Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
---|
05/23/1996 | DE19542033A1 Memory device redundancy circuit for masked ROM error correction |
05/21/1996 | US5519712 Current mode test circuit for SRAM |
05/21/1996 | US5519659 Semiconductor memory device having circuit for activating predetermined rows of memory cells upon detection of disturb refresh test |
05/21/1996 | US5519657 Semiconductor memory device having a redundant memory array and a testing method thereof |
05/21/1996 | US5519652 Nonvolatile semiconductor memory for positively holding stored data |
05/21/1996 | US5519650 Semiconductor device having an improved immunity to a short-circuit at a power supply line |
05/15/1996 | EP0712079A2 Recovery method for a high availability data processing system |
05/15/1996 | EP0711447A1 Programmable logic device with verify circuitry for classifying fuse link states as validly closed, validly open or invalid |
05/15/1996 | EP0711436A1 Distributed directory for information stored on audio quality memory devices |
05/15/1996 | EP0480966B1 A fault tolerant data storage system |
05/15/1996 | EP0315209B1 Microcomputer incorporating memory |
05/15/1996 | DE4416171C2 EEPROM-Vorrichtung EEPROM device |
05/15/1996 | DE19540915A1 Redundante Anordnung von Festkörper-Speicherbausteinen Redundant array of solid state memory devices |
05/15/1996 | CN1122473A Fifo buffer system having an error detection and correction device |
05/14/1996 | US5517616 Multi-processor computer system with system monitoring by each processor and exchange of system status information between individual processors |
05/14/1996 | US5517458 Roll call decoder for semiconductor memory having redundant memory cells |
05/14/1996 | US5517457 Semiconductor memory device |
05/14/1996 | US5517455 Integrated circuit with fuse circuitry simulating fuse blowing |
05/14/1996 | US5517451 Semiconductor memory device and memory initializing method |
05/14/1996 | US5517450 Semiconductor memory device with redundancy circuit |
05/14/1996 | US5517442 Random access memory and an improved bus arrangement therefor |
05/11/1996 | CA2162317A1 Redundant array of solid state memory devices |
05/09/1996 | WO1996013731A1 Semiconductor test chip with on-wafer switching matrix |
05/07/1996 | US5515526 Apparatus for detecting redundant circuit included in logic circuit and method therefor |
05/07/1996 | US5515333 Semiconductor memory |
05/07/1996 | US5515326 Static semiconductor memory device having circuitry for lowering potential of bit lines at commencement of data writing |
05/07/1996 | US5515324 EEPROM having NAND type memory cell array |
05/07/1996 | US5515318 Method of evaluating the gate oxide of non-volatile EPROM, EEPROM and flash-EEPROM memories |
05/07/1996 | US5514980 High resolution circuit and method for sensing antifuses |
05/07/1996 | US5514975 Data output impedance control |
05/07/1996 | US5514884 Very high density wafer scale device architecture |
05/02/1996 | WO1996013003A1 An efficient method for obtaining usable parts from a partially good memory integrated circuit |
05/01/1996 | EP0709853A1 Circuit structure and method for stress testing of bit lines |
05/01/1996 | EP0709782A2 Error detection system for mirrored memory between dual disk storage controllers |
05/01/1996 | EP0709781A2 System for using mirrored memory as a robust communication path between dual disk storage controllers |
05/01/1996 | EP0709776A1 Method for detecting and correcting an error in a multilevel memory and memory device implementing the method |
05/01/1996 | EP0709765A2 Method and system for selecting data for migration in a hierarchic data storage system using frequency distribution tables |
05/01/1996 | EP0438705B1 Integrated circuit driver inhibit control method for test |
04/30/1996 | US5513344 Method of testing cache memories used for an information processing apparatus |
04/30/1996 | US5513327 Integrated circuit I/O using a high performance bus interface |
04/30/1996 | US5513318 Method for built-in self-testing of ring-address FIFOs |
04/30/1996 | US5513314 Computer system |
04/30/1996 | US5513193 Non-volatile semiconductor memory device capable of checking the threshold value of memory cells |
04/30/1996 | US5513192 Fault tolerant disk drive system with error detection and correction |
04/30/1996 | US5513144 On-chip memory redundancy circuitry for programmable non-volatile memories, and methods for programming same |
04/30/1996 | US5513142 Semiconductor memory device for maintaining level of signal line |
04/30/1996 | US5513137 Flash memory having transistor redundancy |
04/30/1996 | US5512846 Signal selecting device controlled by a serially transmitted mode signal requiring but one terminal |
04/30/1996 | US5512397 Stepper scanner discretionary lithography and common mask discretionary lithography for integrated circuits |
04/25/1996 | WO1996012231A1 A translation buffer for detecting and preventing conflicting virtual addresses from being stored therein |
04/25/1996 | DE19524324A1 Non-volatile semiconductor storage device |
04/24/1996 | EP0708451A1 Semiconductor memory device |
04/24/1996 | CN1121248A Unlosable semiconductor memory device |
04/24/1996 | CN1121247A Redundancy scheme for memory circuits |
04/23/1996 | US5511227 Method for configuring a composite drive for a disk drive array controller |
04/23/1996 | US5511180 Method and circuit for determining the size of a cache memory |
04/23/1996 | US5511177 File data multiplexing method and data processing system |
04/23/1996 | US5511162 Automatic LSI testing apparatus using expert system |
04/23/1996 | US5511029 Test circuit in clock synchronous semiconductor memory device |
04/23/1996 | US5511028 Redundancy enable circuit capable of achieving increase in repair efficiency |
04/23/1996 | US5511027 Semiconductor memory apparatus having a plurality of word line drive circuits |
04/18/1996 | WO1996011472A2 A memory device |
04/17/1996 | EP0707267A2 Redundant array of disk drives with asymmetric mirroring and asymmetric mirroring data processing method |
04/17/1996 | CN1120740A Nonlosable semiconductor memory |
04/16/1996 | US5509018 Flash-erase-type nonvolatile semiconductor storage device |
04/16/1996 | US5508969 Adjacent row shift redundancy circuit having signal restorer coupled to programmable links |
04/16/1996 | US5508963 Semiconductor integrated circuit |
04/16/1996 | US5508721 Display unit having automatic testing function |
04/16/1996 | US5508638 Low current redundancy fuse assembly |
04/16/1996 | US5508631 Semiconductor test chip with on wafer switching matrix |
04/16/1996 | CA2044121C Method and means of shortening memory fetch time |
04/10/1996 | EP0706127A2 Methods and system for detecting data loss in a hierarchic data storage system |
04/09/1996 | US5506959 Method and apparatus for testing electronic memories for the presence of multiple cell coupling faults |
04/09/1996 | US5506849 Semiconductor memory device capable of performing an overall test thereon at a shortened time period |
04/09/1996 | US5506807 Memory circuit with redundancy |
04/09/1996 | US5506805 Static semiconductor memory device having circuitry for enlarging write recovery margin |
04/09/1996 | US5506804 Dynamic Random Access Type Semiconductor Device |
04/09/1996 | US5506499 Multiple probing of an auxilary test pad which allows for reliable bonding to a primary bonding pad |
04/09/1996 | US5506437 Microcomputer with high density RAM in separate isolation well on single chip |
04/03/1996 | EP0704854A1 Memory device having error detection and correction function, and methods for reading, writing and erasing the memory device |
04/03/1996 | EP0704801A2 Memory architecture for solid state disc |
04/03/1996 | EP0704800A2 Semiconductor memory device including redundant bit line selection signal generating circuit |
04/03/1996 | EP0378332B1 Semiconductor memory device with redundancy circuits |
04/03/1996 | EP0376245B1 Semiconductors memory device provided with an improved redundant decoder |
04/02/1996 | US5504882 Fault tolerant data storage subsystem employing hierarchically arranged controllers |
04/02/1996 | US5504713 Semiconductor memory device with redundancy circuit |
04/02/1996 | US5504712 Memory in integrated circuit |
04/02/1996 | US5504373 Semiconductor memory module |
04/02/1996 | US5504354 Interconnect substrate with circuits for field-programmability and testing of multichip modules and hybrid circuits |
03/27/1996 | EP0703526A2 Storage management system for concurrent generation and fair allocation of disk space |
03/27/1996 | EP0636258B1 Integrated semiconductor memory with redundancy arrangement |
03/26/1996 | US5502836 Method for disk restriping during system operation |
03/26/1996 | US5502814 Method of detecting defective memory locations in computer system |
03/26/1996 | US5502813 Method and apparatus for testing an NVM |
03/26/1996 | US5502728 Large, fault-tolerant, non-volatile, multiported memory |
03/26/1996 | US5502678 Full memory chip long write test mode |
03/26/1996 | US5502677 Semiconductor memory device incorporating a test mode therein to perform an automatic refresh function |
03/26/1996 | US5502676 Integrated circuit memory with column redundancy having shared read global data lines |
03/26/1996 | US5502675 Semiconductor memory device having a multi-bit input/output configuration which is capable of correcting a bit failure |
03/26/1996 | US5502674 Method and apparatus for repair of memory by redundancy |