Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
08/1989
08/23/1989CN1035018A Method of and system for high-speed, high accuracy functional testing of memories in micro-processor based units
08/22/1989US4860261 Leakage verification for flash EPROM
08/22/1989US4860260 Semiconductor memory device with testing of redundant memory cells
08/22/1989US4860259 Dram with reduced-test-time mode
08/22/1989US4860256 Integrated circuit provided with switching elements for changeover to redundancy elements in a memory
08/16/1989EP0327861A1 Redundancy decoder for an integrated semiconductor memory
08/16/1989EP0083212B1 Semiconductor memory device
08/15/1989US4858192 Semiconductor memory device with redundancy circuit
08/15/1989US4858072 Interconnection system for integrated circuit chips
08/10/1989WO1989007298A1 Improvements in or relating to data handling arrays
08/09/1989EP0083031B1 Semiconductor memory device having a programming circuit
08/08/1989US4855956 Semiconductor memory device with improved cell arrangement
08/08/1989US4855621 Multi-stage, integrated decoder device having redundancy test enable
07/1989
07/26/1989EP0325096A1 A method and an arrangement for reading out updating status information in an integrated circuit
07/25/1989US4852096 CN2 test pattern generator
07/25/1989US4852058 Semiconductor memory circuit having inspection circuit
07/19/1989EP0324386A2 Memory testing device
07/18/1989US4849973 Test system for random access memory
07/18/1989US4849939 Semiconductor memorizing device
07/18/1989US4849938 Semiconductor memory device
07/12/1989EP0323643A2 Semiconductor integrated circuit with a circuit limiting an input voltage to a predetermined voltage
07/12/1989EP0040219B1 Data processor having common monitoring and memory loading and checking means
07/11/1989US4847810 Memory having redundancy circuit
07/11/1989US4847615 Control system for chained circuit modules
07/05/1989EP0323438A2 Circuit and method for self-testing a memory in a gate array with a bidirectional symmetry
07/05/1989EP0323123A2 A storage control system in a computer system
07/05/1989EP0322865A2 Memory testing device
07/04/1989US4845633 System for programming graphically a programmable, asynchronous logic cell and array
06/1989
06/21/1989EP0244443A4 Communication network for multiprocessor packet communication.
06/20/1989US4841525 Method and arrangement for testing mega-bit memory modules with arbitrary test patterns in a multi-bit test mode
06/20/1989US4841485 Read/write memory device with an embedded read-only pattern and method for providing same
06/20/1989US4841482 Leakage verification for flash EPROM
06/20/1989US4841233 Semiconductor integrated circuit adapted to carry out operation test
06/13/1989US4839865 Selective application of voltages for testing storage cells in semiconductor memory arrangements
06/13/1989US4839864 Semiconductor memory device comprising programmable redundancy circuit
06/07/1989EP0319522A2 Programmable word length memory in a gate array with bidirectional symmetry
06/06/1989US4837747 Redundary circuit with a spare main decoder responsive to an address of a defective cell in a selected cell block
06/06/1989US4837742 Electrically programmable ROM
05/1989
05/31/1989EP0318363A1 Method for testing cells of electrically programmable memories and a corresponding integrated circuit
05/30/1989US4835774 Semiconductor memory test system
05/30/1989US4835739 Mass storage bubble memory system
05/30/1989US4835729 Single instruction multiple data (SIMD) cellular array processing apparatus with on-board RAM and address generator apparatus
05/24/1989EP0317474A2 Programmed memory card swap
05/24/1989EP0317472A2 Logic redundancy circuit scheme
05/24/1989EP0317014A1 Random access memory unit with plural test modes and computer equipped with such units
05/24/1989EP0316867A2 Semiconductor file apparatus
05/24/1989DE3738644A1 Digital circuit arrangement
05/23/1989US4833677 Easily testable high speed architecture for large RAMS
05/23/1989US4833652 Semiconductor memory device having a self-diagnosing function
05/23/1989US4833395 Semiconductor device having a test circuit
05/23/1989US4833341 Semiconductor device with power supply voltage converter circuit
05/17/1989EP0316087A2 Method and apparatus for synchronising a plurality of processors
05/17/1989EP0315819A2 Method and apparatus for post-packaging testing of one-time programmable memories
05/17/1989EP0315792A2 Interconnection system for integrated circuit chips
05/17/1989EP0096369B1 Memory building block
05/10/1989EP0315275A2 Flexible asic microcomputer
05/10/1989EP0315257A1 Series-parallel-series memory comprising redundant storage columns, and picture memory comprising such series-parallel-series memories
05/10/1989EP0315209A2 Microcomputer incorporating memory
05/10/1989EP0315157A2 Semiconductor memory system
05/10/1989EP0314924A2 Read/write memory with embedded read-only test pattern, and method for providing same
05/09/1989US4829481 Defective element disabling circuit having a laser-blown fuse
05/09/1989US4829480 Column redundancy circuit for CMOS dynamic random access memory
05/09/1989US4829237 Circuit device having a self-testing function and a testing method thereof
05/05/1989WO1989004022A1 Process for verifying the authenticity of a data medium with integrated circuit
05/03/1989EP0314180A2 Nonvolatile semiconductor memory having a stress test circuit
05/03/1989EP0313967A1 Authentication method for a data carrier with integrated circuit
05/02/1989US4827476 Scan test apparatus for digital systems having dynamic random access memory
05/02/1989US4827452 Semiconductor memory including a selectively disabled redunancy circuit
05/02/1989US4827450 Integrated circuit with memory comprising a fraud-prevention device
05/02/1989US4827115 ID system and method or writing data in an ID system
04/1989
04/26/1989EP0313430A1 Device for structural testing of an integrated circuit
04/26/1989EP0313040A2 Erasable programmable read only memory device
04/26/1989EP0170727B1 Integrated write-read memory
04/25/1989US4825416 Integrated electronic memory circuit with internal timing and operable in both latch-based and register-based systems
04/25/1989US4825414 Semiconductor integrated circuit device having gate array and memory and input-output buffer
04/25/1989US4825206 Automatic feedback of network topology data
04/20/1989DE3833713A1 Halbleiterspeichereinrichtung mit einer vorrichtung zum pruefen und korrigieren von fehlern With a device for testing the semiconductor memory device and correcting errors
04/19/1989EP0098755B1 Programmable address buffer for partial circuits
04/18/1989US4823252 Overlapped control store
04/11/1989US4821238 Semiconductor memory device having test pattern generating circuit
04/11/1989US4820974 Measuring power supply current of a random access memory
04/06/1989WO1989003138A1 Programmable, asynchronous logic cell and array
04/06/1989DE3732830A1 Circuit arrangement for testing the functional capability of a complex circuit
04/05/1989EP0310111A2 Memory incorporating logic LSI and method for testing the same LSI
04/05/1989EP0309793A2 Method and apparatus for testing an integrated circuit including a microprocessor and an instruction cache
04/05/1989EP0044628B1 Redundancy scheme for an mos memory
04/04/1989US4819205 Memory system having memory elements independently defined as being on-line or off-line
04/04/1989US4819154 Memory back up system with one cache memory and two physically separated main memories
04/04/1989US4819151 Microcomputer
03/1989
03/29/1989EP0308726A2 Wafer scale integrated circuit
03/29/1989EP0308660A2 Device for producing a test-compatible, largely fault tolerant configuration of redundantly implemented VLSI systems
03/28/1989US4817056 Semiconductor memory device
03/28/1989US4817052 Semiconductor memory with an improved dummy cell arrangement and with a built-in error correcting code circuit
03/28/1989US4816757 Reconfigurable integrated circuit for enhanced testing in a manufacturing environment
03/22/1989EP0307958A2 Eeprom system with bit error detecting function
03/22/1989EP0307549A2 Memory test pattern generator
03/15/1989EP0306990A2 Semiconductor memory device with dummy cell array
03/15/1989EP0306962A2 Single-chip microcomputer
03/15/1989EP0167540B1 Processing system tolerant of loss of access to secondary storage
03/15/1989EP0097159B1 Two bit per symbol sec/ded code
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