| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 03/24/1993 | EP0533608A2 Method and apparatus for ensuring the recoverability of vital data in a data processing system |
| 03/24/1993 | EP0533375A2 Computer system having memory testing means |
| 03/23/1993 | US5197070 Scan register and testing circuit using the same |
| 03/23/1993 | US5197031 Method for writing data in testing memory device and circuit for testing memory device |
| 03/23/1993 | US5197030 Semiconductor memory device having redundant memory cells |
| 03/23/1993 | CA1314988C Memory device and method implementing wordline redundancy without an access time penalty |
| 03/18/1993 | WO1993005512A1 Semiconductor storage device |
| 03/17/1993 | EP0532356A2 Method of recording data and information regarding defects |
| 03/17/1993 | EP0532087A2 Process for checking the memories of a programmed micro-computer, by means of a micro-programme incorporated in the micro-computer itself |
| 03/16/1993 | US5195096 Method of functionally testing cache tag RAMs in limited-access processor systems |
| 03/16/1993 | US5195057 Semiconductor memory device having a redundant memory which can be selectively placed in a not-in-use status |
| 03/10/1993 | EP0530835A1 Testing circuit provided in digital logic circuits |
| 03/10/1993 | EP0530714A2 Semiconducteur integrated circuit device allowing change of product specification and chip screening method therewith |
| 03/10/1993 | EP0530554A2 Scrubbing and sparing in a memory system |
| 03/10/1993 | EP0530376A1 Semiconductor memory having nonvolatile semiconductor memory cell |
| 03/10/1993 | CN1069821A 半导体存储器件应力状态的自动测试设备 Automatic Test Equipment semiconductor memory device stress state |
| 03/09/1993 | US5193175 Fault-tolerant computer with three independently clocked processors asynchronously executing identical code that are synchronized upon each voted access to two memory modules |
| 03/03/1993 | EP0529945A2 Method and apparatus for programmable memory control with error regulation and test functions |
| 03/03/1993 | EP0529330A2 System with laser link decoder for DRAM redundancy scheme |
| 03/03/1993 | EP0184737B1 Semiconductor memory device having error detection/correction function |
| 02/25/1993 | DE4226047A1 Eine interne spannungsversorgung erzeugender schaltkreis An internal power supply generating circuit |
| 02/25/1993 | DE4201516A1 Vorrichtung zum automatischen testen eines beanspruchungsbetriebes einer halbleiterspeichervorrichtung An apparatus for automatically testing a stress-operation of a semiconductor memory device |
| 02/24/1993 | EP0528744A2 Latch assisted fuse testing for customized integrated circuits |
| 02/24/1993 | EP0528280A1 Memory card apparatus |
| 02/24/1993 | EP0528234A2 Data processing system for generating data bits based on stored data |
| 02/16/1993 | US5187685 Complementary MISFET voltage generating circuit for a semiconductor memory |
| 02/09/1993 | US5185884 Computer controlled optimized pairing of disk units |
| 02/09/1993 | US5185744 Semiconductor memory device with test circuit |
| 02/09/1993 | US5185722 Semiconductor memory device having a memory test circuit |
| 02/09/1993 | US5185720 Memory module for use in a large reconfigurable memory |
| 02/03/1993 | EP0525941A2 Method of self-diagnosing a mobile telephone set for use in a mobile telephone switching system and mobile telephone set being applied to the method |
| 02/03/1993 | EP0525771A2 Data processing device comprising a multiport RAM as a sequential circuit |
| 02/03/1993 | EP0525680A2 Data latch circuit having non-volatile memory cell |
| 02/03/1993 | EP0525068A1 Integrated circuit i/o using a high preformance bus interface |
| 02/02/1993 | US5184327 Semiconductor memory device having on-chip test circuit and method for testing the same |
| 02/02/1993 | US5184326 Integrated semiconductor memory of the dram type and method for testing the same |
| 02/02/1993 | US5184067 Signature compression circuit |
| 01/28/1993 | DE4132298A1 Halbleiterspeicher-redundanz A semiconductor memory redundancy |
| 01/21/1993 | WO1992015931A3 Redundant shift registers for scanning devices |
| 01/21/1993 | DE4223273A1 Mask programmable ROM with error correction circuit - uses parity data to correct bit errors in data read=out via selected word lines |
| 01/21/1993 | DE4223127A1 Test state switching on circuit for memory testing - has level detector, Schmitt trigger, flip=flop and latch, and switches output between reference and operating voltage |
| 01/21/1993 | DE4216211A1 Redundancy circuit for semiconductor memory - has reference voltage circuit coupled to reserve signal reference line and HV circuits for FLOTOX transistors |
| 01/20/1993 | EP0523996A1 Integrated circuit memory device with redundant rows |
| 01/20/1993 | EP0523973A2 A configurable self-test for embedded RAMs |
| 01/20/1993 | EP0523793A1 Iron with detector for nature of textile |
| 01/20/1993 | EP0523760A2 Serial accessed semiconductor memory |
| 01/20/1993 | EP0523759A2 Serial accessed semiconductor memory |
| 01/19/1993 | US5181205 Short circuit detector circuit for memory arrays |
| 01/14/1993 | DE4220196A1 Error correction system for semiconductor memory - uses syndrome signal to provide correction signal for each stored data group |
| 01/14/1993 | DE4129275C1 Function testing memory in dependence on zone addresses - comparing contents of each zone with assigned stipulated data word |
| 01/13/1993 | EP0305987B1 Self-correcting semiconductor memory device and microcomputer incorporating the same |
| 01/12/1993 | US5179537 Semiconductor memory device having monitoring function |
| 01/12/1993 | US5179536 Semiconductor memory device having means for replacing defective memory cells |
| 01/12/1993 | US5179534 Method and apparatus for setting desired logic state at internal point of a select storage element |
| 01/05/1993 | US5177745 Memory device with a test mode |
| 01/05/1993 | US5177744 Method and apparatus for error recovery in arrays |
| 01/05/1993 | US5177573 Semiconductor integrated circuit device |
| 12/30/1992 | EP0520696A2 Semiconductor memory/integrated circuit device with discriminator for diagnostic mode of operation |
| 12/30/1992 | EP0520449A2 Semiconductor memory device |
| 12/30/1992 | EP0520356A1 Semiconductor integrated circuit equipped with diagnostic circuit |
| 12/30/1992 | EP0462876B1 Circuit for testing electrically programmable memory cells |
| 12/29/1992 | US5175839 Storage control system in a computer system for double-writing |
| 12/23/1992 | WO1992022865A1 Phantom duplex copy group apparatus for a disk drive array data storage subsystem |
| 12/23/1992 | EP0519669A2 Encoding and rebuilding data for a DASD array |
| 12/23/1992 | EP0519584A2 Semiconductor memory |
| 12/22/1992 | US5173906 Built-in self test for integrated circuits |
| 12/16/1992 | EP0518603A2 Distributed sparing in DASD arrays |
| 12/16/1992 | EP0517823A1 Data corrections applicable to redundant arrays of independent disks |
| 12/15/1992 | US5172339 Semiconductor memory device having error checking and correcting circuit and operating method therefor |
| 12/09/1992 | EP0517354A2 Semiconductor memory circuit having a test logic circuit structure |
| 12/09/1992 | EP0281740B1 Memories and the testing thereof |
| 12/08/1992 | US5170484 Massively parallel array processing system |
| 12/08/1992 | US5170398 Pattern generating apparatus for memory having a logical operation function |
| 12/02/1992 | EP0516364A2 Semiconductor memory device having burn-in test circuit |
| 12/02/1992 | EP0515577A1 Making and testing an integrated circuit using high density probe points |
| 12/02/1992 | EP0215485B1 Semiconductor memory device |
| 12/01/1992 | US5168501 Method for checking hardware errors |
| 12/01/1992 | US5168468 Semiconductor memory device with column redundancy |
| 12/01/1992 | US5168465 Highly compact EPROM and flash EEPROM devices |
| 12/01/1992 | US5168216 System for testing high-speed digital circuits |
| 11/26/1992 | DE4124572A1 Halbleiterspeichervorrichtung mit redundanz A semiconductor memory device with redundancy |
| 11/26/1992 | DE4121974A1 Hard disc drive controller for personal computer - has access time reduced using transputer based control processor operating with multiple parallel channels |
| 11/25/1992 | EP0514664A2 Dynamic random access memory with a redundancy decoder |
| 11/25/1992 | CN1019243B Method for writing data in testing memory device and circuit for testing memory device |
| 11/25/1992 | CN1019238B Method for mode conversion of dual-port memory device |
| 11/24/1992 | US5167032 Protecting a computer system against inaccessible data |
| 11/24/1992 | US5166608 Arrangement for high speed testing of field-effect transistors and memory cells employing the same |
| 11/24/1992 | CA1310761C Memory readback check apparatus |
| 11/19/1992 | EP0514164A2 Efficiency improved DRAM row redundancy circuit |
| 11/19/1992 | EP0513665A1 Semiconductor memory device having precharge control circuit for prohibiting digit line pair from precharging after replacement with redundant digit line pair |
| 11/19/1992 | EP0513607A2 Method and apparatus for testing an NVM |
| 11/17/1992 | US5165066 Contact chain structure for troubleshooting eprom memory circuits |
| 11/17/1992 | US5165029 Cache memory with test function |
| 11/17/1992 | US5164918 Integrated circuit |
| 11/12/1992 | WO1992020068A1 Fast memory system employing mostly good memories |
| 11/10/1992 | US5163168 Pulse signal generator and redundancy selection signal generator |
| 11/10/1992 | US5163023 Memory circuit capable of replacing a faulty column with a spare column |
| 11/05/1992 | DE4213574A1 ROM with optional predetermined outputs - has address recognition circuits enabling predetermined logic levels to be applied to output lines |
| 11/04/1992 | EP0511560A2 Low voltage programmable storage element |
| 11/03/1992 | US5161159 Semiconductor memory with multiple clocking for test mode entry |