Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
07/1987
07/21/1987US4682328 Dynamic memory refresh and parity checking circuit
07/16/1987WO1987003716A3 Fault tolerant memory system
07/15/1987EP0228949A2 Test method and apparatus for cellular array processor chip
07/14/1987US4680762 Method and apparatus for locating soft cells in a ram
07/14/1987US4680760 Accelerated test apparatus and support logic for a content addressable memory
07/14/1987US4680698 High density ROM in separate isolation well on single with chip
07/09/1987EP0138906A4 Redundant memory circuit and method of programming and verifying the circuit.
07/09/1987DE3700251A1 Verfahren und vorrichtung zur diagnose logischer schaltungen Method and device for diagnosis of logical circuits
07/08/1987EP0228283A2 Semiconductor memory circuit having inspection circuit
07/07/1987US4679196 Semiconductor memory device with a bit error detecting function
07/02/1987DE3643560A1 Flexible correction of firmware
07/01/1987EP0226887A1 Method and circuit arrangement for testing integrated circuits
06/1987
06/30/1987US4676761 Process for producing a matrix of electronic components
06/25/1987DE3619174A1 Arrangement for testing RAMs
06/24/1987EP0226205A2 Method of relocating data in and extending life of a memory system
06/23/1987US4675673 Programmable pin driver system
06/23/1987US4675513 EPROM programmer
06/18/1987WO1987003716A2 Fault tolerant memory system
06/18/1987WO1987002487A3 Control system for chained circuit modules
06/17/1987CN86107558A Single instruction multiple data (simd) cellular array processing apparatus with on-board ram and address generator apparatus
06/16/1987US4674090 Method of using complementary logic gates to test for faults in electronic components
06/16/1987EP0225642A2 Memory test pattern generator
06/09/1987US4672614 Semiconductor memory device with parallel addressing and data-correcting functions
06/09/1987US4672609 Memory system with operation error detection
06/09/1987US4672583 Dynamic random access memory device provided with test circuit for internal refresh circuit
06/09/1987US4672582 Semiconductor device
06/09/1987US4672581 Repairable memory array
06/09/1987US4672240 Programmable redundancy circuit
06/02/1987US4670878 Column shift circuitry for high speed testing of semiconductor memory devices
06/02/1987US4670708 Short detector for fusible link array using a pair of parallel connected reference fusible links
05/1987
05/27/1987EP0223690A2 Processor array with means to control cell processing state
05/27/1987EP0223188A2 Semiconductor programmable memory device
05/27/1987EP0049629B1 Redundancy scheme for a dynamic ram
05/26/1987US4669082 Method of testing and addressing a magnetic core memory
05/21/1987WO1987002166A3 Improvements relating to wafer scale integrated circuits
05/20/1987EP0097146B1 Improvements in or relating to wafer-scale integrated circuits
05/20/1987CN86106713A Array reorganization with internal cellular control and processing
05/19/1987US4667330 Semiconductor memory device
05/19/1987US4667288 Enable/disable control checking apparatus
05/13/1987EP0221360A2 Digital data message transmission networks and the establishing of communication paths therein
05/06/1987EP0220718A2 IC card
05/06/1987EP0220577A2 Memory array
05/05/1987CA1221466A1 Memory subsystem
04/1987
04/29/1987EP0120034A4 In-package e?2 prom redundancy.
04/28/1987US4661955 Extended error correction for package error correction codes
04/28/1987US4661930 High speed testing of integrated circuit
04/23/1987WO1987002487A2 Control system for chained circuit modules
04/22/1987EP0219413A2 An array reconfiguration apparatus and method particularly adapted for use with very large scale integrated circuits
04/22/1987EP0218830A2 A memory test apparatus
04/22/1987EP0030245B1 Semiconductor memory device
04/22/1987CN86105632A 数据处理方法 Data processing method
04/21/1987US4660179 Semiconductor memory device with switching for redundant cells
04/15/1987EP0218261A2 Test pattern generator
04/15/1987EP0217905A1 Wafer scale integrated circuit
04/15/1987EP0217846A1 Electrically programmable read-only memory.
04/14/1987US4658400 WSI tester
04/14/1987US4658380 CMOS memory margining control circuit for a nonvolatile memory
04/14/1987US4658379 Semiconductor memory device with a laser programmable redundancy circuit
04/14/1987US4658156 Voltage detection circuit for detecting input voltage larger in absolute value than power supply voltage
04/09/1987WO1987002166A2 Improvements relating to wafer scale integrated circuits
04/09/1987WO1987002155A1 Communication network for multiprocessor packet communication
04/08/1987EP0217307A2 Radiation hard memory cell
04/08/1987EP0217168A2 Method for processing address translation exceptions in a virtual memory system
04/07/1987US4656610 Semiconductor memory device having redundancy means
04/07/1987US4656609 Semiconductor memory device
04/01/1987EP0215992A1 Method for storing the control code of a processor allowing effective code modification and addressing circuit therefor
03/1987
03/31/1987US4654849 High speed concurrent testing of dynamic read/write memory array
03/31/1987US4654847 Apparatus for automatically correcting erroneous data and for storing the corrected data in a common pool alternate memory array
03/31/1987US4654830 Method and structure for disabling and replacing defective memory in a PROM
03/31/1987US4654827 High speed testing of semiconductor memory devices
03/31/1987US4654819 For a fault-tolerant computer system
03/31/1987CA1219965A1 Self repair large scale integrated circuit
03/26/1987WO1987000675A3 Control system for chained circuit modules
03/26/1987WO1987000674A3 Wafer-scale integrated circuit memory
03/25/1987EP0215485A2 Semiconductor memory device
03/25/1987EP0215464A2 Semiconductor integrated circuit device
03/24/1987US4653050 Fault-tolerant memory system
03/18/1987EP0214914A2 Test method for detecting faulty memory cells in a programmable semiconductor device
03/18/1987EP0214705A2 Semiconductor memory with improvend data programming time
03/18/1987EP0214508A2 Integrated semiconducteur memory
03/17/1987US4651304 EPROM memory device having a test circuit
03/17/1987US4651030 Decoder circuit for MOS memory of a redundant structure
03/11/1987EP0213534A2 IC card
03/11/1987EP0096027B1 Branched labyrinth wafer scale integrated circuit
03/05/1987DE3530257A1 Method of testing a random-access memory during its operation
03/04/1987EP0213044A2 Defective element disabling circuit having a laser-blown fuse
03/04/1987EP0213037A2 Semiconductor memory device having test pattern generating circuit
03/04/1987EP0212997A2 Semiconductor integrated circuit adapted to carry out a test operation
03/04/1987EP0212547A2 method and device for refreshing dynamic semiconductor memory device
03/04/1987EP0212520A2 Data processing method
03/04/1987EP0212208A1 Circuit arrangement for testing integrated-circuit units
03/04/1987EP0032957B1 Information processing system for error processing, and error processing method
03/03/1987US4648075 Redundancy circuit for a semiconductor memory device
02/1987
02/26/1987DE3626803A1 Halbleiterspeichereinrichtung mit einer redundanzschaltung A semiconductor memory device with a redundancy circuit
02/26/1987DE3620858A1 Schaltung zum auffrischen, ueberpruefen und korrigieren von in einem speicher gespeicherten datensignalen Circuit for refresh, check and correct data stored in a memory data signals
02/25/1987EP0211358A1 Method of monitoring semiconductor memories with devices for the protection of stored data, and devices for controlling memories for semiconductor memories operating according to this method
02/24/1987US4646307 Memory contents confirmation
02/24/1987US4646304 Single error correction circuit for system memory
02/17/1987US4644540 Diagnostic method for addressing arrangement verification
02/17/1987US4644539 Circuit arrangement capable of prohibiting an access to a part of a control memory on occurrence of an error in the part
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