| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 11/03/1992 | US5161157 Field-programmable redundancy apparatus for memory arrays |
| 11/03/1992 | US5161120 Data output buffer for a semiconductor memory |
| 10/27/1992 | US5159599 High speed testing for programmable logic devices |
| 10/27/1992 | US5159571 Semiconductor memory with a circuit for testing characteristics of flip-flops including selectively applied power supply voltages |
| 10/27/1992 | US5159263 Lsi system having a test facilitating circuit |
| 10/21/1992 | EP0509633A2 Semiconductor memory |
| 10/21/1992 | EP0509485A1 Semiconductor integrated circuit having post-package testing function for error detection and correction circuit |
| 10/21/1992 | EP0509360A1 Dynamic random access memory device with multiple word line selector used in burn-in test |
| 10/20/1992 | US5157664 Tester for semiconductor memory devices |
| 10/20/1992 | US5157634 Dram having extended refresh time |
| 10/20/1992 | US5157630 Semiconductor memory which can be prevented from shifting to undesired operation mode |
| 10/20/1992 | US5157629 Selective application of voltages for testing storage cells in semiconductor memory arrangements |
| 10/20/1992 | US5157628 Semiconductor memory |
| 10/20/1992 | US5157627 Method and apparatus for setting desired signal level on storage element |
| 10/20/1992 | US5157335 On-chip error detection circuit |
| 10/20/1992 | US5157328 System for and method of detecting reverse packaging of PROM |
| 10/15/1992 | WO1992017842A1 Stable memory operations |
| 10/14/1992 | EP0508441A2 Recording device having short data writing time |
| 10/13/1992 | US5155845 Data storage system for providing redundant copies of data on different disk drives |
| 10/13/1992 | US5155844 Background memory test during system start up |
| 10/13/1992 | US5155835 Automatically archiving infrequently used data records |
| 10/13/1992 | US5155819 Flexible ASIC microcomputer permitting the modular modification of dedicated functions and macroinstructions |
| 10/13/1992 | US5155704 Random access memory integrated circuit |
| 10/13/1992 | US5155701 Semiconductor integrated circuit device and method of testing the same |
| 10/07/1992 | EP0507026A2 A process for storing files of an electronic system |
| 10/06/1992 | US5153882 Serial scan diagnostics apparatus and method for a memory device |
| 10/06/1992 | US5153880 Integrated circuit memory array |
| 10/06/1992 | US5153853 Method and apparatus for measuring EEPROM threshold voltages in a nonvolatile DRAM memory device |
| 10/06/1992 | US5153521 Broken wire detector for use in a massively parallel array processing system |
| 10/06/1992 | US5153509 System for testing internal nodes in receive and transmit FIFO's |
| 09/30/1992 | EP0505914A2 Programmable read only memory device having a test tool for testing the error checking and correction circuit |
| 09/30/1992 | EP0505652A1 Memory system with adaptable redundancy |
| 09/30/1992 | EP0505603A1 Method for testing a data memory having an associated protection memory and a circuit arrangement carrying out said method |
| 09/29/1992 | US5151906 Semiconductor memory device having self-correcting function |
| 09/29/1992 | US5151881 Semiconductor memory including an arrangement to permit external monitoring of an internal control signal |
| 09/23/1992 | EP0504434A1 Semiconductor memory unit having redundant structure |
| 09/23/1992 | CN1018401B Method of flash write for testing ram |
| 09/22/1992 | US5150325 Bi-CMOS semiconductor memory device, including improved layout structure and testing method |
| 09/17/1992 | WO1992015931A2 Redundant shift registers for scanning devices |
| 09/17/1992 | WO1992015892A1 Test process for redundant shift registers |
| 09/16/1992 | EP0503770A1 Interleaved multiprocessor memory system |
| 09/16/1992 | EP0503100A1 Semiconductor memory |
| 09/16/1992 | EP0502884A1 Method and device for semiconductor fabrication fault analasys. |
| 09/15/1992 | US5148540 System with backup of data storage status and device identification for enabling system recovery after powerloss |
| 09/15/1992 | US5148436 Circuit for detecting false read data from eprom |
| 09/15/1992 | US5148398 Semiconductor memory device with built-in test circuit and method for testing the same |
| 09/10/1992 | DE4107007A1 Watchdog system for data and address buses of data processing system - has module with memories and registers for test data and reference values for comparison |
| 09/08/1992 | US5146606 Systems for interconnecting and configuring plurality of memory elements by control of mode signals |
| 09/08/1992 | US5146589 Refresh control for dynamic memory in multiple processor system |
| 09/08/1992 | US5146571 Remapping defects in a storage system through the use of a tree structure |
| 09/08/1992 | US5146458 Data transfer checking system |
| 09/08/1992 | US5146429 Semiconductor memory device including a redundancy circuitry for repairing a defective memory cell and a method for repairing a defective memory cell |
| 09/03/1992 | DE4202623A1 Sensing path arrangement for test circuits, e.g. for testing RAM(s) - has two groups of registers in series with controller managing priority of shift operation of first gp. |
| 08/26/1992 | EP0238417B1 Semiconductor memory device |
| 08/25/1992 | US5142541 Error-bit generating circuit for use in a non-volatile semiconductor memory device |
| 08/25/1992 | US5142540 Multipart memory apparatus with error detection |
| 08/25/1992 | US5142496 Method for measuring VT 's less than zero without applying negative voltages |
| 08/25/1992 | US5142495 Variable load for margin mode |
| 08/19/1992 | EP0499365A2 Data processing system and method for encoding and rebuilding data contents of unavailable DASDS |
| 08/19/1992 | EP0499131A1 High efficiency row redundancy for dynamic ram |
| 08/18/1992 | US5140597 Semiconductor memory device having mask rom structure |
| 08/18/1992 | US5140554 Integrated circuit fuse-link tester and test method |
| 08/18/1992 | US5140553 Flash writing circuit for writing test data in dynamic random access memory (dram) devices |
| 08/18/1992 | US5140189 WSI decoder and patch circuit |
| 08/11/1992 | US5138619 Built-in self test for integrated circuit memory |
| 08/11/1992 | US5138427 Semiconductor device having a particular structure allowing for voltage stress test application |
| 08/11/1992 | US5138419 Wafer scale integration device with dummy chips and relay pads |
| 08/07/1992 | WO1992014208A1 Disk drive array memory system using nonuniform disk drives |
| 08/07/1992 | CA2101848A1 Disk drive array memory system using nonuniform disk drives |
| 07/29/1992 | EP0496613A2 Portable semiconductor storage device |
| 07/29/1992 | EP0496506A2 A processing unit for a computer and a computer system incorporating such a processing unit |
| 07/29/1992 | EP0496391A2 Semiconductor memory device |
| 07/29/1992 | EP0496282A2 Redundant random access memory device equipped with encoder coupled between programming circuits and redundant word line driving circuits |
| 07/28/1992 | US5134616 Dynamic ram with on-chip ecc and optimized bit and word redundancy |
| 07/28/1992 | US5134587 Semiconductor memory with automatic test mode exit on chip enable |
| 07/28/1992 | US5134586 Semiconductor memory with chip enable control from output enable during test mode |
| 07/28/1992 | US5134585 Circuit for repairing defective bit in semiconductor memory device and repairing method |
| 07/28/1992 | US5134584 Reconfigurable memory |
| 07/28/1992 | US5134583 Nonvolatile semiconductor memory device having redundant data lines and page mode programming |
| 07/23/1992 | WO1992012520A1 Process for testing a store arranged on a semiconductor component as a macrocell on the self-testing principle and circuit for implementing said process |
| 07/23/1992 | DE4134192A1 Integrierter schaltkreis mit verarbeitung im speicher Integrated circuitry with processing in the store |
| 07/22/1992 | EP0186459B1 Semiconductor memory incorporating a test pattern generator |
| 07/21/1992 | US5132973 Testable embedded RAM arrays for bus transaction buffering |
| 07/21/1992 | US5132937 Semiconductor memory device having on-chip test circuit and operating method thereof |
| 07/21/1992 | US5132929 Static RAM including leakage current detector |
| 07/21/1992 | US5132928 Divided word line type non-volatile semiconductor memory device |
| 07/21/1992 | US5132565 Semiconductor integrated circuit including voltage level shifting |
| 07/15/1992 | EP0494547A2 Fault mapping apparatus for computer memory |
| 07/14/1992 | US5130989 Serial and parallel scan technique for improved testing of systolic arrays |
| 07/14/1992 | US5130575 Testable latch self checker |
| 07/08/1992 | CN1062613A Redundant means of semiconductor memory device and method thereof |
| 07/07/1992 | US5128947 Self-checking memory cell array apparatus |
| 07/07/1992 | US5128944 Apparatus and method for providing notification of bit-cell failure in a redundant-bit-cell memory |
| 07/07/1992 | US5128941 Method of organizing a memory for fault tolerance |
| 07/07/1992 | CA1304821C Memory selftest method and apparatus |
| 07/02/1992 | DE4141478A1 Semiconductor memory with test mode - has memory cell field in matrix of lines and columns, and read=out data transmit line |
| 07/02/1992 | DE4111708A1 Redundanzvorrichtung fuer eine halbleiterspeichervorrichtung und verfahren zum ersetzen einer defekten speicherzelle Redundancy device for a semi-conductor memory device and method for replacing a defective memory cell |
| 07/01/1992 | EP0493013A2 Semiconductor integrated circuit having test circuit |
| 07/01/1992 | EP0492624A1 Semiconductor integrated circuit |
| 07/01/1992 | EP0492610A1 Dynamic random access memory |