| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
|---|
| 03/26/1996 | US5502672 Data output buffer control circuit |
| 03/26/1996 | US5502645 Behavioral synthesis for reconfigurable datapath structures |
| 03/26/1996 | US5502395 Method for programming antifuses for reliable programmed links |
| 03/21/1996 | WO1996008840A1 A flash eprom transistor array and method for manufacturing the same |
| 03/21/1996 | WO1996008822A2 Sense amplifier for non-volatile semiconductor memory |
| 03/21/1996 | DE19506542C1 Power-on self test for personal computer work-station memory |
| 03/20/1996 | EP0702373A1 Redundant address memory and test method therefor |
| 03/20/1996 | EP0702238A1 On-chip oscillator and test method therefor |
| 03/20/1996 | EP0701733A1 A burst mode memory accessing system |
| 03/20/1996 | CN1118924A Memory assembly, odd-even check bit emulator and odd-even check bit emulating method |
| 03/19/1996 | US5500826 Solid state peripheral storage device |
| 03/19/1996 | US5500824 Adjustable cell plate generator |
| 03/19/1996 | US5500823 Memory defect detection arrangement |
| 03/19/1996 | US5500822 Address decoder for repair of memory device |
| 03/19/1996 | US5500821 Semiconductor memory device |
| 03/14/1996 | WO1996007969A1 On board error correction apparatus |
| 03/14/1996 | DE19529691A1 Semiconductor memory with test mode |
| 03/14/1996 | DE19520630A1 Wafer burn-in test circuit for sensing defective cell of semiconductor memory device |
| 03/13/1996 | EP0701259A2 Auto-program circuit for a non-volatile memory device |
| 03/13/1996 | EP0701212A2 Data processor with address translation mechanism |
| 03/13/1996 | EP0701210A2 Data processor having data bus and instruction fetch bus provided separately from each other |
| 03/13/1996 | EP0505652B1 Memory system with adaptable redundancy |
| 03/13/1996 | CN1118519A Semiconductor memory device |
| 03/12/1996 | US5499385 Method for accessing and transmitting data to/from a memory in packets |
| 03/12/1996 | US5499250 System having multiple subsystems and test signal source resident upon common substrate |
| 03/12/1996 | US5499249 Method and apparatus for test generation and fault simulation for sequential circuits with embedded random access memories (RAMs) |
| 03/12/1996 | US5499248 Test vector generator comprising a decompression control unit and a conditional vector processing unit and method for generating a test vector |
| 03/12/1996 | US5499211 Bit-line precharge current limiter for CMOS dynamic memories |
| 03/12/1996 | US5498990 Reduced CMOS-swing clamping circuit for bus lines |
| 03/12/1996 | US5498886 Circuit module redundancy architecture |
| 03/10/1996 | CA2131735A1 Board errors correction apparatus |
| 03/06/1996 | EP0699999A2 Memory architecture for automatic test equipment using vector module table |
| 03/05/1996 | US5497459 System for testing instruction queue circuit and central processing unit having the system |
| 03/05/1996 | US5497458 Cache testability circuit for embedded diagnostics |
| 03/05/1996 | US5497378 System and method for testing a circuit network having elements testable by different boundary scan standards |
| 03/05/1996 | US5497376 Method and device for detecting and correcting errors in memory modules |
| 03/05/1996 | US5497353 Semiconductor memory device |
| 03/05/1996 | US5497350 Integrated semiconductor memory device capable of switching from a memory mode to an internal test mode |
| 03/05/1996 | US5497348 Burn-in detection circuit |
| 03/05/1996 | US5497347 BICMOS cache TAG comparator having redundancy and separate read an compare paths |
| 03/05/1996 | US5497117 Input sense circuit having selectable thresholds |
| 03/05/1996 | US5497079 Semiconductor testing apparatus, semiconductor testing circuit chip, and probe card |
| 02/29/1996 | DE19530660A1 Microcomputer system with direct or indirect communication with EEPROM |
| 02/28/1996 | EP0698891A1 Testing a non-volatile memory |
| 02/28/1996 | EP0698890A1 Testing an integrated circuit device |
| 02/28/1996 | EP0698889A1 Memory device |
| 02/28/1996 | EP0698848A1 Method and apparatus for testing an integrated circuit |
| 02/28/1996 | EP0698273A1 Memory iddq-testable through cumulative word line activation |
| 02/27/1996 | US5495572 Data reconstruction method and system wherein timing of data reconstruction is controlled in accordance with conditions when a failure occurs |
| 02/27/1996 | US5495491 System using a memory controller controlling an error correction means to detect and correct memory errors when and over a time interval indicated by registers in the memory controller |
| 02/27/1996 | US5495448 Memory testing through cumulative word line activation |
| 02/27/1996 | US5495447 Method and apparatus using mapped redundancy to perform multiple large block memory array repair |
| 02/27/1996 | US5495446 Pre-charged exclusionary wired-connected programmed redundant select |
| 02/27/1996 | US5495445 Redundancy scheme for memory circuits |
| 02/22/1996 | WO1996005191A1 Natriuretic cyclic compounds |
| 02/22/1996 | DE4429633A1 Memories monitoring method for EEPROM and battery buffered memory |
| 02/21/1996 | EP0697702A2 Semiconductor memory device and high-voltage switching circuit |
| 02/21/1996 | EP0697660A1 HMC: a hybrid mirrored and chained data replication method to support high availability for disk arrays |
| 02/21/1996 | EP0697659A1 Redundancy circuit for an integrated circuit semiconductor memory |
| 02/21/1996 | CN1117193A Method and circuit for preparing defect in semiconductor memory device |
| 02/21/1996 | CN1117167A Apparatus for generating address data |
| 02/21/1996 | CN1031084C Computer controlled optimized pairing of disk units |
| 02/21/1996 | CN1031083C Memory card resident diagnostic testing |
| 02/20/1996 | US5493676 Severe environment data recording system |
| 02/20/1996 | US5493532 Integrated circuit memory with disabled edge transition pulse generation during special test mode |
| 02/20/1996 | US5493531 Integrated circuitry for checking the utilization rate of redundancy memory elements in a semiconductor memory device |
| 02/14/1996 | CN1116755A Active matrix panel and method for fabricating the same |
| 02/14/1996 | CN1116710A Wafer burn-in test circuit of a semiconductor memory device |
| 02/13/1996 | US5491665 IDDQ -testable RAM |
| 02/13/1996 | US5491664 Flexibilitiy for column redundancy in a divided array architecture |
| 02/13/1996 | US5491662 Microcontroller memory cell current reading method |
| 02/13/1996 | US5491660 On-chip operation control for memories |
| 02/13/1996 | US5491655 Semiconductor memory device having non-selecting level generation circuitry for providing a low potential during reading mode and high level potential during another operation mode |
| 02/13/1996 | US5491444 Fuse circuit with feedback disconnect |
| 02/13/1996 | US5491359 Microcomputer with high density ram in separate isolation well on single chip |
| 02/07/1996 | EP0696031A1 Programmable integrated memory with emulation means |
| 02/06/1996 | US5490264 Generally-diagonal mapping of address space for row/column organizer memories |
| 02/06/1996 | US5490115 Method and apparatus for writing to memory cells in a minimum number of cycles during a memory test operation |
| 02/06/1996 | US5490107 Nonvolatile semiconductor memory |
| 02/01/1996 | WO1996002917A1 Testing of memory content |
| 02/01/1996 | WO1996002916A1 Memory with stress circuitry for detecting defects |
| 02/01/1996 | DE4427108A1 Kraftfahrzeug-Steuergerät Motor vehicle control device |
| 02/01/1996 | CA2194289A1 Testing of memory content |
| 01/31/1996 | EP0694840A2 Motor vehicle controller using electrically erasable and programmable memory |
| 01/31/1996 | EP0427260B1 Non-volatile memory devices |
| 01/31/1996 | CN1030868C Adapter for constructing redundant disk storage system |
| 01/30/1996 | US5488731 Multiprocessor system |
| 01/30/1996 | US5488701 In log sparing for log structured arrays |
| 01/30/1996 | US5488583 Memory integrated circuits having on-chip topology logic driver, and methods for testing and producing such memory integrated circuits |
| 01/30/1996 | US5488578 Semiconductor memory device including bit check function and testing method using the same |
| 01/23/1996 | US5487045 Sense amplifier having variable sensing load for non-volatile memory |
| 01/23/1996 | US5487042 Semiconductor integrated circuit device equipped with answer system for teaching optional functions to diagnostic system |
| 01/23/1996 | US5487041 For increasing the operating speed of a cache memory |
| 01/23/1996 | US5487040 Semiconductor memory device and defective memory cell repair circuit |
| 01/23/1996 | US5487039 Semiconductor memory device |
| 01/23/1996 | US5487036 Nonvolatile semiconductor memory |
| 01/23/1996 | US5486766 Method for testing switch matrices |
| 01/17/1996 | CN1115104A Row redundancy circuit and method for a semiconductor memory device with a double row decoder |
| 01/16/1996 | US5485571 In a computer system |
| 01/16/1996 | US5485474 Scheme for information dispersal and reconstruction |