Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
01/1996
01/16/1996US5485425 Semiconductor memory device having redundant column and operation method thereof
01/16/1996US5485424 Semiconductor memory and redundant-address writing method
01/16/1996US5485105 Apparatus and method for programming field programmable arrays
01/16/1996CA2047911C Circuit arrangement for an indicator device having a matrix composed of bistable matrix points
01/11/1996DE4322994C2 Halbleiterspeichervorrichtung und Verfahren zum Setzen des Test-Modus einer Halbleiterspeichervorrichtung A semiconductor memory device and method of setting the test mode of a semiconductor memory device
01/10/1996EP0691617A2 Directional asymmetric signal swing bus system for circuit module architecture
01/10/1996EP0691612A1 A test circuit of embedded arrays in mixed logic and memory chips
01/10/1996EP0419863B1 Multiple I/O select memory
01/09/1996US5483544 Vector-specific testability circuitry
01/09/1996US5483493 Multi-bit test circuit of semiconductor memory device
01/09/1996US5483491 Memory card device
01/09/1996US5483490 Semiconductor integrated device and wiring correction arrangement therefor
01/09/1996US5483488 Semiconductor static random access memory device capable of simultaneously carrying disturb test in a plurality of memory cell blocks
01/09/1996US5483471 Microcomputer
01/09/1996US5483155 Test system and method for dynamic testing of a plurality of packaged same-type charge coupled device image sensors
01/03/1996EP0690381A1 Redundancy scheme for memory circuits
01/03/1996EP0689695A1 Fault tolerant memory system
01/03/1996CN1114456A Semiconductor dovice and unit for driving same
01/02/1996US5481749 Shift register divided into a number of cells and a number of stages within each cell to permit bit and multiple bit shifting
01/02/1996US5481671 Memory testing device for multiported DRAMs
01/02/1996US5481670 Method and apparatus for backup in a multi-memory device
01/02/1996US5481551 IC element testing device
01/02/1996US5481499 Integrated matrix memory, comprising a circuit arrangement for testing the addressing
01/02/1996US5481498 Redundancy circuit for semiconductor memory device
01/02/1996CA2044441C Semiconductor storage system
12/1995
12/28/1995WO1995035573A1 Process for matching partial memory devices
12/27/1995EP0689143A1 Data storage subsystem
12/27/1995EP0689125A2 Method of utilizing storage disks of differing capacity in a single storage volume in a hierarchic disk array
12/27/1995EP0451595B1 Short circuit detector circuit for memory array
12/26/1995US5479653 Disk array apparatus and method which supports compound raid configurations and spareless hot sparing
12/26/1995US5479611 Disk array apparatus
12/26/1995US5479609 Solid state peripheral storage device having redundent mapping memory algorithm
12/26/1995US5479415 Method and apparatus for generating test pulses
12/26/1995US5479413 Method for testing large memory arrays during system initialization
12/26/1995US5479371 Semiconductor memory device
12/26/1995US5479370 Semiconductor memory with bypass circuit
12/26/1995US5479093 Internal voltage generating circuit of a semiconductor device
12/21/1995WO1995034897A1 Memory test system
12/21/1995WO1995034858A1 Memory error correction
12/19/1995US5477494 Apparatus for generating address bit patterns for testing semiconductor memory devices
12/19/1995US5477492 Memory device to detect and compensate for defective memory cells
12/19/1995US5477151 Capacitor and diode circuitry for on chip power spike detection
12/19/1995CA2034027C Dynamic ram with on-chip ecc and optimized bit and word redundancy
12/14/1995DE19520979A1 Semiconductor memory with column redundancy device for esp. DRAM
12/13/1995EP0686981A2 Method for testing large memory arrays during system initialization
12/13/1995EP0686980A1 Semiconductor memory device having means for replacing defective memory cells
12/13/1995EP0686979A1 Failure tolerant memory device, in particular of the flash EEPROM type
12/13/1995EP0686978A1 A method for in-factory testing of flash EEPROM devices
12/13/1995EP0686907A2 Memory system with hierarchic disk array and memory map store for persistent storage of virtual mapping information
12/13/1995EP0392895B1 Flash EEprom system
12/13/1995EP0361404B1 Memory circuit provided with improved redundant structure
12/13/1995CN1113348A Semiconductor integrated circuit with a stress circuit and method for suppluing a stress voltage thereof
12/12/1995US5475815 Built-in-self-test scheme for testing multiple memory elements
12/12/1995US5475693 Error management processes for flash EEPROM memory arrays
12/12/1995US5475692 Semiconductor memory device
12/12/1995US5475648 Redundancy semiconductor memory device which utilizes spare memory cells from a plurality of different memory blocks, and utilizes the same decode lines for both the primary and spare memory cells
12/12/1995US5475646 Screening circuitry for a dynamic random access memory
12/12/1995US5475640 Method and apparatus for inhibiting a predecoder when selecting a redundant row line
12/06/1995EP0685852A2 Memory system and method of using same
12/06/1995EP0685073A1 Separate i ddq-testing of signal path and bias path in an ic
12/05/1995US5473753 Method of managing defects in flash disk memories
12/05/1995US5473616 Address pattern generator
12/05/1995US5473575 Integrated circuit I/O using a high performance bus interface
12/05/1995US5473573 Single chip controller-memory device and a memory architecture and methods suitable for implementing the same
11/1995
11/30/1995WO1995032507A1 Programmable logic device with verify circuitry for classifying fuse link states as validly closed, validly open or invalid
11/30/1995WO1995032433A1 Method for programming antifuses for reliable programmed links
11/30/1995DE19519453A1 Semiconductor memory test appts. for integrated logic circuit with multiple RAM, ROM
11/30/1995DE19517555A1 Semiconductor memory matrix appts. with redundant memory cells for e.g. SRAM
11/30/1995DE19515661A1 DASD semiconductor memory
11/28/1995US5471640 Programmable disk array controller having n counters for n disk drives for stripping data where each counter addresses specific memory location by a count n
11/28/1995US5471482 VLSI embedded RAM test
11/28/1995US5471480 Parallel test circuit for use in a semiconductor memory device
11/28/1995US5471479 Arrangement for column sparing of memory
11/28/1995US5471478 Flash EEPROM array data and header file structure
11/28/1995US5471431 Structure to recover a portion of a partially functional embedded memory
11/28/1995US5471430 Test circuit for refresh counter of clock synchronous type semiconductor memory device
11/28/1995US5471429 Burn-in circuit and method therefor of semiconductor memory device
11/28/1995US5471427 Circuit for repairing defective bit in semiconductor memory device and repairing method
11/28/1995US5471426 Redundancy decoder
11/22/1995EP0480915B1 Defective element disabling circuit having a laser-blown fuse
11/22/1995CN1112276A Semiconductor memory apparatus
11/21/1995US5469453 Data corrections applicable to redundant arrays of independent disks
11/21/1995US5469451 Error detection and correction of a semiconductor memory device
11/21/1995US5469450 Nonvolatile memory device including multi-ECC circuit
11/21/1995US5469445 Transparent testing of integrated circuits
11/21/1995US5469444 Semiconductor memory system
11/21/1995US5469443 Method and apparatus for testing random access memory
11/21/1995US5469401 Column redundancy scheme for DRAM using normal and redundant column decoders programmed with defective array address and defective column address
11/21/1995US5469396 Apparatus and method determining the resistance of antifuses in an array
11/21/1995US5469394 Nonvolatile semiconductor memory device having a status register and test method for the same
11/21/1995US5469393 Monolithic memory device
11/21/1995US5469391 Semiconductor memory device including redundancy circuit for remedying defect in memory portion
11/21/1995US5469390 Semiconductor memory system with the function of the replacement to the other chips
11/21/1995US5469389 Semiconductor memory with memory matrix comprising redundancy cell columns associated with single matrix sectors
11/21/1995US5469388 Row redundancy circuit suitable for high density semiconductor memory devices
11/21/1995US5469384 Decoding scheme for reliable multi bit hot electron programming
11/21/1995US5469381 Semiconductor memory having non-volatile semiconductor memory cell
11/21/1995US5469379 Multi-level vROM programming method and circuit
11/21/1995US5469065 On chip capacitor based power spike detection
11/21/1995CA2030940C Computer controlled optimized pairing of disk units
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