| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 05/07/1998 | WO1998019241A1 Method and apparatus for correcting a multilevel cell memory by using error locating codes |
| 05/07/1998 | DE19747112A1 Main memory watchdog control system |
| 05/06/1998 | EP0840329A1 Method and apparatus for testing counter and serial access memory containing it |
| 05/06/1998 | EP0840328A2 Method and device for testing memory circuits |
| 05/06/1998 | EP0840327A1 Protection circuit for redundancy registers set-up cells of electrically programmable non-volatile memory devices |
| 05/06/1998 | EP0765497B1 Memory error correction |
| 05/06/1998 | EP0559368B1 Memory column redundancy and localized column redundancy control signals |
| 05/06/1998 | CN1180930A Decision method for semiconductor integrated circuit whether or not qualified and semiconductor integrated circuit |
| 05/05/1998 | US5749091 Cache controller with index stack for coherency fault tolerance |
| 05/05/1998 | US5748939 Memory device with a central control bus and a control access register for translating an access request into an access cycle on the central control bus |
| 05/05/1998 | US5748879 Cache memory testing method |
| 05/05/1998 | US5748870 Fault-tolerant networkable computer software with access locking |
| 05/05/1998 | US5748641 Test circuit of semiconductor memory device having data scramble function |
| 05/05/1998 | US5748640 Technique for incorporating a built-in self-test (BIST) of a DRAM block with existing functional test vectors for a microprocessor |
| 05/05/1998 | US5748639 Multi-bit test circuits for integrated circuit memory devices and related methods |
| 05/05/1998 | US5748638 Method for storing security relevant data |
| 05/05/1998 | US5748545 Memory device with on-chip manufacturing and memory cell defect detection capability |
| 05/05/1998 | US5748544 Apparatus and method for reducing test time of the data retention parameter in a dynamic random access memory |
| 05/05/1998 | US5748543 Self repairing integrated circuit memory devices and methods |
| 05/05/1998 | US5748533 Read circuit which uses a coarse-to-fine search when reading the threshold voltage of a memory cell |
| 05/05/1998 | US5748527 Nonvolatile memory having transistor redundancy |
| 05/05/1998 | US5748526 Circuit for repair of flash memory cells and a method of repair |
| 05/05/1998 | US5748520 Semiconductor memory device having minimal leakage current |
| 05/05/1998 | US5747869 Reduced pitch laser redundancy fuse bank structure |
| 05/05/1998 | CA2063897C Method and means for distributed sparing in dasd arrays |
| 04/30/1998 | WO1998018134A1 Overvoltage detection circuit for test mode selection |
| 04/30/1998 | WO1998018133A1 Memory tester |
| 04/30/1998 | DE19746302A1 Test device for semiconductor memory, DRAM |
| 04/30/1998 | DE19723262A1 Halbleiterschaltungsvorrichtung, die eine sicherungsprogrammierbare Bestanden/Durchgefallen- Identifizierungsschaltung aufweist, und Bestanden/Durchgefallen-Bestimmungsverfahren für dieselbe A semiconductor circuit device having a fuse programmable pass / Durchgefallen- identification circuit, and pass / fail determination method for the same |
| 04/30/1998 | DE19720231C1 Test method for multi-processor computer system |
| 04/29/1998 | EP0541992B1 Data reconstruction in a storage device array system |
| 04/28/1998 | US5745673 Memory architecture for solid state discs |
| 04/28/1998 | US5745499 Integrated circuit |
| 04/28/1998 | US5745498 Rapid compare of two binary numbers |
| 04/28/1998 | US5745420 Integrated memory circuit with sequenced bitlines for stress test |
| 04/28/1998 | US5745419 Method and apparatus for measuring the offset voltages of SRAM sense amplifiers |
| 04/28/1998 | US5745415 Circuit for SRAM test mode isolated bitline modulation |
| 04/28/1998 | US5745411 Semiconductor memory device |
| 04/28/1998 | US5745409 Non-volatile memory with analog and digital interface and storage |
| 04/28/1998 | US5745405 Process leakage evaluation and measurement method |
| 04/23/1998 | WO1998016933A1 Memory tester and method of switching the tester to ram test mode and rom test mode |
| 04/23/1998 | WO1998016919A1 Method of insuring data integrity with a data randomizer |
| 04/22/1998 | EP0837606A1 Interactive information transmission installation for PC-TV |
| 04/22/1998 | EP0837392A1 A memory device with an error correction function |
| 04/22/1998 | EP0671686B1 Synchronous remote data duplexing |
| 04/22/1998 | CN1179623A Specific part searching method and device for memory LSI |
| 04/21/1998 | US5742934 Flash solid state disk card with selective use of an address conversion table depending on logical and physical sector numbers |
| 04/21/1998 | US5742616 System and method testing computer memories |
| 04/21/1998 | US5742615 Non-volatile semiconductor memory |
| 04/21/1998 | US5742614 Semiconductor random access memory unit |
| 04/21/1998 | US5742613 Memory array of integrated circuits capable of replacing faulty cells with a spare |
| 04/21/1998 | US5742557 Multi-port random access memory |
| 04/21/1998 | US5742556 Redundancy scheme for semiconductor RAMS |
| 04/21/1998 | US5742549 Sense amplifier circuit for detecting degradation of digit lines and method thereof |
| 04/21/1998 | US5742548 Electrically modifiable non-volatile memory with write checking |
| 04/21/1998 | US5742547 Circuits for block redundancy repair of integrated circuit memory devices |
| 04/16/1998 | WO1998016011A1 Zero power fuse circuit |
| 04/16/1998 | WO1998015960A1 Trimming circuit |
| 04/16/1998 | WO1998015958A1 Charge sharing detection circuit for anti-fuses |
| 04/16/1998 | CA2268254A1 Trimming circuit |
| 04/15/1998 | EP0836197A2 Method for accelerated test of semiconductor devices |
| 04/15/1998 | EP0836196A2 Improvements in or relating to non-volatile memory devices |
| 04/15/1998 | EP0836142A2 Semiconductor memory capable of mapping bad blocks |
| 04/15/1998 | EP0835489A1 Method and system for using mirrored data to detect corrupt data |
| 04/15/1998 | EP0646858B1 Data storage system architecture |
| 04/15/1998 | EP0585870B1 Dynamic random access memory with voltage stress applying circuit |
| 04/15/1998 | CN1178989A Semiconductor capable of imaging bad block |
| 04/15/1998 | CN1178988A Semiconductor storage with auxiliary storage |
| 04/15/1998 | CN1038075C Nonlosable semiconductor memory |
| 04/14/1998 | US5740412 Set-select multiplexer with an array built-in self-test feature |
| 04/14/1998 | US5740349 Method and apparatus for reliably storing defect information in flash disk memories |
| 04/14/1998 | US5740179 Integrated circuit memory device |
| 04/14/1998 | US5740177 Method of correcting error, suitable for storage device |
| 04/14/1998 | US5740119 Semiconductor memory device having internal address converting function, whose test and layout are conducted easily |
| 04/14/1998 | US5740114 Redundant memory cell selecting circuit having fuses coupled to memory cell group address and memory cell block address |
| 04/14/1998 | US5740098 Using one memory to supply addresses to an associated memory during testing |
| 04/09/1998 | WO1998015058A1 Self-timed pulse control circuit |
| 04/09/1998 | WO1998014956A1 Memory array, memory cell, and sense amplifier test and characterization |
| 04/09/1998 | WO1998014955A1 Data retention test for static memory cell |
| 04/09/1998 | WO1998014954A1 Memory tester |
| 04/09/1998 | WO1998014950A1 Memory block select using multiple word lines to address a single memory cell row |
| 04/09/1998 | WO1998014947A1 Memory including resistor bit-line loads |
| 04/09/1998 | WO1998014944A1 Active power supply filter |
| 04/09/1998 | WO1998014883A1 A method and apparatus for sampling data from a memory |
| 04/09/1998 | DE19743707A1 Large capacity memory tester for flash-memory |
| 04/09/1998 | DE19612441C2 Schaltungsanordnung mit einer Testschaltung A circuit arrangement with a testing circuit |
| 04/08/1998 | EP0834124A1 Parallel testing of cpu cache and instruction units |
| 04/08/1998 | EP0714546A4 Erase and program verification circuit for non-volatile memory |
| 04/07/1998 | US5737587 Resynchronization circuit for circuit module architecture |
| 04/07/1998 | US5737511 Method of reducing chip size by modifying main wordline repair structure |
| 04/07/1998 | US5737269 Semiconductor memory with burst mode feature for the redundant memory area |
| 04/07/1998 | US5737266 Methods and apparatus for programming content-addressable memories using floating-gate memory cells |
| 04/02/1998 | DE19639607A1 Instruction buffer cache memory testing method |
| 04/02/1998 | DE19638973A1 Elektronisches Steuergerät, insbesondere für eine in einem Kraftfahrzeug vorgesehene Einrichtung Electronic control unit, in particular for an opening provided in a motor vehicle device |
| 04/01/1998 | EP0833348A1 Method and circuit for checking multilevel programming of floating-gate nonvolatile memory cells, particlarly flash cells |
| 04/01/1998 | EP0833249A1 Semiconductor integrated circuit with error detecting circuit |
| 04/01/1998 | EP0832520A1 Dedicated alu architecture for 10-bit reed-solomon error correction module |
| 04/01/1998 | EP0832486A1 Nonvolatile memory blocking architecture and redundancy |
| 04/01/1998 | EP0832438A1 Method and apparatus for probing, testing, burn-in, repairing and programming of integrated circuits in a closed environment using a single apparatus |
| 04/01/1998 | EP0813711A4 Error management processes for flash eeprom memory arrays |