Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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09/11/1996 | EP0438273B1 Semiconductor memory devices having column redundancy |
09/10/1996 | US5555522 Semiconductor memory having redundant cells |
09/10/1996 | US5555371 Data backup copying with delayed directory updating and reduced numbers of DASD accesses at a back up site using a log structured array data storage |
09/10/1996 | US5555249 Non-destructive memory testing in computers |
09/10/1996 | US5555212 Method and apparatus for redundancy word line replacement in a semiconductor memory device |
09/10/1996 | US5554553 Highly compact EPROM and flash EEPROM devices |
09/04/1996 | EP0730231A2 Semiconductor memory with cells grouped into individually addressable units, and its method of operation |
09/04/1996 | EP0729633A1 Sense amplifier for non-volatile semiconductor memory |
09/04/1996 | EP0163580B1 Semiconductor integrated circuit with redundant circuit replacement |
09/03/1996 | US5553238 Powerfail durable NVRAM testing |
09/03/1996 | US5553233 Management apparatus for volume-medium correspondence information for use in dual file system |
09/03/1996 | US5553232 Automated safestore stack generation and move in a fault tolerant central processor |
09/03/1996 | US5553231 Fault tolerant memory system |
09/03/1996 | US5553082 Built-in self-test for logic circuitry at memory array output |
09/03/1996 | US5553026 Non-volatile semiconductor memory device |
09/03/1996 | US5553025 Semiconductor memory device executing a memory test in a plurality of test modes |
09/03/1996 | US5553023 In a computer system |
09/03/1996 | US5552743 Thin film transistor redundancy structure |
08/29/1996 | WO1996026523A1 An iterative method of recording analog signals |
08/29/1996 | DE19606637A1 Integrated circuit test device for e.g. semiconductor memory |
08/29/1996 | DE19506957A1 Actualization and loading method for application programs in microprocessor memory |
08/28/1996 | EP0729100A1 Cache testing using a modified snoop cycle command |
08/28/1996 | EP0729099A1 Mirror storage controller |
08/28/1996 | EP0729034A2 Test circuit and process for functional testing electronic circuits |
08/28/1996 | EP0728367A1 A flash eprom transistor array and method for manufacturing the same |
08/27/1996 | US5551004 Structure which renders faulty data of a cache memory uncacheable in order that a partially functional cache memory may be utilized |
08/27/1996 | US5550986 Data storage device matrix architecture |
08/27/1996 | US5550974 Testable memory array which is immune to multiple wordline assertions during scan testing |
08/27/1996 | US5550973 In a computer network |
08/27/1996 | US5550846 Circuit for generating an output sequence of values |
08/27/1996 | US5550842 EEPROM verification circuit with PMOS transistors |
08/27/1996 | US5550838 Method for testing characteristics of a semiconductor memory device in a series of steps |
08/27/1996 | US5550776 Semiconductor memory device capable of driving word lines at high speed |
08/27/1996 | US5550394 Semiconductor memory device and defective memory cell correction circuit |
08/22/1996 | WO1996025744A1 On-chip memory redundancy circuitry for programmable non-volatile memories, and methods for programming same |
08/22/1996 | DE19604764A1 Semiconductor memory structure for DRAM, VSRAM and PSRAM |
08/22/1996 | CA2218178A1 Multi-purpose transaction card system |
08/21/1996 | EP0727785A1 Enhanced self-test of memories |
08/21/1996 | EP0419760B1 Zero standby power, radiation hardened, memory redundancy circuit |
08/21/1996 | CN1129338A Semi-conductor memory element |
08/20/1996 | US5548743 Data processing system with duplex common memory having physical and logical path disconnection upon failure |
08/20/1996 | US5548720 Fault supervision method for transmission apparatus |
08/20/1996 | US5548716 Recording medium dualizing system |
08/20/1996 | US5548596 Semiconductor memory device with read out data transmission bus for simultaneously testing a plurality of memory cells and testing method thereof |
08/20/1996 | US5548557 Nonvolatile semiconductor memory device with a row redundancy circuit |
08/20/1996 | US5548555 Method and circuit for repairing defect in a semiconductor memory device |
08/20/1996 | US5548554 Integrated programming circuitry for an electrically programmable semiconductor memory device with redundancy |
08/20/1996 | US5548553 Method and apparatus for providing high-speed column redundancy |
08/20/1996 | US5548225 Block specific spare circuit |
08/15/1996 | WO1996024898A1 Apparatus for entering and executing test mode operations for memory |
08/15/1996 | WO1996024897A2 Parallel processing redundancy scheme for faster access times and lower die area |
08/15/1996 | WO1996011472A3 A memory device |
08/14/1996 | EP0726521A2 Disk array having hot spare resources and methods for using hot spare resources to store user data |
08/14/1996 | EP0726514A2 Methods for using non contiguously reserved storage space for data migration in a redundant hierarchic data storage system |
08/13/1996 | US5546558 Memory system with hierarchic disk array and memory map store for persistent storage of virtual mapping information |
08/13/1996 | US5546556 Disk storage system have a defect map of the disk stored in a memory which is different from the disk |
08/13/1996 | US5546537 Method and apparatus for parallel testing of memory |
08/13/1996 | US5546410 Semiconductor memory device with error self-correction system starting parity bit generation/error correction sequences only when increase of error rate is forecasted |
08/13/1996 | US5546407 Data transmission circuit for checking of memory device |
08/13/1996 | US5546402 Flash-erase-type nonvolatile semiconductor storage device |
08/13/1996 | US5546351 Non-volatile semiconductor memory device and memory system using the same |
08/13/1996 | US5546349 Exchangeable hierarchical data line structure |
08/13/1996 | US5546348 Semiconductor disc storage |
08/08/1996 | WO1996024135A1 Memory having adjustable operating characteristics and methods therefor |
08/07/1996 | EP0725344A1 Semiconductor device incorporating fuse-type roll call circuit |
08/07/1996 | EP0725324A2 Methods for avoiding overcommitment of virtual capacity in a redundant hierarchic data storage system |
08/06/1996 | US5544341 Data access apparatus for preventing further cache access in case of an error during block data transfer |
08/06/1996 | US5544339 Array of disk drives with redundant channels |
08/06/1996 | US5544312 Method of detecting loss of power during block erasure and while writing sector data to a solid state disk |
08/06/1996 | US5544175 Method and apparatus for the capturing and characterization of high-speed digital information |
08/06/1996 | US5544123 Semiconductor memory device having a test circuit |
08/06/1996 | US5544118 Flash EEPROM system cell array with defect management including an error correction scheme |
08/06/1996 | US5544116 Erase and program verification circuit for non-volatile memory |
08/06/1996 | US5544113 Random access memory having a flexible array redundancy scheme |
08/06/1996 | US5544108 Monolithic memory device |
08/06/1996 | US5544107 Diagnostic data port for a LSI or VLSI integrated circuit |
08/06/1996 | US5544106 Semiconductor memory device with redundant decoder available for test sequence on redundant memory cells |
08/06/1996 | US5544105 Static semiconductor memory device having circuitry for lowering potential of bit lines at commencement of data writing |
08/06/1996 | US5544098 Semiconductor memory device having an automatically activated verify function capability |
08/01/1996 | WO1996023259A1 Fault tolerant nfs server system and mirroring protocol |
08/01/1996 | DE19602814A1 Non-volatile semiconductor read-only memory with row redundancy |
07/31/1996 | EP0724267A1 Programmable multibit register for coincidence and jump operations and coincidence fuse cell |
07/30/1996 | US5542066 Destaging modified data blocks from cache memory |
07/30/1996 | US5542065 Methods for using non-contiguously reserved storage space for data migration in a redundant hierarchic data storage system |
07/30/1996 | US5542064 Data read/write method by suitably selecting storage units in which multiple copies of identical data are stored and apparatus therefor |
07/30/1996 | US5541942 Method and system for testing memory utilizing specific bit patterns |
07/30/1996 | US5541938 Method and apparatus for mapping memory as to operable and faulty locations |
07/30/1996 | US5541887 Multiple port cells with improved testability |
07/25/1996 | WO1996022569A1 Self-diagnostic asynchronous data buffers |
07/25/1996 | DE19600804A1 Internal voltage generator circuit for semiconductor memory e.g. DRAM |
07/25/1996 | CA2210153A1 Self-diagnostic asynchronous data buffers |
07/24/1996 | EP0723262A2 scanning memory device and error correction method |
07/24/1996 | EP0722609A1 Circuitry and method for selecting a drain programming voltage for a nonvolatile memory |
07/23/1996 | US5539878 Parallel testing of CPU cache and instruction units |
07/23/1996 | US5539753 Method and apparatus for output deselecting of data during test |
07/23/1996 | US5539702 Test apparatus for semi-conductor memory device |
07/23/1996 | US5539699 Flash memory testing apparatus |
07/23/1996 | US5539698 For replacing a defective normal memory cell with a spare one |
07/23/1996 | US5539697 Method and structure for using defective unrepairable semiconductor memory |
07/23/1996 | US5539694 Memory with on-chip detection of bit line leaks |