| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 02/07/2013 | WO2013019713A1 Memory die self-disable if programmable element is not trusted |
| 02/07/2013 | WO2013019672A1 System and method for testing fuse blow reliability for integrated circuits |
| 02/07/2013 | WO2013018281A1 Resistance variable nonvolatile memory device, and driving method therefor |
| 02/07/2013 | WO2013018202A1 Data communication device and control method |
| 02/07/2013 | US20130033948 Device and method for detecting resistive defect |
| 02/07/2013 | US20130033935 Memory die self-disable if programmable element is not trusted |
| 02/06/2013 | CN102915771A SRAM noise margin measuring method |
| 02/06/2013 | CN102915770A Method for reducing inter-crosstalk of internal data of flash memory chip, flash memory storage system and controller thereof |
| 02/06/2013 | CN102915769A Implementation and optimization method for processor EDAC (error detection and correction) circuit |
| 02/06/2013 | CN102915768A Device and method for tolerating faults of storage based on triple modular redundancy of EDAC module |
| 02/06/2013 | CN102915767A Method, device and system for improving SSD (solid state disk) response speed on basis of data compressibility |
| 02/06/2013 | CN102915766A Systems and methods for operating on a storage device using a life-cycle dependent coding scheme |
| 02/06/2013 | CN102915764A Method for improving defect tolerance of flash memory chips, flash memory system and controller thereof |
| 02/06/2013 | CN101510447B Redundancy circuit in semiconductor memory device |
| 02/05/2013 | US8370720 Mass storage device and method for offline background scrubbing of solid-state memory devices |
| 02/05/2013 | US8370719 Persistent moving read reference |
| 02/05/2013 | US8370717 Method and apparatus for flexible buffers in an XOR engine |
| 02/05/2013 | US8370716 USB device and correction method thereof |
| 02/05/2013 | US8370715 Error checking addressable blocks in storage |
| 02/05/2013 | US8370714 Reference cells for spin torque based memory device |
| 02/05/2013 | US8370713 Error correction code decoding device |
| 02/05/2013 | US8370712 Memory management in a non-volatile solid state memory device |
| 02/05/2013 | US8370710 Non-volatile memory devices, systems, and data processing methods thereof |
| 02/05/2013 | US8370708 Data error measuring circuit for semiconductor memory apparatus |
| 02/05/2013 | US8370705 System and method for calculating a checksum address while maintaining error correction information |
| 02/05/2013 | US8370691 Testing of soft error detection logic for programmable logic devices |
| 02/05/2013 | US8369167 Semiconductor memory device and method of testing a sense amplifier of the same |
| 02/05/2013 | US8369166 Redundancy system for non-volatile memory |
| 02/05/2013 | US8369145 Apparatus and method for detecting over-programming condition in multistate memory device |
| 02/05/2013 | US8369137 Semiconductor memory device including a write driver to output a program signal |
| 01/31/2013 | WO2013016467A1 Non-volatile memory saving cell information in a non-volatile memory array |
| 01/31/2013 | WO2013014974A1 Memory controller, semiconductor storage device, and decoding method |
| 01/31/2013 | US20130031432 Fully-buffered dual in-line memory module with fault correction |
| 01/31/2013 | US20130031430 Non-Volatile Memory and Method with Accelerated Post-Write Read Using Combined Verification of Multiple Pages |
| 01/31/2013 | US20130031429 Data Recovery for Defective Word Lines During Programming of Non-Volatile Memory Arrays |
| 01/31/2013 | US20130028036 Method of Screening Static Random Access Memories for Unstable Memory Cells |
| 01/31/2013 | US20130028035 Memory device |
| 01/31/2013 | DE19603107B4 Selbst-Voralterungsschaltung für Halbleiterspeicher Self-Voralterungsschaltung for semiconductor memories |
| 01/31/2013 | DE102011079780A1 Vorrichtung und Verfahren zum Testen eines Speichers eines elektrischen Gerätes Apparatus and method for testing a memory of an electrical apparatus |
| 01/30/2013 | EP2551855A2 Device and method for testing a storage of an electronic device |
| 01/30/2013 | EP2550661A1 Composite semiconductor memory device with error correction |
| 01/30/2013 | CN102903395A Reliability testing method for memories |
| 01/30/2013 | CN102903394A Semiconductor memory apparatus and semiconductor system having the same |
| 01/30/2013 | CN102903393A Memory built-in self-test circuit |
| 01/30/2013 | CN102903392A Memory cell test circuit and test method thereof |
| 01/30/2013 | CN102903391A Memory chip and method for operating the same |
| 01/30/2013 | CN101976584B Quasi-cyclic low density parity-check code (QC-LDPC) decoder and decoding method |
| 01/30/2013 | CN101770814B Flash memory, test method thereof and test system thereof |
| 01/29/2013 | US8365055 High performance cache directory error correction code |
| 01/29/2013 | US8365044 Memory device with error correction based on automatic logic inversion |
| 01/29/2013 | US8365043 Efficient redundant memory unit array |
| 01/29/2013 | US8365042 Unidirectional error code transfer for both read and write data transmitted via bidirectional data link |
| 01/29/2013 | US8365041 MLC self-raid flash data protection scheme |
| 01/29/2013 | US8365040 Systems and methods for handling immediate data errors in flash memory |
| 01/29/2013 | US8365039 Adjustable read reference for non-volatile memory |
| 01/29/2013 | US8365028 Apparatus, methods, and system of NAND defect management |
| 01/29/2013 | US8365027 Processor and method for controlling storage-device test unit |
| 01/29/2013 | US8365026 Methods for performing fail test, block management, erasing and programming in a nonvolatile memory device |
| 01/29/2013 | US8365025 Flash memory |
| 01/29/2013 | US8363496 Semiconductor memory device performing refresh operation and method of testing the same |
| 01/29/2013 | US8362766 Circuit for analyzing and affecting subtle energy resonance |
| 01/24/2013 | WO2011157568A8 Method of protecting a configurable memory against permanent and transient errors and related device |
| 01/24/2013 | US20130024746 Systems and methods of storing data |
| 01/24/2013 | US20130024736 Programming error correction code into a solid state memory device with varying bits per cell |
| 01/24/2013 | US20130021864 Array Power Supply-Based Screening of Static Random Access Memory Cells for Bias Temperature Instability |
| 01/24/2013 | US20130021863 Test mode initialization device and method |
| 01/24/2013 | US20130021862 Dram and method for testing the same in the wafer level burn-in test mode |
| 01/24/2013 | US20130021861 Mechanisms for built-in self test and repair for memory devices |
| 01/24/2013 | US20130021860 Mechanisms for built-in self repair of memory devices using failed bit maps and obvious repairs |
| 01/24/2013 | US20130021859 Mechanisms for built-in self repair of memory devices using failed bit maps and obvious repairs |
| 01/23/2013 | EP2548205A1 Generic march element based memory built-in self test |
| 01/23/2013 | EP2548148A2 Modeling of cell delay change for electronic design automation |
| 01/23/2013 | CN102893336A Memory device having a local current sink |
| 01/23/2013 | CN102890971A Reliability test method for memory |
| 01/23/2013 | CN102890970A POP (Post Office Protocol) packaged SOC (System on Chip) DRAM (Dynamic Random Access Memory) input/output test method and device |
| 01/23/2013 | CN102890969A Data processing method, memory controller and memory storage device |
| 01/23/2013 | CN102890968A Die executing test mode operation and method for performing test mode operation |
| 01/23/2013 | CN102890967A Methods for preheating laser-based system |
| 01/23/2013 | CN101840733B Reliability test method |
| 01/23/2013 | CN101807437B Automatic scanning and sorting system and automatic scanning method for flash memories |
| 01/23/2013 | CN101640074B Memory repair circuit and imitative dual-port static random access memory using same |
| 01/23/2013 | CN101540203B Method for changing operation program in real time |
| 01/23/2013 | CN101499323B Memory module |
| 01/23/2013 | CN101405815B Non-volatile memory and method with redundancy data buffered in data latches for defective locations |
| 01/22/2013 | US8359524 Parallel reed-solomon RAID (RS-RAID) architecture, device, and method |
| 01/22/2013 | US8359521 Providing a memory device having a shared error feedback pin |
| 01/22/2013 | US8359517 Memory system and method using partial ECC to achieve low power refresh and fast access to data |
| 01/22/2013 | US8359501 Memory board with self-testing capability |
| 01/22/2013 | US8359456 Generating random addresses for verification of distributed computerized devices |
| 01/22/2013 | US8359445 Method and apparatus for signaling between devices of a memory system |
| 01/22/2013 | US8358548 Methods for efficiently repairing embedded dynamic random-access memory having marginally failing cells |
| 01/22/2013 | US8358525 Low cost high density rectifier matrix memory |
| 01/17/2013 | US20130019138 Data processing method, memory controller, and memory storage device |
| 01/17/2013 | US20130019133 Methods for testing a memory embedded in an integrated circuit |
| 01/17/2013 | US20130019132 Detecting random telegraph noise induced failures in an electronic memory |
| 01/17/2013 | US20130019131 Measurement of latency in data paths |
| 01/17/2013 | US20130019130 Testing electronic memories based on fault and test algorithm periodicity |
| 01/17/2013 | US20130016574 Semiconductor memory device having improved refresh characteristics |
| 01/16/2013 | EP2546752A1 Memory diagnostic method, memory diagnostic device, and memory diagnostic program |
| 01/16/2013 | EP2545554A2 Ldpc erasure decoding for flash memories |