Patents
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
05/1996
05/23/1996DE19542033A1 Memory device redundancy circuit for masked ROM error correction
05/21/1996US5519712 Current mode test circuit for SRAM
05/21/1996US5519659 Semiconductor memory device having circuit for activating predetermined rows of memory cells upon detection of disturb refresh test
05/21/1996US5519657 Semiconductor memory device having a redundant memory array and a testing method thereof
05/21/1996US5519652 Nonvolatile semiconductor memory for positively holding stored data
05/21/1996US5519650 Semiconductor device having an improved immunity to a short-circuit at a power supply line
05/15/1996EP0712079A2 Recovery method for a high availability data processing system
05/15/1996EP0711447A1 Programmable logic device with verify circuitry for classifying fuse link states as validly closed, validly open or invalid
05/15/1996EP0711436A1 Distributed directory for information stored on audio quality memory devices
05/15/1996EP0480966B1 A fault tolerant data storage system
05/15/1996EP0315209B1 Microcomputer incorporating memory
05/15/1996DE4416171C2 EEPROM-Vorrichtung EEPROM device
05/15/1996DE19540915A1 Redundante Anordnung von Festkörper-Speicherbausteinen Redundant array of solid state memory devices
05/15/1996CN1122473A Fifo buffer system having an error detection and correction device
05/14/1996US5517616 Multi-processor computer system with system monitoring by each processor and exchange of system status information between individual processors
05/14/1996US5517458 Roll call decoder for semiconductor memory having redundant memory cells
05/14/1996US5517457 Semiconductor memory device
05/14/1996US5517455 Integrated circuit with fuse circuitry simulating fuse blowing
05/14/1996US5517451 Semiconductor memory device and memory initializing method
05/14/1996US5517450 Semiconductor memory device with redundancy circuit
05/14/1996US5517442 Random access memory and an improved bus arrangement therefor
05/11/1996CA2162317A1 Redundant array of solid state memory devices
05/09/1996WO1996013731A1 Semiconductor test chip with on-wafer switching matrix
05/07/1996US5515526 Apparatus for detecting redundant circuit included in logic circuit and method therefor
05/07/1996US5515333 Semiconductor memory
05/07/1996US5515326 Static semiconductor memory device having circuitry for lowering potential of bit lines at commencement of data writing
05/07/1996US5515324 EEPROM having NAND type memory cell array
05/07/1996US5515318 Method of evaluating the gate oxide of non-volatile EPROM, EEPROM and flash-EEPROM memories
05/07/1996US5514980 High resolution circuit and method for sensing antifuses
05/07/1996US5514975 Data output impedance control
05/07/1996US5514884 Very high density wafer scale device architecture
05/02/1996WO1996013003A1 An efficient method for obtaining usable parts from a partially good memory integrated circuit
05/01/1996EP0709853A1 Circuit structure and method for stress testing of bit lines
05/01/1996EP0709782A2 Error detection system for mirrored memory between dual disk storage controllers
05/01/1996EP0709781A2 System for using mirrored memory as a robust communication path between dual disk storage controllers
05/01/1996EP0709776A1 Method for detecting and correcting an error in a multilevel memory and memory device implementing the method
05/01/1996EP0709765A2 Method and system for selecting data for migration in a hierarchic data storage system using frequency distribution tables
05/01/1996EP0438705B1 Integrated circuit driver inhibit control method for test
04/1996
04/30/1996US5513344 Method of testing cache memories used for an information processing apparatus
04/30/1996US5513327 Integrated circuit I/O using a high performance bus interface
04/30/1996US5513318 Method for built-in self-testing of ring-address FIFOs
04/30/1996US5513314 Computer system
04/30/1996US5513193 Non-volatile semiconductor memory device capable of checking the threshold value of memory cells
04/30/1996US5513192 Fault tolerant disk drive system with error detection and correction
04/30/1996US5513144 On-chip memory redundancy circuitry for programmable non-volatile memories, and methods for programming same
04/30/1996US5513142 Semiconductor memory device for maintaining level of signal line
04/30/1996US5513137 Flash memory having transistor redundancy
04/30/1996US5512846 Signal selecting device controlled by a serially transmitted mode signal requiring but one terminal
04/30/1996US5512397 Stepper scanner discretionary lithography and common mask discretionary lithography for integrated circuits
04/25/1996WO1996012231A1 A translation buffer for detecting and preventing conflicting virtual addresses from being stored therein
04/25/1996DE19524324A1 Non-volatile semiconductor storage device
04/24/1996EP0708451A1 Semiconductor memory device
04/24/1996CN1121248A Unlosable semiconductor memory device
04/24/1996CN1121247A Redundancy scheme for memory circuits
04/23/1996US5511227 Method for configuring a composite drive for a disk drive array controller
04/23/1996US5511180 Method and circuit for determining the size of a cache memory
04/23/1996US5511177 File data multiplexing method and data processing system
04/23/1996US5511162 Automatic LSI testing apparatus using expert system
04/23/1996US5511029 Test circuit in clock synchronous semiconductor memory device
04/23/1996US5511028 Redundancy enable circuit capable of achieving increase in repair efficiency
04/23/1996US5511027 Semiconductor memory apparatus having a plurality of word line drive circuits
04/18/1996WO1996011472A2 A memory device
04/17/1996EP0707267A2 Redundant array of disk drives with asymmetric mirroring and asymmetric mirroring data processing method
04/17/1996CN1120740A Nonlosable semiconductor memory
04/16/1996US5509018 Flash-erase-type nonvolatile semiconductor storage device
04/16/1996US5508969 Adjacent row shift redundancy circuit having signal restorer coupled to programmable links
04/16/1996US5508963 Semiconductor integrated circuit
04/16/1996US5508721 Display unit having automatic testing function
04/16/1996US5508638 Low current redundancy fuse assembly
04/16/1996US5508631 Semiconductor test chip with on wafer switching matrix
04/16/1996CA2044121C Method and means of shortening memory fetch time
04/10/1996EP0706127A2 Methods and system for detecting data loss in a hierarchic data storage system
04/09/1996US5506959 Method and apparatus for testing electronic memories for the presence of multiple cell coupling faults
04/09/1996US5506849 Semiconductor memory device capable of performing an overall test thereon at a shortened time period
04/09/1996US5506807 Memory circuit with redundancy
04/09/1996US5506805 Static semiconductor memory device having circuitry for enlarging write recovery margin
04/09/1996US5506804 Dynamic Random Access Type Semiconductor Device
04/09/1996US5506499 Multiple probing of an auxilary test pad which allows for reliable bonding to a primary bonding pad
04/09/1996US5506437 Microcomputer with high density RAM in separate isolation well on single chip
04/03/1996EP0704854A1 Memory device having error detection and correction function, and methods for reading, writing and erasing the memory device
04/03/1996EP0704801A2 Memory architecture for solid state disc
04/03/1996EP0704800A2 Semiconductor memory device including redundant bit line selection signal generating circuit
04/03/1996EP0378332B1 Semiconductor memory device with redundancy circuits
04/03/1996EP0376245B1 Semiconductors memory device provided with an improved redundant decoder
04/02/1996US5504882 Fault tolerant data storage subsystem employing hierarchically arranged controllers
04/02/1996US5504713 Semiconductor memory device with redundancy circuit
04/02/1996US5504712 Memory in integrated circuit
04/02/1996US5504373 Semiconductor memory module
04/02/1996US5504354 Interconnect substrate with circuits for field-programmability and testing of multichip modules and hybrid circuits
03/1996
03/27/1996EP0703526A2 Storage management system for concurrent generation and fair allocation of disk space
03/27/1996EP0636258B1 Integrated semiconductor memory with redundancy arrangement
03/26/1996US5502836 Method for disk restriping during system operation
03/26/1996US5502814 Method of detecting defective memory locations in computer system
03/26/1996US5502813 Method and apparatus for testing an NVM
03/26/1996US5502728 Large, fault-tolerant, non-volatile, multiported memory
03/26/1996US5502678 Full memory chip long write test mode
03/26/1996US5502677 Semiconductor memory device incorporating a test mode therein to perform an automatic refresh function
03/26/1996US5502676 Integrated circuit memory with column redundancy having shared read global data lines
03/26/1996US5502675 Semiconductor memory device having a multi-bit input/output configuration which is capable of correcting a bit failure
03/26/1996US5502674 Method and apparatus for repair of memory by redundancy