| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 03/30/1995 | DE4434105A1 Semiconductor device with improved immunity to short-circuiting on a power supply line and method of repairing a semiconductor device |
| 03/30/1995 | DE3608547C2 Rechnersystem mit einem externen Speicher Computer system having an external memory |
| 03/29/1995 | EP0645776A2 Semiconductor memory device executing a memory test |
| 03/29/1995 | EP0645714A1 Dynamic redundancy circuit for integrated circuit memory |
| 03/29/1995 | EP0645713A1 Word line redundancy nonvolatile semiconductor memory |
| 03/29/1995 | EP0645712A2 Semiconductor storage device with redundancy |
| 03/29/1995 | EP0645707A2 Shared memory with benign failure modes |
| 03/29/1995 | EP0640227A4 Fault tolerant power supply for an array of storage devices. |
| 03/28/1995 | US5402380 Nonvolatile semiconductor memory device having a status register and test method for the same |
| 03/28/1995 | US5402377 Semiconductor memory device having a controlled auxiliary decoder |
| 03/28/1995 | US5402376 Semiconductor memory having redundancy circuit |
| 03/28/1995 | US5402370 Circuitry and method for selecting a drain programming voltage for a nonvolatile memory |
| 03/28/1995 | US5402063 Momentary test mode enabling circuit |
| 03/28/1995 | CA2043719C Fabric light control window covering |
| 03/23/1995 | DE4433504A1 Semiconductor memory device |
| 03/23/1995 | DE4433098A1 Semiconductor permanent memory device |
| 03/21/1995 | US5400344 Semiconductor device with function of testing insulation defect between bit lines and testing method therefor |
| 03/21/1995 | US5400343 Apparatus and method for defective column detection for semiconductor memories |
| 03/21/1995 | US5400342 Semiconductor memory having test circuit and test method thereof |
| 03/21/1995 | US5400290 Semiconductor device allowing accurate characteristics test |
| 03/21/1995 | US5400282 Detector circuit for testing semiconductor memory device |
| 03/21/1995 | US5400281 Static random access memory device with memory cell testing circuit |
| 03/16/1995 | WO1995007536A1 Circuitry and method for selecting a drain programming voltage for a nonvolatile memory |
| 03/16/1995 | DE4432138A1 Method and apparatus for controlling peripheral circuits by means of a processor which can execute a holding mode |
| 03/16/1995 | DE4312238C2 Verfahren zum Befreien einer Halbleiterspeichervorrichtung von einem Kurzschluß A method for freeing a semiconductor memory device of a short-circuit |
| 03/16/1995 | DE3534356C2 Halbleiter-Speichervorrichtung The semiconductor memory device |
| 03/15/1995 | EP0643351A1 Method for improving the correctness of microcode storage and corresponding microcode program |
| 03/15/1995 | EP0642685A1 Improved solid state storage device |
| 03/15/1995 | CN1100216A Buffer memory self-diagnosis method for information signal processing apparatus |
| 03/14/1995 | US5398206 Semiconductor memory device with data error compensation |
| 03/14/1995 | US5397946 High-voltage sensor for integrated circuits |
| 03/09/1995 | DE4431791A1 Signal selection device |
| 03/09/1995 | DE4223273C2 Halbleiterspeichereinrichtung und Betriebsverfahren für eine solche Semiconductor memory device and method of operation of such |
| 03/09/1995 | DE4202623C2 Abtastpfadeinrichtung und integrierte Halbleiterschaltkreiseinrichtung mit dieser und Betriebsverfahren für eine solche Abtastpfadeinrichtung and semiconductor integrated circuit device with this and operational procedures for such |
| 03/08/1995 | EP0642137A2 Quiescent-current testable RAM |
| 03/08/1995 | EP0642136A2 Apparatus for generating address data |
| 03/08/1995 | EP0642135A2 A nonvolatile semiconductor memory and its test method |
| 03/08/1995 | EP0642134A2 Test of a static random access memory |
| 03/08/1995 | EP0642081A2 Digital storage system and method having alternating deferred updating of mirrored storage disks |
| 03/08/1995 | EP0642078A2 Method and device for error checking and error correction in memory building blocks |
| 03/08/1995 | EP0641485A1 Membrane dielectric isolation ic fabrication |
| 03/08/1995 | EP0377827B1 Boost clock signal generator |
| 03/07/1995 | US5396641 Reconfigurable memory processor |
| 03/07/1995 | US5396619 In a computer system |
| 03/07/1995 | US5396499 Semiconductor memory device with redundant memory and floatable data line |
| 03/07/1995 | US5396466 Method of testing bit lines of a memory unit |
| 03/07/1995 | US5396465 Circuit for controlling isolation transistors in a semiconductor memory device |
| 03/07/1995 | US5396464 Semiconductor memory with inverted write-back capability and method of testing a memory using inverted write-back |
| 03/07/1995 | US5396124 Circuit redundancy having a variable impedance circuit |
| 03/07/1995 | US5396113 Electrically programmable internal power voltage generating circuit |
| 03/02/1995 | DE4429152A1 Microcomputer |
| 03/01/1995 | EP0640986A1 Semiconductor memory device and method for testing the same |
| 03/01/1995 | EP0640918A1 Semiconductor integrated circuit memory device |
| 03/01/1995 | EP0640917A2 Roll call circuit for semi-conductor memory |
| 03/01/1995 | EP0640228A1 Method and apparatus for reducing memory wearout in a computer system |
| 03/01/1995 | EP0640227A1 Fault tolerant power supply for an array of storage devices |
| 02/28/1995 | US5394536 Stable memory circuit using dual ported VRAM with shift registers in a multiple memory bank setup for high speed data-transfer |
| 02/28/1995 | US5394403 Fully testable chip having self-timed memory arrays |
| 02/28/1995 | US5394370 High speed parallel test architecture |
| 02/28/1995 | US5394369 Semiconductor memory device incorporating redundancy memory cells having parallel test function |
| 02/28/1995 | US5394368 Semiconductor memory device |
| 02/24/1995 | CA2125201A1 Digital storage system and method having alternating deferred updating of mirrored storage disks |
| 02/22/1995 | EP0639811A2 Memory systems with data storage redundancy management |
| 02/22/1995 | EP0446250A4 Control for a rotating media storage system |
| 02/21/1995 | US5392301 Programmable read only memory device having test tool for error checking and correction circuit |
| 02/21/1995 | US5392296 Testing circuit provided in digital logic circuits |
| 02/21/1995 | US5392294 Diagnostic tool and method for locating the origin of parasitic bit faults in a memory array |
| 02/21/1995 | US5392292 System for reconfiguring a computer memory |
| 02/21/1995 | US5392288 Addressing technique for a fault tolerant block-structured storage device |
| 02/21/1995 | US5392248 Circuit and method for detecting column-line shorts in integrated-circuit memories |
| 02/21/1995 | US5392247 Semiconductor memory device including redundancy circuit |
| 02/21/1995 | US5392246 Semiconductor memory with multiple sets & redundant cells |
| 02/21/1995 | US5392245 Redundancy elements using thin film transistors (TFTs) |
| 02/21/1995 | US5392244 Memory systems with data storage redundancy management |
| 02/15/1995 | EP0638902A2 Selector circuit selecting and outputting voltage applied to one of first and second terminal in response to voltage level applied to first terminal |
| 02/14/1995 | US5390324 Computer failure recovery and alert system |
| 02/14/1995 | US5390313 Data storage system with data mirroring and reduced access time data retrieval |
| 02/14/1995 | US5390187 On-line reconstruction of a failed redundant array system |
| 02/14/1995 | US5390186 Method of fault handling for a disk control unit with built-in cache |
| 02/14/1995 | US5390150 Semiconductor memory device with redundancy structure suppressing power consumption |
| 02/14/1995 | CA2030939C Memory card resident diagnostic testing |
| 02/09/1995 | WO1995004321A1 Distributed directory for information stored on audio quality memory devices |
| 02/08/1995 | EP0637824A1 System and method for reducing seek time for read operations in mirrored dasd files |
| 02/07/1995 | US5388242 Multiprocessor system with each processor executing the same instruction sequence and hierarchical memory providing on demand page swapping |
| 02/07/1995 | US5388104 Semiconductor integrated circuit capable of testing memory blocks |
| 02/07/1995 | US5388077 Test device for semiconductor memory device |
| 02/07/1995 | US5388076 Semiconductor memory device |
| 02/07/1995 | US5388071 Semiconductor memory device regulable in access time after fabrication thereof |
| 02/07/1995 | US5387823 Fuse-programmable redundancy control circuit |
| 02/02/1995 | WO1995003580A1 Method for rapid recovery from a network file server failure |
| 02/01/1995 | EP0637036A2 Redundancy element check in IC memory without programming substitution of redundant elements |
| 02/01/1995 | EP0637034A1 Method for detecting faulty elements of a redundancy semiconductor memory |
| 02/01/1995 | EP0636984A1 Method and device for checking the data in a computer |
| 02/01/1995 | EP0636258A1 Integrated semiconductor memory with redundancy arrangement. |
| 01/31/1995 | US5386422 Electrically erasable and programmable non-volatile memory system with write-verify controller using two reference levels |
| 01/31/1995 | US5386421 Image memory diagnostic system |
| 01/31/1995 | US5386392 Programmable high speed array clock generator circuit for array built-in self test memory chips |
| 01/31/1995 | US5386390 Semiconductor memory with looped shift registers as row and column drivers |
| 01/31/1995 | US5386388 Single cell reference scheme for flash memory sensing and program state verification |
| 01/31/1995 | US5386387 Semiconductor memory device including additional memory cell block having irregular memory cell arrangement |