Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
03/1982
03/23/1982US4321667 Add-on programs with code verification and control
03/23/1982CA1120599A1 Paired least recently used block replacement algorithm
03/18/1982WO1982000917A1 Tape burn-in circuit
03/18/1982WO1982000896A1 Go/no go margin test circuit for semiconductor memory
03/18/1982WO1982000863A1 A coupling
03/16/1982US4320507 Field programmable device having test provisions for fault detection
03/10/1982EP0046976A2 Semi-conductor memory made of memory building blocks with redundant memory areas
03/09/1982US4319356 Self-correcting memory system
02/1982
02/24/1982EP0046215A2 Circuit for testing cells of an integrated semiconductor programmable memory
02/23/1982CA1118891A1 Fault tolerant bubble memory with redundancy using a stationary register in a single chip
02/18/1982WO1982000535A1 Memory security circuit
02/17/1982EP0045836A2 Data processing apparatus including a BSM validation facility
02/02/1982US4314349 Processing element for parallel array processors
01/1982
01/27/1982EP0044628A2 Redundancy scheme for an MOS memory
01/26/1982US4313199 Recirculating loop memory array fault locator
01/20/1982EP0043902A2 Memory array fault locator
01/13/1982EP0043415A1 Memory array tester
01/12/1982US4310901 Address mapping for memory
01/08/1982EP0031840A4 Memory system.
12/1981
12/29/1981US4308593 Interchangeable magnetic bubble memory
12/23/1981EP0041999A1 Self-correcting memory system and method
12/16/1981EP0041570A1 Redundant magnetic domain memory using parity
12/10/1981WO1981003567A1 Semiconductor memory for use in conjunction with error detection and correction circuit
12/01/1981CA1113608A1 Fault tolerant bubble memory with a single major loop having an integral stationary register
12/01/1981CA1113607A1 Fault tolerant system for bubble memories
11/1981
11/25/1981EP0040219A1 Data processor having common monitoring and memory loading and checking means.
11/17/1981US4301535 Programmable read only memory integrated circuit with bit-check and deprogramming modes and methods for programming and testing said circuit
11/17/1981US4301516 Bubble memory storage unit
11/10/1981US4300234 Address pattern generator for testing a memory
10/1981
10/27/1981CA1111557A1 Fault tolerant bubble memory with redundancy using a stationary register on a single chip
10/13/1981US4295182 Interconnection arrangements for testing microelectronic circuit chips on a wafer
10/06/1981US4293950 Test pattern generating apparatus
09/1981
09/22/1981US4291389 Memory system using faulty bubble memory devices
09/15/1981US4290117 Memory device with circulating storage loops
09/15/1981CA1109115A1 Copy reproduction machine with controller self check system
09/08/1981US4288865 Low-power battery backup circuit for semiconductor memory
08/1981
08/26/1981EP0034188A1 Error correction system
08/25/1981CA1107862A1 Self checking dynamic memory system
08/20/1981WO1981002360A1 Block redundancy for memory array
08/20/1981WO1981002359A1 Low-power battery backup circuit for semiconductor memory
08/20/1981WO1981002357A1 Backup power circuit for biasing bit lines of a static semiconductor memory
08/19/1981EP0034070A2 Fault tolerant memory system
08/11/1981CA1106972A2 Method and apparatus for storing parity encoded data from a plurality of input/output sources
08/05/1981EP0032957A1 Information processing system for error processing, and error processing method
07/1981
07/28/1981US4281398 Block redundancy for memory array
07/28/1981CA1106077A1 Mnos fet memory retention characterization test circuit
07/15/1981EP0032015A2 Field programmable device with test-bits
07/15/1981EP0031840A1 Memory system
07/09/1981WO1981001893A1 Self-correcting memory system and method
07/08/1981EP0031706A2 Apparatus and method for testing semiconductor memory devices
07/08/1981EP0031498A2 Digital data processing system including means for verifying data transferred from a non-volatile to a volatile store
07/08/1981EP0031386A1 Semiconductor memory device
07/08/1981EP0031380A1 Programmable read only memory integrated circuit with bit-check and deprogramming modes and methods for programming and testing said circuit.
07/01/1981EP0031143A2 Memory device
06/1981
06/26/1981EP0023514A4 Memory with redundant rows and columns.
06/25/1981WO1981001768A1 Redundant magnetic domain memory using party
06/23/1981US4275405 Semiconductor timing device with radioactive material at the floating gate electrode of an insulated-gate field-effect transistor
06/23/1981CA1103774A1 Redundant memory for point of sale system
06/17/1981EP0030245A1 Semiconductor memory device
06/02/1981US4271512 Information collection and storage system with memory test circuit
05/1981
05/27/1981EP0029322A1 Semiconductor memory device with redundancy
05/27/1981EP0029304A2 Bubble memory device
05/26/1981US4270188 Nonvolatile semiconductor memory apparatus
05/26/1981CA1102007A1 Duplicated memory system having status indication
05/19/1981US4268911 ROM Program security circuits
05/13/1981EP0028312A1 Method of employing in turn add-on read-only memory devices in a data processor with verification of their availability and validity
05/12/1981US4267583 Memory test device with write and pseudo write signals
05/05/1981US4266294 Copy reproduction machine with controller self check system
04/1981
04/30/1981WO1981001208A1 Data processor having common monitoring and memory loading and checking means
04/21/1981US4263669 Pattern generation system
04/14/1981US4262347 Electronic timepiece
03/1981
03/05/1981WO1981000641A1 Error correction system
03/03/1981US4254477 Reconfigurable memory circuit
02/1981
02/24/1981US4253059 EPROM Reliability test circuit
02/19/1981WO1981000481A1 Information processing system for error processing,and error processing method
02/11/1981EP0023821A2 Apparatus and method for checking a memory and a computer system including a memory and apparatus for checking the memory
02/11/1981EP0023798A2 An address buffer circuit
02/11/1981EP0023514A1 Memory with redundant rows and columns
02/10/1981US4250570 Redundant memory circuit
02/03/1981US4249173 Logic signals control system
01/1981
01/22/1981WO1981000161A1 Memory system
01/22/1981WO1981000154A1 Programmable read only memory integrated circuit with bitcheck and deprogramming modes and methods for programming and testing said circuit
01/20/1981CA1094224A2 Memory array
01/08/1981WO1981000027A1 Semiconductor memory device
01/07/1981EP0020999A1 Tester and method for measuring memory address access time using a data recirculating technique
01/06/1981US4244048 Chip and wafer configuration and testing method for large-scale-integrated circuits
01/06/1981US4243937 Microelectronic device and method for testing same
12/1980
12/24/1980WO1980002889A1 Semiconductor memory device
12/16/1980CA1091805A1 Fault tolerant magnetic bubble memory
12/10/1980EP0020263A1 Bubble memory testing machine and test method using such a machine
11/1980
11/26/1980EP0019150A1 Method of testing the operation of an internal refresh counter in a random access memory and circuit for the testing thereof
11/18/1980US4234935 Means for maintaining the identification of defective minor loops in a magnetic bubble memory
11/12/1980EP0018736A1 Self-testing microcomputer and method of testing
11/11/1980US4233674 Method of configuring an integrated circuit
11/11/1980US4233670 Fault transparent magnetic bubble memory
11/11/1980US4233669 Redundant bubble memory control system
11/11/1980US4233668 Method and apparatus for testing a magnetic bubble memory
11/04/1980US4232377 Memory preservation and verification system
11/04/1980CA1089104A1 Memory sparing arrangement
10/1980
10/29/1980EP0017808A1 Method involving testing an electrically alterable microelectronic memory circuit
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