Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
12/2012
12/19/2012EP2534658A1 System and method to select a reference cell
12/19/2012CN102834872A Method of checking resistance change non-volatile memory device, and resistance change non-volatile memory device
12/19/2012CN102831935A Pulse I-V (intravenous) characteristic testing method and device of phase change memory unit
12/19/2012CN102831934A Method for entering into internal test mode of ASRAM chip
12/19/2012CN102831932A Data read method, memory controller and memory storage apparatus
12/19/2012CN102081970B Method and device for processing error correction and solid-state hard disc equipment
12/19/2012CN101937721B Method for testing memory device
12/19/2012CN101650974B Storage device capable of self-detecting usage state and detecting method thereof
12/18/2012US8335967 Memory system
12/18/2012US8335951 Methods and system for verifying memory device integrity
12/18/2012US8335118 Method of operating a flash memory device
12/13/2012WO2012170154A1 Memory system for error detection and correction coverage
12/13/2012WO2012169114A1 Semiconductor storage device, control method for same, and non-transitory computer readable medium in which control program is stored
12/13/2012US20120317451 Probeless testing of pad buffers on wafer
12/13/2012US20120317449 Device and method for testing semiconductor device
12/13/2012US20120314519 Word line driving signal control circuit, semiconductor memory apparatus having the same, and word line driving method
12/12/2012CN102820064A Identification and mitigation of hard errors in memory systems
12/12/2012CN102820063A 半导体存储装置 The semiconductor memory device
12/12/2012CN102820062A SRAM (Static Random Access Memory) dynamic parameter testing method
12/12/2012CN102034554B Method for enhancing chip burn-in scanning efficiency
12/12/2012CN101908382B Data classification analyzing method and device for chip failure
12/12/2012CN101794622B Data scanning method and device for storage device
12/12/2012CN101692351B Method and device for testing memory
12/12/2012CN101425343B Block repair apparatus and method thereof
12/12/2012CN101414488B 半导体装置 Semiconductor device
12/12/2012CN101369463B Flash memory detection classification method
12/11/2012US8332727 Error correction circuit, flash memory system including the error correction circuit, and operating method of the error correction circuit
12/11/2012US8332726 Non-volatile semiconductor memory device
12/11/2012US8332725 Reprogramming non volatile memory portions
12/11/2012US8332724 Data retrieval systems
12/11/2012US8332696 Defect management method for storage medium and system thereof
12/11/2012US8332505 Method to automatically determine host to LUN (logical unit number) path availability for multi path attached storage systems
12/11/2012US8331178 Memory device capable of operation in a burn in stress mode, method for performing burn in stress on a memory device, and method for detecting leakage current of a memory device
12/11/2012US8331177 Resistance semiconductor memory device having a bit line supplied with a compensating current based on a leak current detected during a forming operation
12/11/2012US8331176 Method and system for evaluating effects of signal phase difference on a memory system
12/11/2012US8331175 Solid state drive systems and methods of reducing test times of the same
12/11/2012US8331174 Semiconductor memory device and method for operating the same
12/06/2012US20120307579 Memory reliability verification techniques
12/06/2012US20120307578 Semiconductor device having redundant select line to replace regular select line
12/06/2012DE102012104648A1 Techniken zur Verifikation einer Verlässlichkeit eines Speichers Techniques for verification of reliability of a memory
12/05/2012EP2529376A2 Data processing system having brown-out detection circuit
12/05/2012CN102812519A Composite semiconductor memory device with error correction
12/05/2012CN102810336A Nonvolatile memory, memory controller, and accessing method thereof
12/05/2012CN102810335A Memory reliability verification techniques
12/04/2012US8327230 Data structure for flash memory and data reading/writing method thereof
12/04/2012US8327229 Data memory system
12/04/2012US8327228 Home agent data and memory management
12/04/2012US8327227 Storage apparatus, method for accessing data and for managing memory block
12/04/2012US8327226 Adjustable error correction code length in an electrical storage device
12/04/2012US8327225 Error correction in a stacked memory
12/04/2012US8327222 Mechanism for adjacent-symbol error correction and detection
12/04/2012US8327220 Data storage device with verify on write command
12/04/2012US8327197 Information processing apparatus including transfer device for transferring data
12/04/2012US8325548 Semiconductor device and semiconductor device test method for identifying a defective portion
12/04/2012US8325547 Test apparatus and repair analysis method
12/04/2012US8325546 Method and system for processing a repair address in a semiconductor memory apparatus
11/2012
11/29/2012WO2012160821A1 Variable-resistance type non-volatile storage device and method for driving variable-resistance type non-volatile storage device
11/29/2012WO2012159677A1 Clamp
11/29/2012US20120303690 Random number generator with ring oscillation circuit
11/29/2012US20120300533 Nonvolatile memory cell operating by increasing order in polycrystalline semiconductor material
11/28/2012CN102804281A Memory dies, stacked memories, memory devices and methods
11/28/2012CN102800367A Test apparatus and test method
11/28/2012CN102800366A Test apparatus and test method
11/28/2012CN102800365A Method and system for testing and calibrating nonvolatile memory
11/28/2012CN102800364A 测试系统 Test System
11/28/2012CN102798774A Test apparatus and test method
11/28/2012CN101494088B Semiconductor integrated circuit device and method of testing same
11/27/2012US8321765 Method of reading data in non-volatile memory device
11/27/2012US8321762 Method for creating an error correction coding scheme
11/27/2012US8321761 ECC bits used as additional register file storage
11/27/2012US8321760 Semiconductor memory device and data processing method thereof
11/27/2012US8321759 Method and apparatus for error correction on a mobile device
11/27/2012US8321758 Data error correction device and methods thereof
11/27/2012US8321757 Method and apparatus for error correction
11/27/2012US8321756 Error detection code memory module
11/27/2012US8321727 System and method responsive to a rate of change of a performance parameter of a memory
11/27/2012US8321726 Repairing memory arrays
11/27/2012US8319720 Redundancy shift register circuit for driver circuit in active matrix type liquid crystal display device
11/22/2012US20120297268 Nonvolatile semiconductor memory device
11/22/2012US20120297257 Memory devices and method for error test, recordation and repair
11/22/2012US20120294100 Method and apparatus for memory power and/or area reduction
11/22/2012US20120294094 Method and apparatus for memory fault tolerance
11/21/2012CN202549312U Detection device for storage chip
11/21/2012CN102792383A Method for checking the functionality of a memory element
11/21/2012CN102789817A Checking algorithm of NAND Flash memory chip
11/21/2012CN102789816A At-speed multi-port memory array test method and apparatus
11/21/2012CN102097133B System and method for testing reliability of mass storage system
11/21/2012CN102034556B Scan chain-based method for testing memory
11/21/2012CN101916593B Memory test system
11/21/2012CN101510445B Method and apparatus for storing and reading bad block meter of memory
11/20/2012US8316284 Collecting failure information on error correction code (ECC) protected data
11/20/2012US8316280 Error correcting device, method of error correction thereof, and memory device and data processing system including of the same
11/20/2012US8316279 Method of estimating and correcting errors in memory cells
11/20/2012US8316264 Failure analysis method, failure analysis apparatus, and computer program product
11/20/2012US8315117 Integrated circuit memory having assisted access and method therefor
11/20/2012US8315116 Repair circuit and repair method of semiconductor memory apparatus
11/20/2012US8315115 Method for testing a main memory
11/15/2012WO2012154512A1 Control circuit and method for testing a memory element
11/15/2012WO2012154240A1 Memory interface with selectable evaluation modes
11/15/2012WO2012153516A1 Input circuit
1 ... 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 ... 306