| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 06/21/1995 | EP0658905A2 Electronic memory circuit |
| 06/21/1995 | EP0658903A1 Double-row address decoding and selection circuitry for an electrically erasable and programmable non-volatile memory device with redundancy, particularly for flash EEPROM devices |
| 06/21/1995 | EP0658845A1 Method and apparatus to store transaction data |
| 06/21/1995 | CN1103985A Method and apparatus for testing a static ram |
| 06/20/1995 | US5426616 Semiconductor IC device having a voltage conversion circuit which generates an internal supply voltage having value compensated for external supply voltage variations |
| 06/20/1995 | US5426613 Semiconductor memory device with improved substrate arrangement to permit forming a plurality of different types of random access memory, and a testing method therefor |
| 06/20/1995 | US5426608 Word line redundancy nonvolatile semiconductor memory |
| 06/20/1995 | US5426607 Redundant circuit for memory having redundant block operatively connected to special one of normal blocks |
| 06/14/1995 | EP0657894A1 Method and apparatus for memory dynamic burn-in and test |
| 06/14/1995 | EP0657814A1 Redundancy circuitry for a semiconductor memory device |
| 06/14/1995 | EP0657811A1 Integrated circuitry for checking the utilization rate of redundancy memory elements in a semiconductor memory device |
| 06/13/1995 | US5424990 Semiconductor memory having built-in voltage stress test mode |
| 06/13/1995 | US5424989 Semiconductor memory device |
| 06/13/1995 | US5424988 Stress test for memory arrays in integrated circuits |
| 06/13/1995 | US5424987 Semiconductor memory device having redundant memory cells and circuit therefor |
| 06/13/1995 | US5424986 Semiconductor memory with power-on reset control of disabled rows |
| 06/13/1995 | US5424984 Semiconductor memory incorporating a plurality of data input buffers for multi-bit operation |
| 06/13/1995 | US5424672 Low current redundancy fuse assembly |
| 06/06/1995 | US5423044 Shared, distributed lock manager for loosely coupled processing systems |
| 06/06/1995 | US5423028 Diagnostic procedure for identifying presence of computer memory |
| 06/06/1995 | US5422892 Integrated circuit test arrangement and method for maximizing the use of tester comparator circuitry to economically test wide data I/O memory devices |
| 06/06/1995 | US5422859 Semiconductor memory system for monitoring a signal output, synchronization with data output from a memory device and indicating that the output data are valid, by using a CPU |
| 06/06/1995 | US5422852 Method and system for screening logic circuits |
| 06/06/1995 | US5422851 Semiconductor memory device capable of verifying use of redundant circuit |
| 06/06/1995 | US5422850 Semiconductor memory device and defective memory cell repair circuit |
| 06/06/1995 | US5422839 Semiconductor memory device |
| 06/01/1995 | WO1995014970A2 A fault tolerant queue system |
| 06/01/1995 | DE4241327C2 Halbleiterspeichervorrichtung A semiconductor memory device |
| 06/01/1995 | CA2176471A1 A fault tolerant queue system |
| 05/31/1995 | EP0655744A1 Multibit semiconductor memory device |
| 05/31/1995 | EP0655743A1 Integrated circuit for the programming of a memory cell in a non-volatile memory register |
| 05/31/1995 | EP0655687A1 Semiconductor memory device having shifting circuit connected between data bus lines and buffer circuits for changing connections therebetween |
| 05/31/1995 | EP0655683A1 Circuit architecture and corresponding method for testing a programmable logic matrix |
| 05/31/1995 | EP0655164A1 Self-testing device for storage arrangements, decoders or the like |
| 05/30/1995 | US5420870 Non-fully-decoded test address generator |
| 05/30/1995 | US5420824 Large-scale semiconductor integrated circuit device and method for relieving the faults thereof |
| 05/30/1995 | US5420822 Non-volatile semiconductor memory device |
| 05/30/1995 | US5420821 Decoder for salvaging defective memory cells |
| 05/30/1995 | US5420505 Direct current booster with test circuit |
| 05/24/1995 | EP0654792A1 Non-volatile electrically alterable memory with write control |
| 05/24/1995 | EP0654739A1 Automatic repair data editing system associated with repairing system for semiconductor integrated circuit device |
| 05/24/1995 | EP0654168A1 Fault-tolerant, high-speed bus system and bus interface for wafer-scale integration |
| 05/24/1995 | DE4441183A1 Row redundancy circuit for cellular integrated memory, e.g. DRAM with fuseboxes |
| 05/24/1995 | CN1102896A Digital storage system and method having having alternating deferred updating of mirrored storage disks |
| 05/23/1995 | US5418791 Semiconductor integrated circuit having test circuit |
| 05/23/1995 | US5418790 Interference grasping test mode circuit for a semiconductor memory device |
| 05/23/1995 | US5418754 Dynamic random access memory device with self-refresh cycle time directly measurable at data pin |
| 05/23/1995 | US5418752 Flash EEPROM system with erase sector select |
| 05/23/1995 | US5418738 Low voltage programmable storage element |
| 05/23/1995 | US5418406 Pulse signal generator and redundancy selection signal generator |
| 05/18/1995 | DE4441007A1 Multibit testing circuit for semiconductor DRAM |
| 05/18/1995 | DE4440169A1 Data output unit for semiconductor memory |
| 05/17/1995 | CN1102718A Examing device for storage |
| 05/16/1995 | US5416920 Method of automatically testing an extended buffer memory |
| 05/16/1995 | US5416782 Method and apparatus for improving data failure rate testing for memory arrays |
| 05/16/1995 | US5416741 Semiconductor memory with built-in parallel bit test mode |
| 05/16/1995 | US5416740 Semiconductor memory device including redundant memory cell array for repairing defect |
| 05/10/1995 | EP0652568A1 Memory card tester |
| 05/10/1995 | EP0652515A1 Memory device, manufacture of such a device and a method of simulating a contiguous memory |
| 05/09/1995 | US5414758 Audio recording apparatus using an imperfect memory circuit |
| 05/09/1995 | US5414714 Method and apparatus for scan testing an array in a data processing system |
| 05/09/1995 | US5414672 Semiconductor memory device including address transition detector |
| 05/09/1995 | US5414668 Semiconductor memory device |
| 05/09/1995 | US5414660 Double word line type dynamic RAM having redundant sub-array of cells |
| 05/09/1995 | US5414659 Semiconductor memory device having address transition detector quickly enabling redundancy decoder |
| 05/09/1995 | US5414364 In an integrated circuit |
| 05/03/1995 | EP0651261A2 System and method for testing a circuit network having elements testable by different boundary scan standards |
| 05/02/1995 | US5412793 Method for testing erase characteristics of a flash memory array |
| 05/02/1995 | US5412671 Data protection and error correction, particularly for general register sets |
| 05/02/1995 | US5412662 Memory testing device for preventing excessive write and erasure |
| 05/02/1995 | US5412612 Semiconductor storage apparatus |
| 05/02/1995 | US5412337 Semiconductor device providing reliable conduction test of all terminals |
| 04/25/1995 | US5410687 Analyzing device for saving semiconductor memory failures |
| 04/25/1995 | US5410670 Accessing system that reduces access times due to transmission delays and I/O access circuitry in a burst mode random access memory |
| 04/25/1995 | US5410668 Reconfigurable cache memory which can selectively inhibit access to damaged segments in the cache memory |
| 04/25/1995 | US5410544 External tester control for flash memory |
| 04/25/1995 | US5410510 Process of making and a DRAM standby charge pump with oscillator having fuse selectable frequencies |
| 04/18/1995 | US5408644 Method and apparatus for improving the performance of partial stripe operations in a disk array subsystem |
| 04/18/1995 | US5408634 Dual disk system for causing optimal disk units to execute I/O request channel programs |
| 04/18/1995 | US5408628 Solid state recorder with flexible width data bus utilizing lock mapping and error correction and detection circuits |
| 04/18/1995 | US5408589 Print device capable of controlling initialization of a data storage device |
| 04/18/1995 | US5408435 Semiconductor memory with inhibited test mode entry during power-up |
| 04/18/1995 | US5408129 Integrated circuit I/O using a high performance bus interface |
| 04/13/1995 | DE4234155C2 Halbleiterspeichervorrichtung A semiconductor memory device |
| 04/12/1995 | EP0419117B1 Wafer-scale semiconductor device having fail-safe circuit |
| 04/11/1995 | US5406566 Semiconductor memory device having diagnostic circuit for comparing multi-bit read-out test data signal with multi-bit write-in test data signal stored in serial-input shift register |
| 04/11/1995 | US5406565 Memory array of integrated circuits capable of replacing faulty cells with a spare |
| 04/11/1995 | US5406520 Universal modular memory |
| 04/11/1995 | US5406504 Multiprocessor cache examiner and coherency checker |
| 04/06/1995 | WO1995009424A1 Automatic test circuitry with non-volatile status write |
| 04/06/1995 | DE4220196C2 Halbleiterspeichervorrichtung und Verfahren zum Korrigieren eines Datenfehlers in einer Halbleiterspeichervorrichtung entsprechend einer vorbestimmten Hamming-Matrix A semiconductor memory device and method for correcting a data error in a semiconductor memory device according to a predetermined Hamming matrix |
| 04/05/1995 | EP0646866A2 Redundant line decoder master enable |
| 04/05/1995 | EP0646858A1 Data storage system architecture |
| 04/04/1995 | US5404336 Semiconductor memory device |
| 04/04/1995 | US5404332 Apparatus for and a method of detecting a malfunction of a FIFO memory |
| 04/04/1995 | US5404331 Redundancy element check in IC memory without programming substitution of redundant elements |
| 04/04/1995 | US5404330 Word line boosting circuit and control circuit therefor in a semiconductor integrated circuit |
| 04/04/1995 | US5404328 Memory cell having floating gate and semiconductor memory using the same |
| 04/04/1995 | US5404099 Semiconductor device |
| 03/30/1995 | DE4434117A1 Bi-CMOS semiconductor storage device |