| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 04/15/1997 | US5621682 Memory system |
| 04/15/1997 | US5621348 Output driver circuit for suppressing noise generation and integrated circuit device for burn-in test |
| 04/10/1997 | DE19542029C1 Verfahren zum selbsttätigen Ermitteln der nötigen Hochspannung zum Programmieren/Löschen eines EEPROMs A method of automatically determining the necessary high voltage for programming / erasing of an EEPROM |
| 04/08/1997 | US5619642 Fault tolerant memory system which utilizes data from a shadow memory device upon the detection of erroneous data in a main memory device |
| 04/08/1997 | US5619513 Fast, cost-effective method for memory testing |
| 04/08/1997 | US5619469 Fuse redundancy circuitry for a semiconductor memory device |
| 04/08/1997 | US5619463 Integrated circuit device and test method therefor |
| 04/08/1997 | US5619462 Fault detection for entire wafer stress test |
| 04/08/1997 | US5619461 Memory system having internal state monitoring circuit |
| 04/08/1997 | US5619460 Method of testing a random access memory |
| 04/08/1997 | US5619459 On-chip mobile ion contamination test circuit |
| 04/08/1997 | US5619455 Pipeline-operating type memory system capable of reading data from a memory array having data width larger than the output data width |
| 04/08/1997 | US5619453 Memory system having programmable flow control register |
| 04/08/1997 | US5619450 Drive circuit for flash memory with improved erasability |
| 04/08/1997 | US5619223 Apparatus for increasing the effective yield of displays with integregated row select driver circuit |
| 04/03/1997 | WO1997012366A2 Hard disk storage system with coupled disks |
| 04/03/1997 | DE19639972A1 Hochgeschwindigkeitstestschaltkreis für eine Halbleiterspeichervorrichtung High-speed test circuit for a semiconductor memory device |
| 04/03/1997 | DE19536226A1 Testbare Schaltungsanordnung mit mehreren identischen Schaltungsblöcken Testable circuit with several identical circuit blocks |
| 04/02/1997 | EP0766259A2 Dynamic random access memory |
| 04/02/1997 | EP0766258A2 Dram signal margin test method |
| 04/02/1997 | EP0766255A1 Parallel programming method of memory words and corresponding circuit |
| 04/02/1997 | EP0766176A2 Replacement semiconductor read-only memory |
| 04/02/1997 | EP0766175A1 Integrated semiconductor memory having redundant memory cells |
| 04/02/1997 | EP0766092A1 Testable circuit with multiple identical circuit blocks |
| 04/02/1997 | EP0765522A1 Memory test system |
| 04/02/1997 | EP0765497A1 Memory error correction |
| 04/01/1997 | US5617534 Interface protocol for testing of a cache memory |
| 04/01/1997 | US5617531 Data Processor having a built-in internal self test controller for testing a plurality of memories internal to the data processor |
| 04/01/1997 | US5617369 Dynamic semiconductor memory device having excellent charge retention characteristics |
| 04/01/1997 | US5617366 Method and apparatus for a test control circuit of a semiconductor memory device |
| 04/01/1997 | US5617365 Semiconductor device having redundancy circuit |
| 04/01/1997 | US5617364 Semiconductor memory device |
| 04/01/1997 | US5617049 Pulse signal generator and redundancy selection signal generator |
| 03/27/1997 | WO1997011381A1 Memory tester |
| 03/26/1997 | EP0764330A1 Eeprom array with flash-like core |
| 03/26/1997 | CN1146053A Non-volatile semiconductor memory |
| 03/25/1997 | US5615335 Storage system self-test apparatus and method |
| 03/25/1997 | US5615330 Recovery method for a high availability data processing system |
| 03/25/1997 | US5615329 Remote data duplexing |
| 03/25/1997 | US5615166 Semiconductor memory integrated circuit |
| 03/25/1997 | US5615165 Non-volatile semiconductor memory device and memory system using the same |
| 03/25/1997 | US5615164 Latched row decoder for a random access memory |
| 03/25/1997 | US5615163 Semiconductor memory device |
| 03/25/1997 | US5615159 Memory system with non-volatile data storage unit and method of initializing same |
| 03/25/1997 | US5615158 Sense amplifier circuit for detecting degradation of digit lines and method thereof |
| 03/25/1997 | US5615157 Semiconductor memory testing apparatus |
| 03/25/1997 | US5615156 Semiconductor memory device having plural memory mats with centrally located reserve bit or word lines |
| 03/25/1997 | US5615154 Flash memory device having erase verification |
| 03/25/1997 | US5615148 Nonvolatile semiconductor memory |
| 03/25/1997 | US5615133 Method and device for storing transaction data |
| 03/19/1997 | EP0763794A2 Semiconductor memory and method for substituting a redundancy memory cell |
| 03/19/1997 | CN1145684A Eeprom array with flash-like core |
| 03/19/1997 | CN1145522A Device and method of writing-in or reading-out data |
| 03/18/1997 | US5613087 In a computer system |
| 03/18/1997 | US5613077 Method and circuit for communication between a module and a bus controller in a wafer-scale integrated circuit system |
| 03/18/1997 | US5612964 High performance, fault tolerant orthogonal shuffle memory and method |
| 03/18/1997 | US5612919 Method of testing an operation of a semiconductor memory device and semiconductor memory device which can be subjected to such an operation test |
| 03/18/1997 | US5612918 Redundancy architecture |
| 03/18/1997 | US5612917 Semiconductor memory device including improved redundancy circuit |
| 03/18/1997 | US5612916 Memory bypass mode |
| 03/12/1997 | EP0762282A1 Atomic update of EDC protected data |
| 03/12/1997 | EP0762266A2 Mass storage disk array device for use in computer systems |
| 03/12/1997 | EP0663086B1 Duplicate control and processing unit for telecommunications equipment |
| 03/12/1997 | EP0606805B1 Test method for integrated circuit devices and related integrated device |
| 03/11/1997 | US5611067 Nonvolatile semiconductor memory device having means for selective transfer of memory block contents and for chaining together unused memory blocks |
| 03/11/1997 | US5611042 Data error detection and correction for a shared SRAM |
| 03/11/1997 | US5610867 DRAM signal margin test method |
| 03/11/1997 | US5610866 Circuit structure and method for stress testing of bit lines |
| 03/11/1997 | US5610865 Semiconductor memory device with redundancy structure |
| 03/06/1997 | DE4407954C2 Halbleiterspeichereinrichtung A semiconductor memory device |
| 03/06/1997 | DE19635284A1 Single-chip processor with external test function |
| 03/06/1997 | DE19618722A1 Semiconductor memory device |
| 03/05/1997 | EP0760518A2 Circuitry and methodology to test single bit failures of integrated circuit memory devices |
| 03/05/1997 | EP0760155A1 A single chip controller-memory device and a memory architecture and methods suitable for implementing the same |
| 03/05/1997 | EP0525941B1 Method of self-diagnosing a mobile telephone set for use in a mobile telephone switching system and mobile telephone set being applied to the method |
| 03/05/1997 | EP0513607B1 Method and apparatus for testing an NVM |
| 03/04/1997 | US5608685 Adjacent row shift redundancy circuit having signal restorer coupled to programmable links and a method thereof |
| 03/04/1997 | US5608679 Fast internal reference cell trimming for flash EEPROM memory |
| 03/04/1997 | US5608678 Column redundancy of a multiple block memory architecture |
| 03/04/1997 | US5608670 Flash memory with improved erasability and its circuitry |
| 03/04/1997 | US5608669 Fast internal reference cell trimming for flash EEPROM memory |
| 03/04/1997 | US5608488 Data processing device for a camera |
| 03/04/1997 | US5608338 Evaluating the lifetime and reliability of a TFT in a stress test using gate voltage and temperature measurements |
| 03/04/1997 | US5608335 Method for the testing of integrated circuit chips and corresponding integrated circuit device |
| 02/27/1997 | WO1997007512A1 On-chip program voltage generator for antifuse repair |
| 02/27/1997 | WO1997007459A1 Memory tester providing fast repair of memory chips |
| 02/27/1997 | DE19633915A1 Fault analysing unit for use in semiconductor memory testing system |
| 02/27/1997 | DE19610838A1 Storing data records in digital memory for ROM stores e.g. CDs and read-write memories |
| 02/27/1997 | DE19503390C2 Datenausgabepuffer-Steuerschaltung Data output buffer control circuit |
| 02/26/1997 | CN1143812A Memory device |
| 02/25/1997 | US5606717 Memory circuitry having bus interface for receiving information in packets and access time registers |
| 02/25/1997 | US5606532 EEPROM array with flash-like core |
| 02/25/1997 | US5606528 Semiconductor memory device allowing data rewriting electrically |
| 02/25/1997 | US5606527 Methods for detecting short-circuited signal lines in nonvolatile semiconductor memory and circuitry therefor |
| 02/25/1997 | US5606523 Non-volatile programmable bistable multivibrator in predefined initial state for memory redundancy circuit |
| 02/20/1997 | DE4345246C2 Integrated circuit output driver for suppressing noise generation, e.g. in DRAM |
| 02/20/1997 | DE19632830A1 Semiconductor memory device, e.g. burn-in testing device |
| 02/20/1997 | DE19608713A1 Speichereinheit Storage unit |
| 02/19/1997 | EP0758785A2 Semiconductor memory device and method of manufacturing the same |
| 02/18/1997 | US5604917 IC memory card having masking function for preventing writing of data into a fixed memory area |