Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
08/1985
08/27/1985US4538247 Redundant rows in integrated circuit memories
08/27/1985US4538245 Enabling circuit for redundant word lines in a semiconductor memory array
08/21/1985EP0151849A2 Information storing circuit using blown and unblown fuses
08/15/1985WO1985003583A1 Crash survivable solid state memory for aircraft flight data recorder systems
08/13/1985US4535455 Correction and monitoring of transient errors in a memory system
08/07/1985EP0150194A1 A byte wide memory circuit having a column redundancy circuit
08/06/1985CA1191558A1 On chip monitor
07/1985
07/30/1985US4532628 System for periodically reading all memory locations to detect errors
07/30/1985US4532611 Redundant memory circuit
07/30/1985US4532607 Programmable circuit including a latch to store a fuse's state
07/24/1985EP0149048A1 Method and apparatus for testing semiconductor devices
07/17/1985EP0148722A2 Zero power cmos redundancy circuit
07/04/1985WO1985002926A1 Processing system tolerant of loss of access to secondary storage
07/03/1985EP0146975A2 Short detector for proms
07/03/1985EP0146891A2 Data processing apparatus having address substitution capabilities
07/02/1985US4527256 Electrically erasable memory matrix (EEPROM)
07/02/1985US4527254 Dynamic random access memory having separated VDD pads for improved burn-in
07/02/1985US4527251 Remap method and apparatus for a memory system which uses partially good memory devices
07/01/1985EP0097159A4 Two bit per symbol sec/ded code.
07/01/1985EP0096030A4 Apparatus for high speed fault mapping of large memories.
07/01/1985EP0041999A4 Self-correcting memory system and method.
06/1985
06/26/1985EP0146357A2 Semiconductor memory device
06/26/1985EP0090002A4 Memory with permanent array division capability.
06/19/1985EP0145595A2 Integrated circuit device
06/19/1985EP0144710A2 Circuit for applying a voltage to a memory cell mos capacitor of a semiconductor memory device
06/18/1985US4524429 Integrated memory matrix comprising nonvolatile reprogrammable storage cells
06/11/1985US4523313 Partial defective chip memory support system
06/05/1985EP0143624A2 Dynamic semiconductor memory device having divided memory cell blocks
06/04/1985CA1188426A1 Identification of repaired integrated circuits
06/04/1985CA1188361A1 Voltage regulation and battery dissipation limiter circuit
05/1985
05/29/1985EP0143039A1 Electronic components array manufacturing process
05/28/1985US4520453 Address transformation system having an address shuffler
05/22/1985EP0142127A2 Redundancy circuit for a semiconductor memory device
05/22/1985EP0141984A2 Multiprocessor central control unit for a telephone switching system
05/21/1985US4519076 Memory core testing system
05/21/1985US4519035 Branched-spiral wafer-scale integrated circuit
05/15/1985EP0141245A2 Method for the operation of a couple of memory blocks normally working in parallel
05/14/1985US4517659 Constant-distance structure polycellular very large scale integrated circuit
05/14/1985CA1187176A1 Programmable address buffer for partial products
05/08/1985EP0140752A2 Memory subsystem
05/08/1985EP0140698A2 Fault-tolerant memory array
05/08/1985EP0140595A2 High speed redundancy processor
05/08/1985EP0140368A2 Programmable read-only memory device provided with test cells
05/02/1985EP0139124A2 Apparatus and method for automatically correcting a double bit hard error within a memory of a computer system and ensuring that said error will never re-occur
05/02/1985EP0138964A1 Apparatus for controlling access to a memory.
05/02/1985EP0138906A1 Redundant memory circuit and method of programming and verifying the circuit
04/1985
04/30/1985US4514830 Defect-remediable semiconductor integrated circuit memory and spare substitution method in the same
04/23/1985US4513389 ROM security circuit
04/16/1985CA1185698A1 Method and means for diagnostic testing of ccd memories
04/10/1985EP0136443A2 Memory correction scheme using spare arrays
04/09/1985US4510603 Testing system for reliable access times in ROM semiconductor memories
04/09/1985CA1185376A1 Memory system with automatic memory reconfiguration
04/03/1985EP0135864A2 System and method for automatically testing integrated circuit memory arrays on different memory array testers
04/03/1985EP0135780A2 Reconfigurable memory
03/1985
03/26/1985US4507761 Functional command for semiconductor memory
03/26/1985US4507730 Memory system with automatic memory configuration
03/26/1985CA1184665A1 Multilevel cache system with graceful degradation capability
03/19/1985US4506364 Memory address permutation apparatus
03/19/1985US4506350 Non-volatile semiconductor memory system
03/19/1985CA1184248A1 Semiconductor memory cell margin test circuit
03/12/1985US4504929 Dynamic semiconductor memory device
03/05/1985US4503538 Method and system to recognize change in the storage characteristics of a programmable memory
02/1985
02/26/1985US4502140 GO/NO GO margin test circuit for semiconductor memory
02/26/1985US4502131 Electrically programmable memory matrix
02/19/1985US4500235 Coupling
02/05/1985US4498151 Digital system
02/05/1985US4498146 Management of defects in storage media
02/05/1985CA1182217A1 Prom erase detector
01/1985
01/31/1985WO1985000460A1 A byte wide memory circuit having a column redundancy circuit
01/29/1985US4497020 Selective mapping system and method
01/23/1985EP0131930A2 Semiconductor memory device
01/22/1985US4495628 CMOS LSI and VLSI chips having internal delay testing capability
01/22/1985US4495603 Test system for segmented memory
01/16/1985EP0059203B1 A coupling
01/15/1985US4494220 Folded bit line memory with one decoder per pair of spare rows
01/15/1985US4494219 Nonvolatile read only memory device
01/09/1985EP0130534A2 Apparatus and method for testing and verifying the refresh logic of dynamic MOS memories
01/08/1985US4493075 Self repairing bulk memory
01/08/1985US4493055 Wafer-scale integrated circuits
01/02/1985EP0017808B1 Method involving testing an electrically alterable microelectronic memory circuit
01/02/1985CA1180452A Storage element reconfiguration
12/1984
12/27/1984EP0128945A1 Memory backup system.
12/18/1984US4489403 Fault alignment control system and circuits
12/18/1984US4489402 Semiconductor memory device
12/18/1984US4489401 Electrical partitioning scheme for improving yields during the manufacture of semiconductor memory arrays
12/18/1984US4489397 Chain configurable polycellular wafer scale integrated circuit
12/11/1984US4488300 Method of checking the integrity of a source of additional memory for use in an electronically controlled sewing machine
12/11/1984US4488298 Multi-bit error scattering arrangement to provide fault tolerant semiconductor static memories
12/11/1984US4488265 Integrated dynamic RAM and ROS
12/11/1984US4488259 On chip monitor
12/11/1984US4488257 Method for confirming incorporation of a memory into microcomputer system
12/11/1984US4488223 Control apparatus for a plurality of memory units
12/05/1984EP0127015A2 Integrated digital MOS semiconductor circuit
12/04/1984US4486834 Multi-computer system having dual common memory
12/04/1984CA1179060A1 Semiconductor memory device
11/1984
11/27/1984US4485471 Method of memory reconfiguration for fault tolerant memory
11/27/1984US4485459 Redundant columns for byte wide memories
11/27/1984US4485435 Memory management method and apparatus for initializing and/or clearing R/W storage areas
11/21/1984EP0125633A2 Testing apparatus for redundant memory
11/14/1984EP0124900A2 Reduntant type memory circuit with an improved clock generator
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