Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
10/1993
10/12/1993US5253354 Row address generator for defective DRAMS including an upper and lower memory device
10/12/1993US5253328 Neural-network content-addressable memory
10/12/1993US5253256 Array disk apparatus with unsuccessful reconstruction indicating function
10/12/1993US5253209 Integrated semiconductor memory
10/12/1993US5253208 Identification circuit for indicating redundant row or column substitution
10/12/1993US5253206 Electrically erasable programmable read-only memory with threshold value measurement circuit
10/12/1993US5252507 Very high density wafer scale device architecture
10/07/1993DE4302223A1 Semiconductor flash EPROM used as one-time programmable ROM if cells excessively erased - has information memory indicating if cell has been classified as over-erased by energy beam or not during testing
10/07/1993DE4242810A1 Elektrisch löschbares und programmierbares "Read Only Memory" mit einem Fehlerprüf- und Korrektur-Schaltkreis Electrically erasable and programmable "Read Only Memory" with error checking and correction circuit
10/06/1993EP0564280A2 Circuit for generating an internal source voltage
10/06/1993EP0195445B1 Semiconductor memory device with an error correction function
10/06/1993CN1077049A Electrically erasable and programmable read only memory with an error check and correction circuit
10/06/1993CN1077048A Circuit for generating an internal source voltage
10/05/1993US5251174 Memory system
09/1993
09/29/1993EP0562604A2 Semiconductor first-in first-out memory device
09/29/1993EP0562548A2 Semiconductor memory device redundancy
09/29/1993EP0561765A1 Novel method of making, testing and test device for integrated circuits
09/28/1993US5249288 Process for accommodating bad disk pages in an electronic printing system
09/28/1993US5249281 Testable ram architecture in a microprocessor having embedded cache memory
09/23/1993DE4234155A1 Zeilenredundanzschaltung fuer eine halbleiterspeichervorrichtung Row redundancy circuit for a semiconductor memory device
09/22/1993EP0561131A2 Module level electronic redundancy
09/21/1993US5247645 Dynamic memory mapper which supports interleaving across 2N +1, 2.sup.NN -1 number of banks for reducing contention during nonunit stride accesses
09/21/1993US5247481 Memory integrated circuit with redundancy and improved addressing in test mode
09/21/1993US5247476 Semiconductor memory device having a mask rom and a prom
09/21/1993CA1322421C Storage control system in a computer system
09/16/1993WO1993018589A1 Data recovery after error correction failure
09/16/1993WO1993018457A1 Transparent testing of integrated circuits
09/15/1993CN1076300A Row redundancy circuit for a semiconductor memory device
09/14/1993US5245579 Semiconductor memory device
09/14/1993US5245577 Integrated circuit two-cycle test mode activation circuit
09/14/1993US5245576 Dynamic memory row/column redundancy scheme
09/08/1993EP0559487A2 Handling data in a system having a processor for controlling access to a plurality of data storage disks
09/08/1993EP0559468A2 Information recording method and apparatus
09/08/1993EP0559368A2 Memory column redundancy and localized column redundancy control signals
09/07/1993US5243703 Apparatus for synchronously generating clock signals in a data processing system
09/07/1993US5243698 Microcomputer
09/07/1993US5243570 Semiconductor memory device having redundant memory cell columns concurrently accessible together with regular memory cell arrays
09/07/1993US5243569 Differential cell-type eprom incorporating stress test circuit
09/07/1993CA2089834A1 High availability disk arrays
09/01/1993EP0558231A2 Device for testing a plurality of functional blocks in a semiconductor integrated circuit
09/01/1993EP0557813A1 System of digital-speech-memory for a telecommunication system
09/01/1993CN1021998C Semiconductor memory device
08/1993
08/31/1993US5241501 Semiconductor memory device for detecting defective memory cells in a short time
08/31/1993US5241500 Method for setting test voltages in a flash write mode
08/31/1993US5241227 Active high band weighting circuit of noise reduction circuit
08/31/1993US5239747 Method of forming integrated circuit devices
08/25/1993EP0557079A2 Discretionary lithography for integrated circuits
08/24/1993US5239659 Phantom duplex copy group apparatus for a disk drive array data storge subsystem
08/24/1993US5239656 Semiconductor memory device for self-correcting data output errors by taking the logical product of first and second identical data outputs
08/24/1993US5239641 Method and apparatus for synchronizing a plurality of processors
08/24/1993US5239637 Digital data management system for maintaining consistency of data in a shadow set
08/24/1993US5239511 Low power redundancy circuit for a memory device
08/24/1993US5239509 Semiconductor memory device
08/24/1993US5239207 Semiconductor integrated circuit
08/19/1993WO1993016394A1 Stepper scanner discretionary lithography and common mask discretionary lithography for integrated circuits
08/18/1993EP0555307A1 A fault tolerant data storage system.
08/17/1993US5237537 Fast compare circuit particularly for memory with redundant addressing components
08/17/1993US5237535 Method of repairing overerased cells in a flash memory
08/17/1993US5237530 Frasable non-volatile semiconductor memory device having read/write test function
08/17/1993US5237466 Method and apparatus for programmably controlling spindle synchronization and phase among disk drives in a storage subsystem
08/11/1993EP0554901A2 A semiconductor memory device
08/11/1993EP0554453A1 Semiconductor storage device
08/11/1993EP0515577A4 Making and testing an integrated circuit using high density probe points
08/10/1993US5235687 Method for replacing memory modules in a data processing system, and data processing system for performing the method
08/10/1993US5235550 Method for maintaining optimum biasing voltage and standby current levels in a DRAM array having repaired row-to-column shorts
08/10/1993US5235549 Semiconductor device with apparatus for performing electrical tests on single memory cells
08/10/1993US5235548 Memory with power supply intercept in redundancy logic
08/05/1993WO1993015462A1 Memory tester
08/04/1993EP0554055A2 A semiconductor memory with improved redundant sense amplifier control
08/04/1993EP0554054A2 Column redundancy architecture for a read/write memory
08/04/1993EP0554053A2 A semiconductor memory with a multiplexer for selecting an output for a redundant memory access
08/04/1993EP0554052A2 Redundancy decoder
08/04/1993EP0553788A2 Semiconductor memory device incorporating redundancy memory cells having parallel test function
08/03/1993USH1221 High speed, small diameter disk storage system
08/03/1993US5233618 Data correcting applicable to redundant arrays of independent disks
08/03/1993US5233614 Fault mapping apparatus for memory
08/03/1993US5233610 Semiconductor memory device having error correcting function
08/03/1993US5233566 Address detector of a redundancy memory cell
08/03/1993US5233564 Multiport memory with test signal generating circuit controlling data transfer from ram port to sam port
08/03/1993US5233562 Methods of repairing field-effect memory cells in an electrically erasable and electrically programmable memory device
08/03/1993US5233559 Row redundancy for flash memories
07/1993
07/27/1993US5231605 DRAM compressed data test mode with expected data
07/27/1993US5231604 Semiconductor memory device having column redundancy system
07/27/1993US5231592 Counter
07/21/1993EP0551718A2 System and method for ensuring write data integrity in a redundant array data storage system
07/20/1993US5230079 Massively parallel array processing system with processors selectively accessing memory module locations using address in microword or in address register
07/15/1993DE4200667A1 Read-write buffer with integrated test circuitry - compares register contents of two feedback shift registers after writing of data to specific address, and after reading of buffer
07/14/1993EP0551009A2 Method for synchronizing reserved areas in a redundant storage array
07/14/1993EP0550853A2 Array of disk drives with redundant channels
07/14/1993EP0287303B1 Scan test apparatus for digital systems having dynamic random access memory
07/13/1993US5228132 Memory module arranged for data and parity bits
07/13/1993US5228000 Test circuit of semiconductor memory device
07/13/1993US5227999 Semiconductor memory device capable of replacing faulty bit lines with redundant bit lines
07/13/1993US5227997 Semiconductor circuit device having multiplex selection functions
07/07/1993EP0550358A2 Fault tolerant multiprocessor cluster
07/06/1993US5226015 Semiconductor memory system
07/06/1993US5225771 Making and testing an integrated circuit using high density probe points
06/1993
06/30/1993EP0549374A2 Nonvolatile semiconductor memory
06/30/1993EP0549193A2 Nonvolatile semiconductor memory device with redundancy
06/30/1993EP0548866A2 Non-volatile semiconductor memory device
1 ... 271 272 273 274 275 276 277 278 279 280 281 282 283 284 285 286 287 288 289 290 291 ... 306