Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
11/1991
11/14/1991DE4115084A1 Test arrangement for semiconductor memory - contains test data memory, cell row selector, transfer device, reduces large capacity memory testing time
11/13/1991EP0456255A2 Dynamic memory device and method for screening the same
11/13/1991EP0456254A2 Semiconductor device and method of screening the same
11/13/1991EP0456195A2 Random access memory with redundancy relief circuit
11/13/1991EP0455977A2 Semiconductor memory device having diagnostic unit operable on parallel data bits
11/13/1991EP0455922A2 Method and apparatus for deriving mirrored unit state when re-initializing a system
11/13/1991EP0455653A1 Integrated semiconductor store.
11/12/1991US5065366 Non-volatile ram bit cell
11/12/1991US5065308 Processing cell for fault tolerant arrays
11/12/1991US5065091 Semiconductor integrated circuit device testing
11/12/1991US5065090 Method for testing integrated circuits having a grid-based, "cross-check" te
11/12/1991CA1292076C Massively parallel array processing system
11/07/1991DE4021600A1 Verfahren zum betriebsartwechsel einer speichervorrichtung mit zwei anschluessen A method for operating mode change a memory device with two terminals
11/06/1991EP0290094B1 Memory having redundant storage space
11/06/1991CN1014659B Semiconductor dynamic memory
11/05/1991US5063304 Integrated circuit with improved on-chip power supply control
10/1991
10/31/1991WO1991016680A1 Integrated circuit i/o using a high preformance bus interface
10/30/1991EP0454051A2 Program element for use in redundancy technique for semiconductor memory device, and method of fabricating a semiconductor memory device having the same
10/30/1991EP0453997A1 Semiconductor memory device
10/30/1991EP0453813A2 An integrated circuit with improved on-chip power supply control
10/30/1991EP0453758A1 Test system comprising integrated circuits for a printed circuit and application of this system for testing said printed circuit
10/29/1991US5062109 Memory tester
10/29/1991US5061980 Semiconductor integrated circuit device
10/23/1991EP0453351A1 Fuse-detection circuit
10/23/1991EP0452649A2 Interlocked on-chip ecc system
10/22/1991US5060230 On chip semiconductor memory arbitrary pattern, parallel test apparatus and method
10/22/1991US5060198 Device for the structural testing of an integrated circuit
10/22/1991US5060197 Static random access memory with redundancy
10/22/1991CA1291269C Efficient address test for large memories
10/17/1991WO1991015853A1 Very high density wafer scale device architecture
10/17/1991DE4110896A1 Detecting redundant circuit in logic circuit - detecting coincidence between results of simulations with and without pseudo-errors
10/16/1991EP0451985A2 Built-in self-test technique for content-addressable memories
10/16/1991EP0451595A2 Short circuit detector circuit for memory array
10/15/1991US5058071 Semiconductor memory device having means for repairing the memory device with respect to possible defective memory portions
10/15/1991US5058070 High speed memory with row redundancy
10/15/1991US5058069 Device for addressing of redundant elements of an integrated circuit memory
10/15/1991US5058068 Redundancy circuit with memorization of output contact pad position
10/15/1991US5058059 Memory circuit having a redundant memory cell array for replacing faulty cells
10/09/1991EP0450801A2 Disk drive array storage system
10/09/1991EP0450632A2 Nonvolatile semiconductor memory device
10/09/1991EP0349557B1 Gate circuit with mos transistors
10/08/1991US5056095 Semiconductor memory having error correction circuit
10/08/1991US5055774 Integrated circuit integrity testing apparatus
10/02/1991EP0449610A2 Electrically erasable programmable read-only memory with threshold value measurement circuit
10/02/1991EP0449417A2 Testing random access memories
10/02/1991EP0449264A2 Pulse signal generator and redundancy selection signal generator
10/02/1991EP0449066A1 Clock digital multiplier
10/02/1991EP0449053A2 Serial scan diagnostic apparatus and method for a memory device
10/02/1991EP0448980A2 Apparatus and method for memory device fault repair
10/02/1991EP0448970A2 An information processing device having an error check and correction circuit
10/02/1991EP0448958A2 Semiconductor integrated circuit having non-volatile memory cells for controlling a predetermined function
10/02/1991DE4110371A1 EEPROM of NAND cell type - has memory cell transistors determining number of cell units with preset number of transistors in series
10/01/1991US5053999 Semiconductor memory device having redundancy and capable of sequentially selecting memory cell lines
10/01/1991US5053990 Program/erase selection for flash memory
10/01/1991US5053700 Method for wafer scale testing of redundant integrated circuit dies
09/1991
09/25/1991EP0448364A2 Semiconductor storage device
09/25/1991EP0448118A2 Differential cell-type EPROM incorporating stress test circuit
09/25/1991EP0447995A2 Analyzing device for saving semiconductor memory failures
09/25/1991EP0447578A1 Memory management in high-performance fault-tolerant computer system
09/25/1991EP0447577A1 High-performance computer system with fault-tolerant capability
09/25/1991EP0447576A1 Synchronization of fault-tolerant computer system having multiple processors
09/25/1991EP0231237B1 Control system for chained circuit modules
09/25/1991EP0212997B1 Semiconductor integrated circuit adapted to carry out a test operation
09/25/1991EP0212208B1 Circuit arrangement for testing integrated-circuit units
09/24/1991US5052002 Method of detecting and indicating errors in a memory device
09/24/1991US5051995 Semiconductor memory device having a test mode setting circuit
09/24/1991US5051994 Computer memory module
09/24/1991US5051887 Maintaining duplex-paired storage devices during gap processing using of a dual copy function
09/19/1991WO1991014227A1 Field-programmable redundancy apparatus for memory arrays
09/18/1991EP0446534A2 Method of functionally testing cache tag rams in limited-access processor systems
09/18/1991EP0446449A2 Dual-port memory suited for self-test and method for testing the same
09/18/1991EP0446250A1 Control for a rotating media storage system
09/18/1991EP0208555B1 Semiconductor memory device having redundancy configuration
09/18/1991EP0146357B1 Semiconductor memory device
09/17/1991CA2033449A1 Method of functionally testing cache tag rams in limited-access processor systems
09/11/1991EP0446002A2 Wafer scale memory having improved multi-bit accessing and system having the wafer scale memory
09/11/1991CN2084642U Non-volatile read only memory detecting device
09/10/1991US5048020 Electronic disk subsystem
09/10/1991US5048019 Method of testing a read-only memory and device for performing the method
09/10/1991US5047983 Semiconductor storage device with redundancy arrangement
09/10/1991US5047770 Apparatus for testing data conversion/transfer functions in a vibratory energy imaging system
09/03/1991WO1991013394A1 Data corrections applicable to redundant arrays of independent disks
09/03/1991US5046180 Semiconductor integrated circuit device comprising non-reprogrammable internal memory device
09/03/1991US5046049 Method of flash write for testing a RAM
09/03/1991US5046048 Semiconductor integrated circuit including output buffer
09/03/1991US5046047 Circuit arrangement for verifying data stored in a random access memory
09/03/1991US5046046 Redundancy CAM using word line from memory
09/03/1991US5045720 Method for selecting a spare column and a circuit thereof
09/03/1991CA2076537A1 Data corrections applicable to redundant arrays of independent disks
08/1991
08/29/1991DE4025640A1 Semiconductor EEPROM with matrix of memory cells - has first writing word line, and second one coupled to different memory cell
08/28/1991EP0443981A1 Bismuth vanadate modified pigments in monoclinic crystalline form
08/28/1991EP0443070A1 Device for verifying the correct functioning of memory locations in a read-write-memory
08/27/1991US5043985 Integrated circuit testing arrangement
08/27/1991US5043940 Flash EEPROM memory systems having multistate storage cells
08/22/1991WO1991012706A1 Making and testing an integrated circuit using high density probe points
08/22/1991DE4105104A1 Halbleiterspeichereinrichtung und verfahren zur fehlerkorrektur Semiconductor memory device and method for error correction
08/22/1991DE4005321A1 Fault tolerant computer system - has working memories in redundant computers divided into high-cost, fail-safe regions and low-cost regions for active and inactive data
08/21/1991EP0442651A2 Apparatus and method for background memory test during system start up
08/21/1991EP0442616A2 Method for testing a computer memory location
08/21/1991EP0442531A2 Array disk apparatus
1 ... 277 278 279 280 281 282 283 284 285 286 287 288 289 290 291 292 293 294 295 296 297 ... 306