Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
09/2012
09/19/2012CN102682852A Semiconductor storage device
09/19/2012CN102682851A Online/offline state detection system and detection method for secure digital (SD) card/multimedia card (MMC)
09/19/2012CN102682850A Digital method to obtain the i-v curves of nvm bitcells
09/19/2012CN102682836A Providing row redundancy to solve vertical twin bit failures
09/19/2012CN102034555B On-line error correcting device for fault by parity check code and method thereof
09/19/2012CN101436434B Nonvolatile memory device, system, and method providing fast program and read operations
09/18/2012US8271857 Correcting errors in longitudinal position (LPOS) words
09/18/2012US8271856 Resistive memory devices and methods of controlling operations of the same
09/18/2012US8271855 Memory scrubbing in third dimension memory
09/18/2012US8270240 Current leakage reduction
09/18/2012US8270239 Semiconductor memory device and methods of performing a stress test on the semiconductor memory device
09/18/2012US8270238 Integrated circuits and methods to compensate for defective non-volatile embedded memory in one or more layers of vertically stacked non-volatile embedded memory
09/13/2012US20120233521 Apparatus, system, and method for decoding linear block codes in a memory controller
09/13/2012US20120233498 Hierarchical error correction for large memories
09/13/2012US20120230137 Memory device and test method for the same
09/13/2012US20120230136 Selectable repair pass masking
09/13/2012US20120230131 Semiconductor storage device
09/13/2012US20120230127 Providing Row Redundancy to Solve Vertical Twin Bit Failures
09/13/2012US20120230107 Semiconductor memory device having memory block configuration
09/13/2012DE10134985B4 Test eines Halbleiterspeichers mit mehreren Speicherbänken Test of a semiconductor memory having a plurality of memory banks
09/12/2012CN102664044A System and method for automatic test on vehicle-mounted radio U disk compatibility
09/12/2012CN102664043A Device and method for test of smart SD card realizing mobile payment
09/12/2012CN101939835B An integrated circuit with a memory matrix with a delay monitoring column
09/11/2012US8266503 Apparatus, system, and method for using multi-level cell storage in a single-level cell mode
09/11/2012US8266502 Recording/reproducing apparatus and recording/reproducing method
09/11/2012US8266501 Stripe based memory operation
09/11/2012US8266496 Apparatus, system, and method for managing data using a data pipeline
09/11/2012US8266493 Low-density parity check decoding using combined check node and variable node
09/11/2012US8266484 Circuits, architectures, apparatuses, systems, methods, algorithms, software and firmware for using reserved cells to indicate defect positions
09/11/2012US8266483 Method for operating a register stage of a dual function data register
09/11/2012US8266390 System and method for providing one-time programmable memory with fault tolerance
09/07/2012WO2012118770A1 System and method for bonded configuration pad continuity check
09/07/2012WO2012118605A1 Adjustable programming speed for nand memory devices
09/06/2012US20120226963 Bad block management for flash memory
09/06/2012US20120226962 Wear-focusing of non-volatile memories for improved endurance
09/06/2012US20120226951 Test apparatus
09/06/2012US20120224422 Nonvolatile Semiconductor Memory Device
09/05/2012CN1992084B Write-once nonvolatile memory with redundancy capability and writing method
09/05/2012CN102655027A Test apparatus
09/05/2012CN101430937B Semiconductor memory device
09/05/2012CN101414489B Fault-tolerance memory and error-correction error-tolerance method
09/04/2012US8261158 Apparatus, system, and method for using multi-level cell solid-state storage as single level cell solid-state storage
09/04/2012US8261141 Real time feedback compensation of programmable logic memory
09/04/2012US8261140 Uninitialized memory detection using error correction codes and built-in self test
09/04/2012US8261139 Clear instruction information to indicate whether memory test failure information is valid
09/04/2012US8261138 Test structure for characterizing multi-port static random access memory and register file arrays
09/04/2012US8261137 Apparatus, a method and a program thereof
09/04/2012US8261135 Interleaving method and communication device
09/04/2012US8261039 Memory controllers, methods, and systems supporting multiple memory modes
09/04/2012US8261016 Method and system for balancing reconstruction load in a storage array using a scalable parity declustered layout
09/04/2012US8260835 Random number generator with ring oscillation circuit
09/04/2012US8259521 Method and circuit for testing a multi-chip package
09/04/2012US8259497 Programming schemes for multi-level analog memory cells
08/2012
08/30/2012US20120221925 Data recovery method and associated device
08/30/2012US20120221920 Multiple erasure correcting codes for storage arrays
08/30/2012US20120221905 Managing Memory Faults
08/30/2012US20120221904 Nonvolatile memory device and method for operating the same
08/30/2012US20120221903 Testing method, non-transitory, computer readable storage medium and testing apparatus
08/30/2012US20120218846 Test circuit, semiconductor memory apparatus using the same, and test method of the semiconductor memory apparatus
08/30/2012US20120218805 Configurable Memory Array
08/29/2012EP2492917A2 Error detection and correction circuitry
08/29/2012CN202404914U Multi-flash-memory testing device
08/29/2012CN202404913U Automatic mounting device for memory grain clamp
08/29/2012CN202404912U Neural network test module and test system of smart card chip memory
08/29/2012CN102651240A Error detection and correction circuitry
08/29/2012CN102651231A 半导体存储器件 The semiconductor memory device
08/29/2012CN101924299B One-touch popping device of memory module test socket
08/29/2012CN101866319B Method for accessing storing device and relevant control circuit
08/29/2012CN101819821B Dynamic loss balancing method for solid state disk
08/29/2012CN101661794B Semiconductor device
08/29/2012CN101558452B Method and device for reconfiguration of reliability data in flash eeprom storage pages
08/29/2012CN101241767B Nonvolatile semiconductor storage device and method of managing the same
08/29/2012CN101101794B Memory testing
08/29/2012CN101042939B Semiconductor apparatus and test method therefor
08/28/2012US8255774 Data storage system with non-volatile memory for error correction
08/28/2012US8255773 System and method of tracking error data within a storage device
08/28/2012US8255772 Adaptive memory scrub rate
08/28/2012US8255771 Memory device repair apparatus, systems, and methods
08/28/2012US8255770 Multi-level cell memory device and method thereof
08/28/2012US8255769 Control apparatus and control method
08/28/2012US8255742 Dynamically replicated memory
08/28/2012US8255741 Facilitating error detection and correction after a memory component failure
08/28/2012US8254204 Burst address generator and test apparatus including the same
08/28/2012US8254192 Resistance change memory
08/28/2012US8254191 Switched interface stacked-die memory architecture
08/28/2012US8252644 Method for forming a nonvolatile memory cell comprising a reduced height vertical diode
08/23/2012WO2012089334A3 Method and system for controlling loss of reliability of non-volatile memory
08/23/2012US20120216085 Devices and method for wear estimation based memory management
08/23/2012US20120215967 Non-volatile memory devices and control and operation thereof
08/23/2012US20120215515 Printed circuit board via model design for high frequency performance
08/23/2012US20120213022 Sip semiconductor system
08/23/2012US20120213021 Semiconductor device having redundant bit line provided to replace defective bit line
08/23/2012US20120213020 Memory controller
08/23/2012US20120213002 Semiconductor memory device having faulty cells
08/23/2012US20120212997 Test structure for characterizing multi-port static random access memory and register file arrays
08/23/2012DE102007007566B4 Halbleiter-Bauelement-System, Speichermodul und Verfahren zum Betreiben eines Halbleiter-Bauelement-Systems Semiconductor component system, memory module and method of operating a semiconductor device system
08/22/2012EP2171722B1 Refresh of non-volatile memory cells based on fatigue conditions
08/22/2012CN1728284B Method for seanning flash memory chip in flash memory disk
08/22/2012CN102646453A Method and system for testing error correcting code module in NandFlash controller
08/22/2012CN102646447A Non-volatile memory device, memory controller, and methods thereof
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