| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 09/02/1994 | CA2113863A1 Method and apparatus for detecting retention faults in memories |
| 09/01/1994 | WO1994019743A1 Intermediate processor disposed between a host processor channel and a storage director with error management |
| 09/01/1994 | DE4305442A1 Device for testing an electronic device |
| 08/31/1994 | EP0613071A2 Semiconductor integrated circuit device having low power consumption voltage monitoring circuit for built-in step-down voltage generator |
| 08/31/1994 | EP0268289B1 Semiconductor memory device |
| 08/30/1994 | US5343439 Memory apparatus |
| 08/30/1994 | US5343434 Nonvolatile semiconductor memory device and manufacturing method and testing method thereof |
| 08/30/1994 | US5343431 Semiconductor memory apparatus, test apparatus therefor and method for relieving semiconductor memory apparatus from short circuit |
| 08/30/1994 | US5343430 Method and circuitry for screening a dynamic memory device for defective circuits |
| 08/30/1994 | US5343429 Semiconductor memory device having redundant circuit and method of testing to see whether or not redundant circuit is used therein |
| 08/30/1994 | US5343426 Data formater/converter for use with solid-state disk memory using storage devices with defects |
| 08/30/1994 | US5343082 Address transition detection circuit |
| 08/24/1994 | EP0612074A1 Column redundancy device for a memory |
| 08/24/1994 | EP0612071A2 Information reproducing method |
| 08/24/1994 | EP0195412B1 Integrated circuit with built-in indicator of internal repair |
| 08/23/1994 | US5341382 Method and apparatus for improving fault coverage of system logic of an integrated circuit with embedded memory arrays |
| 08/23/1994 | US5341336 Method for stress testing decoders and periphery circuits |
| 08/18/1994 | WO1994018622A1 Fault tolerant memory system |
| 08/18/1994 | CA2144980A1 Fault tolerant memory system |
| 08/17/1994 | EP0610862A2 Dynamic random access memory device with self-refresh cycle time directly measurable at data pin |
| 08/17/1994 | EP0188431B2 Gate-array with bidirectional symmetry |
| 08/16/1994 | US5339407 Recovery of cached data from a malfunctioning CPU |
| 08/16/1994 | US5339277 Address buffer |
| 08/16/1994 | US5339273 Semiconductor memory device having a testing function and method of testing the same |
| 08/16/1994 | US5339271 Semiconductor memory circuit |
| 08/10/1994 | EP0544568B1 Reading circuit for redundancy fuse for integrated memory |
| 08/09/1994 | US5337318 Memory IC testing apparatus with redundancy circuit |
| 08/09/1994 | US5337317 Minimizing the programming time in a semiconductor integrated memory circuit having an error correction function |
| 08/09/1994 | US5337286 Semiconductor memory device |
| 08/09/1994 | US5337282 Dynamic random access memory device with refreshing system powered with external power source in trimming stage instead of built-in step-down circuit |
| 08/09/1994 | US5337279 Screening processes for ferroelectric memory devices |
| 08/09/1994 | US5337278 Low-power decoder for selecting redundant memory cells |
| 08/09/1994 | US5337277 Row redundancy circuit for a semiconductor memory device |
| 08/09/1994 | US5337272 Circuit for applying selected voltages to dynamic random access memory |
| 08/02/1994 | US5335202 Verifying dynamic memory refresh |
| 08/02/1994 | US5335198 Flash EEPROM array with high endurance |
| 08/02/1994 | US5334880 Low voltage programmable storage element |
| 07/27/1994 | EP0607780A2 Flash EEPROM having redundant memory cell array |
| 07/27/1994 | CN1090071A Computer controlled optimized pairing of disk units |
| 07/26/1994 | US5333292 Microcomputer for selectively accessing non-volatile memory and other storage unit in response to allocated address inputs |
| 07/26/1994 | US5333289 In a computer system |
| 07/26/1994 | US5333277 Data buss interface and expansion system |
| 07/21/1994 | DE4401346A1 System zum Verteilen von Abtast-und-Halte-Signalen A system for distributing sample-and-hold signals |
| 07/21/1994 | DE4244275C1 Nachprüfung der Datenintegrität bei gepufferter Datenübertragung Verification of data integrity buffered data transfer |
| 07/20/1994 | EP0606805A1 Test method for integrated circuit devices and related integrated device |
| 07/20/1994 | EP0606796A1 Method of uniformly programming an electrically programmable memory and memory using the method |
| 07/20/1994 | EP0606793A1 Method for repairing defective elements in a redundant memory |
| 07/20/1994 | CN1089747A Semiconductor memory device having improved redundancy efficiency |
| 07/19/1994 | US5331644 Decoder checking circuits suitable for semiconductor memories |
| 07/19/1994 | US5331596 Address multiplexed dynamic RAM having a test mode capability |
| 07/19/1994 | US5331594 Semiconductor memory device having word line and bit line test circuits |
| 07/19/1994 | US5331515 Module with leads from multiple chips shorted together only at edge contact locations |
| 07/12/1994 | US5329488 Nonvolatile semiconductor memory device with redundancy circuit |
| 07/12/1994 | US5329228 Test chip for semiconductor fault analysis |
| 07/12/1994 | CA2009529C Servicing interrupt requests in a data processing system without using the services of an operating system |
| 07/07/1994 | WO1994015290A1 Data integrity check in buffered data transmission |
| 07/05/1994 | US5327548 Apparatus and method for steering spare bit in a multiple processor system having a global/local memory architecture |
| 07/05/1994 | US5327531 Data processing system including corrupt flash ROM recovery |
| 07/05/1994 | US5327388 Semiconductor memory device |
| 07/05/1994 | US5327383 Method and circuitry for erasing a nonvolatile semiconductor memory incorporating row redundancy |
| 07/05/1994 | US5327382 Method of testing redundant memory cells |
| 07/05/1994 | US5327381 Redundancy selection apparatus and method for an array |
| 07/05/1994 | US5327380 Method and apparatus for inhibiting a predecoder when selecting a redundant row line |
| 07/05/1994 | US5327363 Pattern memory circuit for integrated circuit testing apparatus |
| 06/29/1994 | CN1025261C Semiconductor integrated circuit chip having identification circuit therein |
| 06/28/1994 | US5325367 Memory device containing a static ram memory that is adapted for executing a self-test, and integrated circuit containing such a device as an embedded static ram memory |
| 06/28/1994 | US5325365 In a memory emulation test apparatus, a method of and system for fast functional testing of memories in microprocessor-based units |
| 06/28/1994 | US5325363 Fault tolerant power supply for an array of storage devices |
| 06/28/1994 | US5325334 Column redundancy circuit for a semiconductor memory device |
| 06/28/1994 | US5325333 Semiconductor memory device |
| 06/28/1994 | US5325332 Dual port semiconductor memory device |
| 06/28/1994 | US5325053 Apparatus for testing timing parameters of high speed integrated circuit devices |
| 06/22/1994 | EP0602798A2 Structure for using a portion of an integrated circuit die |
| 06/22/1994 | EP0602276A1 Programmable address decoder |
| 06/21/1994 | US5323353 Method and apparatus for repair of memory by redundancy |
| 06/21/1994 | US5323351 Method and apparatus for programming electrical erasable programmable read-only memory arrays |
| 06/21/1994 | US5323348 Semiconductor memory device having multiple memory arrays and including redundancy circuit for repairing a faulty bit |
| 06/15/1994 | EP0601650A1 Repairable matrix display |
| 06/15/1994 | EP0601649A1 Repairable redundantly-driven matrix display |
| 06/15/1994 | EP0601441A2 Information recording and/or reproducing apparatus |
| 06/15/1994 | EP0601392A2 Method of testing the crosstalk behaviour of digital memories |
| 06/15/1994 | CN1025077C Method for multi-bit parallel test in semiconductor memory device |
| 06/14/1994 | US5321826 Disk control system in which spare disk and master disks are dynamically exchanged |
| 06/14/1994 | US5321703 Data recovery after error correction failure |
| 06/14/1994 | US5321699 Electrically erasable and programmable non-volatile memory system with write-verify controller using two reference levels |
| 06/14/1994 | US5321697 Solid state storage device |
| 06/14/1994 | US5321661 Self-refreshing memory with on-chip timer test circuit |
| 06/14/1994 | US5321655 Semiconductor memory device |
| 06/14/1994 | US5321653 Circuit for generating an internal source voltage |
| 06/09/1994 | DE4341692A1 Halbleiter-Speichervorrichtung mit verbesserter Redundanz Effizienz A semiconductor memory device having improved redundancy efficiency |
| 06/08/1994 | EP0600817A2 Dual-port array with storage redundancy |
| 06/08/1994 | EP0600729A1 Data storage arrangement |
| 06/08/1994 | EP0600655A2 Integrated circuit test arrangement and method |
| 06/08/1994 | EP0600527A1 Stress mode circuit for an integrated circuit with on-chip voltage down converter |
| 06/08/1994 | EP0600160A2 Semiconductor memory device with a test mode |
| 06/08/1994 | EP0600151A2 Nonvolatile semiconductor memory device having electrically and collectively erasable characteristics |
| 06/07/1994 | US5319755 Integrated circuit I/O using high performance bus interface |
| 06/07/1994 | US5319599 Redundancy circuit for semiconductor memory device |
| 06/07/1994 | US5319592 Fuse-programming circuit |
| 06/07/1994 | US5319589 Dynamic content addressable memory device and a method of operating thereof |