Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
08/1991
08/21/1991EP0442319A2 Redundancy scheme for eliminating defects in a memory device
08/21/1991EP0442301A2 Dynamic RAM with on-chip ECC and optimized bit and word redundancy
08/14/1991EP0441518A2 Built-in self-test technique for read-only memories
08/14/1991EP0441090A2 Computer controlled optimized pairing of disk units
08/14/1991EP0441088A1 Memory card resident diagnostic testing
08/13/1991US5040150 Semiconductor integrated circuit device
08/07/1991EP0440206A2 Semiconductor memory having built-in test circuit
08/07/1991CN1053695A Computer controlled optimized pairing of disk units
08/07/1991CN1053694A Memory card resident diagnostic testing
08/06/1991US5038368 Redundancy control circuit employed with various digital logic systems including shift registers
08/06/1991CA1287409C Test system for random access memory
07/1991
07/31/1991EP0439189A1 Device for testing multi-port memory circuits
07/31/1991EP0438705A2 Integrated circuit driver inhibit control method for test
07/30/1991US5036516 Process and means for selftest of RAMs in an electronic device
07/25/1991DE4001563A1 Testing bit state write-read memories - writes complementary test bit patterns into all memory cells
07/24/1991EP0438273A2 Semiconductor memory devices having column redundancy
07/24/1991EP0438172A1 Semiconductor memory device having monitoring function
07/24/1991EP0261164B1 Random address system for circuit modules
07/24/1991EP0217846B1 Electrically programmable read-only memory
07/23/1991US5034925 Semiconductor memory device with redundancy responsive to advanced analysis
07/23/1991US5034923 Static RAM with soft defect detection
07/23/1991US5034687 Signature indicating circuit
07/23/1991US5034685 Test device for testing integrated circuits
07/23/1991CA1286803C Serial testing technique for embedded memories
07/23/1991CA1286781C Self-testing memory
07/17/1991EP0437386A1 Security latch for i.c.
07/17/1991EP0437218A2 Semiconductor memory tester
07/17/1991EP0437217A2 Memory tester
07/17/1991EP0437081A2 Redundancy for serial memory
07/17/1991CN1053143A Semiconductor memory devive
07/16/1991US5033048 Memory selftest method and apparatus same
07/16/1991US5033024 Matrix memory with redundancy and minimizes delay
07/16/1991CA1286405C Id system and method of writing data in an id system
07/09/1991US5031152 Test circuit for non-volatile storage cell
07/09/1991US5031151 Wordline drive inhibit circuit implementing worldline redundancy without an access time penalty
07/09/1991US5031142 Reset circuit for redundant memory using CAM cells
07/09/1991US5031139 Random address system for circuit modules
07/09/1991US5031092 Microcomputer with high density ram in separate isolation well on single chip
07/09/1991US5030861 Gate circuit having MOS transistors
07/03/1991EP0435287A1 Semiconductor memory device
07/03/1991EP0434904A2 Signal margin testing system
07/03/1991EP0434901A2 A memory module utilizing partially defective memory chips
07/03/1991EP0205258B1 Semiconductor integrated circuit having a function for switching the operational modes of an internal circuit
07/02/1991US5029330 Semiconductor memory device
07/02/1991US5029131 Fault tolerant differential memory cell and sensing
06/1991
06/26/1991EP0434589A2 Fault tolerant memory
06/26/1991EP0434200A1 Repairable memory circuit
06/26/1991EP0433831A2 A method for organizing a memory for fault tolerance
06/26/1991EP0433799A2 PROM speed measuring method
06/25/1991US5027354 Electronic memory testing device
06/19/1991EP0433141A1 Redundancy circuit for memory
06/19/1991EP0432481A2 Methods and apparatus for verifying the state of a plurality of electrically programmable memory cells
06/18/1991US5025422 Semiconductor memory device
06/18/1991US5025418 Semiconductor device for performing automatic replacement of defective cells
06/13/1991WO1991008585A1 Method and device for semiconductor fabrication fault analasys
06/12/1991EP0432004A1 Redundancy circuit with the memorization of the position of the output
06/12/1991EP0431911A2 Memory cell having floating gate and semiconductor memory using the same
06/12/1991CN1052209A Method of flash write for testing ram
06/11/1991US5023874 Screening logic circuits for preferred states
06/11/1991US5023840 External terminal
06/11/1991US5023839 Redundant semiconductor memory device
06/11/1991US5023813 Non-volatile memory usage
06/11/1991US5023476 Semiconductor device with power supply mode-change controller for reliability testing
06/05/1991EP0430682A2 Serial access semiconductor memory devices
06/05/1991EP0430482A2 Technique for information protection on fault-tolerant redundant information storage devices
06/05/1991EP0430128A2 Circuit for testability
06/05/1991EP0429673A1 Test pattern generator
06/04/1991US5022031 Semiconductor memory comprising an on-chip error correction device, and integrated circuit comprising such a semiconductor memory
06/04/1991US5022008 PROM speed measuring method
06/04/1991US5022007 Test signal generator for semiconductor integrated circuit memory and testing method thereof
06/04/1991US5022006 Semiconductor memory having bit lines with isolation circuits connected between redundant and normal memory cells
06/04/1991US5021998 Semiconductor memory device with low-house pads for electron beam test
06/04/1991US5021944 Semiconductor memory having redundancy circuit for relieving defects
06/04/1991US5020219 Method of making a flexible tester surface for testing integrated circuits
05/1991
05/28/1991US5020059 Reconfigurable signal processor
05/22/1991EP0428396A2 Bit error correcting circuit for a nonvolatile memory
05/22/1991CN1051634A Multiple i/o select memory
05/21/1991US5018104 Redundant circuit incorporated in semiconductor memory device
05/15/1991EP0427260A2 Non-volatile memory devices
05/14/1991US5016220 Semiconductor memory device with logic level responsive testing circuit and method therefor
05/14/1991US5016216 Decoder for a floating gate memory
05/08/1991EP0426483A2 Disk storage subsystem
05/08/1991EP0426185A2 Data redundancy and recovery protection
05/04/1991CA2029151A1 Data redundancy and recovery protection
05/02/1991EP0424979A2 Random address system for circuit modules
05/02/1991EP0424911A2 Memory system having self-testing function
05/02/1991EP0424612A2 Apparatus and method for real time data error capture and compression for redundancy analysis of a memory
05/02/1991DE4033981A1 Memory circuit board with semiconductor recording medium - has SRAM or EEPROM with preset wafer size for estimated storage capacity
04/1991
04/30/1991US5012472 Dynamic type semiconductor memory device having an error checking and correcting circuit
04/30/1991US5012425 A postage meter
04/30/1991US5012180 System for testing internal nodes
04/24/1991EP0424301A2 Overlapped data scrubbing with data refreshing
04/24/1991EP0424191A2 Device and method for defect handling in semi-conductor memory
04/24/1991EP0423833A1 Non-volatile memory device
04/24/1991EP0423495A2 A semiconductor memory device
04/24/1991EP0155829B1 Semiconductor memory device
04/24/1991EP0115170B1 Apparatus for programming for programmable circuit in redundancy circuit system
04/23/1991CA1283485C Memory system employing a zero dc power gate array for error detection
04/18/1991DE4030790A1 Abtastregister und testschaltkreis, der dieses benutzt Scan register and test circuitry that uses this
04/17/1991EP0422912A2 Semiconductor integrated circuit device having test circuit
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