| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 01/31/1995 | US5386386 Redundancy circuit having a spare memory block replacing defective memory cells in different blocks |
| 01/31/1995 | US5386380 Read only memory |
| 01/26/1995 | DE4324795A1 Method for testing alterations to source code programs |
| 01/25/1995 | EP0635786A1 Device for storing data |
| 01/24/1995 | US5384906 Method and apparatus for synchronizing a plurality of processors |
| 01/24/1995 | US5384789 Semiconductor memory device having ECC circuit for decreasing the number of common bus lines to realize large scale integration and low power consumption |
| 01/24/1995 | US5384784 Semiconductor memory device comprising a test circuit and a method of operation thereof |
| 01/24/1995 | US5384741 Semiconductor memory device adapted for preventing a test mode operation from undesirably occurring |
| 01/24/1995 | US5384737 Pipelined memory having synchronous and asynchronous operating modes |
| 01/18/1995 | EP0634751A1 Method and apparatus for parallel testing of memory |
| 01/18/1995 | EP0509633B1 Semiconductor memory |
| 01/17/1995 | US5383205 Semiconductor memory device having an error correction circuit and an error correction method of data in a semiconductor memory device |
| 01/17/1995 | US5383195 BIST circuit with halt signal |
| 01/17/1995 | US5383193 Method for testing non-volatile memories |
| 01/17/1995 | US5383162 Semiconductor memory device |
| 01/17/1995 | US5383157 Parallel TESTMODE |
| 01/17/1995 | US5383156 Semiconductor device for permitting easy external detection of use of redundant circuit and semiconductor memory device therefore |
| 01/17/1995 | US5383147 IC card and method of checking the memory capacity of IC card |
| 01/12/1995 | DE4422786A1 Memory system |
| 01/10/1995 | US5381544 Copyback memory system and cache memory controller which permits access while error recovery operations are performed |
| 01/10/1995 | US5381419 Method and apparatus for detecting retention faults in memories |
| 01/10/1995 | US5381418 For verifying correct operation of storage device |
| 01/10/1995 | US5381373 Voltage stress test circuit for a DRAM |
| 01/10/1995 | US5381372 Semiconductor memory device |
| 01/10/1995 | US5381371 Semiconductor memory device incorporating redundancy memory cells capable of accessing defective memory cells |
| 01/10/1995 | US5381370 Memory with minimized redundancy access delay |
| 01/10/1995 | US5381368 Hardware implemented row copy enable mode for DRAMS to create repetitive backgrounds for video images or DRAM testing |
| 01/05/1995 | DE4416171A1 EEPROM device |
| 01/04/1995 | EP0632468A1 Fast data compression circuit for semiconductor memory chips including an abist structure |
| 01/04/1995 | EP0632467A1 Integrated circuit with a processor-based abist circuit |
| 01/04/1995 | EP0632464A1 Microcontroller memory cell current reading method |
| 01/04/1995 | EP0632384A1 High speed and programmable array clock generator circuit for abist semiconductor memory chips |
| 01/04/1995 | EP0632381A2 Fault-tolerant computer systems |
| 01/04/1995 | EP0632380A1 A circuit allowing a two-pass fuse blow to memory chips combining abist and redundancy capabilities |
| 01/04/1995 | EP0632282A2 Semiconductor integrated circuit device with test mode switching |
| 01/03/1995 | US5379417 System and method for ensuring write data integrity in a redundant array data storage system |
| 01/03/1995 | US5379415 Fault tolerant memory system |
| 01/03/1995 | US5379413 User selectable word/byte input architecture for flash EEPROM memory write and erase operations |
| 01/03/1995 | US5379411 Fault indication in a storage device array |
| 01/03/1995 | US5379410 Data generating apparatus generating consecutive data and having a data skip scheme and a method of operating the same |
| 01/03/1995 | US5379303 Maximizing improvement to fault coverage of system logic of an integrated circuit with embedded memory arrays |
| 01/03/1995 | US5379276 Data information recording/reproducing apparatus which minimizes record failures |
| 01/03/1995 | US5379260 Memory cell having a super supply voltage |
| 01/03/1995 | US5379259 Semiconductor memory device |
| 01/03/1995 | US5379258 Circuit for repairing defective bit in semiconductor memory device and repairing method |
| 01/03/1995 | US5379246 Semiconductor memory device having loop configuration |
| 12/28/1994 | EP0631285A1 Voltage supply detection and switching system for content addressable memory (CAM) |
| 12/27/1994 | US5377152 Semiconductor memory and screening test method thereof |
| 12/27/1994 | US5377148 Apparatus and method to test random access memories for a plurality of possible types of faults |
| 12/27/1994 | US5377147 Method and circuitry for preconditioning shorted rows in a nonvolatile semiconductor memory incorporating row redundancy |
| 12/27/1994 | US5377146 Hierarchical redundancy scheme for high density monolithic memories |
| 12/27/1994 | US5377144 Semiconductor integrated circuit memory part |
| 12/27/1994 | US5376879 Method and apparatus for evaluating electrostatic discharge conditions |
| 12/22/1994 | WO1994029870A1 A burst mode memory accessing system |
| 12/22/1994 | CA2163540A1 A burst mode memory accessing system |
| 12/21/1994 | EP0630026A2 Semiconductor memory device incorporating a test mode therein to perform an automatic refresh function |
| 12/21/1994 | EP0629868A1 Flat panel display device and method of inspection of same |
| 12/20/1994 | US5375231 Control memory error correcting apparatus |
| 12/20/1994 | US5375227 Method of and apparatus for automatic recovery of a cache in a storage system |
| 12/20/1994 | US5375091 Method and apparatus for memory dynamic burn-in and test |
| 12/20/1994 | US5375090 Semiconductor memory device |
| 12/20/1994 | US5375088 Random access memory with plurality of amplifier groups |
| 12/15/1994 | DE4342821C1 Electronic memory circuit |
| 12/15/1994 | DE4328899C1 Process for producing a functional memory module using two partially defective random-access memory units |
| 12/14/1994 | EP0628831A1 Bidirectional boundary scan test cell |
| 12/13/1994 | US5373510 Test circuit of input architecture of erasable and programmable logic device |
| 12/13/1994 | US5373509 Semiconductor memory device and method of testing the same |
| 12/13/1994 | US5373472 Semiconductor memory apparatus |
| 12/13/1994 | US5373471 Semiconductor memory device having redundancy memory cells for replacing defective |
| 12/08/1994 | WO1994028555A1 Self-testing device for storage arrangements, decoders or the like |
| 12/08/1994 | WO1994028549A2 Erase and program verification circuit for non-volatile memory |
| 12/06/1994 | US5371882 Spare disk drive replacement scheduling system for a disk drive array data storage subsystem |
| 12/06/1994 | US5371748 Technique and apparatus for testing an electrically programmable ROM embedded among other digital circuitry on an IC chip |
| 12/06/1994 | US5371712 Semiconductor memory device having detection circuitry for sensing faults in word lines |
| 12/06/1994 | US5371710 Semiconductor memory device having test mode |
| 12/06/1994 | US5371708 FIFO-type semiconductor device |
| 12/06/1994 | US5371390 Interconnect substrate with circuits for field-programmability and testing of multichip modules and hybrid circuits |
| 11/30/1994 | EP0626645A2 Structure for deselecting broken select lines in memory arrays |
| 11/30/1994 | EP0626644A1 Structure to utilize a partially functional cache memory |
| 11/30/1994 | EP0381405B1 Semiconductor memory device having mask rom structure |
| 11/30/1994 | EP0350943B1 Semiconductor integrated circuit including output buffer |
| 11/29/1994 | US5369767 Servicing interrupt requests in a data processing system without using the services of an operating system |
| 11/29/1994 | US5369758 Checking for proper locations of storage devices in a storage array |
| 11/29/1994 | US5369752 Method and apparatus for shifting data in an array of storage elements in a data processing system |
| 11/29/1994 | US5369647 Circuitry and method for testing a write state machine |
| 11/29/1994 | US5369646 Semiconductor integrated circuit device having test circuit |
| 11/29/1994 | US5369608 Apparatus for relieving standby current fail of memory device |
| 11/29/1994 | CA2027992C System for programmed operation of direct access storage device (dasd) subsystems |
| 11/24/1994 | DE4317175A1 Selbsttesteinrichtung für Speicheranordnungen, Decoder od. dgl. Self-testing device for memory devices, or the decoder. Like. |
| 11/22/1994 | US5367682 Data processing virus protection circuitry including a permanent memory for storing a redundant partition table |
| 11/22/1994 | US5367669 Fault tolerant hard disk array controller |
| 11/22/1994 | US5367668 Method and apparatus for fault-detection |
| 11/22/1994 | US5367492 Semiconductor memory device providing reduced test time |
| 11/22/1994 | US5367491 Apparatus for automatically initiating a stress mode of a semiconductor memory device |
| 11/22/1994 | US5367484 Programmable high endurance block for EEPROM device |
| 11/22/1994 | US5367472 Method for testing a computer input device |
| 11/22/1994 | US5367263 Semiconductor integrated circuit device and test method therefor |
| 11/15/1994 | US5365482 Semiconductor memory device with provision of pseudo-acceleration test |
| 11/15/1994 | US5365481 Semiconductor memory device having test mode and method of setting test mode |
| 11/10/1994 | DE4302223C2 Nicht-flüchtige Halbleiterspeichereinrichtung sowie Herstellungsverfahren dafür The non-volatile semiconductor memory device and manufacturing method thereof |