Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
06/1983
06/15/1983EP0081381A2 Refresh address generators for dynamic semiconductor memory devices
06/15/1983EP0081309A2 Constant-distance structure polycellular very large scale integrated circuit
06/14/1983US4388719 Dynamic signal generator
06/09/1983WO1983002019A1 Branched-spiral wafer-scale integrated circuit
06/08/1983EP0080935A2 Dynamic semiconductor memory device
06/08/1983EP0080834A2 Branched-spiral wafer-scale integrated circuit
06/08/1983EP0080785A2 Parallel/series error correction circuit
06/07/1983CA1147818A1 Semiconductor integrated circuit device having control signal generating circuits
05/1983
05/26/1983WO1983001848A1 Memory security system
05/18/1983EP0078942A2 Storage element reconfiguration
05/17/1983US4384348 Method for testing semiconductor memory device
05/17/1983US4384326 Memory security circuit using the simultaneous occurance of two signals to enable the memory
04/1983
04/28/1983WO1983001523A1 Error-correcting memory with low storage overhead and fast correction mechanism
04/20/1983EP0077204A2 Error-correcting memory with low storage overhead and fast correction mechanism
04/19/1983US4380812 Refresh and error detection and correction technique for a data processing system
04/14/1983WO1983001351A1 Voltage regulation and battery dissipation limiter circuit
04/13/1983EP0076629A2 Reconfigureable memory system
04/12/1983US4380066 Defect tolerant memory
04/06/1983EP0076124A2 Method of testing IC memories
03/1983
03/31/1983WO1983001147A1 Memory with permanent array division capability
03/29/1983CA1143859A1 Add-on programs with code verification and control
03/16/1983EP0074305A2 Fault isolating memory decoder
03/09/1983EP0073677A2 A MIS transistor circuit including a voltage holding circuit
03/09/1983EP0073330A2 Hierarchical storage systems adapted for error handling
03/08/1983US4376300 Memory system employing mostly good memories
03/01/1983US4375678 Redundant memory arrangement providing simultaneous access
02/1983
02/09/1983EP0070823A1 Semiconductor memory redundant element identification circuit
02/09/1983EP0070822A1 Semiconductor memory cell margin test circuit
02/01/1983US4371963 Method and apparatus for detecting and correcting errors in a memory
02/01/1983US4371754 Automatic fault recovery system for a multiple processor telecommunications switching control
01/1983
01/25/1983US4370746 Memory address selector
01/20/1983WO1983000254A1 Prom erase detector
01/18/1983US4369511 Semiconductor memory test equipment
01/18/1983US4369510 Soft error rewrite control system
01/11/1983US4368532 Memory checking method
01/11/1983US4368523 Liquid crystal display device having redundant pairs of address buses
12/1982
12/29/1982EP0067864A1 Method and apparatus for detecting and correcting errors in a memory
12/22/1982EP0067556A2 Digital data processing system
12/21/1982US4365319 Semiconductor memory device
12/21/1982US4365318 Two speed recirculating memory system using partially good components
12/15/1982EP0013290B1 Large scale integrated circuit wafer and method of testing same
12/08/1982EP0066147A2 Control method and apparatus for a plurality of memory units
12/07/1982US4363124 Recirculating loop memory array tester
11/1982
11/23/1982US4360775 Machine for testing planar magnetic film with magnetic bubbles
11/16/1982US4359771 Method and apparatus for testing and verifying the operation of error control apparatus within a memory
11/16/1982CA1135869A1 Memory preservation and verification system
11/09/1982US4358833 Memory redundancy apparatus for single chip memories
11/02/1982US4357656 Method and apparatus for disabling and diagnosing cache memory storage locations
10/1982
10/19/1982US4355393 Microcomputer having a ram for storing parity bits
10/19/1982US4355376 Apparatus and method for utilizing partially defective memory devices
10/12/1982US4354253 Bubble redundancy map storage using non-volatile semiconductor memory
10/06/1982EP0061602A1 A method of fabricating and testing a programmable integrated circuit before it is programmed
09/1982
09/08/1982EP0059309A2 A memory system with flexible replacement units
09/08/1982EP0059203A1 A coupling.
09/08/1982EP0059188A1 Tape burn-in circuit
09/08/1982EP0059184A1 Go/no go margin test circuit for semiconductor memory
09/01/1982EP0058795A2 Wait circuitry for interfacing between field maintenance processor and device specific adaptor circuit
08/1982
08/31/1982US4347589 Refresh counter test
08/31/1982US4347587 Semiconductor integrated circuit memory device with both serial and random access arrays
08/24/1982US4346459 Redundancy scheme for an MOS memory
08/24/1982US4346454 Bubble memory with on chip error map storage on permalloy disk elements
08/19/1982WO1982002793A1 Semiconductor memory redundant element identification circuit
08/19/1982WO1982002792A1 Semiconductor memory cell margin test circuit
08/18/1982EP0058049A2 Defect-remediable semiconductor integrated circuit memory with spare substitution
08/17/1982US4345319 Self-correcting, solid-state-mass-memory organized by bits and with reconfiguration capability for a stored program control system
08/10/1982US4344155 Method of and apparatus for inscribing a control character in a memory
07/1982
07/28/1982EP0056400A1 Memory security circuit.
07/27/1982US4342103 Address buffer circuit
07/27/1982US4342084 Main storage validation means
07/27/1982US4342079 Duplicated memory system having status indication
07/14/1982EP0055918A2 A field programmable semiconductor memory device
07/14/1982EP0055906A2 Semiconductor memory device
07/13/1982US4339804 Memory system wherein individual bits may be updated
07/08/1982WO1982002266A1 Method and apparatus for detecting and correcting errors in a memory
07/07/1982EP0055594A2 Electrically programmable non-volatile semiconductor memory device
06/1982
06/30/1982EP0055129A2 Semiconductor memory device
06/30/1982EP0054692A2 Memory testing apparatus
06/29/1982US4337524 Backup power circuit for biasing bit lines of a static semiconductor memory
06/23/1982EP0054023A1 Semiconductor memory for use in conjunction with error detection and correction circuit
06/23/1982EP0012017B1 Programmable computer comprising means for checking the error-correcting circuits
06/16/1982EP0053665A1 Testing embedded arrays in large scale integrated circuits
06/15/1982US4335457 Method for semiconductor memory testing
06/15/1982US4335162 Magnetic bubbles, garnets, quenching, barriers
06/08/1982US4334307 Data processing system with self testing and configuration mapping capability
06/01/1982US4333162 Bubble memory with conductor programmable transparent error map
06/01/1982US4333142 Self-configurable computer and memory system
05/1982
05/26/1982EP0052481A2 Semiconductor device having a device state identifying circuit
05/25/1982US4332028 Method of measuring the memory address access time (AAT) utilizing a data recirculation technique, and a tester for accomplishing same
05/11/1982US4329685 Controlled selective disconnect system for wafer scale integrated circuits
04/1982
04/21/1982EP0050008A2 Semiconductor device
04/21/1982EP0050005A2 Semiconductor memory with improved data programming time
04/20/1982US4326290 Means and methods for monitoring the storage states of a memory and other storage devices in a digital data processor
04/20/1982US4326266 Monitoring system for a modular digital data processor
04/20/1982US4326251 Monitoring system for a digital data processor
04/14/1982EP0049629A2 Redundancy scheme for a dynamic RAM
03/1982
03/30/1982US4322812 Digital data processor providing for monitoring, changing and loading of RAM instruction data
03/24/1982EP0047859A2 Two speed recirculating memory system
03/23/1982US4321693 Magnetic bubble memory chip with dedicated redundancy data section provided thereon
03/23/1982US4321692 Bubble memory system having defective minor loops
03/23/1982US4321691 Redundant bubble detector
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