| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 04/17/1991 | EP0090332B1 Semiconductor memory device |
| 04/17/1991 | EP0090331B1 Semiconductor memory device |
| 04/16/1991 | US5008857 Semiconductor memory device provided with an improved system for detecting the positions using a redundant structure |
| 04/16/1991 | US5008617 Functional testing of ultra large area, ultra large scale integrated circuits |
| 04/10/1991 | EP0421693A2 Memory self-test |
| 04/09/1991 | US5007053 Method and apparatus for checksum address generation in a fail-safe modular memory |
| 04/09/1991 | US5007026 Method for the testing of one time programmable memories and corresponding memory |
| 04/09/1991 | US5006787 Self-testing circuitry for VLSI units |
| 04/03/1991 | EP0420388A2 Test latch circuit |
| 04/03/1991 | EP0419863A2 Multiple I/O select memory |
| 04/03/1991 | EP0419760A2 Zero standby power, radiation hardened, memory redundancy circuit |
| 04/03/1991 | CN1012297B Array recognization with internal cellular control and processing |
| 04/02/1991 | US5005158 Redundancy for serial memory |
| 03/27/1991 | EP0419202A2 A semiconductor memory device |
| 03/27/1991 | EP0419117A2 Wafer-scale semiconductor device having fail-safe circuit |
| 03/27/1991 | EP0418521A2 Testable latch self checker |
| 03/26/1991 | US5003542 Semiconductor memory device having error correcting circuit and method for correcting error |
| 03/20/1991 | EP0418030A2 Improvements in and relating to stable memory circuits |
| 03/20/1991 | EP0417484A2 Semiconductor memory device and process for making the same |
| 03/19/1991 | CA1281775C Failure information processing in automatic memory tester |
| 03/14/1991 | DE4027050A1 Halbleiterspeichereinrichtung mit fehlererfassungs- und-korrekturschaltkreis und betriebsverfahren fuer diese Semiconductor memory device with error detection and correction circuitry and operational procedures for these |
| 03/13/1991 | EP0416968A2 Array disk system and method of writing and reading data in array disk system |
| 03/13/1991 | EP0416714A2 Wafer-scale integrated memory circuits |
| 03/13/1991 | EP0416532A2 Semiconductor memory device associated with peripheral logic gates having a scan-path diagnostic mode of operation |
| 03/12/1991 | US4999813 Nonvolatile semiconductor memory having a stress test circuit |
| 03/12/1991 | CA1281428C Information processing system capable of reducing invalid memory operations by detecting an error in a main memory |
| 03/06/1991 | CN1049742A Extended flash writing circuit for dram-test |
| 03/05/1991 | US4998223 Programmable semiconductor memory apparatus |
| 03/05/1991 | US4998203 Postage meter with a non-volatile memory security circuit |
| 02/28/1991 | DE4025158A1 Encased PROM with memory cell field - has field cells in matrix of lines and columns, and replacement memory cell |
| 02/27/1991 | EP0414477A2 Semiconductor memory device having redundant memory cells |
| 02/26/1991 | US4996670 Zero standby power, radiation hardened, memory redundancy circuit |
| 02/26/1991 | US4996641 Diagnostic mode for a cache |
| 02/20/1991 | EP0413347A2 Semiconductor nonvolatile memory device |
| 02/19/1991 | US4994735 Flexible tester surface for testing integrated circuits |
| 02/13/1991 | EP0412838A2 Semiconductor memories |
| 02/13/1991 | CN1011643B Method of and system for high-speed, high accuracy functional testing of meories in micro-processor based units |
| 02/12/1991 | US4992985 Method for selectively initiating/terminating a test mode in an address multiplexed DRAM and address multiplexed DRAM having such a capability |
| 02/12/1991 | US4992984 Memory module utilizing partially defective memory chips |
| 02/06/1991 | EP0412039A2 Non-volatile memory usage |
| 02/06/1991 | EP0411626A2 Semiconductor memory device having a redundancy |
| 02/06/1991 | EP0411594A2 Circuit and method for testing the reliability of the function of a semi-conductor memory |
| 02/06/1991 | EP0411347A2 Eeprom memory cell with improved protection against errors due to cell breakdown |
| 02/06/1991 | EP0411069A1 Redundancy and testing techniques for ic wafers |
| 02/05/1991 | US4991175 Signature analysis |
| 02/05/1991 | US4991139 Semiconductor memory device |
| 02/05/1991 | US4990992 Semiconductor integrated circuit device |
| 01/30/1991 | EP0410492A2 Non-volatile semiconductor memory device having an improved testing mode of operation and method of forming checkerwise test pattern in memory cell array |
| 01/30/1991 | EP0410464A2 Semiconductor memory device having diagnostic circuit for memory cells |
| 01/30/1991 | EP0410413A2 Semiconductor memory apparatus with a spare memory cell array |
| 01/30/1991 | EP0128945B1 Memory backup system |
| 01/29/1991 | US4989181 Serial memory device provided with high-speed address control circuit |
| 01/24/1991 | WO1991001023A1 A fault tolerant data storage system |
| 01/24/1991 | DE4022153A1 Semiconductor DRAM with test circuit - has memory cells, each IGFET and capacitor, with bit line coupled to FET |
| 01/22/1991 | US4987560 Semiconductor memory device |
| 01/16/1991 | EP0408234A2 A non-volatile counter |
| 01/16/1991 | EP0408233A2 A non-volatile RAM bit cell |
| 01/16/1991 | EP0408057A2 Semiconductor memory device |
| 01/16/1991 | EP0408002A2 A programmable semiconductor memory apparatus |
| 01/16/1991 | EP0188431B1 Gate-array with bidirectional symmetry |
| 01/16/1991 | CN1048624A Method and apparatus for diagnosing failures in read only memory and like |
| 01/15/1991 | US4985866 Compound semiconductor memory device having redundant circuit configuration |
| 01/15/1991 | US4985832 SIMD array processing system with routing networks having plurality of switching stages to transfer messages among processors |
| 01/15/1991 | US4985674 Real time, hostile environment, memory tester interface |
| 01/09/1991 | EP0407173A2 Semiconductor memory device |
| 01/09/1991 | CN1048463A Method for writing data in testing memory device and circuit for testing memory device |
| 01/08/1991 | US4984205 Semiconductor memory device with improved indicator of state of redundant structure |
| 01/03/1991 | DE3920871A1 Integrated solid state memory |
| 01/02/1991 | EP0405925A2 Method and apparatus for managing a shadow set of storage media |
| 01/02/1991 | EP0405586A1 Semiconductor device and method of burning in the same |
| 01/02/1991 | EP0405576A2 Semiconductor memory device |
| 01/02/1991 | EP0405371A2 Semiconducteur memory device with improved address discriminating circuit for discriminating an address assigned defective memory cell replaced with redundant memory cell |
| 01/02/1991 | EP0405280A2 Self-checking memory cell array apparatus |
| 01/02/1991 | EP0404995A1 Integrated-circuit array |
| 01/02/1991 | EP0404940A1 Memory testing system |
| 01/02/1991 | CN1011085B Circuit arrangement for testing integrated circuit components |
| 01/01/1991 | US4982380 Semiconductor memory device having output data buffer unit shared between usual access mode and test mode of operation |
| 01/01/1991 | US4982366 Static semiconductor memory with readout inhibit means |
| 01/01/1991 | US4982360 Memory subsystem |
| 12/31/1990 | CA2020268A1 Digital data management system |
| 12/27/1990 | WO1990016069A1 Semiconductor memory device |
| 12/27/1990 | WO1990015999A1 Test pattern generator |
| 12/27/1990 | EP0403821A2 Semiconductor integrated circuit device incorporating a test circuit |
| 12/25/1990 | US4980888 Memory testing system |
| 12/20/1990 | DE4018296A1 Test circuit for writing multi byte into semiconductor memory - has several data bus line selectors, forming data input buffer circuit outputs |
| 12/19/1990 | EP0402542A1 Method of removing uncommitted changes to stored data by a database management system |
| 12/19/1990 | EP0402497A1 Method of and apparatus for diagnosing failures in read only memory systems and the like |
| 12/13/1990 | CA2018932A1 Method of removing uncommitted changes made to stored data by a database management system |
| 12/12/1990 | EP0401994A2 Method of implementing error corrected memory |
| 12/12/1990 | EP0401957A2 Circuit for repairing defective bit in semiconductor memory device and repairing method |
| 12/12/1990 | EP0401792A2 Semiconductor memory device |
| 12/06/1990 | DE4017616A1 Halbleiterspeichereinrichtung mit einem auf dem chip befindlichen testschaltkreis und betriebsverfahren hierfuer A semiconductor memory device having a chip located on the test circuit and method of operation herein for |
| 12/05/1990 | EP0400184A1 Integrated semiconductor DRAM memory and method for its operation |
| 12/05/1990 | EP0400183A1 Sense amplifier for a DRAM-type integrated semi-conductor memory |
| 12/05/1990 | EP0400179A1 Semi-conductor memory internal parallel test method and apparatus |
| 12/04/1990 | US4975882 User programmable redundant memory |
| 12/04/1990 | US4975881 Semiconductor memory device provided with an improved redundant decoder |
| 12/04/1990 | US4975876 Method for arranging a read-only memory for reading out updating status information in an integrated circuit |
| 11/29/1990 | DE4001223A1 Halbleiterspeichervorrichtung mit einem redundanten block A semiconductor memory device with a redundant block |
| 11/28/1990 | EP0399535A2 Memory circuit having a redundant memory cell array for replacing faulty cells |