| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 08/30/1988 | US4768193 Semiconductor memory device having error correction function and incorporating redundancy configuration |
| 08/30/1988 | US4768169 Fault-tolerant memory array |
| 08/24/1988 | CN88100490A Measuring method for effective address of mass storage |
| 08/23/1988 | US4766573 Semiconductor memory device with error correcting circuit |
| 08/09/1988 | US4763304 Semiconductor random access memory device having switchable input and output bit forms |
| 08/09/1988 | CA1240397A1 Address generator for storage and retrieval of diagnostic data |
| 08/02/1988 | US4761767 High reliability integrated circuit memory |
| 08/02/1988 | CA1240066A1 Dynamic memory refresh and parity checking circuit |
| 07/27/1988 | EP0276047A2 Microcomputer with built-in EPROM |
| 07/27/1988 | EP0275752A1 Integrated circuit having means for switching towards redundant elements in a memory |
| 07/26/1988 | US4760575 IC card having fault checking function |
| 07/26/1988 | CA1239695A1 Crash survivable solid state memory for aircraft flight data recorder systems |
| 07/19/1988 | US4758992 Method and device for refreshing dynamic semiconductor memory device |
| 07/19/1988 | US4758991 Rewritable semiconductor memory device having a decoding inhibit function |
| 07/19/1988 | US4758989 ROM having bit lines interlaced with column lines and cell column selection according to regularly interlaced logical fields |
| 07/19/1988 | US4758988 Dual array EEPROM for high endurance capability |
| 07/19/1988 | US4758749 CMOS current sense amplifier |
| 07/13/1988 | EP0274378A2 Semiconductor memory device |
| 07/12/1988 | US4757523 High speed testing of integrated circuit |
| 07/12/1988 | US4757503 Self-testing dynamic ram |
| 07/12/1988 | US4757475 Semiconductor memory device having diode matrix type decoder and redundancy configuration |
| 07/12/1988 | US4757474 Semiconductor memory device having redundancy circuit portion |
| 07/12/1988 | US4757215 Data transmission circuit having decreased parasitic capacitance |
| 07/06/1988 | EP0273821A2 Semiconductor integrated circuit with a test function |
| 07/05/1988 | US4755970 Method and apparatus for functional testing of a memory which is reprogrammable electrically word by word |
| 06/29/1988 | EP0272848A2 Semiconductor device having programmable read only memory cells for specific mode |
| 06/28/1988 | US4754434 Switching plane redundancy |
| 06/28/1988 | US4754396 Overlapped control store |
| 06/28/1988 | CA1238715A1 Fault tolerant memory |
| 06/21/1988 | US4752929 Method of operating a semiconductor memory with a capability of testing, and an evaluation circuit for performing the method |
| 06/21/1988 | US4752914 Semiconductor integrated circuit with redundant circuit replacement |
| 06/14/1988 | US4751679 Gate stress test of a MOS memory |
| 06/14/1988 | US4751656 Method for choosing replacement lines in a two dimensionally redundant array |
| 06/14/1988 | US4751636 Memory management method and apparatus for initializing and/or clearing R/W storage areas |
| 06/14/1988 | CA1238124A1 Stability testing of semiconductor memories |
| 06/07/1988 | US4750181 Dynamic circuit checking apparatus using data input and output comparisons for testing the data integrity of a circuit |
| 06/07/1988 | US4750158 Integrated matrix of nonvolatile, reprogrammable storage cells |
| 06/01/1988 | EP0268789A2 Modular organized storage tester |
| 05/31/1988 | US4748627 Semiconductor memory device with an error correction function |
| 05/31/1988 | US4748597 Semiconductor memory device with redundancy circuits |
| 05/31/1988 | US4748320 IC card |
| 05/25/1988 | EP0268401A2 Semiconductor memory systems and methods of operating them |
| 05/25/1988 | EP0268289A2 Semiconductor memory device |
| 05/18/1988 | EP0267587A2 Semiconductor memory device with improved cell arrangement |
| 05/18/1988 | CN87107224A Massively parallel array processing system |
| 05/17/1988 | US4745582 Bipolar-transistor type random access memory device having redundancy configuration |
| 05/10/1988 | US4744061 Dynamic semiconductor memory device having a simultaneous test function for divided memory cell blocks |
| 05/10/1988 | US4744060 Bipolar-transistor type random access memory having redundancy configuration |
| 05/10/1988 | US4744058 Semiconductor programmable memory device and method of writing a predetermined pattern to same |
| 05/10/1988 | US4744049 Microcode testing of a cache in a data processor |
| 05/03/1988 | US4742564 Tuning alignment data memory device for tuning circuits tunable to selectable frequencies |
| 05/03/1988 | US4742490 Integrated semiconductor memory |
| 05/03/1988 | US4742489 Integrated semiconductor memory |
| 05/03/1988 | US4742486 Semiconductor integrated circuit having function for switching operational mode of internal circuit |
| 04/27/1988 | EP0264893A2 Semiconductor memory |
| 04/26/1988 | US4740971 Tag buffer with testing capability |
| 04/26/1988 | US4740925 Extra row for testing programmability and speed of ROMS |
| 04/26/1988 | US4740919 Electrically programmable logic array |
| 04/26/1988 | US4740914 Address generator |
| 04/26/1988 | EP0150194A4 A byte wide memory circuit having a column redundancy circuit. |
| 04/13/1988 | EP0263470A2 Method and arrangements for testing megabit memory modules with arbitrary test patterns in a multiple bit test mode |
| 04/13/1988 | EP0263312A2 Semiconductor memory device with a self-testing function |
| 04/12/1988 | US4737936 Semiconductor memory device having improved write-verify operation |
| 04/12/1988 | US4737935 Integrated write/read memory |
| 04/06/1988 | EP0262867A2 Integrated circuit with memory self-test |
| 04/06/1988 | EP0262675A1 Semiconductor memory device with improved cell arrangement |
| 04/06/1988 | EP0262452A2 Redundant storage device having address determined by parity of lower address bits |
| 04/05/1988 | US4736373 Memory tester having concurrent failure data readout and memory repair analysis |
| 04/05/1988 | US4736291 General-purpose array processor |
| 03/30/1988 | EP0110636B1 Improvements in or relating to semiconductor memories |
| 03/29/1988 | US4734889 Semiconductor memory |
| 03/29/1988 | CA1234629A1 Fast writing circuit for a soft error protected storage cell |
| 03/23/1988 | EP0261034A2 Massively parallel array processing system |
| 03/23/1988 | EP0260982A2 Test system for random access memory |
| 03/22/1988 | US4733394 Electrically programmable semiconductor memory showing redundance |
| 03/22/1988 | US4733393 Test method and apparatus for cellular array processor chip |
| 03/22/1988 | US4733392 Fail memory equipment in memory tester |
| 03/22/1988 | US4733372 Semiconductor memory having redundancy |
| 03/16/1988 | EP0259859A2 Information processing system capable of reducing invalid memory operations by detecting an error in a main memory |
| 03/16/1988 | EP0259444A1 Nonvolatile memory system having a testing capability. |
| 03/16/1988 | EP0034188B1 Error correction system |
| 03/15/1988 | US4731760 On-chip test circuitry for an ECL PROM |
| 03/15/1988 | US4731759 Integrated circuit with built-in indicator of internal repair |
| 03/08/1988 | US4730318 Modular organized storage tester |
| 03/08/1988 | US4730273 On-chip programmability verification circuit for programmable read only memory having lateral fuses |
| 03/02/1988 | EP0257120A1 Decoding method and circuit arrangement for a redundant CMOS semiconductor memory |
| 03/02/1988 | EP0056400B1 Memory security circuit |
| 03/01/1988 | US4729117 Semiconductor memory device |
| 02/25/1988 | DE3724509A1 Dynamischer ram Dynamic ram |
| 02/24/1988 | EP0256864A2 Digital data processing apparatus |
| 02/23/1988 | US4727516 Semiconductor memory device having redundancy means |
| 02/18/1988 | DE3635012C1 Method of testing a RAM |
| 02/16/1988 | US4726023 Determination of testability of combined logic end memory by ignoring memory |
| 02/16/1988 | US4726021 Semiconductor memory having error correcting means |
| 02/16/1988 | US4725985 Circuit for applying a voltage to a memory cell MOS capacitor of a semiconductor memory device |
| 02/16/1988 | US4725980 Read only memory circuit |
| 02/09/1988 | US4724531 Gate array with bidirectional symmetry |
| 02/09/1988 | US4724517 Microcomputer with prefixing functions |
| 02/09/1988 | US4724422 Redundant decoder |
| 02/03/1988 | EP0255449A1 Semiconductor integrated circuit having a test circuit |