Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
10/2012
10/16/2012US8289794 Integrated circuit
10/16/2012US8289793 Nonvolatile semiconductor memory device capable of testing diodes and manufacturing method thereof
10/16/2012US8289792 Memory test circuit, semiconductor integrated circuit and memory test method
10/16/2012US8289791 Test method and device for memory device
10/16/2012CA2555610C Methods and systems for handling software operations associated with startup and shutdown of handheld devices
10/11/2012WO2012138492A1 Hardware efficient on-chip digital temperature coefficient voltage generator and method
10/11/2012WO2012137340A1 Testing method and semiconductor integrated circuit implementing said testing method
10/11/2012US20120260150 Data management in solid state storage systems
10/11/2012US20120260139 Firmware Monitoring of Memory Scrub Coverage
10/11/2012US20120260138 Error logging in a storage device
10/11/2012US20120260137 Memory buffer for buffer-on-board applications
10/11/2012US20120257468 Semiconductor memory device
10/11/2012US20120257467 Memory repair analysis apparatus, memory repair analysis method, and test apparatus
10/11/2012US20120257462 Repair method and integrated circuit using the same
10/11/2012US20120257461 Method of testing a semiconductor memory device
10/11/2012US20120257441 Memory bit redundant vias
10/10/2012EP2507833A1 Bypass capacitor circuit and method of providing a bypass capacitance for an integrated circuit die
10/10/2012CN202487177U Moveable storage medium detecting device and system thereof
10/10/2012CN1930635B Adaptive deterministic grouping of blocks into multi-block units
10/10/2012CN1697078B Semiconductor memory
10/10/2012CN102725799A Data processing system having brown-out detection circuit
10/10/2012CN102103893B Device for generating test pattern of memory wafer and method thereof
10/10/2012CN101894591B Linear feedback shift register (LFSR)-based random test device for external storage interface
10/10/2012CN101789270B Memory bank test equipment
10/10/2012CN101479807B Memory device with speculative commands to memory core
10/10/2012CN101443852B Method and device for regulating digital delay function for regulating data memory cell
10/10/2012CN101404184B Semiconductor memory device
10/10/2012CN101183563B Memory system including flash memory and method of operating the same
10/09/2012US8286054 Semiconductor memory, operating method of semiconductor memory, and system
10/09/2012US8286044 Dynamic random access memory having internal built-in self-test with initialization
10/09/2012US8286038 Method and apparatus for managing disc defects using updateable DMA, and disc thereof
10/09/2012US8284591 Semiconductor memory device and test method therefor
10/04/2012WO2012134755A2 Measurement initialization circuitry
10/04/2012WO2012065018A3 Estimating wear of non-volatile, solid state memory
10/04/2012US20120254680 Nonvolatile memory device and bad area managing method thereof
10/04/2012US20120254679 Systems and Methods for Enhanced Media Defect Detection
10/04/2012US20120254678 Method and system for determining support for a memory card
10/04/2012US20120250438 Dynamic random access memory address line test technique
10/04/2012US20120250437 Semiconductor device, control method thereof and data processing system
10/03/2012CN102714061A Bit-replacement technique for DRAM error correction
10/03/2012CN102708929A Scan slice test data coding method and device
10/03/2012CN102708928A Early degradation detection in flash memory using test cells
10/03/2012CN102708927A Method for improving reliability of storage, and flash memory operating method
10/03/2012CN102054536B Device for testing DP (Dual Port) SRAM (Static Random Access Memory) by utilizing ALPG tester
10/03/2012CN101858956B Ageing test system
10/03/2012CN101783182B Detection circuit and detection device of resistance changing memory
10/03/2012CN101635173B Method and circuit for self calibration of non-volatile memories, and non-volatile memory circuit
10/03/2012CN101499325B Non-volatile memory system and method with variable error correcting capability
10/03/2012CN101405818B Semiconductor memory and test system
10/03/2012CN101399090B Holding jaw mechanism, test socket mechanism and storage module positioning device
10/02/2012US8281227 Apparatus, system, and method to increase data integrity in a redundant storage system
10/02/2012US8281226 Reproduction apparatus and reproduction method
10/02/2012US8281225 Digital data coding and recording apparatus, and method of using the same
10/02/2012US8281223 Detection of fuse re-growth in a microprocessor
10/02/2012US8281222 Detection and correction of fuse re-growth in a microprocessor
10/02/2012US8281220 Apparatus for detecting and recovering from data destruction caused in an unaccessed memory cell by read, and method therefor
10/02/2012US8281219 Error correction code (ECC) circuit test mode
10/02/2012US8281217 Memory devices and encoding and/or decoding methods
10/02/2012US8281199 Hybrid self-test circuit structure
10/02/2012US8281194 Scan path switch testing of output buffer with ESD
10/02/2012US8281192 Storage medium reproducing apparatus, storage medium reproducing method, and computer program product for reading information from storage medium
10/02/2012US8281191 Fully-buffered dual in-line memory module with fault correction
10/02/2012US8281190 Circuits and methods for processing memory redundancy data
10/02/2012US8279655 Non-volatile semiconductor memory device and method of controlling non-volatile semiconductor memory device
09/2012
09/27/2012WO2012127177A1 Configuration memory cell
09/27/2012US20120246544 Method and apparatus for memory read-refresh, scrubbing and variable-rate refresh
09/27/2012US20120246542 Selective checkbit modification for error correction
09/27/2012US20120246527 Built-in self test circuit and designing apparatus
09/27/2012US20120246526 Parallelization of Error Analysis Circuitry for Reduced Power Consumption
09/27/2012US20120243355 Semiconductor apparatus
09/27/2012US20120243354 Repairing Soft Failures in Memory Cells in SRAM Arrays
09/27/2012US20120243299 Power efficient dynamic random access memory devices
09/26/2012EP2502234A2 Bit-replacement technique for dram error correction
09/26/2012CN1717744B A method and device to detect the likely onset of thermal relaxation in magnetic data storage devices
09/26/2012CN102693760A Error correction method for NAND flash memory
09/26/2012CN101630535B Data processing circuit and method
09/26/2012CN101154444B Method of programming a phase change memory device
09/25/2012US8276045 ECC interleaving for multi-track recording on magnetic tape
09/25/2012US8276044 Method for appending data to tape medium, and apparatus employing the same
09/25/2012US8276041 Data integrity validation using hierarchical volume management
09/25/2012US8276033 Data writing method for a flash memory, and flash memory controller and flash memory storage apparatus using the same
09/25/2012US8276029 System and method for using a memory mapping function to map memory defects
09/25/2012US8276028 Using error information from nearby locations to recover uncorrectable data in non-volatile memory
09/25/2012US8276027 Semiconductor memory and method for testing the same
09/25/2012US8274853 Semiconductor device and method for testing the same
09/25/2012US8274852 Semiconductor memory apparatus and method of testing the same
09/20/2012WO2012125542A1 Methods, devices, and systems for data sensing
09/20/2012WO2012124063A1 Semiconductor recording device and method for controlling semiconductor recording device
09/20/2012US20120240010 Unidirectional Error Code Transfer for Both Read and Write Data Transmitted via Bidirectional Data Link
09/20/2012US20120239992 Method of controlling a semiconductor storage device
09/20/2012US20120239866 Non-volatile memory with error correction for page copy operation and method thereof
09/20/2012US20120236668 Memory module with discrete heating element
09/20/2012DE102012102080A1 Fehlertolerante Flip-Flops Fault-tolerant flip-flop
09/20/2012DE102005032466B4 Halbleiterspeicherbauelement und Leseverfahren The semiconductor memory device and reading method
09/19/2012EP2501040A1 Scannable configuration memory
09/19/2012CN102687121A Error correction in a stacked memory
09/19/2012CN102682856A Memory device and test method for the same
09/19/2012CN102682855A Error tolerant flip-flops
09/19/2012CN102682854A Storage with redundant circuit and method for providing redundant circuit for storage
09/19/2012CN102682853A Test system and test method for memory
1 ... 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 ... 306