2012US20120201091 Memory card test interface
08/09/2012DE19630913B4 Schaltung zur Erfassung sowohl eines Normalbetriebs als auch eines Einbrennbetriebs einer Halbleitervorrichtung Circuit for detecting both a normal operation as well as a semiconductor device of a Einbrennbetriebs
08/08/2012EP2485293A1 Battery system
08/08/2012EP2483890A2 Methods and systems for reducing supply and termination noise
08/08/2012CN102630318A Solid-state storage system with parallel access of multiple flash/PCM devices
08/08/2012CN101777388B Method for obtaining phase-change memory phase-change resistance crystallization rate
08/08/2012CN101040445B Error protecting groups of data words
08/07/2012US8239732 Error correction coding in flash memory devices
08/07/2012US8239731 Methods and apparatus for providing multilevel coset coding and probabilistic error correction
08/07/2012US8239730 Non-volatile semiconductor memory device
08/07/2012US8239729 Data storage device with copy command
08/07/2012US8239714 Apparatus, system, and method for bad block remapping
08/07/2012US8239713 Data storage device with bad block scan command
08/07/2012US8239712 Computer system and memory use setting program
08/07/2012US8239643 Non-volatile memory and method with control data management
08/07/2012US8239607 System and method for an asynchronous data buffer having buffer write and read pointers
08/07/2012US8238140 Semiconductor memory and program
08/02/2012US20120198294 Methods For At-Speed Testing Of Memory Interface
08/02/2012US20120198293 Storage device and method for controlling storage device
08/02/2012US20120198292 Test apparatus and test method
08/02/2012US20120198291 Locally synchronous shared bist architecture for testing embedded memories with asynchronous interfaces
08/02/2012US20120198290 Non-volatile memory device and programming method thereof
08/02/2012US20120195145 Semiconductor memory for disconnecting a bit line from a sense amplifier in a standby period and memory system including the semiconductor memory
08/02/2012US20120195144 Semiconductor device and manufacturing method thereof
08/02/2012US20120195133 Semiconductor memory device having data compression test cicuit
08/01/2012CN102623069A Random excitation flash model verification method
08/01/2012CN102623068A 半导体集成电路及其控制方法 A semiconductor integrated circuit and control method
08/01/2012CN102623067A Soft decoding systems and methods for flash based memory systems
08/01/2012CN102623066A Saving and acquisition method for solidification code parameter table
07/2012
07/31/2012US8234544 Data access apparatus and data access method
07/31/2012US8234528 Systems and methods for monitoring a memory system
07/31/2012US8234527 Method for error test, recordation and repair
07/31/2012US8233341 Method and structure for SRAM cell trip voltage measurement
07/26/2012WO2012078397A3 Memory device on the fly crc mode
07/26/2012WO2012075330A3 Apparatus, system, and method for matching patterns with an ultra fast check engine
07/26/2012WO2012075329A3 Apparatus, system, and method for matching patterns with an ultra fast check engine based on flash cells
07/26/2012US20120192035 Memory system and operation method thereof
07/26/2012US20120192034 Lengthening Life of a Limited Life Memory
07/26/2012US20120192032 Data storage apparatus, memory control apparatus and method for controlling flash memories
07/26/2012US20120192018 Apparatus and method for detecting over-programming condition in multistate memory device
07/26/2012US20120188830 Semiconductor memory device correcting fuse data and method of operating the same
07/25/2012EP2479676A1 Memory control circuit, memory control method, and integrated circuit
07/25/2012CN202352352U Autonomous NAND refreshing system
07/25/2012CN102610281A Time sequence implementation method based on flash serial test interface on smart card
07/25/2012CN102610280A Method and device for repairing memory chip, and memory chip
07/25/2012CN102610279A Method for executing NAND flash memory by solidifying code
07/25/2012CN102610278A Method for verifying solid-state self-destruction hard disk function and detecting data residue
07/25/2012CN102610268A Method for synchronizing data strobe signal in double data rate 3(DDR3) using oscilloscope
07/24/2012US8230396 Apparatus and method to debug a software program
07/24/2012US8230309 Maximum likelihood detector, error correction circuit and medium storage device
07/24/2012US8230303 Memory system and data processing method thereof
07/24/2012US8230302 Data protection method for memory
07/24/2012US8230277 Storage of data in data stores having some faulty storage locations
07/24/2012US8230276 Writing to memory using adaptive write techniques
07/24/2012US8230275 Use of parity bits to detect memory installation defects
07/24/2012US8230274 JTAG controlled self-repair after packaging
07/24/2012US8230157 Memory device and method of multi-bit programming
07/24/2012US8228750 Low cost comparator design for memory BIST
07/24/2012US8228749 Margin testing of static random access memory cells
07/19/2012US20120185741 Apparatus and method for detecting a memory access error
07/19/2012US20120185664 Synchronous Global Controller for Enhanced Pipelining
07/19/2012US20120182817 Redundant memory array for replacing memory sections of main memory
07/19/2012US20120182816 Semiconductor device and manufacturing method thereof
07/19/2012DE102005018640B4 Schaltungsanordnung Circuitry
07/18/2012EP1346364B1 Data processing device with a write once memory (wom)
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