| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 07/02/1986 | EP0186459A2 Semiconductor memory incorporating a test pattern generator |
| 07/02/1986 | EP0186175A2 Semiconductor memory device having improved redundant structure |
| 07/02/1986 | EP0186054A2 Semiconductor memory device having improved write-verify operation |
| 07/02/1986 | EP0186051A2 Integrated semiconductor memory |
| 07/02/1986 | EP0186040A1 Integrated semiconductor memory |
| 07/01/1986 | US4598402 System for treatment of single bit error in buffer storage unit |
| 07/01/1986 | US4598388 Semiconductor memory with redundant column circuitry |
| 07/01/1986 | US4598357 Cache/disk subsystem with file number for recovery of cached data |
| 06/24/1986 | US4597084 Computer memory apparatus |
| 06/24/1986 | US4597062 Non-volatile semiconductor memory system |
| 06/18/1986 | EP0184737A2 Semiconductor memory device having error detection/correction function |
| 06/18/1986 | EP0184613A2 Method for detecting intermittent error in volatile memory |
| 06/17/1986 | US4595875 Short detector for PROMS |
| 06/17/1986 | CA1206265A1 System for correction of single-bit error in buffer storage unit |
| 06/04/1986 | EP0183323A2 Method and structure for disabling and replacing defective memory in a prom device |
| 05/28/1986 | EP0182717A2 A read only memory circuit |
| 05/27/1986 | US4592052 Method of testing bubble memory devices |
| 05/27/1986 | US4592025 Information storing circuit using blown and unblown fuses |
| 05/27/1986 | US4592024 Semiconductor ROM |
| 05/27/1986 | US4592016 Magnetic bubble memory device |
| 05/20/1986 | US4590388 CMOS spare decoder circuit |
| 05/14/1986 | EP0034070B1 Fault tolerant memory system |
| 05/13/1986 | US4589099 Solid slice memory |
| 05/13/1986 | US4588907 Integrated digital MOS semiconductor circuit |
| 05/07/1986 | EP0180212A2 Redundancy scheme for a dynamic memory |
| 05/06/1986 | US4587639 Static semiconductor memory device incorporating redundancy memory cells |
| 05/06/1986 | US4587638 Semiconductor memory device |
| 05/06/1986 | US4587480 Delay testing method for CMOS LSI and VLSI integrated circuits |
| 04/29/1986 | US4586178 Method for testing cells |
| 04/29/1986 | US4586170 Semiconductor memory redundant element identification circuit |
| 04/23/1986 | EP0178950A2 Bipolar-transistor type random access memory device having a redundancy configuration |
| 04/23/1986 | EP0178949A2 Bipolar-transistor type semiconductor memory device having a redundancy configuration |
| 04/23/1986 | EP0178948A2 Bipolar-transistor random access memory having a redundancy configuration |
| 04/22/1986 | US4584682 Reconfigurable memory using both address permutation and spare memory elements |
| 04/22/1986 | US4584681 Memory correction scheme using spare arrays |
| 04/22/1986 | US4584674 Semiconductor memory device with improved memory arrangement |
| 04/22/1986 | US4584673 Series/parallel/series shift register memory system |
| 04/22/1986 | CA1203631A1 Detecting improper operation of a digital data processing apparatus |
| 04/22/1986 | CA1203575A1 Semiconductor memory redundant element identification circuit |
| 04/16/1986 | EP0086310B1 Semiconductor integrated circuit device with test circuit |
| 04/15/1986 | US4583179 Semiconductor integrated circuit |
| 04/10/1986 | WO1986002182A1 Fault tolerant memory array |
| 04/08/1986 | US4581739 Integrated circuit |
| 04/08/1986 | CA1203027A1 Computer memory system which detects errors, address errors and operation errors |
| 04/01/1986 | US4580247 Semiconductor floating gate memory cell |
| 03/25/1986 | US4578781 MIS transistor circuit |
| 03/19/1986 | EP0174638A2 Integrated circuit with function of monitoring an internal signal |
| 03/18/1986 | US4577294 Apparatus for accessing information |
| 03/12/1986 | EP0174236A1 Semiconductor integrated circuit device having a test circuit |
| 03/12/1986 | EP0053665B1 Testing embedded arrays in large scale integrated circuits |
| 03/11/1986 | US4575824 Method for controlling read-out or write in of semiconductor memory device and apparatus for the same |
| 03/11/1986 | US4575792 Shared interface apparatus for testing the memory sections of a cache unit |
| 03/05/1986 | EP0173060A2 Method for controlling memory components and memory circuit board controlled by this method |
| 02/26/1986 | EP0172734A2 Semiconductor memory device |
| 02/26/1986 | EP0172593A2 Short detector for fusible link array |
| 02/26/1986 | EP0172311A2 Memory element for a wafer scale integrated circuit |
| 02/25/1986 | US4573146 Testing and evaluation of a semiconductor memory containing redundant memory elements |
| 02/19/1986 | EP0172016A2 Semiconductor memory device having a redundancy circuit |
| 02/19/1986 | EP0171418A1 Crash survivable solid state memory for aircraft flight data recorder systems |
| 02/18/1986 | US4571724 System for testing digital logic devices |
| 02/18/1986 | US4571707 Memory circuit with improved redundant structure |
| 02/18/1986 | US4571706 Semiconductor memory device |
| 02/13/1986 | WO1986001036A1 Programmable word length and self-testing memory in a gate array with bidirectional symmetry |
| 02/13/1986 | EP0067864A4 Method and apparatus for detecting and correcting errors in a memory. |
| 02/12/1986 | EP0170727A1 Integrated write-read memory |
| 02/11/1986 | US4570243 Low power I/O scheme for semiconductor memories |
| 01/28/1986 | US4567580 Redundancy roll call technique |
| 01/21/1986 | US4566081 Semiconductor device with spare memory cells |
| 01/14/1986 | US4564924 Memory module with extra spacing between redundant rows and columns |
| 01/14/1986 | CA1199405A1 Folded bit line memory with one decoder per pair of spare rows |
| 12/31/1985 | US4562536 Directory test error mode control apparatus |
| 12/17/1985 | US4559626 Portable minicomputer for testing memories |
| 12/17/1985 | US4559616 Fast, non-volatile semiconductor/bubble memory with temperature-compensated magnetic bias field |
| 12/17/1985 | CA1198210A1 Redundant columns for byte wide memories |
| 12/04/1985 | EP0163580A2 Semiconductor integrated circuit with redundant circuit replacement |
| 12/04/1985 | EP0162936A1 Single error correction circuit for system memory |
| 12/04/1985 | EP0089397B1 Integrated memory matrix with programmable non volatile cells |
| 12/03/1985 | US4556975 Semiconductor memory for storing information |
| 11/27/1985 | EP0162418A2 Semiconductor memory test equipment |
| 11/21/1985 | EP0161639A2 Self contained array timing |
| 11/13/1985 | EP0160720A1 Semiconductor memory cell having an electrically floating memory gate |
| 11/12/1985 | US4553225 Method of testing IC memories |
| 11/07/1985 | WO1985004966A1 Cmos spare circuit |
| 11/05/1985 | US4551838 Logic circuit |
| 11/05/1985 | US4551822 Dynamic semiconductor memory device |
| 10/30/1985 | EP0159928A2 Semiconductor integrated circuit device having fuse-type information storing circuit |
| 10/22/1985 | CA1195783A1 Process for the production of a matrix of electronic components |
| 10/16/1985 | EP0158006A2 Electronically selectable redundant array (ESRA) |
| 10/15/1985 | US4547867 Multiple bit dynamic random-access memory |
| 10/08/1985 | US4546455 Semiconductor device |
| 10/08/1985 | US4546454 Semiconductor circuit |
| 10/02/1985 | EP0156345A2 Semiconductor memory device |
| 10/01/1985 | US4544882 Apparatus for testing an integrated circuit chip without concern as to which of the chip's terminals are inputs or outputs |
| 09/25/1985 | EP0155829A2 Semiconductor memory device |
| 09/25/1985 | EP0031386B1 Semiconductor memory device |
| 09/24/1985 | US4543647 Electrically programmable non-volatile semiconductor memory device |
| 09/24/1985 | CA1194213A1 Sync suppression scrambling of television signals for subscription tv |
| 09/17/1985 | US4542454 Apparatus for controlling access to a memory |
| 09/10/1985 | US4541090 Semiconductor memory device |
| 09/04/1985 | EP0153752A2 Semiconductor memory device with a bit error detecting function |