Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
02/1990
02/20/1990US4903268 Semiconductor memory device having on-chip error check and correction functions
02/20/1990US4903266 Memory self-test
02/20/1990US4903265 Method and apparatus for post-packaging testing of one-time programmable memories
02/20/1990US4903111 Integrated circuit device
02/14/1990EP0354860A1 Highly integrated EPROM device laid out in a grid and having an altered coupling factor and a redundancy capability
02/13/1990US4901320 Self-correcting semiconductor memory device and microcomputer incorporating the same
02/13/1990US4901284 Static random access memory
02/07/1990EP0353660A2 Fault prevention method in memory systems of data-processing installations, in particular telephone exchanges
02/07/1990EP0353435A2 Error correction device for parity protected memory systems
02/06/1990US4899342 Method and apparatus for operating multi-unit array of memories
02/06/1990US4899313 Semiconductor memory device with an improved multi-bit test mode
01/1990
01/31/1990EP0352730A2 Semiconductor memory device provided with an improved system for detecting the positions using a redundant structure
01/31/1990EP0138964B1 Apparatus for controlling access to a memory
01/30/1990US4897817 Semiconductor memory device with a built-in test circuit
01/23/1990US4896322 Circuit configuration and a method for the testing of storage cells
01/23/1990US4896055 Semiconductor integrated circuit technology for eliminating circuits or arrays having abnormal operating characteristics
01/23/1990CA1264868A1 Semiconductor defect monitor for diagnosing processing-induced defects
01/17/1990EP0351109A2 Reducing resources in a high reliability data storage subsystem
01/17/1990EP0350943A2 Semiconductor integrated circuit including output buffer
01/17/1990EP0350888A2 Signature compression circuit
01/17/1990EP0350538A1 Memory device containing a static RAM memory that is adapted for executing a self-test, and integrated circuit containing such a device as an embedded static RAM memory
01/16/1990US4894800 Reconfigurable register bit-slice for self-test
01/10/1990EP0349775A2 Flash eeprom memory systems and methods of using them
01/10/1990EP0349774A2 Highly compact eprom and flash eeprom divices
01/10/1990EP0349557A1 Gate circuit with mos transistors.
01/09/1990US4893072 Apparatus for testing an integrated circuit device
01/09/1990CA1264376A1 Method and apparatus for locating and displaying historical information within an electronic postage meter
01/08/1990EP0171418A4 Crash survivable solid state memory for aircraft flight data recorder systems.
01/02/1990US4891811 Efficient address test for large memories
12/1989
12/27/1989EP0347970A2 Read-only memory test method, and device for carrying out the method
12/26/1989US4890262 Semiconductor memory with built-in defective bit relief circuit
12/19/1989US4888772 Testing circuit for random access memory device
12/19/1989US4888686 System for storing information with comparison of stored data values
12/14/1989WO1989012320A1 Wafer scale integrated circuits
12/13/1989CN1006095B Method of and system for fast functional testing of random access memories
12/06/1989EP0345162A1 Wafer scale integration device
12/05/1989US4885748 Method and circuit configuration of the parallel input of data into a semiconductor memory
12/05/1989US4885721 Semiconductor memory device with redundant memory cells
12/05/1989US4885720 Memory device and method implementing wordline redundancy without an access time penalty
12/05/1989CA1263760A1 Apparatus for multiprocessor communication
11/1989
11/30/1989WO1989011659A1 Novel method of making, testing and test device for integrated circuits
11/29/1989EP0343344A2 Semiconductor memory device with improved indicator of the state of the redundant structure
11/29/1989EP0096783B1 Method for storing data words in fault tolerant memory to recover uncorrectable errors
11/21/1989US4882673 Method and apparatus for testing an integrated circuit including a microprocessor and an instruction cache
11/16/1989WO1989011134A1 Electronic computing and storage system for franking machines
11/16/1989WO1989009471A3 Memory selftest method and apparatus
11/14/1989US4881202 Semiconductor memory device using partial decoders for redundancy
11/14/1989US4881200 Erasable programmable read only memory device
11/14/1989CA1262964A1 Radiation hard gated feedback memory cell
11/08/1989EP0340895A2 Improvements in logic and memory circuit testing
11/07/1989US4879689 Nonvolatile semiconductor memory device
11/02/1989WO1989010593A1 Memory testing system
10/1989
10/31/1989US4878220 Semiconductor memory device
10/31/1989US4878209 Macro performance test
10/31/1989US4878174 Flexible ASIC microcomputer permitting the modular modification of dedicated functions and macroinstructions
10/25/1989EP0338455A2 Elektronische Registrierkasse mit Speicherdefekterkennung
10/24/1989US4876685 Failure information processing in automatic memory tester
10/24/1989US4876684 Method of and apparatus for diagnosing failures in read only memory systems and the like
10/19/1989DE3811736A1 Method of storing and reading data
10/18/1989EP0337393A2 2-cell/1-bit type EPROM
10/18/1989EP0337384A2 Redundant circuit incorporated in semiconductor memory device
10/18/1989EP0337106A2 Embedded array access time test
10/18/1989EP0099910B1 Semiconductor memory utilizing redundant circuitry
10/17/1989US4875212 Memory device with integrated error detection and correction
10/17/1989US4875194 Semiconductor memory device with protection cells
10/11/1989EP0336435A2 Memory diagnostic apparatus and method
10/11/1989EP0336101A2 Semiconductor memory device
10/10/1989US4873705 Method of and system for high-speed, high-accuracy functional testing of memories in microprocessor-based units
10/10/1989US4873686 Test assist circuit for a semiconductor device providing fault isolation
10/10/1989US4873669 Random access memory device operable in a normal mode and in a test mode
10/05/1989WO1989009471A2 Memory selftest method and apparatus
10/04/1989EP0335149A2 Semiconductor memory redundancy scheme
10/04/1989EP0335125A2 DRAM with redundancy and improved testability
10/03/1989US4872168 Integrated circuit with memory self-test
10/03/1989US4872166 Information processing system capable of reducing invalid memory operations by detecting an error in a main memory
10/03/1989US4872137 Reprogrammable control circuit
10/03/1989US4871963 Method and apparatus for testing EPROM type semiconductor devices during burn-in
09/1989
09/28/1989DE3903714A1 Halbleiterspeichereinrichtung mit einer testmode-setzschaltung Semiconductor memory device having a test mode-boost circuit
09/27/1989EP0334763A1 Method of testing a fleeting programmable memory, and this memory
09/26/1989US4870618 Semiconductor memory equipped with test circuit for testing data holding characteristic during data programming period
09/26/1989CA1261020A1 Diagnostic method for addressing arrangement verification
09/26/1989CA1260139A1 Mass data recorder with dual memory system
09/20/1989EP0333241A2 Integrated monolithic circuit comprising a test bus
09/20/1989EP0333207A2 Mask rom with spare memory cells
09/19/1989US4868823 High speed concurrent testing of dynamic read/write memory array
09/19/1989US4868818 Fault tolerant hypercube computer system architecture
09/19/1989US4868789 Random access memory system with circuitry for avoiding use of defective memory cells
09/19/1989CA1259680A1 Digital signal scrambler
09/13/1989CN1035569A Address transform method and apparatus
09/12/1989US4866676 Testing arrangement for a DRAM with redundancy
09/12/1989US4866604 Digital data processing apparatus with pipelined memory cycles
09/07/1989DE3906897A1 Semiconductor memory device with improved redundancy circuit
08/1989
08/31/1989DE3900979A1 Elektrisch loeschbares und programmierbares nur-lese-speichergeraet Electrically erasable and programmable read-only-speichergeraet
08/31/1989DE3805391A1 Verfahren zur selbstpruefung eines random access memory (ram) einer schaltung Method for selbstpruefung a random access memory (ram) of a circuit
08/29/1989US4862460 Test pattern generator
08/29/1989US4862459 Test method for detecting faulty memory cell of a programmable device
08/29/1989US4862418 Non-volatile, programmable semiconductor memory having reduced testing time
08/29/1989US4862417 Redundant-storage memory
08/29/1989US4862416 Semiconductor memory device with redundant memory cell
08/29/1989US4862411 Multiple copy data mechanism on synchronous disk drives
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