Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
10/1997
10/14/1997US5677870 Non-volatile programmable bistable multivibrator, programmable by the source, for the memory redundancy circuit
10/14/1997US5677867 Memory with isolatable expandable bit lines
10/14/1997CA2069236C Method of self-diagnosing a mobile telephone set for use in a mobile telephone switching system and mobile telephone set being applied the method
10/09/1997WO1997037357A1 Circuit arrangement with a test circuit
10/08/1997EP0800138A1 Control apparatus and method for a RAID storage subsystem
10/07/1997US5675546 On-chip automatic procedures for memory testing
10/07/1997US5675545 Method of forming a database that defines an integrated circuit memory with built in test circuitry
10/07/1997US5675544 Method and apparatus for parallel testing of memory circuits
10/07/1997US5675543 Integrated semiconductor memory device
10/07/1997US5675540 Non-volatile memory system having internal data verification test mode
10/07/1997US5675539 Method and circuit for testing memories in integrated circuit form
10/02/1997DE19612441A1 Schaltungsanordnung mit einer Testschaltung A circuit arrangement with a testing circuit
10/01/1997EP0798845A2 Voltage-boosting circuit with mode signal
10/01/1997EP0798739A2 Read circuit which uses a coarse-to-fine search when reading the threshold voltage of a memory cell
10/01/1997EP0798642A1 Redundancy management method and architecture, particularly for non-volatile memories
10/01/1997EP0798565A2 High voltage level detection circuit
09/1997
09/30/1997US5673388 Memory testing in a multiple processor computer system
09/30/1997US5673383 Storage system with a flash memory module
09/30/1997US5673271 High speed pattern generator
09/30/1997US5673270 Semiconductor memory device having register for holding test resultant signal
09/30/1997US5673231 Semiconductor memory device in which leakage current from defective memory cell can be suppressed during standby
09/30/1997US5673229 Dynamic random access memory
09/30/1997US5673228 Integrated circuit having an EEPROM, semiconductor wafer provided with such integrated circuits, and method of testing such a semiconductor wafer
09/30/1997US5673227 Integrated circuit memory with multiplexed redundant column data path
09/25/1997WO1997035318A1 Data processor with built-in dram
09/24/1997EP0797211A1 Semiconductor memory device with clamping circuit for preventing malfunction
09/24/1997EP0797146A1 Data input/output managing device, particularly for a non-volatile memory
09/24/1997EP0797145A1 Sectorized electrically erasable and programmable non-volatile memory device with redundancy
09/24/1997EP0797144A1 Circuit for detecting the coincidence between a binary information unit stored therein and an external datum
09/23/1997US5671394 Microcomputer having ROM data protection function
09/23/1997US5671392 Memory device circuit and method for concurrently addressing columns of multiple banks of multi-bank memory array
09/23/1997US5671239 Semiconductor memory of xN type having error correcting circuit by parity
09/23/1997US5671231 Method and apparatus for performing cache snoop testing on a cache system
09/23/1997US5671229 Flash eeprom system with defect handling
09/23/1997US5671189 Low standby power redundancy circuit
09/23/1997US5671185 Apparatus for replacing defective cells in a memory device
09/23/1997US5671184 Semiconductor memory with cells combined into individually addressable units, and method for operating such memories
09/23/1997US5671180 Semiconductor memory device with function of preventing loss of information due to leak of charges or disturbing
09/23/1997US5671178 Erase verifying circuit for a nonvolatile semiconductor memory with column redundancy
09/18/1997WO1997034300A1 Apparatus and method for utilizing nonperfect memory elements
09/18/1997WO1997034299A1 Semiconductor testing device with rewrite controller
09/17/1997EP0795826A2 Systems and methods for implementing inter-device cell replacements
09/17/1997EP0795825A2 Semiconductor memory with a redundant circuit
09/16/1997US5668818 System and method for scan control of a programmable fuse circuit in an integrated circuit
09/16/1997US5668815 Method for testing integrated memory using an integrated DMA controller
09/16/1997US5668764 Testability apparatus and method for faster data access and silicon die size reduction
09/16/1997US5668763 Semiconductor memory for increasing the number of half good memories by selecting and using good memory blocks
09/16/1997US5668643 Recording apparatus having a text processing mode using a threshold and an image processing mode using a mean valve of pixel data samples as the pixel gradation valve
09/10/1997CN1159058A Semiconductor integrated circuit device having synchronous function with plurality of external clocks
09/09/1997US5666513 Automatic reconfiguration of multiple-way cache system allowing uninterrupted continuing processor operation
09/09/1997US5666512 Disk array having hot spare resources and methods for using hot spare resources to store user data
09/09/1997US5666482 Method and system for bypassing a faulty line of data or its associated tag of a set associative cache memory
09/09/1997US5666480 Fault-tolerant hierarchical bus system and method of operating same
09/09/1997US5666317 Semiconductor memory device
09/09/1997US5666316 Integrated seminconductor memory
09/09/1997US5666315 Semiconductor memory device having a redundancy function suppressible of leakage current from a defective memory cell
09/09/1997US5666314 Semiconductor memory device for selecting and deselecting blocks of word lines
09/09/1997US5666313 Semiconductor memory device with complete inhibition of boosting of word line drive signal and method thereof
09/09/1997US5666312 Column redundancy scheme for a random access memory incorporating multiplexers and demultiplexers for replacing defective columns in any memory array
09/09/1997US5666049 Semiconductor testing apparatus, semiconductor testing circuit chip, and probe card
09/04/1997WO1997032312A1 Circuit arrangement for a programmable non-volatile memory
09/04/1997WO1997032253A1 Semiconductor memory device having faulty cells
09/04/1997WO1997020316A3 Automated process for generating boards from defective chips
09/04/1997DE19607724A1 Schaltungsanordnung für einen programmierbaren nichtflüchtigen Speicher Circuit arrangement for a programmable nonvolatile memory
09/03/1997EP0793176A2 Semiconductor memory device capable of preventing malfunction due to disconnection of column select line or word select line
09/03/1997EP0793173A2 Non-volatile semicon-ductor storage unit having a correction coding circuit
09/03/1997EP0792507A1 Circuits, systems, and methods for accounting for defective cells in a memory device
09/03/1997EP0792270A1 Natriuretic cyclic compounds
09/02/1997US5664187 Method and system for selecting data for migration in a hierarchic data storage system using frequency distribution tables
09/02/1997US5664089 Multiple power domain power loss detection and interface disable
09/02/1997US5663965 Apparatus and method for testing a memory array
09/02/1997US5663964 Method for testing digital memory devices
09/02/1997US5663679 Thin film transistor redundancy structure
09/02/1997US5663658 For reducing the amount of current drawn through a blowable fuse
09/02/1997US5662838 Liquid vaporizing apparatus
08/1997
08/27/1997EP0791934A2 Semiconductor memory device
08/27/1997EP0537973B1 Nand-cell type electrically erasable and programmable read- only memory with redundancy circuit
08/26/1997US5661732 Computer system element
08/26/1997US5661730 Same state and opposite state diagnostic test for ferroelectric memories
08/26/1997US5661729 Semiconductor memory having built-in self-test circuit
08/26/1997US5661694 Programmable semiconductor memory device
08/26/1997US5661690 Circuit and method for performing tests on memory array cells using external sense amplifier reference current
08/26/1997US5661689 Semiconductor device incorporating fuse-type roll call circuit
08/26/1997US5661323 Integrated circuit fuse programming and reading circuits
08/21/1997WO1997029856A1 Simm/dimm board handler
08/21/1997WO1996041249A3 Intelligent disk-cache memory
08/20/1997EP0728367A4 A flash eprom transistor array and method for manufacturing the same
08/20/1997CN1035698C Electrically erasable and programmable read only memory with error check and correction circuit
08/19/1997US5659704 Methods and system for reserving storage space for data migration in a redundant hierarchic data storage system by dynamically computing maximum storage space for mirror redundancy
08/19/1997US5659678 Fault tolerant memory
08/19/1997US5659551 Programmable computer system element with built-in self test method and apparatus for repair during power-on
08/19/1997US5659550 Latent defect handling in EEPROM devices
08/19/1997US5659549 Memory test system having a pattern generator for a multi-bit test
08/19/1997US5659519 Boosting voltage generator of semiconductor memory device
08/19/1997US5659514 Memory cell and current mirror circuit
08/19/1997US5659513 Static semiconductor memory device having improved characteristics
08/19/1997US5659511 Method for measuring the current leakage of a dynamic random access memory capacitive junction
08/19/1997US5659510 Integrated circuit devices with reliable fuse-based mode selection capability and methods of operating same
08/19/1997US5659509 Method for programming redundancy registers in a row redundancy integrated circuitry for a semiconductor memory device, and row redundancy integrated circuitry
08/19/1997US5659259 Circuit and method of sensing small voltage changes on highly capacitively loaded electronic signals
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