Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
11/1984
11/13/1984US4483001 Online realignment of memory faults
11/13/1984CA1177956A1 Field programmable device
11/06/1984US4481627 Embedded memory testing method and apparatus
10/1984
10/30/1984US4480199 Identification of repaired integrated circuits
10/25/1984WO1984004225A1 Self repair large scale integrated circuit
10/25/1984WO1984004196A1 Redundant memory circuit and method of programming and verifying the circuit
10/25/1984EP0056400A4 Memory security circuit.
10/23/1984US4479214 System for updating error map of fault tolerant memory
10/16/1984US4477884 Semiconductor memory with improved data programming time
10/16/1984CA1176371A1 Redundancy scheme for an mos memory
10/11/1984WO1984003968A1 Apparatus for controlling access to a memory
10/10/1984EP0121394A2 Static semiconductor memory device incorporating redundancy memory cells
10/09/1984US4476546 Programmable address buffer for partial products
10/09/1984CA1175938A1 Memory device
10/03/1984EP0120458A2 Integrated dynamic read/write memory
10/03/1984EP0120034A1 In-package e?2 prom redundancy
10/02/1984US4475194 Dynamic replacement of defective memory words
09/1984
09/25/1984US4473895 Semiconductor memory device
09/19/1984EP0118583A1 Memory correction unit
09/12/1984EP0117903A2 Semiconductor memory device with decoding arrangement
09/11/1984US4471483 Branched labyrinth wafer-scale integrated circuit
09/11/1984US4471472 Semiconductor memory utilizing an improved redundant circuitry configuration
08/1984
08/29/1984EP0116544A1 Management of defects in storage media.
08/28/1984US4468759 Testing method and apparatus for dram
08/22/1984EP0116464A2 A semiconductor memory device
08/22/1984EP0116440A2 Integrated semiconductor circuit device for generating a switching control signal
08/22/1984EP0116344A2 Power backed-up dual memory system
08/21/1984US4467457 Nonvolatile semiconductor memory device
08/21/1984US4467422 Data processing system
08/14/1984US4466017 Sync suppression scrambling of television signals for subscription TV
08/14/1984US4465973 Pad for accelerated memory test
08/14/1984CA1172768A1 Semiconductor memory devices
08/08/1984EP0115170A2 Apparatus for programming for programmable circuit in redundancy circuit system
08/08/1984EP0115144A2 Method of testing bubble memory devices
08/07/1984US4464754 Memory system with redundancy for error avoidance
08/07/1984US4464752 Multiple event hardened core memory
08/07/1984US4464750 Semiconductor memory device
08/07/1984US4464747 High reliability memory
08/07/1984US4464736 In-package E2 PROM redundancy
08/07/1984US4464717 For use in a microcomputer system
08/07/1984CA1172316A1 Refresh counter test
08/01/1984EP0114763A2 Redundant rows in integrated circuit memories
07/1984
07/31/1984US4463450 Semiconductor memory formed of memory modules with redundant memory areas
07/31/1984CA1171700A1 Boring devices
07/25/1984EP0029322B1 Semiconductor memory device with redundancy
07/24/1984US4462091 For a random access memory arrangement
07/18/1984EP0113516A2 Microcomputer
07/17/1984US4461001 Deterministic permutation algorithm
07/17/1984US4461000 ROM/PLA Structure and method of testing
07/17/1984US4460999 Memory tester having memory repair analysis under pattern generator control
07/17/1984US4460998 Semiconductor memory devices
07/17/1984US4460997 Memory tester having memory repair analysis capability
07/11/1984EP0113178A2 Microcomputer
07/10/1984US4459694 Field programmable device with circuitry for detecting poor insulation between adjacent word lines
07/10/1984US4459686 Semiconductor device
07/10/1984US4459685 Redundancy system for high speed, wide-word semiconductor memories
07/10/1984US4459549 Method and apparatus for testing magnetic bubble devices by varying the components of input signals
07/10/1984CA1170766A1 Semiconductor memory for use in conjunction with error detection and correction circuit
07/04/1984EP0112622A2 Error correction in buffer storage units
07/03/1984US4458349 Method for storing data words in fault tolerant memory to recover uncorrectable errors
07/03/1984US4458338 Circuit for checking memory cells of programmable MOS-integrated semiconductor memories
07/03/1984US4458334 Redundancy map storage for bubble memories
07/03/1984CA1170373A1 Method and apparatus for testing and verifying the operation of error control apparatus included within a memory system
06/1984
06/26/1984US4456996 Parallel/series error correction circuit
06/26/1984US4456995 Apparatus for high speed fault mapping of large memories
06/26/1984US4456993 Data processing system with error processing apparatus and error processing method
06/26/1984US4456980 Semiconductor memory device
06/26/1984US4456966 Memory system with flexible replacement units
06/21/1984WO1984002409A1 Memory backup system
06/20/1984EP0111399A2 Microcomputer
06/20/1984EP0111053A2 On-chip monitor
06/19/1984US4455495 Programmable semiconductor integrated circuitry including a programming semiconductor element
06/19/1984CA1169566A1 Method and apparatus for detecting and correcting errors in a memory
06/13/1984EP0110643A2 Microcomputer
06/13/1984EP0110642A2 Microcomputer
06/13/1984EP0110636A2 Improvements in or relating to semiconductor memories
06/13/1984EP0110354A2 Detecting improper operation of a digital data processing apparatus
06/05/1984US4453251 Error-correcting memory with low storage overhead and fast correction mechanism
06/05/1984US4453248 Fault alignment exclusion method to prevent realignment of previously paired memory defects
06/05/1984US4453237 Multiple bit output dynamic random-access memory
05/1984
05/29/1984CA1168364A1 Soft error rewrite control system
05/23/1984EP0109006A2 Dynamic random access memory having separated voltage terminal pads, for improved burn-in, methods for manufacturing and testing such memory
05/22/1984US4450560 Tester for LSI devices and memory devices
05/22/1984US4450559 Memory system with selective assignment of spare locations
05/16/1984EP0108578A2 Address transformation system having an address shuffler
05/08/1984USRE31582 Automatic control system for method and apparatus for checking devices of an automotive vehicle in use with a microcomputer
05/01/1984US4446534 Programmable fuse circuit
05/01/1984CA1166752A1 Memory management method and apparatus
04/1984
04/24/1984CA1166352A1 Backup power circuit for biasing bit lines of a static semiconductor memory
04/18/1984EP0105402A2 Memory address permutation apparatus
04/17/1984CA1165893A1 Error-correcting system
04/10/1984US4442519 Memory address sequence generator
04/10/1984CA1165451A1 Refresh and error detection and correction technique for a data processing system
04/10/1984CA1165450A1 Data processing system with self testing and configuration mapping capability
04/04/1984EP0104850A2 Semiconductor memory device
04/04/1984EP0104442A2 Monolithic integrated semiconductor device
04/03/1984US4441170 Memory redundancy apparatus for single chip memories
04/03/1984CA1165006A1 Data processing system with error processing and the error processing method
03/1984
03/29/1984WO1984001236A1 In-package e2prom redundancy
03/28/1984EP0104120A2 Redundant columns for byte wide memories
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