Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
04/1998
04/01/1998CN1177818A Semiconductor storage device and test method thereof
03/1998
03/31/1998US5734818 For disaster recovery purposes
03/31/1998US5734661 Method and apparatus for providing external access to internal integrated circuit test circuits
03/31/1998US5734660 Scan test circuit for use in semiconductor integrated circuit
03/31/1998US5734620 Hierarchical memory array structure with redundant components having electrically isolated bit lines
03/31/1998US5734617 Shared pull-up and selection circuitry for programmable cells such as antifuse cells
03/31/1998US5734615 Memory testing apparatus for microelectronic integrated circuit
03/31/1998US5734613 Multi-port random access memory
03/31/1998US5734612 Semiconductor memory device with a plurality of memory cells connected to bit lines and method of adjusting the same
03/27/1998CA2216415A1 Method for accelerated test of semiconductor devices
03/26/1998WO1998012707A1 Method and apparatus for providing external access to internal integrated circuit test circuits
03/26/1998WO1998012706A1 Device and method for testing integrated circuit dice in an integrated circuit module
03/26/1998WO1998012705A1 Memory test circuit
03/26/1998WO1998012637A1 Dynamic spare column replacement memory system
03/26/1998DE4447523C2 BiCMOS semiconductor SRAM device circuit
03/25/1998EP0831496A2 A method and system for testing memory
03/25/1998EP0831401A1 Semiconductor integrated circuit device containing means for storing chip specific information
03/25/1998EP0831400A2 On-line reconstruction of a failed redundant array system
03/25/1998EP0831397A2 A method and apparatus for operation control of memories
03/25/1998CN1177188A Semiconductor device having semiconductor memory circuit to be tested, method of testing semiconductor memory circuit and head circuit for semiconductor memory circuit
03/24/1998US5732207 Microprocessor having single poly-silicon EPROM memory for programmably controlling optional features
03/24/1998US5732034 Semiconductor memory device having an address key circuit for reducing power consumption
03/24/1998US5732033 Method and circuit for rapidly equilibrating paired digit lines of a memory device during testing
03/24/1998US5732032 Semiconductor memory device having a burn-in control circuit and burn-in test method thereof
03/24/1998US5732031 Address comparing for non-precharged redundancy address matching with redundancy disable mode
03/24/1998US5732030 Method and system for reduced column redundancy using a dual column select
03/24/1998US5732029 Method and circuit for testing memory cells in semiconductor memory device
03/24/1998US5732022 Non-volatile semiconductor memory device
03/24/1998US5732015 Method of controlling the leakage current through an sram
03/24/1998US5731734 Zero power fuse circuit
03/24/1998US5731733 Static, low current sensing circuit for sensing the state of a fuse device
03/24/1998US5731716 Programmable multibit register for coincidence and jump operations and coincidence fuse cell
03/19/1998WO1998011555A1 Technique for incorporating a built-in self-test (bist) of a dram block with existing functional test vectors for a microprocessor
03/18/1998EP0829086A1 Technique for reconfiguring a high density memory
03/18/1998CN1176467A Method for testing semiconductor memory device and semiconductor memory device
03/17/1998US5729679 Powerfail durable NVRAM testing
03/17/1998US5729677 Method of testing a cache tag memory array
03/17/1998US5729551 Space efficient column decoder for flash memory redundant columns
03/17/1998US5729497 Method of using parity and ECC bits to increase the yield of non-parity ECC devices
03/17/1998US5729152 Termination circuits for reduced swing signal lines and methods for operating same
03/12/1998WO1998010425A1 Method and apparatus for correcting a multilevel cell memory by using interleaving
03/12/1998WO1998003915A3 Flash memory card
03/11/1998EP0828257A2 Method and device for testing a memory circuit in a semiconductor device
03/11/1998EP0828216A1 Renumbered array architecture for multi-array memories
03/11/1998EP0570516A4 Disk drive array memory system using nonuniform disk drives
03/11/1998EP0492609B1 Semiconductor device with voltage stress testing pads
03/11/1998CN1037721C Method and circuit for repairing defect in semiconductor memory device
03/10/1998US5727001 Circuit and method for testing an integrated circuit
03/10/1998US5726994 Address multiplex semiconductor memory device for enabling testing of the entire circuit or for only partial components thereof
03/10/1998US5726950 Synchronous semiconductor memory device performing input/output of data in a cycle shorter than an external clock signal cycle
03/10/1998US5726949 Semiconductor memory device having a redundant configuration
03/10/1998US5726940 Semiconductor memory device of which prescribed state of operation is terminated under a prescribed condition and method of operating a semiconductor memory device for terminating prescribed state of operation
03/10/1998US5726939 Semiconductor memory device having fast writing circuit for test thereof
03/10/1998US5726585 Switching circuit for use in a semiconductor memory device
03/10/1998US5725995 Transistors and integrated circuits
03/04/1998EP0827157A2 Method and device for testing a semiconductor memory circuit
03/04/1998EP0541996B1 Disk array apparatus and method for determining the presence of correct storage devices therein
03/04/1998EP0523996B1 Integrated circuit memory device with redundant rows
03/04/1998CN1175311A Error management processes for flash EEPROM memory arrays
03/03/1998US5724367 Semiconductor memory device having scan path for testing
03/03/1998US5724366 Semiconductor memory device
03/03/1998US5724365 Method of utilizing redundancy testing to substitute for main array programming and AC speed reads
03/03/1998US5724300 Non-volatile semiconductor memory device and memory system using the same
03/03/1998US5724295 Partitioned dynamic memory allowing substitution of a redundant circuit in any partition and using partial address disablement and disablement override
03/03/1998US5724290 Method and programming device for detecting an error in a memory
03/03/1998US5724289 Nonvolatile semiconductor memory capable of selectively performing a pre-conditioning of threshold voltage before an erase self-test of memory cells and a method related therewith
03/03/1998US5723999 Redundant row fuse bank circuit
02/1998
02/26/1998WO1998008166A1 Semiconductor memory device having error detection and correction
02/26/1998DE19736250A1 Fault repair method for memory component
02/25/1998EP0825615A2 System and method for testing audio RAM memories
02/25/1998EP0825614A2 Arrangement and method of measuring the speed of memory unit in an integrated circuit
02/25/1998EP0504434B1 Semiconductor memory unit having redundant structure
02/24/1998US5721861 Array disc memory equipment capable of confirming logical address positions for disc drive modules installed therein
02/24/1998US5721741 Memory test system
02/24/1998US5721706 Non-volatile-programmable bistable multivibrator, programmable by the source, for memory redundancy circuit
02/24/1998US5721159 Method for manufacturing and testing a nonvolatile memory device
02/19/1998WO1998007192A1 Memory module assembly using partially defective chips
02/19/1998WO1998007163A1 A method for testing integrated memory using an integrated dma controller
02/19/1998WO1998007162A1 Memory testing apparatus
02/18/1998EP0824237A2 Audio RAM having error detection and correction function
02/17/1998US5720031 Method and apparatus for testing memory devices and displaying results of such tests
02/17/1998US5719888 Memory system
02/17/1998US5719881 Test pattern generating apparatus and method
02/17/1998US5719880 On-chip operation for memories
02/17/1998US5719879 Integrated circuit device
02/17/1998US5719810 Semiconductor memory device having cache memory function
02/17/1998US5719808 Flash EEPROM system
02/17/1998US5718799 Fabric light control window covering
02/12/1998WO1998006103A1 System for optimizing memory repair time using test data
02/12/1998WO1998006102A1 Antifuse detect circuit
02/11/1998EP0823685A1 Cache memory capable of using faulty tag memory
02/11/1998EP0823128A1 Improved test and assembly apparatus
02/11/1998EP0520696B1 Semiconductor memory/integrated circuit device with discriminator for diagnostic mode of operation
02/10/1998US5717698 Method and apparatus for testing a network with a programmable logic matrix
02/10/1998US5717696 Circuit for testing a semiconductor chip having embedded arrays intermixed with logic
02/10/1998US5717694 Fail analysis device for semiconductor memory test system
02/10/1998US5717652 Semiconductor memory device capable of high speed plural parallel test, method of data writing therefor and parallel tester
02/10/1998US5717651 Semiconductor memory
02/10/1998US5717643 Semiconductor memory device with testing function
02/10/1998US5717340 Circuit for testing pumped voltage gates in a programmable gate array
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