Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
11/1995
11/16/1995WO1995030988A1 A single chip controller-memory device and a memory architecture and methods suitable for implementing the same
11/15/1995EP0682314A2 Redundant disk storage system
11/15/1995EP0566604B1 Process for testing a store arranged on a semiconductor component as a macrocell on the self-testing principle
11/14/1995US5467468 Semiconductor memory device having built-in test circuits selectively activated by decoder circuit
11/14/1995US5467457 Read only type semiconductor memory device including address coincidence detecting circuits assigned to specific address regions and method of operating the same
11/14/1995US5467358 Process for checking the memories of a programmed microcomputer by means of a micro-program incorporated in the microcomputer itself
11/14/1995US5467357 EEPROM apparatus
11/14/1995US5467356 Semiconductor memory device
11/14/1995US5467315 Semiconductor memory device facilitated with plural self-refresh modes
11/14/1995US5467314 Method of testing an address multiplexed dynamic RAM
11/14/1995US5467267 PROM built-in micro computer
11/09/1995WO1995030227A1 A method and apparatus for testing a memory circuit with parallel block write operation
11/09/1995DE4345320A1 Disk array appts. - has cache memory for storing data and redundant information, and non-volatile memory which stores data even if power supply fails
11/08/1995EP0681295A1 Burn-in method for nonvolatile flash - EPROM memory devices
11/08/1995EP0681239A2 Fault-tolerant computer system with I/O function capabilities
11/08/1995EP0355768B1 Semiconductor memory cells and semiconductor memory device employing the semiconductor memory cells
11/07/1995US5465234 Semiconductor memory device having shifting circuit connected between data bus lines and data buffer circuits for changing connections therebetween
11/07/1995US5465233 Structure for deselecting broken select lines in memory arrays
11/07/1995US5465053 Electronic drive circuits for active matrix devices, and a method of self-testing and programming such circuits
11/07/1995US5465052 Method of testing liquid crystal display substrates
11/02/1995EP0680051A1 Testable memory array
11/02/1995EP0680050A1 Flash EEPROM with auto-function for automatically writing or erasing data
11/02/1995EP0679996A2 Semiconductor memory device and its driving method
11/01/1995CN1111017A Multi-bit test circuit of semiconductor memory device
10/1995
10/31/1995US5463776 Storage management system for concurrent generation and fair allocation of disk space among competing requests
10/31/1995US5463765 Disk array system, data writing method thereof, and fault recovering method
10/31/1995US5463758 System and method for reducing seek time for read operations in mirrored DASD files
10/31/1995US5463637 Apparatus and method for testing a buffer memory device which checks whether data is valid or invalid
10/31/1995US5463636 Semiconductor memory device with built-in confirmation unit for accelerating test
10/31/1995US5463635 Semiconductor memory device including means for checking the operation of an internal address generator
10/31/1995US5463586 Erase and program verification circuit for non-volatile memory
10/31/1995US5463585 Semiconductor device incorporating voltage reduction circuit therein
10/25/1995EP0678915A2 Integrated semiconductor device with an EEPROM, semiconductor substrate with such integrated circuits and method for use of such a semiconductor substrate
10/25/1995EP0411626B1 Semiconductor memory device having a redundancy
10/24/1995US5461634 Memory storage verification system for use in an integrated circuit for performing power signal measurements
10/24/1995US5461588 Memory testing with preservation of in-use data
10/24/1995US5461587 Row redundancy circuit and method for a semiconductor memory device with a double row decoder
10/24/1995US5461586 Self-timed redundancy circuit
10/19/1995WO1995024774A3 Memory iddq-testable through cumulative word line activation
10/19/1995DE4413257A1 Integrierte Schaltungsanordnung mit einem EEPROM, Halbleiterscheibe mit solchen integrierten Schaltungen sowie Verfahren zur Verwendung einer solchen Halbleiterscheibe Integrated circuit arrangement having an EEPROM, the semiconductor wafer having such integrated circuits as well as methods of using such a semiconductor wafer
10/19/1995DE4234157C2 Halbleiter-Speichervorrichtung mit einer Treibersignal-Erzeugungseinrichtung für den Ausgangs-Puffer A semiconductor memory device comprising a drive signal generation device for the output buffer
10/18/1995EP0677849A2 Multiple I/O select memory
10/17/1995US5459857 Fault tolerant disk array data storage subsystem
10/17/1995US5459856 System having independent access paths for permitting independent access from the host and storage device to respective cache memories
10/17/1995US5459733 Input/output checker for a memory array
10/17/1995US5459691 Memory circuit
10/17/1995US5459690 Integrated semiconductor memory with redundancy arrangement
10/17/1995US5459416 Sense amplifier common mode dip filter circuit to avoid false misses
10/12/1995DE19513789A1 Defect address memory circuit for semiconductor memory device
10/11/1995EP0676769A1 Electrically alterable read only memory comprising test functions
10/11/1995EP0676068A1 Data integrity check in buffered data transmission
10/10/1995US5457696 Semiconductor memory having internal test circuit
10/10/1995US5457695 Method and system for screening logic circuits
10/10/1995US5457656 Zero static power memory device redundancy circuitry
10/10/1995US5457655 Column redundance circuit configuration for a memory
10/10/1995US5457651 Method and architecture for accelerated programming of uniform data into an electrically programmable memory
10/05/1995DE4309814C2 Nichtflüchtige Halbleiterspeichervorrichtung A non-volatile semiconductor memory device
10/04/1995EP0675504A1 Circuit device for measuring the threshold voltage distribution of non-volatile memory cells
10/04/1995EP0675502A2 Multiple sector erase flash EEPROM system
10/04/1995EP0675501A1 Non-volatile memory element with double programmable cell and corresponding reading circuit for redundancy circuits
10/04/1995EP0675441A1 Redundancy fuses matrix array for integrated memory and implementing method
10/04/1995EP0675440A1 Redundancy circuitry layout for a semiconductor memory device
10/04/1995EP0675439A1 Fuse circuitry which can emulate fuse blowing
10/04/1995EP0675436A1 Recoverable set associative cache
10/03/1995US5455934 Fault tolerant hard disk array controller
10/03/1995US5455799 For eliminating contention operating mode/power-on reset signal
10/03/1995US5455798 Semiconductor memory with improved redundant sense amplifier control
10/03/1995US5455796 Semiconductor memory device
10/03/1995US5455517 Data output impedance control
09/1995
09/28/1995DE19501537A1 Multi-bit test circuit for solid state memory circuits
09/27/1995EP0674320A1 Memory device with programmable self-refreshing and testing methods therefore
09/27/1995EP0674264A1 Circuit for selecting redundant memory elements and FLASH EEPROM containing said circuit
09/27/1995EP0674263A1 Asynchronous remote data copying
09/27/1995EP0359941B1 Compound semiconductor memory device with redundancy configuration
09/26/1995US5453954 Semiconductor integrated circuit device with built-in regulating system for determining margins of main circuits
09/26/1995US5453696 Embedded fuse resistance measuring circuit
09/20/1995EP0672985A1 Asynchronous remote data duplexing
09/20/1995EP0525068A4 Integrated circuit i/o using a high preformance bus interface
09/20/1995EP0443070B1 Device for verifying the correct functioning of memory locations in a read-write-memory
09/19/1995US5452467 Microcomputer with high density ram in separate isolation well on single chip
09/19/1995US5452418 Method of using stream buffer to perform operation under normal operation mode and selectively switching to test mode to check data integrity during system operation
09/19/1995US5452311 Method and apparatus to improve read reliability in semiconductor memories
09/19/1995US5452258 Semiconductor read only memory
09/19/1995US5452253 Burn-in test circuit for semiconductor memory device
09/19/1995US5452252 Semiconductor memory unit
09/19/1995US5452251 Semiconductor memory device for selecting and deselecting blocks of word lines
09/19/1995US5451896 Semiconductor integrated circuit device with an internal voltage-down converter
09/19/1995US5451489 Multilayer element wafers with photoresist layers treated with light
09/14/1995WO1995024774A2 Memory iddq-testable through cumulative word line activation
09/13/1995EP0671686A1 Synchronous remote data duplexing
09/13/1995EP0399258B1 Semiconductor memory device having self-correcting function
09/12/1995US5450578 Method and apparatus for automatically routing around faults within an interconnect system
09/12/1995US5450424 Semiconductor memory device with error checking and correcting function
09/12/1995US5450364 Method and apparatus for production testing of self-refresh operations and a particular application to synchronous memory devices
09/12/1995US5450362 Semiconductor integrated circuit device
09/12/1995US5450361 Semiconductor memory device having redundant memory cells
09/12/1995US5450360 Flash EEPROM having memory cell arrays supplied respectively with erasing voltage via transfer gates different in current capability from each other
09/12/1995US5450016 Method of quickly evaluating contact resistance of semiconductor device
09/06/1995EP0670551A1 Remote dual copy system
09/06/1995EP0670548A1 Method and structure for recovering smaller density memories from larger density memories
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