Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
07/1990
07/18/1990CN1008848B Measuring melthod for effective address of mass storage
07/17/1990USRE33266 Folded bit line memory with one decoder per pair of spare rows
07/17/1990US4942576 Badbit counter for memory testing
07/17/1990US4942575 Error connection device for parity protected memory systems
07/17/1990US4942556 Semiconductor memory device
07/11/1990EP0377249A1 Matrix memory, comprising standard blocks, standard sub-blocks, a redundant block, and redundant sub blocks, and integrated circuit comprising a plurality of such matrix memories
07/04/1990EP0376487A2 EPM having an improvement in non-volatile storage of accounting data
07/04/1990EP0376486A2 EPM having an improvement in non-volatile memory organization
07/04/1990EP0376245A2 Semiconductors memory device provided with an improved redundant decoder
07/04/1990EP0375915A2 A contact chain structure for troubleshooting EPROM memory circuits
07/04/1990EP0375864A2 Cache bypass
07/03/1990US4939733 Syndrome generator for Hamming code and method for generating syndrome for Hamming code
07/03/1990US4939694 Defect tolerant self-testing self-repairing memory system
07/03/1990US4939389 VLSI performance compensation for off-chip drivers and clock generation
06/1990
06/30/1990CA2003375A1 Epm having an improvement in non-volatile memory organization
06/28/1990WO1990007153A1 Redundancy and testing techniques for ic wafers
06/26/1990US4937830 Semiconductor memory device having function of checking and correcting error of read-out data
06/26/1990US4937790 Semiconductor memory device
06/26/1990US4937787 Programmable read only memory with means for discharging bit line before program verifying operation
06/26/1990US4937700 Semiconductor integrated circuit with a circuit limiting an input voltage to a predetermined voltage
06/26/1990US4937659 Interconnection system for integrated circuit chips
06/26/1990US4937658 Interconnection system for integrated circuit chips
06/26/1990US4937465 Apparatus to urge a current spike into a fuse
06/21/1990DE3906494A1 Error bit generation circuit for use in a non-volatile semiconductor memory device
06/19/1990US4935900 Dynamic random access memory with a self-refreshing function
06/19/1990US4935899 Semiconductor memory device with redundant memory cells
06/13/1990EP0372580A2 Synchronization of fault-tolerant computer system having multiple processors
06/13/1990EP0372579A2 High-performance computer system with fault-tolerant capability
06/13/1990EP0372578A2 Memory management in high-performance fault-tolerant computer system
06/13/1990EP0186719B1 Device for correcting errors in memories
06/12/1990US4933908 Fault detection in memory refreshing system
06/09/1990CA2003342A1 Memory management in high-performance fault-tolerant computer system
06/09/1990CA2003338A1 Synchronization of fault-tolerant computer system having multiple processors
06/09/1990CA2003337A1 High-performance computer system with fault-tolerant capability
06/06/1990EP0371243A2 Fail-safe modular memory
06/06/1990CN1042792A Semiconductor dynamic memory
05/1990
05/30/1990EP0370558A2 Writing process with a checkerboard pattern for a matrix of EEPROM memory cells and device for executing the above process
05/30/1990EP0370194A2 Reconfigurable register bit slice
05/23/1990EP0116440B1 Integrated semiconductor circuit device for generating a switching control signal
05/22/1990US4928281 Semiconductor memory
05/22/1990US4928022 Redundancy interconnection circuitry
05/17/1990WO1990005339A1 Control for a rotating media storage system
05/16/1990EP0145595B1 Integrated circuit device
05/15/1990US4926424 Test auxiliary circuit for testing semiconductor device
05/15/1990US4926373 Word processor for selecting a control program stored in the word processor when a control program in an externally detachable memory is not able to be read
05/15/1990US4924589 Method of making and testing an integrated circuit
05/10/1990DE3936704A1 Error-detecting cellular semiconductor memory with codeword generator - includes writing and read=out circuits for test data and stored codewords, integrated on same memory chip
05/09/1990EP0366757A1 Memory selftest method and apparatus.
05/09/1990EP0366702A1 Integrated circuits.
05/01/1990US4922451 Memory re-mapping in a microcomputer system
05/01/1990US4922408 Apparatus for multi-processor communications
05/01/1990US4922134 Testable redundancy decoder of an integrated semiconductor memory
05/01/1990US4922128 Boost clock circuit for driving redundant wordlines and sample wordlines
05/01/1990CA1268549A1 Column redundancy for two port random access memory
04/1990
04/25/1990EP0365114A2 Interface arrangement for interfacing a data storage device with a data handling system
04/24/1990US4920479 Multiprocessor system with storage control units including buffer storage units comprising an error recovery system for storage control units
04/19/1990WO1990004228A1 Pattern generator
04/18/1990EP0364110A2 Semiconductor memory device having a serial access memory
04/18/1990EP0067556B1 Digital data processing system
04/17/1990US4918692 Automated error detection for multiple block memory array chip and correction thereof
04/17/1990US4918691 Testing of integrated circuit modules
04/17/1990US4918662 Semiconductor memory device having redundant structure for segmented word line arrangement
04/17/1990US4918379 Integrated monolithic circuit having a test bus
04/17/1990US4918378 Method and circuitry for enabling internal test operations in a VLSI chip
04/17/1990US4918335 Interconnection system for integrated circuit chips
04/11/1990EP0362197A1 Self-testing memory
04/11/1990EP0199744B1 Fault tolerant memory array
04/10/1990US4916700 Semiconductor storage device
04/10/1990US4916626 Coupling circuit for non-volatile memories in an electronic machine, and franking machine applying said circuit
04/04/1990EP0361404A2 Memory circuit provided with improved redundant structure
04/03/1990US4914632 Semiconductor devices having redundancy circuitry and operating method therefor
03/1990
03/28/1990EP0359941A2 Compound semiconductor memory device with redundancy configuration
03/27/1990US4912710 Self-checking random access memory
03/27/1990US4912698 Multi-processor central control unit of a telephone exchange system and its operation
03/27/1990US4912395 Testable LSI device incorporating latch/shift registers and method of testing the same
03/27/1990CA1267225A1 Electronic memory system
03/21/1990EP0359372A2 Memory testing system
03/21/1990EP0359212A2 Computer system capable of controlling access to expanded memory
03/21/1990EP0359204A2 Semicondutor memory device capable of relieving defective bits
03/20/1990US4910735 Semiconductor integrated circuit with self-testing
03/14/1990EP0358376A2 Integrated test circuit
03/14/1990EP0358371A2 Enhanced test circuit
03/13/1990US4908798 Semiconductor memory device with memory cell arrays and a redundant memory cell array associated with a small number of write-in and sense amplifying circuits
03/13/1990US4908525 Cut-only CMOS switch for discretionary connect and disconnect
03/08/1990DE3928410A1 Halbleiterspeichereinrichtung und testverfahren dafuer A semiconductor memory device and test method therefor
03/07/1990EP0357532A2 Improvements in performance sensing for integrated circuit chips
03/07/1990EP0357516A2 Semiconductor static memory device
03/07/1990EP0356999A2 Memory tester
03/06/1990US4907203 Semiconductor memory device with changeable word organization modes including a test mode
03/06/1990US4907148 Cellular array processor with individual cell-level data-dependent cell control and multiport input memory
03/06/1990US4906994 Multi-stage integrated decoder device
02/1990
02/28/1990EP0355768A2 Semiconductor memory cells and semiconductor memory device employing the semiconductor memory cells
02/27/1990US4905197 Semiconductor memory having circuitry for discharging a digit line before verifying operation
02/27/1990US4905194 Semiconductor memory device with a circuit for analyzing defects in word-lines
02/27/1990US4905192 Semiconductor memory cell
02/27/1990US4905191 Microcomputer with built-in EPROM and test mode
02/27/1990US4905142 Semiconductor integrated circuit device with built-in arrangement for memory testing
02/22/1990DE3924695A1 Inner self-testing and redundancy programming - carries out inner programming of redundancy bit or word coders, corresp. to determined redundancy structure
02/21/1990EP0180212B1 Redundancy scheme for a dynamic memory
02/21/1990EP0151849B1 Information storing circuit using blown and unblown fuses
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