| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 01/16/2013 | CN102881336A Mut for testing memory modules |
| 01/16/2013 | CN102881335A Strain test analysis system for double date rate (DDR) memory bank |
| 01/16/2013 | CN102881334A Error correction method for data storage in control system of nuclear detection robot |
| 01/16/2013 | CN102881324A Write circuit, readout circuit, memory buffer and memory bank |
| 01/16/2013 | CN101887758B Emulation verification method of nonvolatile memory |
| 01/15/2013 | US8356231 Use of alternative value in cell detection |
| 01/15/2013 | US8356216 Error scanning in flash memory |
| 01/15/2013 | US8356215 Testing apparatus and method for analyzing a memory module operating within an application system |
| 01/15/2013 | US8356214 Internal signal monitoring device in semiconductor memory device and method for monitoring the same |
| 01/10/2013 | WO2013006222A1 Adaptive multi-bit error correction in endurance limited memories |
| 01/10/2013 | US20130013981 Temporary mirroring, logical segregation, and redundant programming or addressing for solid state drive operation |
| 01/10/2013 | US20130013968 System, method, and computer program product for analyzing monitor data information from a plurality of memory devices having finite endurance and/or retention |
| 01/10/2013 | US20130010558 Method of Detecting Connection Defects of Memory and Memory Capable of Detecting Connection Defects thereof |
| 01/10/2013 | US20130010557 Memory repair systems and methods for a memory having redundant memory |
| 01/10/2013 | US20130010551 Systems, memories, and methods for repair in open digit memory architectures |
| 01/10/2013 | US20130010543 Memory device having switch providing voltage to bit line |
| 01/10/2013 | US20130010538 Memory device and method for repairing a semiconductor memory |
| 01/09/2013 | EP2543041A2 Repairable io in an integrated circuit |
| 01/09/2013 | CN202662294U Programmable static random access memory (SRAM) sequential control circuit based on built-in self-test (BIST) control |
| 01/09/2013 | CN202662293U On-line and off-line detecting system for secure digital (SD)/multimedia card (MMC) |
| 01/09/2013 | CN102870119A Modeling of cell delay change for electronic design automation |
| 01/09/2013 | CN102867545A Multiple-driver cross-connected memory testing device and application method thereof |
| 01/09/2013 | CN102867544A Method of testing storage array and control device |
| 01/09/2013 | CN102867541A Low-power-consumption SRAM (static random access memory) |
| 01/09/2013 | CN101752010B Flash memory controller and method for setting the error correction capacity of flesh memory |
| 01/09/2013 | CN101594133B Semiconductor integrated circuit, control method, and information processing apparatus |
| 01/09/2013 | CN101458971B Test system and method for built-in memory |
| 01/08/2013 | US8352835 Data verification using checksum sidefile |
| 01/08/2013 | US8352834 High throughput interleaver / deinterleaver |
| 01/08/2013 | US8352833 System and method for data read of a synchronous serial interface NAND |
| 01/08/2013 | US8352814 Electronic control apparatus |
| 01/08/2013 | US8352813 Transition fault testing for a non-volatile memory |
| 01/08/2013 | US8352812 Protecting data storage structures from intermittent errors |
| 01/08/2013 | US8351253 Thin film magnetic memory device capable of conducting stable data read and write operations |
| 01/03/2013 | US20130007545 Managing logically bad blocks in storage devices |
| 01/03/2013 | US20130007543 Estimating temporal degradation of non-volatile solid-state memory |
| 01/03/2013 | US20130007542 Preemptive memory repair based on multi-symbol, multi-scrub cycle analysis |
| 01/03/2013 | US20130007541 Preemptive memory repair based on multi-symbol, multi-scrub cycle analysis |
| 01/03/2013 | US20130003477 Semiconductor memory device including spare antifuse array and antifuse repair method of the semiconductor memory device |
| 01/03/2013 | US20130003459 Read Error Recovery for Solid-State Memory Based on Cumulative Background Charges |
| 01/03/2013 | US20130003444 Semiconductor memory device and test method therefor |
| 01/02/2013 | EP2539899A1 Method for checking the functionality of a memory element |
| 01/02/2013 | EP2159709B1 Error correcting method and computing element |
| 01/02/2013 | CN202650549U High-low temperature and high-low voltage simulation test system for internal memory |
| 01/02/2013 | CN202650548U Automatic electrical characteristic test system for internal memories |
| 01/02/2013 | CN102855943A Error correction controller, flash memory chip system thereof and error correction method |
| 01/02/2013 | CN102855942A Semiconductor chip |
| 01/02/2013 | CN102855941A Preemptive memory repair based on multi-symbol, multi-scrub cycle analysis |
| 01/02/2013 | CN102855940A Syndrome computing method and computing device thereof |
| 01/02/2013 | CN102855939A Semiconductor apparatus and test method therefor |
| 01/02/2013 | CN102163463B Double coin search method for reducing BCH (broadcast channel) decoding delay |
| 01/02/2013 | CN101964213B Test method on failure analysis of storage cell |
| 01/02/2013 | CN101901634B USB memory testing sorter |
| 01/02/2013 | CN101901589B Image processing system and sampling phase correction method of memory device |
| 01/02/2013 | CN101789268B Memory device and operation method thereof |
| 01/02/2013 | CN101770813B Detection method for detecting interference phenomenon of adjacent blocks of non-volatile storage |
| 01/02/2013 | CN101727366B Computer system for performing remote copy using journal |
| 01/02/2013 | CN101329916B Flash memory device error correction code controllers and related methods and memory systems |
| 01/02/2013 | CN101325090B Offsetting cyclic redundancy code lanes from data lanes to reduce latency |
| 01/02/2013 | CN101079321B Flash memory device including a dummy cell |
| 01/01/2013 | US8347185 Memory and method for checking reading errors thereof |
| 01/01/2013 | US8347180 Data storage system and method |
| 01/01/2013 | US8347179 Selective storage of additional inversion data or EDC data |
| 01/01/2013 | US8347176 Method and apparatus for memory read-refresh, scrubbing and variable-rate refresh |
| 01/01/2013 | US8347171 Semiconductor memory device capable of reducing current in PASR mode |
| 01/01/2013 | US8347165 Self-timed error correcting code evaluation system and method |
| 01/01/2013 | US8347155 Systems and methods for predicting failure of a storage medium |
| 01/01/2013 | US8345496 Memory test apparatus and testing method |
| 01/01/2013 | US8345495 Test circuit, nonvolatile semiconductor memory appratus using the same, and test method |
| 01/01/2013 | US8345494 Semiconductor memory device |
| 01/01/2013 | US8345493 Semiconductor memory device |
| 12/27/2012 | WO2012177368A1 Bit scan circuit and method in non-volatile memory |
| 12/27/2012 | WO2012134755A3 Measurement initialization circuitry |
| 12/27/2012 | US20120327729 Memory testing device having cross interconnections of multiple drivers and its implementing method |
| 12/27/2012 | DE10002127B4 Testverfahren für einen Datenspeicher Test method for a data memory |
| 12/26/2012 | CN202632785U Data detecting device for NAND Flash chip |
| 12/26/2012 | CN102842344A Method for testing EEPROM (electrically erasable programmable read-only memory) read-write cycle times |
| 12/26/2012 | CN102842343A System and method for execution of different baud rate test instruction in CLI (command-line interface) |
| 12/26/2012 | CN102842342A Test system and method for data storage |
| 12/26/2012 | CN102136299B Method for preventing address data of LED decoding module from being lost |
| 12/26/2012 | CN101719383B Method for testing flash memory chips |
| 12/26/2012 | CN101202109B Non-volatile semiconductor memory system and corresponding programming method |
| 12/25/2012 | US8341501 Adaptive endurance coding of non-volatile memories |
| 12/25/2012 | US8341500 Detecting corrupted data for a system having non-volatile memory |
| 12/25/2012 | US8341499 System and method for error detection in a redundant memory system |
| 12/25/2012 | US8341498 System and method of data encoding |
| 12/25/2012 | US8341497 Semiconductor storage |
| 12/25/2012 | US8341496 Redundant data in storage medium |
| 12/25/2012 | US8341476 I-R voltage drop screening when executing a memory built-in self test |
| 12/25/2012 | US8341471 Apparatus and method for synchronization within systems having modules processing a clock signal at different rates |
| 12/25/2012 | US8341470 Semiconductor memory device supporting read data bus inversion function and method of testing the semiconductor memory device |
| 12/25/2012 | US8341468 Information apparatus |
| 12/25/2012 | US8339888 Memory devices having programmable elements with accurate operating parameters stored thereon |
| 12/25/2012 | US8339868 Semiconductor device and write control method for semiconductor device |
| 12/25/2012 | US8339728 Magnetic memory device using magnetic domain motion |
| 12/20/2012 | WO2012173238A1 Semiconductor device manufacturing method and semiconductor device |
| 12/20/2012 | US20120324301 Method for checking the functional ability of a memory element |
| 12/20/2012 | US20120320688 Switched interface stacked-die memory architecture |
| 12/20/2012 | DE10129263B4 Nichtflüchtiger ferroelektrischer Speicher und Verfahren zum Erfassen mangelhafter Zellen in diesem Non-volatile ferroelectric memory and method for detecting defective cells in this |
| 12/19/2012 | EP2534659A2 Memory dies, stacked memories, memory devices and methods |