Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
02/1988
02/03/1988EP0255362A2 Semiconductor integrated circuit
02/02/1988US4723227 Redundant type memory circuit with an improved clock generator
01/1988
01/27/1988EP0254691A2 Method and apparatus for testing eprom type semiconductor devices during burn-in
01/26/1988US4722084 Array reconfiguration apparatus and methods particularly adapted for use with very large scale integrated circuits
01/20/1988EP0253161A1 Testing circuit for random access memory device
01/19/1988US4720818 Semiconductor memory device adapted to carry out operation test
01/19/1988US4720817 Defect tolerant memory device
01/13/1988EP0252325A2 Semiconductor device having a fuse circuit and a detecting circuit for detecting the states of the fuses in the fuse circuit
01/12/1988US4719627 Memory system employing a low DC power gate array for error correction
01/12/1988US4719601 Column redundancy for two port random access memory
01/12/1988US4719599 Programmable read-only memory device provided with test cells
01/12/1988US4719598 Bit addressable programming arrangement
01/12/1988US4719418 Defect leakage screen system
01/12/1988US4719411 Addressable test matrix for measuring analog transfer characteristics of test elements used for integrated process control and device evaluation
01/12/1988CA1231456A1 Extended error correction for package error correction codes
01/07/1988EP0251429A2 Non-volatile semiconductor memory
01/05/1988US4718042 Non-destructive method and circuit to determine the programmability of a one time programmable device
01/05/1988US4718041 EEPROM memory having extended life
12/1987
12/23/1987EP0250242A2 Semiconductor memory device having erroneous write operation preventing circuit
12/23/1987EP0250011A2 Scheduling of concurrent processes in a microcomputer system
12/23/1987EP0249903A2 Semiconductor memory device
12/22/1987US4715034 Method of and system for fast functional testing of random access memories
12/22/1987US4714839 Control circuit for disabling or enabling the provision of redundancy
12/16/1987EP0248875A1 Fault tolerant memory system
12/15/1987US4713814 Stability testing of semiconductor memories
12/15/1987US4713812 Method and apparatus for replacement of data and of a data memory in an automotive-type electronic control system
12/15/1987US4713769 Method and apparatus for locating and displaying historical information within an electronic postage meter
12/10/1987DE3619255A1 Device for testing RAMs
12/08/1987US4712216 Method and device for correcting errors in memories
12/01/1987US4710930 Method and apparatus for diagnosing a LSI chip
12/01/1987CA1229918A1 Byte organized static memory
11/1987
11/19/1987EP0245591A2 Method and apparatus for transferring information into electronic systems
11/17/1987US4707810 Integrated circuit memory
11/17/1987US4707806 Semiconductor integrated circuit device having fuse-type information storing circuit
11/11/1987EP0245055A2 Integrated electronic memory circuits
11/11/1987EP0244628A1 Sense amplifier for a semiconductor memory device
11/11/1987EP0244443A1 Communication network for multiprocessor packet communication
11/11/1987EP0116544B1 Management of defects in storage media
11/10/1987US4706249 Semiconductor memory device having error detection/correction function
11/10/1987US4706248 Semiconductor integrated circuit with error correction function incorporated therein
11/10/1987US4706157 Semiconductor intergrated circuit
11/05/1987WO1987005724A3 Random address system for circuit modules
11/04/1987EP0243859A2 Two port random access memory with column redundancy
11/03/1987US4704678 Function set for a microcomputer
10/1987
10/28/1987EP0242981A2 Semiconductor memory device having redundancy circuit portion
10/28/1987EP0242854A2 Semiconductor memory devices
10/27/1987US4703453 Semiconductor memory with an improved dummy cell arrangement and with a built-in error correcting code circuit
10/22/1987DE3612730A1 Processor system
10/20/1987US4701919 Semiconductor device incorporating memory test pattern generating circuit
10/20/1987US4701887 Semiconductor memory device having a redundancy circuit
10/20/1987US4701695 Short detector for PROMS
10/14/1987EP0241203A2 Detecting repaired memory devices
10/14/1987EP0241086A1 Device having tuning circuits for preset frequencies
10/14/1987EP0240864A2 High-yield semiconductor memory devices
10/14/1987EP0240534A1 control system for chained circuit modules
10/14/1987EP0240531A1 Improvements relating to wafer scale integrated circuits
10/13/1987US4700187 Programmable, asynchronous logic cell and array
10/07/1987EP0239968A2 Nonvolatile semiconductor memory device
10/07/1987EP0239916A2 Semiconductor memory device having a test mode and a standard mode of operation
10/06/1987US4698812 Memory system employing a zero DC power gate array for error correction
10/06/1987US4698808 Method for detecting intermittent error in volatile memory
10/06/1987US4698807 Self repair large scale integrated circuit
09/1987
09/30/1987EP0239299A2 Overlapped control store
09/30/1987EP0239196A1 Semiconductor memory device having redundancy circuit portion
09/24/1987WO1987005724A2 Random address system for circuit modules
09/24/1987DE3709032A1 Grossschaltkreis-halbleitervorrichtung Gross circuit semiconductor device
09/23/1987EP0238417A2 Semiconductor memory device
09/23/1987EP0108114B1 Pad for accelerated memory test
09/17/1987DE3608547A1 Computer system with external memory
09/16/1987EP0236717A2 Method for choosing replacement lines in a two-dimensionally redundant array
09/15/1987US4694454 Dynamic memory diagnosis and error correction apparatus
09/15/1987US4694432 Semiconductor memory device
09/15/1987CA1226942A1 Apparatus and method for testing and verifying the refresh logic of dynamic mos memories
09/11/1987WO1987005432A1 Nonvolatile memory system having a testing capability
09/09/1987EP0236053A2 Memory system employing a zero DC power gate array for error correction
09/09/1987EP0236052A2 Memory system employing a low DC power gate array for error correction
09/08/1987US4692923 Fault tolerant memory
09/08/1987US4692901 Semiconductor memory
09/08/1987US4692900 Semiconductor memory device having block pairs
09/02/1987EP0234937A2 Tag buffer with testing capability
09/02/1987EP0234907A2 Semiconductor memory device with redundant memory cell
09/01/1987US4691301 Semiconductor memory with redundant column circuitry
09/01/1987US4691300 Redundant column substitution architecture with improved column access time
08/1987
08/25/1987US4689792 Self test semiconductor memory with error correction capability
08/25/1987US4689772 Read complete test technique for memory arrays
08/25/1987US4689494 Redundancy enable/disable circuit
08/19/1987EP0232641A2 Cellular array processing apparatus with on-chip RAM and address generator apparatus
08/18/1987US4688219 Semiconductor memory device having redundant memory and parity capabilities
08/18/1987US4687989 CMDS integrated circuit for specifying a circuit parameter
08/12/1987EP0231903A2 Semiconductor memory device
08/12/1987EP0231438A2 Information recording system
08/12/1987EP0231237A1 Control system for chained circuit modules.
08/11/1987US4686621 Test apparatus for testing a multilevel cache system with graceful degradation capability
08/11/1987US4686456 Memory test circuit
08/05/1987EP0231041A1 Non-volatile, programmable semiconductor memory
08/04/1987US4685086 Memory cell leakage detection circuit
07/1987
07/30/1987WO1987004542A1 Improvements relating to wafer scale integrated circuits
07/30/1987DE3602112A1 System zur speicherung von informationen System for storing information
07/29/1987CN86106427A Array rearrangenment apparatus and method used particularly in very large scale integration
07/23/1987EP0138964A4 Apparatus for controlling access to a memory.
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