Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
03/1984
03/28/1984EP0103654A1 Electrically programmable memory matrix
03/27/1984EP0040219A4 Data processor having common monitoring and memory loading and checking means.
03/07/1984EP0102296A1 Process for manufacturing a matrix of electronic components
03/06/1984US4435754 Method of selecting PROM data for selective mapping system
03/06/1984CA1163374A1 Block redundancy for memory array
02/1984
02/22/1984EP0101107A2 Method of testing a semiconductor memory array
02/21/1984CA1162648A1 Low-power battery backup circuit for semiconductor memory
02/16/1984WO1984000628A1 Management of defects in storage media
02/15/1984EP0100339A1 A circuit for applying a high voltage signal to a fusible link
02/08/1984EP0099910A1 Semiconductor memory utilizing redundant circuitry.
02/07/1984US4430735 Apparatus and technique for testing IC memories
02/07/1984US4430727 Storage element reconfiguration
02/01/1984EP0099473A2 Integrated combined dynamic RAM and ROS
01/1984
01/31/1984US4429389 Test pattern address generator
01/31/1984US4429388 Field programmable device with internal dynamic test circuit
01/24/1984US4428068 IC with built-in electrical quality control flag
01/19/1984WO1984000225A1 Method for scrambling digital information and device for implementing such method
01/18/1984EP0098755A2 Programmable address buffer for partial circuits
01/17/1984US4426688 Memory system having an alternate memory
01/11/1984EP0098079A2 Semiconductor memory device with redundancy decoder circuit
01/10/1984CA1160342A1 Redundancy scheme for a dynamic ram
01/04/1984EP0097621A1 Method for disguising digital information, and device for performing the same
01/04/1984EP0097159A1 Two bit per symbol sec/ded code.
01/04/1984EP0097148A1 Improvements in or relating to wafer scale integrated circuits.
01/04/1984EP0097146A1 Improvements in or relating to wafer-scale integrated circuits.
12/1983
12/28/1983EP0096783A2 Method for storing data words in fault tolerant memory to recover uncorrectable errors
12/28/1983EP0096782A2 Online realignment of memory faults
12/28/1983EP0096781A2 System for updating error map of fault tolerant memory
12/28/1983EP0096780A2 A fault alignment exclusion method to prevent realignment of previously paired memory defects
12/28/1983EP0096779A2 Multi-bit error scattering arrangement to provide fault tolerant semiconductor memory
12/27/1983US4423492 Semiconductor memory device
12/21/1983EP0096369A2 Memory building block
12/21/1983EP0096030A1 Apparatus for high speed fault mapping of large memories.
12/21/1983EP0096027A1 Branched labyrinth wafer scale integrated circuit.
12/20/1983US4422161 Memory array with redundant elements
12/13/1983US4420807 Selectively holding data in a buffer for defective backing store tracks
12/07/1983EP0095721A2 Semiconductor memory device
12/07/1983EP0095669A2 Automatically reconfigurable memory system and method therefor
11/1983
11/30/1983EP0095028A2 Fault alignment control system and circuits
11/29/1983US4418403 Semiconductor memory cell margin test circuit
11/24/1983WO1983004109A1 Pad for accelerated memory test
11/23/1983EP0094645A2 Fault-tolerant circuitry for semiconductor memory
11/22/1983US4417154 Circuit for applying a high voltage signal to a fusible link
11/09/1983EP0031380A4 Programmable read only memory integrated circuit with bit-check and deprogramming modes and methods for programming and testing said circuit.
11/08/1983US4414665 Semiconductor memory device test apparatus
11/08/1983US4414664 Wait circuitry for interfacing between field maintenance processor and device specific adaptor circuit
11/01/1983US4413327 Radiation circumvention technique
10/1983
10/26/1983EP0092245A2 Functional command for semiconductor memory
10/25/1983US4412327 Test circuit for checking memory output state continuously during time window
10/11/1983US4409676 Method and means for diagnostic testing of CCD memories
10/11/1983US4409675 Address gate for memories to protect stored data, and to simplify memory testing, and method of use thereof
10/11/1983CA1155233A1 Redundant memory arrangement providing simultaneous access
10/05/1983EP0090638A2 Cache memory systems
10/05/1983EP0090332A2 Semiconductor memory device
10/05/1983EP0090331A2 Semiconductor memory device
10/05/1983EP0090219A2 Memory system restructured by deterministic permutation algorithm
10/05/1983EP0090175A2 Memory system
10/05/1983EP0090002A1 Memory with permanent array division capability
10/04/1983US4408305 Memory with permanent array division capability
09/1983
09/28/1983EP0089891A2 Identification of repaired integrated circuits
09/28/1983EP0089397A1 Integrated memory matrix with programmable non volatile cells
09/21/1983EP0088815A1 Electrically erasable memory matrix (EEPROM)
09/20/1983US4406013 Multiple bit output dynamic random-access memory
09/20/1983CA1154168A1 Processing element for parallel array processors
09/14/1983EP0088202A2 Memory address sequence generator
09/13/1983US4404647 Dynamic array error recovery
09/13/1983US4404635 Programmable integrated circuit and method of testing the circuit before it is programmed
09/13/1983US4404519 Testing embedded arrays in large scale integrated circuits
09/07/1983EP0087610A2 Random access memory arrangement with a word redundancy scheme
08/1983
08/31/1983EP0086905A1 Memory system with an integrated matrix of non-volatile reprogrammable memory cells
08/30/1983US4402081 Semiconductor memory test pattern generating apparatus
08/24/1983EP0086361A2 Device and method for the functional testing of an electrical word-programmable memory
08/24/1983EP0086310A1 Semiconductor integrated circuit device with test circuit
08/23/1983US4400809 Arbitrary drive for magnetic field waveform control
08/23/1983US4400772 Method and apparatus for direct memory access in a data processing system
08/23/1983US4400661 Voltage regulation and battery dissipation limiter circuit
08/18/1983WO1983002861A1 A circuit for applying a high voltage signal to a fusible link
08/18/1983WO1983002847A1 Semiconductor memory utilizing redundant circuitry
08/16/1983US4399372 Integrated circuit having spare parts activated by a high-to-low adjustable resistance device
08/10/1983EP0085386A2 Semiconductor device with spare memory cells
08/09/1983US4398248 Adaptive WSI/MNOS solid state memory system
08/02/1983CA1151294A1 Memory with redundant rows and columns
07/1983
07/27/1983EP0084460A2 Improvements in and relating to computer memory control systems
07/19/1983US4394763 Error-correcting system
07/19/1983US4394750 Prom erase detector
07/12/1983US4393475 Non-volatile semiconductor memory and the testing method for the same
07/12/1983US4393474 EPROM and RAM cell layout with equal pitch for use in fault tolerant memory device or the like
07/07/1983WO1983002378A1 Sync suppression scrambling of television signals for subscription tv
07/07/1983WO1983002357A1 Improvements in or relating to wafer scale integrated circuits
07/07/1983WO1983002345A1 Two bit per symbol sec/ded code
07/06/1983EP0083230A1 Method for controlling read-out or write in of semiconductor memory device and apparatus for the same
07/06/1983EP0083212A2 Semiconductor memory device
07/06/1983EP0083031A2 Semiconductor memory device having a programming circuit
07/06/1983EP0082981A2 Memory system with selective assignment of spare locations
07/05/1983US4392211 Semiconductor memory device technical field
07/05/1983US4392201 Diagnostic subsystem for a cache memory
06/1983
06/23/1983WO1983002193A1 Improvements in or relating to wafer-scale integrated circuits
06/23/1983WO1983002164A1 Apparatus for high speed fault mapping of large memories
06/23/1983WO1983002163A1 Branched labyrinth wafer scale integrated circuit
06/21/1983US4389715 Redundancy scheme for a dynamic RAM
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