G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation

Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
02/1987
02/17/1987	US4644494 Solid state memory for aircraft flight data recorder systems
02/11/1987	CN86105604A Circuit arrangment for testing integrated circuit components
02/11/1987	CN86100445A Dynamic memory refresh & parity chekcing circuit
02/10/1987	US4642784 Integrated circuit manufacture
02/05/1987	DE3526485A1 Schaltungsanordnung zum pruefen integrierter schaltungseinheiten Circuitry for testing integrated circuit units
02/03/1987	US4641286 Auxiliary decoder for semiconductor memory device
02/03/1987	US4641285 Line change-over circuit and semiconductor memory using the same
01/1987
01/29/1987	WO1987000675A2 Control system for chained circuit modules
01/29/1987	WO1987000674A2 Wafer-scale integrated circuit memory
01/27/1987	US4639919 Distributed pattern generator
01/27/1987	US4639915 High speed redundancy processor
01/27/1987	US4639897 Priority encoded spare element decoder
01/27/1987	US4639896 Redundant row decoding for programmable devices
01/27/1987	US4639895 Semiconductor memory device
01/27/1987	US4639858 Apparatus and method for testing and verifying the refresh logic of dynamic MOS memories
01/20/1987	US4638463 Fast writing circuit for a soft error protected storage cell
01/20/1987	CA1216901A1 Information storing circuit using blown and unblown fuses
01/14/1987	EP0208555A2 Semiconductor memory device having redundancy configuration
01/10/1987	EP0099910A4 Semiconductor memory utilizing redundant circuitry.
01/07/1987	EP0207249A2 Electrically programmable logic array
01/06/1987	US4635232 Semiconductor memory device
01/06/1987	US4635190 Integrated dynamic write-read memory with a decoder blocking the data path from the memory matrix
01/02/1987	DE3522220A1 Arrangement for output of control signals to control elements of a process
12/1986
12/30/1986	US4633442 Protective circuitry for a read only memory
12/30/1986	US4633429 Partial memory selection using a programmable decoder
12/30/1986	EP0206844A1 Once only electrically programmable read-only memory
12/30/1986	EP0206695A2 Semiconductor memory device adapted to carry out operation test
12/30/1986	EP0206486A2 Memory test circuit
12/30/1986	EP0097148B1 Improvements in or relating to wafer scale integrated circuits
12/30/1986	EP0031380B1 Programmable read only memory integrated circuit with bit-check and deprogramming modes and methods for programming and testing said circuit
12/23/1986	US4631724 Semiconductor memory test equipment
12/17/1986	EP0205258A2 Semiconductor integrated circuit having a function for switching the operational modes of an internal circuit
12/16/1986	US4630241 Method of programming for programmable circuit in redundancy circuit system
12/16/1986	CA1215471A1 Redundant rows in integrated circuit memories
12/09/1986	US4628510 Memory device
12/09/1986	US4628509 Testing apparatus for redundant memory
12/03/1986	EP0203357A2 Apparatus for substituting a memory in a motor vehicle control system
12/02/1986	US4627053 Method of repairing semiconductor memory
11/1986
11/26/1986	EP0202892A2 Semiconductor memory device with diode matrix decoder and redundancy configuration
11/26/1986	EP0202873A2 Semiconductor memory device
11/25/1986	US4625162 Fusible link short detector with array of reference fuses
11/25/1986	CA1214553A1 Semiconductor memory device
11/12/1986	CN86101909A Mass data recorder with dual memory system
11/11/1986	US4622668 Process and apparatus for testing a microprocessor and dynamic ram
11/05/1986	EP0199744A1 Fault tolerant memory array.
11/05/1986	EP0100339A4 A circuit for applying a high voltage signal to a fusible link.
11/04/1986	US4621346 Low power CMOS fuse circuit
11/04/1986	US4621345 Soft error protection circuit for a storage cell
10/1986
10/29/1986	EP0198935A1 Electrically erasable programmable redundant semiconductor memory
10/28/1986	CA1213325A1 Digital circuit testing arrangement
10/23/1986	WO1986006205A1 Electrically programmable read-only memory
10/23/1986	WO1986006186A1 Wafer scale integrated circuit
10/15/1986	EP0197363A1 Process for operating a semiconductor memory with integrated parallel test capability and evaluation circuit for carrying out the process
10/15/1986	CN86100419A Serial accessed semiconductor memory
10/14/1986	US4617651 Redundancy circuit for use in a semiconductor memory array
10/08/1986	EP0196838A2 Mass data recorder with dual memory system
10/01/1986	EP0195839A1 Stability testing of semiconductor memories
09/1986
09/30/1986	US4615030 Semiconductor memory device with self correction circuit
09/30/1986	US4614881 Integrated semiconductor circuit device for generating a switching control signal using a flip-flop circuit including CMOS FET's and flip-flop setting means
09/24/1986	EP0195631A2 Semiconductor memory
09/24/1986	EP0195445A2 Semiconductor memory device with an error correction function
09/24/1986	EP0195429A2 Semiconductor memory device
09/24/1986	EP0195412A2 Integrated circuit with built-in indicator of internal repair
09/23/1986	US4613959 Zero power CMOS redundancy circuit
09/23/1986	CA1211858A1 Address transformation system having an address shuffler
09/17/1986	EP0194663A2 A postage meter with a non-volatile memory security circuit
09/16/1986	US4612640 Error checking and correction circuitry for use with an electrically-programmable and electrically-erasable memory array
09/16/1986	US4612630 EEPROM margin testing design
09/03/1986	EP0193210A2 Semiconductor memory device with a built-in test circuit
09/03/1986	CN86102265A Method of and system for fast functional testing of random access memories
09/02/1986	CA1210863A1 Method of testing bubble memory devices
08/1986
08/27/1986	EP0192121A2 Test circuit for a cross-coupled transistor storage cell
08/26/1986	US4608688 Processing system tolerant of loss of access to secondary storage
08/26/1986	US4608687 Bit steering apparatus and method for correcting errors in stored data, storing the address of the corrected data and using the address to maintain a correct data condition
08/26/1986	US4608669 Self contained array timing
08/19/1986	US4607219 Method of inspecting semiconductor non-volatile memory devices
08/19/1986	CA1210157A1 Memory backup system
08/13/1986	EP0190813A2 Processing cell for fault tolerant arrays
08/12/1986	US4606025 Automatically testing a plurality of memory arrays on selected memory array testers
08/12/1986	US4606013 Redundancy-secured semiconductor memory
08/12/1986	US4605872 Programmable CMOS circuit for use in connecting and disconnecting a semiconductor device in a redundant electrical circuit
08/06/1986	EP0189699A2 Interdigitated bit line ROM
08/06/1986	EP0189615A2 Method of using complementary logic gates to test for faults in electronic compounds
08/06/1986	EP0189576A2 Multiple pixel mapped video memory system
08/05/1986	US4604730 Semiconductor memory device
08/05/1986	US4604727 Memory with configuration RAM
07/1986
07/30/1986	EP0189030A2 A fast writing circuit for a soft error protected storage cell
07/29/1986	US4603406 Power backed-up dual memory system
07/29/1986	US4603405 Monolithically integrated semiconductor circuit
07/29/1986	US4603404 Semiconductor memory device with redundant cells
07/29/1986	US4603399 Data processing apparatus for address substitution
07/23/1986	EP0188192A2 Extended error correction for package error correction codes
07/23/1986	EP0188013A1 Fusible link short detector with array of reference fuses
07/22/1986	CA1208310A1 Integrated semiconductor circuit device for generating a switching control signal
07/15/1986	US4601034 Method and apparatus for testing very large scale integrated memory circuits
07/15/1986	US4601031 Repairable ROM array
07/15/1986	US4601019 Memory with redundancy
07/09/1986	EP0186773A2 A soft error protection circuit for a latch
07/09/1986	EP0186719A1 Device for correcting errors in memories
07/08/1986	US4599709 Byte organized static memory

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