| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 02/18/1997 | US5604756 Testing device for concurrently testing a plurality of semiconductor memories |
| 02/18/1997 | US5604710 Arrangement of power supply and data input/output pads in semiconductor memory device |
| 02/18/1997 | US5604703 Semiconductor memory device with error check-correction function permitting reduced read-out time |
| 02/18/1997 | US5604702 Dynamic redundancy circuit for memory in integrated circuit form |
| 02/18/1997 | US5604699 Method of evaluating the dielectric layer of nonvolatile EPROM, EEPROM and flash-EEPROM memories |
| 02/18/1997 | US5604693 On-chip program voltage generator for antifuse repair |
| 02/13/1997 | WO1997005626A1 Method and apparatus for performing memory cell verification on a nonvolatile memory circuit |
| 02/13/1997 | WO1997005621A1 Memory system having non-volatile data storage structure for memory control parameters and method |
| 02/12/1997 | EP0758112A1 Integrated semiconductor memory device having redundancy circuit arrangement |
| 02/12/1997 | EP0757837A1 A method and apparatus for testing a memory circuit with parallel block write operation |
| 02/12/1997 | EP0757836A1 An iterative method of recording analog signals |
| 02/11/1997 | US5602988 Fault tolerant queue system |
| 02/11/1997 | US5602987 Flash EEprom system |
| 02/11/1997 | US5602855 Integrated test circuit |
| 02/11/1997 | US5602792 Semiconductor device having supply voltage converting circuits |
| 02/11/1997 | US5602789 Electrically erasable and programmable non-volatile and multi-level memory systemn with write-verify controller |
| 02/11/1997 | US5602786 Method for programming redundancy registers in a column redundancy integrated circuitry for a semiconductor memory device, and column redundancy integrated circuitry |
| 02/11/1997 | US5602782 Pipeline-operating type memory system capable of reading data from a memory array having data width larger than the output data width |
| 02/11/1997 | US5602778 Nonvolatile semiconductor memory device with a row redundancy circuit |
| 02/11/1997 | US5602777 Semiconductor memory device having floating gate transistors and data holding means |
| 02/11/1997 | US5602044 Memory with on-chip detection of bit line leaks |
| 02/06/1997 | WO1997004459A1 Built in self test (bist) for multiple rams |
| 02/06/1997 | WO1997004328A1 Memory defect analyzer for semiconductor memory tester |
| 02/06/1997 | DE4434105C2 Halbleiterspeichervorrichtung mit einer verbesserten Immunität gegen einen Kurzschluß auf einer Stromversorgungsleitung und Verfahren zum Reparieren einer Halbleiterspeichervorrichtung A semiconductor memory device with an improved immunity to a short circuit on a power supply line and method of repairing a semiconductor memory device |
| 02/05/1997 | EP0757353A2 Multi-port random access memory |
| 02/05/1997 | EP0530376B1 Semiconductor memory having nonvolatile semiconductor memory cell |
| 02/05/1997 | EP0480752B1 Semiconductor memory device with short circuit identifying means |
| 02/04/1997 | US5600821 Distributed directory for information stored on audio quality memory devices |
| 02/04/1997 | US5600600 Method for programming and testing a nonvolatile memory |
| 02/04/1997 | US5600594 Threshold voltage measuring device for memory cells |
| 02/04/1997 | US5600593 Apparatus and method for reducing erased threshold voltage distribution in flash memory arrays |
| 02/04/1997 | US5600277 Apparatus and method for a NMOS redundancy fuse passgate circuit using a VPP supply |
| 01/30/1997 | WO1997003401A1 Address comparing for non-precharged redundancy address matching |
| 01/28/1997 | US5598528 Checking for proper locations of storage device in a storage device array |
| 01/28/1997 | US5598373 Semiconductor memory system |
| 01/23/1997 | WO1997002574A1 Method of testing semiconductor memory and apparatus for implementing the method |
| 01/22/1997 | EP0755009A2 Data server employing doubly striped mirroring of data across multiple storage disks |
| 01/22/1997 | EP0674264B1 Circuit for selecting redundant memory elements and FLASH EEPROM containing said circuit |
| 01/22/1997 | EP0402542B1 Method of removing uncommitted changes to stored data by a database management system |
| 01/21/1997 | US5596713 Method to prevent data loss in an electrically erasable read only memory |
| 01/21/1997 | US5596711 Computer failure recovery and alert system |
| 01/21/1997 | US5596583 Test circuitry, systems and methods |
| 01/21/1997 | US5596542 Semiconductor memory device having dual word line configuration |
| 01/21/1997 | US5596538 Semiconductor memory device |
| 01/21/1997 | US5596537 Semiconductor device test circuit having test enable circuitry and test mode-entry circuitry |
| 01/21/1997 | US5596536 Redundancy circuit |
| 01/21/1997 | US5596535 Semiconductor storage device |
| 01/16/1997 | DE4344233C2 Halbleitervorrichtung Semiconductor device |
| 01/16/1997 | DE4328605C2 Halbleiterspeichereinrichtung A semiconductor memory device |
| 01/15/1997 | EP0753860A2 A semiconductor memory with a clocked access code for test mode entry |
| 01/15/1997 | EP0753859A1 Method for setting the threshold voltage of a reference memory cell |
| 01/15/1997 | EP0753815A2 Method and system for the automatic detection and correction of invalid data sets |
| 01/15/1997 | CN1140316A Semiconductor memory device capable of simultaneously designating multibit test mode and special test mode |
| 01/14/1997 | US5594900 System and method for providing a backup copy of a database |
| 01/14/1997 | US5594886 Pseudo-LRU cache memory replacement method and apparatus utilizing nodes |
| 01/14/1997 | US5594743 Fifo buffer system having an error detection and correction device |
| 01/14/1997 | US5594701 Semiconductor memory device having a plurality of blocks |
| 01/14/1997 | US5594694 Memory circuit with switch for selectively connecting an input/output pad directly to a nonvolatile memory cell |
| 01/14/1997 | US5594693 Matrix device with redundancy fuses for integrated memory |
| 01/14/1997 | US5594689 Non-volatile semiconductor memory capable of erase- verifying memory cells in a test mode using a defective count circuit activated by a test mode signal |
| 01/09/1997 | DE4336884C2 Schaltungsanordnung Circuitry |
| 01/09/1997 | DE4335061C2 Mehrspeichervorrichtung More memory device |
| 01/08/1997 | EP0752706A1 Method to set an integrated circuit in a second operating mode |
| 01/08/1997 | EP0525771B1 Data processing device comprising a multiport RAM as a sequential circuit |
| 01/07/1997 | US5592650 Computer apparatus and method for replacing programs between memories by employing protection mechanism with write enable generation scheme |
| 01/07/1997 | US5592632 Defect tolerant integrated circuit subsystem for communication between a module and a bus controller in a wafer-scale integrated circuit system |
| 01/07/1997 | US5592618 Remote copy secondary data copy validation-audit function |
| 01/07/1997 | US5592616 Method for performing efficient memory testing on large memory arrays using test code executed from cache memory |
| 01/07/1997 | US5592499 Semiconductor memory device |
| 01/07/1997 | US5592494 Semiconductor integrated circuit |
| 01/07/1997 | US5592427 Semiconductor memory having a sense amplifier with load transistors having different load characteristics |
| 01/07/1997 | US5592425 Method and apparatus for testing a memory where data is passed through the memory for comparison with data read from the memory |
| 01/07/1997 | US5592424 Semiconductor integrated circuit device |
| 01/07/1997 | US5592423 Semiconductor integrated circuit enabling external monitor and control of voltage generated in internal power supply circuit |
| 01/07/1997 | US5592422 Reduced pin count stress test circuit for integrated memory devices and method therefor |
| 01/07/1997 | US5592419 Flash memory with improved erasability and its circuitry |
| 01/07/1997 | US5592417 Non-volatile programmable bistable multivibrator, programmable by the source, for memory redundancy circuit |
| 01/07/1997 | US5592416 Electronic storage circuit |
| 01/07/1997 | US5592077 Circuits, systems and methods for testing ASIC and RAM memory devices |
| 01/07/1997 | US5592018 Membrane dielectric isolation IC fabrication |
| 01/07/1997 | US5592007 Membrane dielectric isolation transistor fabrication |
| 01/03/1997 | WO1997000559A1 Dedicated alu architecture for 10-bit reed-solomon error correction module |
| 01/03/1997 | WO1997000518A1 Semiconductor memory, memory device, and memory card |
| 01/03/1997 | WO1997000478A1 Parallel testing of cpu cache and instruction units |
| 01/02/1997 | EP0751397A2 Test mode setting circuit of test circuit for semiconductor memory |
| 01/01/1997 | CN1139276A Auto-program circuit in nonvolatile semiconductor memory device |
| 12/31/1996 | US5590276 Method for synchronizing reserved areas in a redundant storage array |
| 12/31/1996 | US5590272 Defect recovery method |
| 12/31/1996 | US5590085 Column redundancy device for semiconductor memory |
| 12/31/1996 | US5590079 Wafer burn-in test circuit of a semiconductor memory device |
| 12/31/1996 | US5590075 Method for testing an electrically erasable and programmable memory device |
| 12/31/1996 | US5590074 Nonvolatile semiconductor memory |
| 12/27/1996 | WO1996042054A1 Method, system and apparatus for efficiently generating binary numbers for testing storage devices |
| 12/27/1996 | WO1996042052A1 Method and apparatus for detecting duplicate entries in a look-up table |
| 12/27/1996 | EP0750315A2 Non-volatile semiconductor memory |
| 12/24/1996 | US5588115 Redundancy analyzer for automatic memory tester |
| 12/24/1996 | US5588111 Fault-tolerant computer system having switchable I/O bus interface modules |
| 12/24/1996 | US5588110 Method for transferring data between two devices that insures data recovery in the event of a fault |
| 12/24/1996 | US5588046 Digital telephone answering device and method of testing message storage memory therein |
| 12/24/1996 | US5587950 Test circuit in clock synchronous semiconductor memory device |