| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
|---|
| 03/19/1992 | WO1992004717A1 Circuit arrangement for testing a semiconductor store by means of parallel tests with different test bit patterns |
| 03/19/1992 | WO1992004674A1 Computer memory array control |
| 03/19/1992 | DE4029247A1 Doppel-port-speichereinrichtung Dual-port memory device |
| 03/18/1992 | EP0475764A2 Redundant decoder circuit |
| 03/18/1992 | EP0475590A1 A semiconductor memory with chip enable control from output enable during test mode |
| 03/18/1992 | EP0475589A1 A semiconductor memory with automatic test mode exit on chip enable |
| 03/18/1992 | EP0475588A1 A semiconductor memory with inhibited test mode entry during power-up |
| 03/18/1992 | EP0475346A2 Semiconductor memory device having means for monitoring bias voltage |
| 03/17/1992 | US5097449 Non-volatile memory structure |
| 03/17/1992 | US5097448 Semiconductor memory device capable of relieving defective bits |
| 03/17/1992 | US5097447 Semiconductor memory device having a serial access memory |
| 03/17/1992 | US5097206 Built-in test circuit for static CMOS circuits |
| 03/12/1992 | DE4028819A1 Schaltungsanordnung zum testen eines halbleiterspeichers mittels paralleltests mit verschiedenen testbitmustern Circuitry for testing a semiconductor memory using parallel tests with different testbitmustern |
| 03/11/1992 | EP0474451A2 Method and apparatus for error recovery in storage arrays |
| 03/11/1992 | EP0275752B1 Integrated circuit having means for switching towards redundant elements in a memory |
| 03/11/1992 | EP0142127B1 Redundancy circuit for a semiconductor memory device |
| 03/10/1992 | US5095344 Highly compact eprom and flash eeprom devices |
| 03/04/1992 | EP0473193A2 Semiconductor device having a temperature detection circuit |
| 03/04/1992 | EP0472818A2 Built-in self test for integrated circuits |
| 02/26/1992 | EP0472485A2 Data file directories and methods |
| 02/26/1992 | EP0472266A2 A semiconductor memory with improved test mode |
| 02/26/1992 | EP0472209A2 Semiconductor memory device having redundant circuit |
| 02/26/1992 | EP0471935A2 Circuit for supervising a matrix of bistable points |
| 02/25/1992 | US5091910 Information processing device |
| 02/25/1992 | US5091908 Built-in self-test technique for read-only memories |
| 02/25/1992 | US5091884 Semiconductor memory device with improved address discriminating circuit for discriminating an address assigned defective memory cell replaced with redundant memory cell |
| 02/20/1992 | WO1992002934A1 Integrated memory having improved testing means |
| 02/19/1992 | EP0471544A2 Semiconductor memory with a sequence of clocked access codes for test mode entry |
| 02/19/1992 | EP0471543A2 A semiconductor memory with a clocked access code for test mode entry |
| 02/19/1992 | EP0471542A2 An improved power-on reset circuit for controlling test mode entry |
| 02/19/1992 | EP0471541A2 A semiconductor memory with multiple clocking for test mode entry |
| 02/19/1992 | EP0471540A2 A semiconductor memory with a flag for indicating test mode |
| 02/18/1992 | US5089993 Memory module arranged for data and parity bits |
| 02/18/1992 | US5089958 Fault tolerant computer backup system |
| 02/18/1992 | US5089951 Microcomputer incorporating memory |
| 02/18/1992 | CA1296110C Reconfigurable register bit-slice for self-test |
| 02/12/1992 | EP0470897A1 Integrated memory circuit with redundancy and improved addressing in test mode |
| 02/12/1992 | CN1058666A Variable size set associative dram redundancy scheme |
| 02/11/1992 | US5088081 Method and apparatus for improved disk access |
| 02/11/1992 | US5088066 Redundancy decoding circuit using n-channel transistors |
| 02/11/1992 | US5088063 Semiconductor memory device having on-chip test circuit |
| 02/06/1992 | WO1992001986A1 Improvements relating to chained circuit modules |
| 02/05/1992 | EP0470030A2 Fast memory power-on diagnostics using direct memory addressing |
| 02/05/1992 | EP0469705A2 High speed testing for programmable logic devices |
| 02/05/1992 | EP0469571A2 Redundant semiconductor memory device |
| 02/05/1992 | EP0469507A1 Integrated circuit comprising a standard cell, an application cell and a test cell |
| 02/05/1992 | EP0469252A1 Laser link decoder for DRAM redundancy scheme |
| 02/04/1992 | US5086413 Non-volatile semiconductor memory device having an improved testing mode of operation and method of forming checkerwise test pattern in memory cell array |
| 01/29/1992 | EP0468535A2 Microcomputer having ROM data protection function |
| 01/29/1992 | EP0468141A2 Memory |
| 01/29/1992 | EP0378538B1 Arrangement and process for detecting and localizing faulty circuits in a storage component |
| 01/29/1992 | EP0212547B1 Method and device for refreshing dynamic semiconductor memory device |
| 01/28/1992 | US5084873 Chip error detector |
| 01/28/1992 | US5084838 Large-scale integrated circuit device such as a wafer scale memory having improved arrangements for bypassing, redundancy, and unit integrated circuit interconnection |
| 01/23/1992 | DE4113590A1 Microcomputer with programming unit - contains overwritable, non-volatile memory with gate and selection circuits facilitating program content definition |
| 01/22/1992 | EP0467638A2 Semiconductor memory device |
| 01/22/1992 | EP0467448A2 Processing device and method of programming such a processing device |
| 01/22/1992 | EP0467079A2 Disc array storage system |
| 01/21/1992 | US5083294 Semiconductor memory device having a redundancy |
| 01/21/1992 | US5083264 Process and apparatus for saving and restoring critical files on the disk memory of an electrostatographic reproduction machine |
| 01/15/1992 | EP0466247A1 Stable low-dissipation reference circuit |
| 01/15/1992 | EP0465808A1 Variable size set associative DRAM redundancy scheme |
| 01/15/1992 | EP0283907B1 Circuit arrangement and method for testing memory cells |
| 01/15/1992 | EP0229144B1 Wafer-scale integrated circuit memory |
| 01/10/1992 | WO1992016946A1 Semiconductor memory having nonvolatile semiconductor memory cell |
| 01/08/1992 | EP0464577A2 Semiconductor memory device having breaker associated with address decoder circuit for deactivating defective memory cell |
| 01/08/1992 | CN1057720A Method for multi-bit parallel test in semiconductor memory device |
| 01/07/1992 | US5079747 Semiconductor memory device having diagnostic unit operable on parallel data bits |
| 01/07/1992 | US5079744 Test apparatus for static-type semiconductor memory devices |
| 01/07/1992 | US5079743 Circuit for applying selected voltages to dynamic random access memory |
| 01/02/1992 | EP0252325B1 Semiconductor device having a fuse circuit and a detecting circuit for detecting the states of the fuses in the fuse circuit |
| 01/01/1992 | CN1057543A Laser ling decoder for dram redun-dancy scheme |
| 12/31/1991 | US5077744 Method for error protection in telephone switching installations |
| 12/31/1991 | US5077738 Test mode enable scheme for memory |
| 12/31/1991 | US5077691 Flash EEPROM array with negative gate voltage erase operation |
| 12/31/1991 | US5077690 Memory input data test arrangement |
| 12/31/1991 | US5077689 Method for multi-bit parallel test in semiconductor memory device |
| 12/27/1991 | EP0462876A1 Circuit for testing electrically programmable memory cells |
| 12/27/1991 | EP0462743A1 Method and apparatus for accomplishing output-specific data compaction |
| 12/26/1991 | WO1991020034A1 Data storage system for providing redundant copies of data on different disk drives |
| 12/24/1991 | US5075892 Parallel read circuit for testing high density memories |
| 12/17/1991 | US5073891 Method and apparatus for testing memory |
| 12/11/1991 | EP0460692A2 Semiconductor memory with failure handling circuit |
| 12/10/1991 | US5072424 Wafer-scale integrated circuit memory |
| 12/10/1991 | US5072138 Semiconductor memory with sequential clocked access codes for test mode entry |
| 12/10/1991 | US5072137 Semiconductor memory with a clocked access code for test mode entry |
| 12/04/1991 | EP0459521A2 Semiconductor memory device with a redundancy circuit |
| 12/04/1991 | EP0459001A1 Integrated semiconductor memory |
| 12/04/1991 | EP0214914B1 Test method for detecting faulty memory cells in a programmable semiconductor device |
| 12/04/1991 | CN1056770A Semiconductor integrated circuit chip having identification circuit therein |
| 12/04/1991 | CN1015031B Extended flash writing circuit for dram-test |
| 12/03/1991 | US5070502 Defect tolerant set associative cache |
| 11/28/1991 | DE4026326A1 Integrated circuit chip having identification circuit - has voltage limiter and option unit determining identification by existence of current path, between power and input terminals |
| 11/27/1991 | EP0457819A1 Fault masking in semiconductor memories |
| 11/27/1991 | EP0457808A1 Parallel microprocessor architecture |
| 11/21/1991 | EP0457308A2 Data processing system having an input/output path disconnecting mechanism and method for controlling the data processing system |
| 11/20/1991 | CN1056361A Method for mode conversion of dual-port memory device |
| 11/20/1991 | CN1056360A Redundancy scheme for eliminating defects in memory device |
| 11/19/1991 | US5067105 System and method for automatically configuring translation of logical addresses to a physical memory address in a computer memory system |
| 11/14/1991 | WO1991017545A1 Integrated semiconductor store with parallel test facility and redundancy process |