Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
10/1996
10/31/1996DE19611709A1 Halbleiterspeichervorrichtung mit Redundanzfunktion A semiconductor memory device with redundancy function
10/31/1996DE19609441A1 Semiconductor DRAM circuit with test mode for personal computer and workstation
10/30/1996EP0740308A2 Dynamic semiconductor memory device
10/29/1996US5570381 Synchronous DRAM tester
10/29/1996US5570318 Semiconductor memory device incorporating redundancy memory cells
10/29/1996US5570317 Memory circuit with stress circuitry for detecting defects
10/29/1996US5570058 Signal line testing circuit causing no delay in transmission of a normal data signal
10/24/1996WO1996033495A1 On-chip capacitor
10/24/1996DE19536232C1 Multiple hard disk storage system
10/23/1996EP0738974A2 Serial access memory device with improved fault tolerance
10/23/1996EP0738418A1 A method of testing a memory address decoder and a fault-tolerant memory address decoder
10/22/1996US5568629 Method for partitioning disk drives within a physical disk array and selectively assigning disk drive partitions into a logical disk array
10/22/1996US5568628 Storage control method and apparatus for highly reliable storage controller with multiple cache memories
10/22/1996US5568626 Method and system for rewriting data in a non-volatile memory a predetermined large number of times
10/22/1996US5568609 Data processing system with path disconnection and memory access failure recognition
10/22/1996US5568444 Semiconductor memory device
10/22/1996US5568439 Flash EEPROM system which maintains individual memory block cycle counts
10/22/1996US5568437 Built-in self test for integrated circuits having read/write memory
10/22/1996US5568436 Semiconductor device and method of screening the same
10/22/1996US5568435 Circuit for SRAM test mode isolated bitline modulation
10/22/1996US5568434 Multi-bit testing circuit for semiconductor memory device
10/22/1996US5568433 For storing data in a data processing system
10/22/1996US5568432 Semiconductor memory device including redundancy memory cell remedying defective memory cell
10/22/1996US5568426 Method and apparatus for performing memory cell verification on a nonvolatile memory circuit
10/22/1996US5568408 Automatic repair data editing system associated with repairing system for semiconductor integrated circuit device
10/22/1996US5568061 Redundant line decoder master enable
10/17/1996WO1996032728A1 Circuit for sram test mode isolated bitline modulation
10/17/1996WO1996032677A1 Improved shift register with comparator
10/17/1996WO1996024897A3 Parallel processing redundancy scheme for faster access times and lower die area
10/16/1996EP0737981A2 Memory device circuit and method for concurrently addressing columns of multiple banks of a multi-bank memory array
10/16/1996EP0737913A1 Scannable last-in-first-out register stack
10/16/1996EP0669622B1 Bias circuit for a transistor in a memory cell
10/15/1996US5566386 Nonvolatile semiconductor memory device having a status register and test method for the same
10/15/1996US5566316 Method and apparatus for hierarchical management of data storage elements in an array storage device
10/15/1996US5566194 Method and apparatus to improve read reliability in semiconductor memories
10/15/1996US5566185 Semiconductor integrated circuit
10/15/1996US5566128 Semiconductor memory device
10/15/1996US5566114 Redundancy circuitry for a semiconductor memory device
10/15/1996US5566110 Electrically erasable programmable read only memory and method of operation
10/15/1996US5566109 EEPROM, write control method for EEPROM, and IC card
10/15/1996US5566107 Programmable circuit for enabling an associated circuit
10/15/1996US5565799 On chip error detection circuit
10/10/1996WO1996031882A1 Memory circuit with hierarchical bit line structure
10/10/1996WO1996031825A1 Memory management
10/09/1996EP0736876A1 Selective fuse encoder
10/09/1996CN1132914A Semiconductor storage device
10/08/1996US5563841 Semiconductor memory device having redundant circuit
10/08/1996US5563833 Using one memory to supply addresses to an associated memory during testing
10/08/1996US5563832 Semiconductor memory device having interface units memorizing available memory cell sub-arrays
10/08/1996US5563830 Semiconductor memory device with data bus having plurality of I/O pins and with circuitry having latching and multiplexing function
10/08/1996US5563820 Semiconductor memory device having two layers of bit lines arranged crossing with each other
10/08/1996US5563546 Selector circuit selecting and outputting voltage applied to one of first and second terminal in response to voltage level applied to first terminal
10/03/1996WO1996030833A1 Electronic data storage devices and methods of manufacture and testing thereof
10/03/1996WO1996030831A1 Memory testing in a multiple processor computer system
10/02/1996EP0735537A2 Apparatus and method for reading and writing data
10/02/1996EP0509485B1 Semiconductor integrated circuit having post-package testing function for error detection and correction circuit
10/02/1996EP0490680B1 A semiconductor memory with multiplexed redundancy
10/02/1996CN1132395A Semiconductor memory device having cache memory function
10/02/1996CN1132354A 半导体集成电路器件 The semiconductor integrated circuit device
10/01/1996US5561765 Algorithm for testing a memory
10/01/1996US5561671 Self-diagnostic device for semiconductor memories
10/01/1996US5561639 Semiconductor memory device with high speed detect function
10/01/1996US5561636 Random access memory with a simple test arrangement
10/01/1996US5561635 PROM IC enabling a stricter memory cell margin test
10/01/1996US5561632 Nonvolatile semiconductor flash memory
10/01/1996US5561631 High-speed minimal logic self blank checking method for programmable logic device
10/01/1996US5561628 IC card and a method for parallel processing flash memories
10/01/1996US5561627 Nonvolatile semiconductor memory device and data processor
10/01/1996US5561621 Non-volatile programmable bistable multivibrator with reduced parasitics in reading mode notably for memory redundancy circuit
09/1996
09/26/1996WO1996029704A1 Eeprom array with flash-like core
09/26/1996WO1996029649A1 Method and system for testing memory programming devices
09/25/1996EP0733975A1 Binary data output interface
09/25/1996EP0733974A2 Memory device for the representation of analog signals
09/25/1996EP0733973A1 Information coherency detector contained in an integrated circuit
09/24/1996US5559956 Storage system with a flash memory module
09/24/1996US5559764 HMC: A hybrid mirror-and-chained data replication method to support high data availability for disk arrays
09/24/1996US5559748 Semiconductor integrated circuit allowing change of product specification and chip screening method therewith
09/24/1996US5559747 Static RAM and processing apparatus including static RAM
09/24/1996US5559745 Static random access memory SRAM having weak write test circuit
09/24/1996US5559744 Semiconductor integrated circuit device having a test mode setting circuit
09/24/1996US5559743 Redundancy circuitry layout for a semiconductor memory device
09/24/1996US5559742 Flash memory having transistor redundancy
09/24/1996US5559741 Semiconductor memory device
09/24/1996US5559739 Dynamic random access memory with a simple test arrangement
09/19/1996WO1996028826A1 Semiconductor memory device having deterioration determining function
09/18/1996EP0732703A1 Method for testing a semiconductor memory circuit
09/18/1996EP0732701A2 Bit-line precharge current limiter for CMOS dynamic memories
09/17/1996US5557619 Integrated circuits with a processor-based array built-in self test circuit
09/17/1996US5557618 Signal sampling circuit with redundancy
09/17/1996US5557574 Semiconductor memory device with function of carrying out logic judgement for correct recognition of memory operation
09/17/1996US5557573 Entire wafer stress test method for integrated memory devices and circuit therefor
09/17/1996US5557571 Dynamic random access memory with internal testing switches
09/17/1996US5557232 Semiconductor integrated circuit device having a control circuit for setting the test mode
09/17/1996US5557195 Method and apparatus for evaluating electrostatic discharge conditions
09/12/1996DE4143452C2 Cache control unit for fault tolerant computer system
09/12/1996DE19609085A1 Faulty block detection system in semiconductor equipment
09/11/1996EP0731471A1 Static random access memories
09/11/1996EP0731470A2 Method for erasing nonvolatile semiconductor memory device incorporating redundancy memory cells
09/11/1996EP0730764A1 A fault tolerant queue system
09/11/1996EP0491523B1 A semiconductor memory with precharged redundancy multiplexing
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