Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
11/1994
11/08/1994US5363502 Hot stand-by method and computer system for implementing hot stand-by method
11/08/1994US5363382 Fault analysis apparatus for memories having redundancy circuits
11/08/1994US5363333 Dynamic random access memory device having power supply system appropriately biasing switching transistors and storage capacitors in burn-in testing process
11/08/1994US5363331 Semiconductor memory with column line control circuits for protection against broken column lines
11/02/1994EP0622809A1 Method for stress testing decoders and periphery circuits in memory arrays
11/02/1994EP0622803A2 Address buffer
11/02/1994EP0622636A1 Method for improving accuracy tester auto-calibration
11/01/1994US5361232 CMOS static RAM testability
11/01/1994US5361231 Dynamic random access memory device with redundant word lines shared between memory cell arrays
11/01/1994US5361230 Memory device delaying timing of outputting data in a test mode as compared with a normal operating mode
11/01/1994US5361227 Non-volatile semiconductor memory device and memory system using the same
11/01/1994US5361033 On chip bi-stable power-spike detection circuit
10/1994
10/27/1994WO1994024674A1 Semiconductor memory tester
10/26/1994EP0621537A2 Structure to recover a portion of a partially functional embedded memory
10/25/1994US5359722 Method for shortening memory fetch time relative to memory store time and controlling recovery in a DRAM
10/25/1994US5359570 Solid state peripheral storage device
10/25/1994US5359569 Semiconductor memory
10/25/1994US5359563 Memory system with adaptable redundancy
10/25/1994US5359561 Semiconductor memory device
10/25/1994US5359560 Semiconductor memory device having improved redundancy efficiency
10/25/1994US5359559 Semiconductor memory device having redundant memory cells
10/25/1994US5359557 Dual-port array with storage redundancy having a cross-write operation
10/19/1994EP0620557A2 Memory defect detection arrangement
10/19/1994EP0620556A2 Semiconductor memory device having register for holding test resultant signal
10/19/1994EP0620524A2 Improvements in or relating to memories and their manufacture
10/18/1994US5357621 Serial architecture for memory module control
10/18/1994US5357607 File storage process for electronic printing systems having multiple disks
10/18/1994US5357530 Data output control circuit
10/18/1994US5357529 Error detecting and correcting apparatus and method with transparent test mode
10/18/1994US5357523 Memory testing system with algorithmic test data generation
10/18/1994US5357522 Test circuit of input/output macrocell of erasable and programmable logic device
10/18/1994US5357521 Address sensitive memory testing
10/18/1994US5357509 Data writing during process of data restoration in array disk storage system
10/18/1994US5357473 Semiconductor storage system including defective bit replacement
10/18/1994US5357472 Non-volatile semiconductor memory device
10/18/1994US5357471 Fault locator architecture and method for memories
10/18/1994US5357470 Semiconductor memory device having redundancy memory cells
10/18/1994US5357458 System for allowing a content addressable memory to operate with multiple power voltage levels
10/18/1994US5357195 Testing set up and hold input timing parameters of high speed integrated circuit devices
10/18/1994US5357193 Semiconductor memory having a voltage stress applying circuit
10/12/1994EP0619580A1 Method for monitoring the contents of a memory
10/12/1994EP0619545A2 Improved method and apparatus for repair of memory by redundancy
10/12/1994EP0619541A2 Flash memory control method and information processing system therewith
10/12/1994EP0542856B1 Integrated memory having improved testing means
10/11/1994US5355344 Structure for using a portion of an integrated circuit die
10/11/1994US5355342 Semiconductor memory device having multiple selector unit simultaneously selecting memory cells from memory cell blocks in diagnostic mode of operation
10/11/1994US5355341 Integrated memory having improved testing means
10/11/1994US5355340 Semiconductor memory with multiplexed redundancy
10/11/1994US5355339 Row redundancy circuit of a semiconductor memory device
10/11/1994US5355338 Redundancy circuit for semiconductor memory device
10/11/1994US5355337 Arrangement of redundant cell array for semiconductor memory device
10/11/1994US5355331 Semiconductor memory device having electrically isolated memory and logic sections
10/11/1994US5354695 Membrane dielectric isolation IC fabrication
10/06/1994DE4226047C2 Schaltkreis zur Erzeugung einer internen Spannungsversorgung mit einer Steuerschaltung zur Durchführung eines Belastungstests ("Burn-in-Test") Circuit for generating an internal power supply with a control circuit for performing an exercise stress test ("burn-in test")
10/05/1994EP0618587A1 Semiconductor memory with memory matrix comprising redundancy cell columns associated with single matrix sectors
10/05/1994EP0618535A2 EEprom card with defective cell substitution
10/05/1994CN1093201A Semiconductor memory and method of setting type
10/04/1994US5353436 Method and apparatus for synchronizing a plurality of processors
10/04/1994US5353254 Semiconductor memory device having burn-in test circuit
10/04/1994US5353253 Semiconductor memory device
09/1994
09/29/1994WO1994022085A1 Fault tolerant memory system
09/29/1994WO1994022082A1 An improved fault tolerant hard disk array controller
09/29/1994DE4344233A1 Semiconductor device for allowing a simple external determination of the use of a redundant circuit and semiconductor memory device for this
09/28/1994EP0617429A2 Semiconductor memory device having test circuit
09/28/1994EP0617428A1 Semiconductor memory device and memory initializing method
09/28/1994EP0617377A2 Microcomputer with flash memory
09/28/1994EP0617363A2 Defective cell substitution in EEprom array
09/28/1994EP0617362A1 Data back-up in data processing system
09/28/1994EP0410464B1 Semiconductor memory device having diagnostic circuit for memory cells
09/27/1994US5351246 Method and means for coding and rebuilding that data contents of unavailable DASDs or rebuilding the contents of DASDs in error in the presence of reduced number of unavailable DASDs in a DASD array
09/27/1994US5351214 Memory with on-chip detection of bit line leaks
09/27/1994US5351213 Integrated semiconductor memory device utilizing a test circuit
09/27/1994US5351210 Serially accessible semiconductor memory with multiple level storage cells
09/21/1994EP0616335A2 Nonvolatile semiconductor memory device having a status register and test method for the same
09/20/1994US5349562 Dynamic random access memory device suitable for shortening time required for testing self-refresh function
09/20/1994US5349559 Internal voltage generating circuit
09/20/1994US5349558 Sector-based redundancy architecture
09/20/1994US5349557 Semiconductor memory device
09/20/1994US5349556 Row redundancy circuit sharing a fuse box
09/20/1994US5349555 Redundancy circuit
09/15/1994DE4407954A1 Semiconductor memory device with a redundant circuit
09/14/1994EP0615253A2 Semiconductor memory with built-in burn-in test
09/14/1994EP0615252A2 Semiconductor memory with built-in parallel bit test mode
09/14/1994EP0615251A2 Semiconductor memory with built-in parallel bit test mode
09/14/1994EP0615249A2 Semiconductor dynamic random access memory
09/14/1994EP0615211A1 Device for storing security data
09/14/1994EP0615193A1 Memory card device
09/13/1994US5347489 Method and circuitry for preconditioning shorted rows in a nonvolatile semiconductor memory incorporating row redundancy
09/13/1994US5347484 Nonvolatile memory with blocked redundant columns and corresponding content addressable memory sets
09/08/1994DE4406258A1 Information processing device
09/07/1994EP0614193A2 Method and apparatus for detecting retention faults in memories
09/07/1994EP0614144A2 Semiconductor integrated circuit device equipped with answer system for teaching optional functions to diagnostic system
09/07/1994EP0614142A2 System and method for detecting and correcting memory errors
09/07/1994EP0614141A2 Method and apparatus for improving fault tolerance of multi-media document management systems
09/07/1994EP0502884B1 Method and device for semiconductor fabrication fault analasys
09/06/1994USRE34718 DRAM with reduced-test-time-mode
09/06/1994US5345423 Parallel test circuit of a semiconductor memory device
09/06/1994US5345413 For a programmable semiconductor memory device
09/06/1994US5345110 Low-power fuse detect and latch circuit
09/06/1994US5345060 Iron comprising a type-of-fabric detector
1 ... 266 267 268 269 270 271 272 273 274 275 276 277 278 279 280 281 282 283 284 285 286 ... 306