Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
08/1998
08/04/1998US5790448 On-chip program voltage generator for antifuse repair
08/04/1998US5789970 Static, low current, low voltage sensing circuit for sensing the state of a fuse device
08/04/1998CA2128595C Shared memory with benign failure modes
07/1998
07/30/1998WO1998033112A1 Semiconductor disk device
07/29/1998EP0855650A1 Structure to recover a portion of a partially functional embedded memory
07/29/1998CN1188896A Memory testing apparatus
07/28/1998US5787460 Disk array apparatus that only calculates new parity after a predetermined number of write requests
07/28/1998US5787097 Output data compression scheme for use in testing IC memories
07/28/1998US5787096 Circuit and method for testing an integrated circuit
07/28/1998US5787091 Shared redundancy programming of memory with plural access ports
07/28/1998US5787044 Memory-cell array and a method for repairing the same
07/28/1998US5787043 Semiconductor memory device having a redundancy capability
07/28/1998US5786716 Signal generator for generating test mode signals
07/28/1998US5786702 Method for detecting defects in integrated-circuit arrays
07/28/1998US5785902 Liquid vaporizing apparatus
07/23/1998WO1998032132A1 Sdram clocking test mode
07/23/1998DE19758068A1 Circuit for driving and control of bit-line sensing amplifier array
07/23/1998DE19737837A1 DRAM with memory cell array in matrix of lines and columns for DRAM testing
07/23/1998DE19638973C2 Elektronisches Steuergerät, insbesondere für eine in einem Kraftfahrzeug vorgesehene Einrichtung Electronic control unit, in particular for an opening provided in a motor vehicle device
07/22/1998EP0854483A2 Digital signal reproduction apparatus
07/22/1998EP0607780B1 Flash EEPROM having redundant memory cell array
07/22/1998EP0554055B1 A semiconductor memory with improved redundant sense amplifier control
07/22/1998EP0554052B1 Redundancy decoder
07/22/1998EP0482928B1 Semiconductor memory
07/22/1998CN1188299A TFT/LCD active data line repair
07/22/1998CN1188238A Semiconductor device testing apparatus
07/21/1998US5784551 Duplicate control and processing unit for telecommunications equipment
07/21/1998US5784382 Method and apparatus for dynamically testing a memory within a computer system
07/21/1998US5784327 Electrically programmable/electrically readable semiconductor memory device
07/21/1998US5784323 Test converage of embedded memories on semiconductor substrates
07/21/1998US5784322 Standby current detecting circuit for use in a semiconductor memory device and method thereof
07/21/1998US5784321 Semiconductor memory device with redundant circuit
07/21/1998US5784314 Method for setting the threshold voltage of a reference memory cell
07/21/1998US5784174 Method for managing memory data at power-up
07/16/1998WO1998031019A1 High-speed test system for a memory device
07/16/1998DE19703145A1 Testing procedure for computer connecting lines
07/15/1998CN1187677A Dynamic semiconductor memory and measuring method thereof
07/15/1998CN1187676A Synchronous semiconductor memory
07/14/1998US5781721 Method and apparatus for testing cache RAM residing on a microprocessor
07/14/1998US5781719 Semiconductor disk device having a large capacity of quick-access memory and hard disk for backup and its data storage method
07/14/1998US5781717 Dynamic spare column replacement memory system
07/14/1998US5781564 Method and apparatus for detecting and concealing data errors in stored digital data
07/14/1998US5781562 Method, system and apparatus for efficiently generating binary numbers for testing storage devices
07/14/1998US5781558 Diagnostic memory access
07/14/1998US5781557 Memory test mode for wordline resistive defects
07/14/1998US5781486 Apparatus for testing redundant elements in a packaged semiconductor memory device
07/14/1998US5781485 Apparatus and method for controlling operating mode in semiconductor memory device
07/14/1998US5781484 Semiconductor memory device
07/14/1998US5781483 Device and method for repairing a memory array by storing each bit in multiple memory cells in the array
07/14/1998US5781474 Parallel programming method of memory words and corresponding circuit
07/14/1998US5781471 PMOS non-volatile latch for storage of redundancy addresses
07/14/1998US5781171 Shift register, driving circuit and drive unit for display device
07/14/1998US5781037 Method and apparatus for an address transition detection circuit
07/09/1998WO1998029815A1 Ic card
07/09/1998WO1998029814A1 Ic card
07/09/1998CA2275968A1 Ic card
07/08/1998EP0740838B1 Process for testing digital storage devices
07/08/1998EP0668563B1 Method for programming redundancy registers in a row redundancy integrated circuitry for a semiconductor memory device
07/08/1998EP0541288B1 Circuit module redundacy architecture
07/07/1998USH1741 Method and apparatus for pattern sensitivity stress testing of memory systems
07/07/1998US5778009 Dedicated ALU architecture for 10-bit Reed-Solomon error correction module
07/07/1998US5777933 Semiconductor memory device capable of reading/writing data from/into arbitrary memory cell in an input/output compression test mode
07/07/1998US5777932 Semiconductor memory device test circuit having an improved compare signal generator circuit
07/07/1998US5777931 Synchronized redundancy decoding systems and methods for integrated circuit memory devices
07/07/1998US5777930 Semiconductor device
07/02/1998WO1998028746A1 Redundancy for wide hierarchical i/o organizations
07/01/1998EP0567104B1 Semiconductor memory device having a self-refresh function
07/01/1998EP0515577B1 Making and testing an integrated circuit using high density probe points
07/01/1998CN1186308A Fuse restoring circuit
06/1998
06/30/1998US5774647 Management of memory modules
06/30/1998US5774646 Method for detecting faulty elements of a redundancy semiconductor memory
06/30/1998US5774472 Semiconductor memory device capable of realizing stable test mode operation
06/30/1998US5774471 Multiple location repair word line redundancy circuit
06/25/1998WO1998027556A1 Memory test set
06/24/1998EP0849743A2 Built-in self test memory devices
06/24/1998EP0849675A2 Volatile memory chip with non-volatile memory locations for storing quality information
06/24/1998CN1185629A Semi-conductor storage device
06/23/1998US5771346 Apparatus and method for detecting over-programming condition in multistate memory device
06/23/1998US5771242 Memory array built-in self-test circuit having a programmable pattern generator for allowing unique read/write operations to adjacent memory cells, and method therefor
06/23/1998US5771195 Circuit and method for replacing a defective memory cell with a redundant memory cell
06/23/1998US5771194 Memory circuit, data control circuit of memory circuit and address assigning circuit of memory circuit
06/23/1998US5771191 Method and system for inspecting semiconductor memory device
06/23/1998US5771188 Adjustable cell plate generator
06/23/1998US5770964 Arrangement enabling pin contact test of a semiconductor device having clamp protection circuit, and method of testing a semiconductor device
06/23/1998US5770963 Flash memory with improved erasability and its circuitry
06/16/1998USRE35825 Method for maintaining optimum biasing voltage and standby current levels in a DRAM array having repaired row-to-column shorts
06/16/1998US5768290 Semiconductor integrated circuit device incorporating fuse-programmable pass/fail identification circuit and pass/fail determination method thereof
06/16/1998US5768288 Method and apparatus for programming a programmable logic device having verify logic for comparing verify data read from a memory location with program data
06/16/1998US5768287 Apparatus and method for programming multistate memory device
06/16/1998US5768206 Memory circuit
06/16/1998US5768198 Semiconductor memory having redundancy function in block write operation
06/16/1998US5768197 Redundancy circuit for semiconductor memory device
06/16/1998US5768196 Shift-register based row select circuit with redundancy for a FIFO memory
06/16/1998US5768195 Semiconductor memory device
06/16/1998US5768177 Controlled delay circuit for use in synchronized semiconductor memory
06/16/1998US5768175 Ferroelectric memory with fault recovery circuits
06/16/1998US5768173 Memory modules, circuit substrates and methods of fabrication therefor using partially defective memory devices
06/16/1998US5767709 Synchronous test mode initalization
06/10/1998EP0847060A1 Memory tester APG with flexible Z register programming
06/10/1998EP0847010A2 Row redundancy block architecture
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