| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 07/01/1992 | EP0492609A2 Semiconductor device with voltage stress testing pads |
| 07/01/1992 | EP0492106A1 Endurance management for solid state files |
| 07/01/1992 | EP0492099A2 A flexible redundancy architecture and fuse download scheme |
| 07/01/1992 | EP0491998A1 Programme-controlled method and circuit arrangement for generating pulses within successive time intervals |
| 07/01/1992 | EP0282384B1 Method and arrangement for addressing redundant elements in an integrated memory |
| 06/30/1992 | US5127097 Memory writing apparatus |
| 06/30/1992 | US5127014 Dram on-chip error correction/detection |
| 06/30/1992 | US5127010 Pattern generator |
| 06/30/1992 | US5127008 Integrated circuit driver inhibit control test method |
| 06/30/1992 | US5126973 Redundancy scheme for eliminating defects in a memory device |
| 06/30/1992 | US5126889 Technique for information protection on fault-tolerant redundant information storage devices |
| 06/24/1992 | EP0491523A1 A semiconductor memory with precharged redundancy multiplexing |
| 06/24/1992 | EP0491290A2 IC Tester |
| 06/24/1992 | EP0491105A1 Improved sense circuit for storage devices such as non-volatile memories, with enhanced sensing discrimination |
| 06/23/1992 | US5124949 Semiconductor memory device with a redundant memory cell array |
| 06/23/1992 | US5124948 Mask ROM with spare memory cells |
| 06/23/1992 | US5124946 Semiconductor memory device associated with peripheral logic gates having a scan-path diagnostic mode of operation |
| 06/23/1992 | US5124945 Method and apparatus for verifying the state of a plurality of electrically programmable memory cells |
| 06/23/1992 | US5124587 Integrated circuit with a configuration circuit |
| 06/23/1992 | CA1304164C Memory test method and apparatus |
| 06/17/1992 | EP0490680A2 A semiconductor memory with multiplexed redundancy |
| 06/16/1992 | US5123016 Arrangement and method for identifying and localizing faulty circuits of a memory module |
| 06/16/1992 | US5122987 Semiconductor memory device with individually addressable space cells capable of driving a data bus |
| 06/03/1992 | EP0488782A1 Data writing during process of data restoration in array disk storage system |
| 06/03/1992 | EP0488612A1 A semiconductor memory with inverted write-back capability and method of testing using inverted write-back |
| 06/03/1992 | EP0488593A2 Dynamic random access memory device with improved refreshing unit |
| 06/03/1992 | EP0488425A1 Semiconductor memory device |
| 06/03/1992 | CN1016910B Self-testing memory |
| 06/02/1992 | US5119337 Semiconductor memory device having burn-in test function |
| 06/02/1992 | US5119335 Semiconductor static memory device |
| 05/29/1992 | WO1992009035A1 Multilevel, hierarchical, dynamically mapped data storage subsystem |
| 05/27/1992 | EP0486794A2 DRAM having extended refresh time |
| 05/27/1992 | EP0195631B1 Semiconductor memory |
| 05/26/1992 | US5117426 Circuit, device, and method to detect voltage leakage |
| 05/26/1992 | US5117393 Method of testing memory cells in an address multiplexed dynamic ram including test mode selection |
| 05/21/1992 | DE4136729A1 Cache control unit for fault tolerant computer system |
| 05/20/1992 | EP0486295A2 Semiconductor memory device with redundant circuit |
| 05/20/1992 | EP0485976A2 Fault analysis apparatus for memories having redundancy circuits |
| 05/20/1992 | EP0131930B1 Semiconductor memory device |
| 05/19/1992 | US5115413 Semiconductor memory device |
| 05/19/1992 | US5115146 Power-on reset circuit for controlling test mode entry |
| 05/14/1992 | WO1992008229A1 System for locating and anticipating data storage media failures |
| 05/14/1992 | WO1992008193A1 A fault tolerant data storage system |
| 05/13/1992 | EP0251429B1 Non-volatile semiconductor memory |
| 05/13/1992 | EP0249903B1 Semiconductor memory device |
| 05/12/1992 | US5113399 Memory test methodology |
| 05/12/1992 | US5113371 Semiconductor memory apparatus with a spare memory cell array |
| 05/07/1992 | EP0561765A4 Novel method of making, testing and test device for integrated circuits. |
| 05/05/1992 | US5111457 Detection and recovery from an nvm data integrity failure |
| 05/05/1992 | US5111433 Semiconductor memory device with inhibiting test mode cancellation and operating method thereof |
| 05/05/1992 | US5111136 Semiconductor circuit |
| 05/05/1992 | US5111073 Wafer-scale semiconductor device having fail-safe circuit |
| 05/05/1992 | US5111060 Electronic circuit equipped with redundant or spare circuit elements for every circuit element |
| 04/30/1992 | WO1992007362A1 Semiconductor memory unit having redundant structure |
| 04/29/1992 | EP0482928A2 Semiconducteur memory |
| 04/29/1992 | EP0482853A2 Method and apparatus for storage device management |
| 04/29/1992 | EP0482819A2 On-line reconstruction of a failed redundant array system |
| 04/29/1992 | EP0482793A1 Light control window covering |
| 04/28/1992 | US5109505 Semiconductor memory disk apparatus with backup device capable of being accessed immediately after power source is recovered |
| 04/28/1992 | US5109382 Method and apparatus for testing a memory |
| 04/28/1992 | US5109360 Row/column address interchange for a fault-tolerant memory system |
| 04/28/1992 | US5109257 Testing circuit for semiconductor memory array |
| 04/24/1992 | CA2053692A1 On-line reconstruction of a failed redundant array system |
| 04/22/1992 | EP0481731A2 Circuit for detecting false read data from eprom |
| 04/22/1992 | EP0481703A2 Interconnect structure for use with programming elements and test devices |
| 04/22/1992 | EP0481494A2 Memory apparatus |
| 04/22/1992 | EP0480966A1 A fault tolerant data storage system. |
| 04/22/1992 | EP0231903B1 Semiconductor memory device |
| 04/21/1992 | US5107501 Built-in self-test technique for content-addressable memories |
| 04/21/1992 | US5107464 Semiconductor memory system |
| 04/21/1992 | US5107461 Eeprom memory cell with improved protection against errors due to cell breakdown |
| 04/21/1992 | US5107377 Method and apparatus for digital storage and retrieval of data |
| 04/21/1992 | US5107205 Semiconductor device tester with a test waveform monitoring circuit |
| 04/21/1992 | CA1299289C Integrated circuit with memory self-test |
| 04/16/1992 | WO1992006475A1 Semiconductor memory |
| 04/15/1992 | EP0480915A1 Defective element disabling circuit having a laser-blown fuse |
| 04/15/1992 | EP0480752A2 Semiconductor memory device with short circuit identifying means |
| 04/15/1992 | EP0480421A2 Testable RAM architecture in a microprocessor having embedded cache memory |
| 04/15/1992 | EP0188192B1 Extended error correction for package error correction codes |
| 04/14/1992 | US5105449 Non-volatile counter employing memory cell groups and fault detection logic |
| 04/14/1992 | US5105425 Adaptive or fault tolerant full wafer nonvolatile memory |
| 04/14/1992 | US5103557 Making and testing an integrated circuit using high density probe points |
| 04/09/1992 | DE4132831A1 Halbleiterspeichereinrichtung mit redundanzschaltung zum reparieren eines fehlerhaften bit Semiconductor memory device having redundancy circuit for repairing a defective bit |
| 04/09/1992 | DE4132116A1 Redundancy circuit for semiconductor memory device - provides defined connection paths between main and auxiliary row and column selection lines |
| 04/08/1992 | EP0479460A2 Logic circuit for reliability and yield enhancement |
| 04/07/1992 | US5103426 Decoding circuit and method for functional block selection |
| 04/07/1992 | US5103424 Memory column interface with fault tolerance |
| 04/07/1992 | US5103166 Semiconductor integrated circuit chip having an identification circuit therein |
| 04/01/1992 | EP0477809A2 High speed redundant rows and columns for semiconductor memories |
| 04/01/1992 | EP0477369A1 Semiconductor memory device |
| 03/31/1992 | US5101492 Data redundancy and recovery protection |
| 03/31/1992 | US5101409 Checkboard memory self-test |
| 03/31/1992 | US5101121 Security locks for integrated circuit |
| 03/26/1992 | DE4130572A1 Testing read-write memories - using shift register test signal generator for cyclic inputs |
| 03/26/1992 | DE4130570A1 Testing read-write memories - using shift register generator with facility for changing cycle conditions |
| 03/25/1992 | EP0476962A2 System for configuring a shared storage |
| 03/25/1992 | EP0476247A1 Semiconductor storage system |
| 03/24/1992 | US5099481 Registered RAM array with parallel and serial interface |
| 03/24/1992 | US5099297 EEPROM cell structure and architecture with programming and erase terminals shared between several cells |
| 03/24/1992 | CA1297998C Interconnection system for integrated circuit chips |