G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation

Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
03/1989
03/14/1989	US4812678 Easily testable semiconductor LSI device
03/09/1989	WO1989002122A1 Arrangement and process for detecting and localizing faulty circuits in a storage component
03/08/1989	EP0305987A2 Self-correcting semiconductor memory device and microcomputer incorporating the same
03/07/1989	US4811299 Dynamic RAM device having a separate test mode capability
03/07/1989	US4811298 Decoding circuit arrangement for redundant semiconductor storage systems
03/07/1989	US4811294 Data integrity verifying circuit for electrically erasable and programmable read only memory (EEPROM)
03/01/1989	EP0304999A1 Semiconductor memory comprising an on-chip error correction device, and integrated circuit comprising such a semiconductor memory
03/01/1989	EP0077204B1 Error-correcting memory with low storage overhead and fast correction mechanism
02/1989
02/28/1989	US4809231 Method and apparatus for post-packaging testing of one-time programmable memories
02/28/1989	CA1250665A1 Method for storing the control code of a processor allowing effective code modification and addressing circuit therefor
02/22/1989	EP0303856A2 Method and apparatus for maintaining duplex-paired devices by means of a dual copy function
02/22/1989	EP0303855A2 Identification of data storage devices
02/21/1989	US4807197 Integrated circuit with function of monitoring an internal signal
02/21/1989	US4807196 Refresh address counter test control circuit for dynamic random access memory system
02/21/1989	US4807191 Redundancy for a block-architecture memory
02/21/1989	US4807188 Nonvolatile memory device with a high number of cycle programming endurance
02/15/1989	CN1031148A Self-testing memory
02/07/1989	US4803656 Semiconductor memory device having redundancy circuit portion
02/01/1989	EP0301794A1 Dynamic random access memory with a self-refreshing function
01/1989
01/31/1989	US4802166 Device for the verification of memory cells on the basis of the threshold drop obtainable during writing
01/31/1989	US4802137 Semiconductor memory device
01/31/1989	US4802117 Method of preserving data storage in a postal meter
01/31/1989	US4801869 Semiconductor defect monitor for diagnosing processing-induced defects
01/26/1989	WO1989000728A1 Integrated circuits
01/25/1989	EP0300885A1 Integrated circuit memory including an anti-fraud device
01/25/1989	EP0300516A2 Digital data processing system
01/25/1989	EP0300467A2 Semiconductur memory device with redundant memory cell array
01/25/1989	EP0300455A2 Programmable device and method of testing programmable device
01/24/1989	US4800332 Reconfigurable integrated circuit with enhanced testability of memory cell leakage
01/18/1989	EP0299677A2 Redundancy circuitry
01/17/1989	US4799195 Semiconductor memory device with a sense amplifier
01/17/1989	US4799021 Method and apparatus for testing EPROM type semiconductor devices during burn-in
01/17/1989	US4798976 Logic redundancy circuit scheme
01/10/1989	US4797886 Memory test pattern generator
01/04/1989	EP0297821A2 Semiconductor integrated circuit device having gate array and memory
01/04/1989	EP0297518A1 Programmable read only memory with means for discharging bit line before program verifying operation
01/03/1989	US4796233 Bipolar-transistor type semiconductor memory device having redundancy configuration
01/03/1989	US4795964 Method and apparatus for measuring the capacitance of complementary field-effect transistor devices
12/1988
12/29/1988	DE3817857A1 Method of self-testing a random access memory (RAM) of a circuit
12/27/1988	US4794597 Memory device equipped with a RAS circuit
12/27/1988	US4794568 Redundancy circuit for use in a semiconductor memory device
12/20/1988	CA1247254A1 Postage meter with a non-volatile memory security circuit
12/15/1988	DE3718182A1 Verfahren und anordnung zur ausfuehrung eines selbsttestes eines wortweise organisierten rams Method and arrangement for carrying out a self-organized in words of a famous rams
12/14/1988	EP0294947A2 Semiconductor memory device with an error-checking circuit
12/13/1988	US4791615 Memory with redundancy and predecoded signals
12/13/1988	US4791614 Semiconductor memory device having erroneous write operation preventing function
12/13/1988	US4791319 Semiconductor device with redundancy circuit and means for activating same
12/01/1988	WO1988009554A1 Process and arrangement for self-checking of a word-oriented ram
12/01/1988	DE3716594A1 Circuit arrangement for telecommunications systems, in particular telephone switching systems, with storage devices in which the correctness of stored information portions is checked
11/1988
11/30/1988	EP0293339A1 Nonvolatile memory device with a high number of cycle programming endurance
11/29/1988	US4788684 Memory test apparatus
11/23/1988	EP0292206A1 Self-testing memory arrangement and method
11/17/1988	WO1988009038A1 Self-testing memory
11/17/1988	EP0291283A2 Memory test method and apparatus
11/09/1988	EP0290094A1 Memory having redundant storage space
11/08/1988	US4783785 Method and apparatus for diagnosis of logical circuits
11/08/1988	US4783782 Manufacturing test data storage apparatus for dynamically reconfigurable cellular array processor chip
11/08/1988	US4783781 Semiconductor memory device having redundancy configuration with read circuit for defective memory address
11/03/1988	DE3713070A1 Circuit arrangement for sub-units of a device or system which is controlled by a stored program, and consists of several sub-units, e.g. a data processing system
11/02/1988	EP0288804A2 A semiconductor defect monitor
11/01/1988	US4782488 Digital signal scrambler
11/01/1988	US4782487 Memory test method and apparatus
11/01/1988	US4782486 Self-testing memory
11/01/1988	US4782467 Radiation hard gated feedback memory cell
11/01/1988	US4782465 Semiconductor integrated circuit device with memory cells connected to a divided sub-word line
10/1988
10/25/1988	US4780875 Semiconductor memory with reduced size ECC circuit
10/25/1988	US4780855 System for controlling a nonvolatile memory having a data portion and a corresponding indicator portion
10/25/1988	US4780851 Semiconductor memory device having improved redundant structure
10/25/1988	US4780602 IC card
10/19/1988	EP0287303A2 Scan test apparatus for digital systems having dynamic random access memory
10/19/1988	EP0286852A1 Circuit arrangement and method for testing memory cells
10/18/1988	US4779272 Testable variable-threshold non-volatile semiconductor memory
10/18/1988	CA1243428A1 Electrical lapping guide for controlling the batch fabrication of thin film magnetic transducers
10/12/1988	EP0285955A1 Device to connect non-volatile memories in an electronic machine, and postage meter using it
10/11/1988	US4777586 Semiconductor integrated circuit device with built-in arrangement for memory testing
10/06/1988	DE3709524A1 Method of testing the memory cell contents of a program memory
10/05/1988	CN88100759A Memory re-mapping in microcomputer system
09/1988
09/28/1988	EP0284102A2 Semiconductor memory device with improved redundant scheme
09/28/1988	EP0283908A1 Integrated multistage decoder
09/28/1988	EP0283907A1 Circuit arrangement and method for testing memory cells
09/28/1988	EP0283906A1 Method and circuit arrangement for testing a semiconductor memory
09/28/1988	EP0283564A2 Memory re-mapping in a microcomputer system
09/27/1988	US4774712 Redundant storage device having address determined by parity of lower address bits
09/27/1988	US4774493 Method and apparatus for transferring information into electronic systems
09/22/1988	WO1988007292A1 Gate circuit with mos transistors
09/21/1988	EP0283186A2 Semiconductor integrated circuit with a plurality of circuit blocks having equivalent functions
09/21/1988	EP0282976A1 Method and circuit arrangement for the parallel write-in of data in a semiconductor memory
09/21/1988	EP0282975A1 Multi-stage integrated decoder device
09/21/1988	EP0282926A2 ID system and method of writing data in an ID system
09/21/1988	EP0096030B1 Apparatus for high speed fault mapping of large memories
09/20/1988	US4773046 Semiconductor device having fuse circuit and detecting circuit for detecting states of fuses in the fuse circuit
09/20/1988	CA1242276A1 Programmable word length and self-testing memory in a gate array with bidirectional symmetry
09/20/1988	CA1242246A1 Defect leakage screen system
09/14/1988	EP0282384A1 Method and arrangement for addressing redundant elements in an integrated memory
09/14/1988	EP0281868A2 Semiconductor memory device with protection cells
09/14/1988	EP0281740A2 Memories and the testing thereof
09/13/1988	US4771407 Semiconductor integrated circuit having function for switching operational mode of internal circuit
09/06/1988	US4769644 Cellular automata devices
08/1988
08/31/1988	EP0279912A2 Multiple copy data mechanism on synchronous disk drives
08/30/1988	US4768194 Integrated semiconductor memory

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