| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 08/14/1997 | WO1997029384A1 Assembly and method for testing integrated circuit devices |
| 08/14/1997 | DE19639613A1 Integrated memory and parallel test circuit |
| 08/14/1997 | DE19604375A1 Evaluation of test responses from digital integrated circuits |
| 08/13/1997 | EP0711436B1 Distributed directory for information stored on audio quality memory devices |
| 08/13/1997 | EP0477369B1 Semiconductor memory device |
| 08/12/1997 | US5657481 Memory device with a phase locked loop circuitry |
| 08/12/1997 | US5657443 Enhanced test system for an application-specific memory scheme |
| 08/12/1997 | US5657440 Asynchronous remote data copying using subsystem to subsystem communication |
| 08/12/1997 | US5657332 Soft errors handling in EEPROM devices |
| 08/12/1997 | US5657284 Apparatus and method for testing for defects between memory cells in packaged semiconductor memory devices |
| 08/12/1997 | US5657283 Diagnostic data port for a LSI or VLSI integrated circuit |
| 08/12/1997 | US5657282 Semiconductor memory device with stress circuit and method for supplying a stress voltage thereof |
| 08/12/1997 | US5657281 Systems and methods for implementing inter-device cell replacements |
| 08/12/1997 | US5657280 Defective cell repairing circuit and method of semiconductor memory device |
| 08/12/1997 | US5657279 Redundant circuit configuration for an integrated semiconductor memory |
| 08/12/1997 | US5657270 Electrically erasable programmable read-only memory with threshold value controller for data programming |
| 08/12/1997 | US5656944 Burn-in voltage detection circuit for semiconductor chip |
| 08/07/1997 | DE19630913A1 Burn-in sensor circuit for semiconductor memory |
| 08/06/1997 | EP0788116A1 Overvoltage detection circuit for mode selection |
| 08/06/1997 | EP0788110A2 Semiconductor memory device with a pipe-line operation |
| 08/06/1997 | EP0456195B1 Random access memory with redundancy relief circuit |
| 08/05/1997 | US5655150 Recording device having alternative recording units operated in three different conditions depending on activities in maintenance diagnosis mechanism and recording sections |
| 08/05/1997 | US5655113 Resynchronization circuit for a memory system and method of operating same |
| 08/05/1997 | US5654930 Semiconductor memory device having low power self refresh and burn-in functions |
| 08/05/1997 | US5654925 Circuit for applying a stress voltage in sequence to selected memory blocks in a semiconductor device |
| 08/05/1997 | US5654924 Semiconductor memory device capable of operating with potentials of adjacent bit lines inverted during multi-bit test |
| 08/05/1997 | US5654922 Nonvolatile semiconductor flash memory |
| 08/05/1997 | US5654564 Interconnect structure with programmable IC for interconnecting electronic components, including circuitry for controlling programmable IC |
| 08/05/1997 | US5654220 Method of making a stacked 3D integrated circuit structure |
| 08/05/1997 | US5654127 Forming cavities in substrate, lining and covering with flexible layer, metal layer, second flexible layer, removing substrate to expose flexible material, removing to expose metal, forming metal tip, removing rest of substrate |
| 07/30/1997 | EP0786780A1 Data output control circuit of semiconductor memory device having pipeline structure |
| 07/30/1997 | EP0550853B1 Array of disk drives with redundant channels |
| 07/30/1997 | CN1155938A Memory with stress circuitry for detecting defects |
| 07/29/1997 | US5652855 Memory circuit, method of access, and method of preparation of data in memory |
| 07/29/1997 | US5652725 Semiconductor memory device having a redundant row and a redundant column which can be accessed prior to substitution |
| 07/29/1997 | US5652722 System and method for controlling voltage and current characteristics of bit lines in a memory array |
| 07/29/1997 | US5652721 Testing an integrated circuit device |
| 07/29/1997 | US5652580 Method and apparatus for detecting duplicate entries in a look-up table |
| 07/23/1997 | EP0785509A2 Method and apparatus for providing error-tolerant storage of information |
| 07/23/1997 | EP0784847A2 A memory device |
| 07/23/1997 | EP0529945B1 Method and apparatus for programmable memory control with error regulation and test functions |
| 07/23/1997 | CN1155150A Storage unit with reduced number of fuse box |
| 07/22/1997 | US5651133 Methods for avoiding over-commitment of virtual capacity in a redundant hierarchic data storage system |
| 07/22/1997 | US5651128 Programmable integrated circuit memory comprising emulation means |
| 07/22/1997 | US5650962 Semiconductor nonvolatile memory device |
| 07/22/1997 | US5650961 Cell characteristic measuring circuit for a nonvolatile semiconductor memory device and cell characteristic measuring method |
| 07/22/1997 | US5650734 Programming programmable transistor devices using state machines |
| 07/17/1997 | WO1997025719A1 Test pattern generator |
| 07/17/1997 | WO1997025718A1 Multi-bit test pattern generator |
| 07/17/1997 | WO1997025717A1 Test pattern generator |
| 07/17/1997 | WO1997025674A1 Circuit and method for enabling a function in a multiple memory device module |
| 07/17/1997 | DE19652572A1 Bereitschaftsstrom-Erfassungsschaltkreis zur Verwendung in einer Halbleiterspeichervorrichtung Standby current detection circuit for use in a semiconductor memory device |
| 07/17/1997 | DE19610555A1 Leak voltage detector circuit for MOS capacitor of e.g. DRAM |
| 07/16/1997 | CN1154561A Semiconductor storage device and electronic equipment using the same |
| 07/16/1997 | CN1154559A Semi-conductor memory device and it testing circuit, memory device system and data transmission system |
| 07/15/1997 | US5649150 Scannable last-in-first-out register stack |
| 07/15/1997 | US5648974 System having multiple subsystems and test signal source resident upon common substrate |
| 07/15/1997 | US5648934 On-chip memory redundancy circuitry for programmable non-volatile memories, and methods for programming same |
| 07/15/1997 | US5648933 Structure for deselecting broken select lines in memory arrays |
| 07/15/1997 | US5648661 Integrated circuit wafer comprising unsingulated dies, and decoder arrangement for individually testing the dies |
| 07/15/1997 | CA2067466C Method and apparatus for testing an nvm |
| 07/10/1997 | DE4007187C2 Integrierte Halbleiterschaltungseinrichtung A semiconductor integrated circuit device |
| 07/09/1997 | EP0783170A1 Apparatus and method for the acquisition and analysis of a three-dimensional distribution of discrete points |
| 07/09/1997 | EP0782747A1 Memory with stress circuitry for detecting defects |
| 07/09/1997 | EP0532087B1 Process for checking the memories of a programmed micro-computer, by means of a micro-programme incorporated in the micro-computer itself |
| 07/09/1997 | EP0480421B1 Testable RAM architecture in a microprocessor having embedded cache memory |
| 07/09/1997 | CN1153984A Redundancy circuit and method of semiconductor memory device |
| 07/08/1997 | US5646948 Apparatus for concurrently testing a plurality of semiconductor memories in parallel |
| 07/08/1997 | US5646897 Logic gate circuit and parallel bit test circuit for semiconductor memory devices, capable of operation at low power source levels |
| 07/08/1997 | US5646896 Memory device with reduced number of fuses |
| 07/03/1997 | WO1997023907A1 Reduced pitch laser redundancy fuse bank structure |
| 07/03/1997 | WO1997023827A1 Method for setting the operating mode of an integrated circuit and an integrated circuit |
| 07/03/1997 | WO1997015054A3 A flash eeprom memory with separate reference array |
| 07/03/1997 | DE19603107A1 Self pre-ageing circuit device for semiconductor memory e.g. application specific memory |
| 07/02/1997 | EP0782147A1 Method and programming device for detecting an error in a memory |
| 07/02/1997 | EP0507026B1 A process for storing files of an electronic system |
| 07/02/1997 | CN1153572A Testing of memory content |
| 07/02/1997 | CN1153387A Semiconductor memory device having dual word line configuration |
| 07/01/1997 | US5644767 Method and apparatus for determining and maintaining drive status from codes written to disk drives of an arrayed storage subsystem |
| 07/01/1997 | US5644704 Method and apparatus for verifying the contents of a storage device |
| 07/01/1997 | US5644699 Memory apparatus and data processor using the same |
| 07/01/1997 | US5644618 Method of self-diagnosing a mobile telephone set for use in a mobile telephone switching system and a mobile telephone set to which the method is applied |
| 07/01/1997 | US5644581 Method and apparatus for converting logic test vectors to memory test patterns |
| 07/01/1997 | US5644579 Bi-directional data transfer system enabling forward/reverse bit sequences |
| 07/01/1997 | US5644578 Failure memory device |
| 07/01/1997 | US5644542 Stress test for memory arrays in integrated circuits |
| 07/01/1997 | US5644541 Memory substitution system and method for correcting partially defective memories |
| 07/01/1997 | US5644540 In a redundancy repair circuit |
| 07/01/1997 | US5644539 Storage device employing a flash memory |
| 07/01/1997 | US5644530 Electrically modifiable non-volatile memory incorporating test functions |
| 07/01/1997 | US5644529 Integrated circuit for the programming of a memory cell in a non-volatile memory register |
| 07/01/1997 | US5644331 Flat panel display device and method of inspection of same |
| 07/01/1997 | US5644250 Structure for externally identifying an internal state of a semiconductor device |
| 06/26/1997 | WO1997017704A3 Method and device for automatic determination of the required high voltage for programming/erasing an eeprom |
| 06/26/1997 | DE19630746A1 Associative memory circuit device, e.g. content addressable memory |
| 06/25/1997 | EP0780764A2 A redundancy circuit for memory devices having high frequency addressing cycles |
| 06/25/1997 | EP0541991B1 Fault indication in a storage device array |
| 06/24/1997 | US5642318 Testing method for FIFOS |
| 06/24/1997 | US5642317 Semiconductor memory device incorporating a test mechanism |
| 06/24/1997 | US5642316 Method and apparatus of redundancy for non-volatile memory integrated circuits |