Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
11/1990
11/28/1990EP0399258A2 Semiconductor memory device having self-correcting function
11/28/1990EP0399240A2 Semiconductor memory device
11/28/1990EP0398971A1 Improvements in or relating to data handling arrays
11/28/1990EP0159928B1 Semiconductor integrated circuit device having fuse-type information storing circuit
11/27/1990US4974226 Circuit for testing integrated circuits
11/22/1990EP0398696A2 Servicing interrupts in a data processing system
11/22/1990EP0398552A2 Linear array wafer scale integration architecture
11/22/1990EP0398521A2 Memory system
11/22/1990EP0398357A2 Test circuit in semiconductor memory device
11/22/1990EP0089891B1 Identification of repaired integrated circuits
11/20/1990US4972418 Memory readback check apparatus
11/20/1990US4972380 Decoding circuit for functional block
11/20/1990US4972372 Programmable device and method of testing programmable device
11/20/1990US4972144 Testable multiple channel decoder
11/15/1990DE4014723A1 Semiconductor memory with redundancy circuit - has memory cell field divided into blocks and redundancy circuit spares
11/14/1990EP0397194A2 Semiconductor memory device having two types of memory cell
11/14/1990EP0124900B1 Reduntant type memory circuit with an improved clock generator
11/13/1990US4970727 Semiconductor integrated circuit having multiple self-test functions and operating method therefor
11/13/1990US4970724 Redundancy and testing techniques for IC wafers
11/13/1990US4970691 2-cell/1-bit type EPROM
11/13/1990US4970686 Semiconductor memory cells and semiconductor memory device employing the semiconductor memory cells
11/13/1990US4970648 High performance flight recorder
11/13/1990US4970641 Exception handling in a pipelined microprocessor
11/07/1990EP0259444B1 Nonvolatile memory system having a testing capability
11/06/1990US4969148 Serial testing technique for embedded memories
11/06/1990US4969124 Programmable device
11/02/1990CA2015853A1 Linear array wafer scale integration architecture
10/1990
10/31/1990EP0395612A2 Memory unit and method of making the same
10/31/1990EP0394502A1 Diagnostic mode for a cache
10/31/1990CN1010260B Memory re-mapping in microcomputer system
10/30/1990US4967415 EEPROM system with bit error detecting function
10/30/1990US4967394 Semiconductor memory device having a test cell array
10/30/1990US4967387 Semiconductor integrated circuit device
10/30/1990US4967326 Communicating data between processes in an array of computers
10/25/1990DE3938153A1 Microprocessor with memory error bit correction using ECC codes - has error bit checker generating, storing and checking test data patterns
10/24/1990EP0393626A2 Microcomputer with a built-in prom
10/24/1990EP0393205A1 Pattern generator
10/24/1990EP0142510B1 Method of self repair of large scale integrated circuit modules and self repair large scale integrated circuit
10/23/1990US4965799 Method and apparatus for testing integrated circuit memories
10/23/1990US4965768 Semiconductor device having programmable read only memory cells for specific mode
10/23/1990US4965717 Multiple processor system having shared memory with private-write capability
10/18/1990WO1990012401A1 Memory with power supply intercept and redundancy logic
10/18/1990WO1990012364A1 Device for repairing an image memory
10/17/1990EP0392895A2 Flash EEprom system
10/17/1990EP0226887B1 Method and circuit arrangement for testing integrated circuits
10/16/1990US4963825 Method of screening EPROM-related devices for endurance failure
10/11/1990DE3911407A1 Redundant computer system
10/02/1990US4961053 Circuit arrangement for testing integrated circuit components
10/02/1990CA1274913A1 Processing system tolerant of loss of access to secondary storage
09/1990
09/26/1990EP0389203A2 Semiconductor memory device having information indicative of presence of defective memory cells
09/20/1990DE4007187A1 Integrierte halbleiterschaltungseinrichtung und betriebsverfahren dafuer Integrated semiconductor circuit device and operating method therefor
09/19/1990EP0387379A1 DRAM-type integrated semiconductor memory and method for testing it
09/19/1990EP0387378A1 DRAM-type integrated semiconductor memory and method for testing it
09/18/1990US4958352 Semiconductor memory device with error check and correcting function
09/18/1990US4958346 Memory testing device
09/18/1990US4958345 Memory testing device
09/18/1990US4958324 Method for the testing of electrically programmable memory cells, and corresponding integrated circuit
09/18/1990US4958316 Static random access memory
09/12/1990EP0386573A2 Method for vertical fuse testing
09/11/1990US4956819 Circuit configuration and a method of testing storage cells
09/11/1990US4956818 Memory incorporating logic LSI and method for testing the same LSI
09/11/1990US4956816 Non-volatile semiconductor memory having improved testing circuitry
09/11/1990US4956602 Wafer scale testing of redundant integrated circuit dies
09/11/1990US4955131 Method of building a variety of complex high performance IC devices
09/05/1990EP0385836A1 Method for replacing memory modules in a computer system and computer system for carrying out this method
09/05/1990EP0385704A2 Semiconductor memory device having output data buffer unit shared between usual access mode and test mode of operation
09/05/1990EP0385591A2 Serial testing technique for embedded memories
09/04/1990US4955023 Error correction control system for control memory
09/04/1990US4954994 FIFO memory capable of simultaneously selecting a plurality of word lines
09/04/1990US4954988 Memory device wherein a shadow register corresponds to each memory cell
08/1990
08/28/1990US4953164 Cache memory system having error correcting circuit
08/23/1990WO1990009666A1 Improvements relating to control systems for chained circuit modules
08/23/1990WO1990009635A1 Parallel microprocessor architecture
08/23/1990WO1990009634A1 Fault masking in semiconductor memories
08/22/1990EP0383452A2 Semiconductor memory device having means for replacing defective memory cells
08/21/1990US4951257 Reference setting circuit for determining written-in content in nonvolatile semiconductor memories
08/21/1990US4951254 Static memory unit having a plurality of test modes, and computer equipped with such units
08/21/1990US4951253 Semiconductor memory system
08/21/1990US4951220 Method and apparatus for manufacturing a test-compatible, largely defect-tolerant configuration of redundantly implemented, systolic VLSI systems
08/21/1990US4950921 Semiconductor integrated circuit having a built-in voltage generator for testing at different power supply voltages
08/16/1990EP0382453A2 Circuit arrangement for verifying data stored in a random access memory
08/16/1990EP0381667A1 Programmable, asynchronous logic cell and array
08/16/1990DE4002664A1 Halbleitereinrichtung mit einer testfunktion und testverfahren hierfuer Semiconductor device having a test function and test procedures for here
08/09/1990WO1990009024A1 Integrated semiconductor store
08/08/1990EP0381644A2 Multi-processor system and method for maintaining the reliability of shared data structures
08/08/1990EP0381405A1 Semiconductor memory device having mask rom structure
08/08/1990EP0381140A2 Data processing apparatus
08/08/1990EP0125633B1 Testing apparatus for redundant memory
08/08/1990CA2009477A1 Parallel microprocessor architecture
08/07/1990US4947378 Memory element exchange control circuit capable of automatically refreshing a defective address
08/07/1990US4947375 Addressing of redundant columns and rows of an integrated circuit memory
08/07/1990US4947105 Method and circuit for testing integrated circuit modules
08/02/1990CA2008868A1 Initiazation of a main storage
07/1990
07/31/1990US4945535 Information processing unit
07/25/1990EP0378613A1 Wafer scale integrated circuits
07/25/1990EP0378538A1 Arrangement and process for detecting and localizing faulty circuits in a storage component.
07/24/1990US4943966 For allocating memory address base addresses among memory units
07/24/1990US4943946 Control system for chained circuit modules
07/18/1990EP0378332A2 Semiconductor memory device with redundancy circuits
07/18/1990EP0377827A2 Boost clock signal generator
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