G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation

Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
09/1998
09/09/1998	CN1192567A Repair fuse circuit performing complete latch operation using flash memory cell
09/08/1998	US5805794 Method for programming an integrated circuit device
09/08/1998	US5805789 Programmable computer system element with built-in self test method and apparatus for repair during power-on
09/08/1998	US5805606 Cache module fault isolation techniques
09/08/1998	US5805605 Semiconductor integrated device
09/08/1998	US5805604 Apparatus and method for reading and writing data
09/08/1998	US5805514 Method for testing a semiconductor memory device and a semiconductor memory device
09/08/1998	US5805513 Semiconductor memory device with improved substrate arrangement to permit forming a plurality of different types of random access memory, and a testing method therefor
09/08/1998	US5805512 Semiconductor memory device
09/08/1998	US5803938 Liquid vaporizing apparatus
09/03/1998	DE4200667C2 Schaltungsanordnung zur Fehlerüberwachung eines Pufferspeichers Circuit arrangement for fault monitoring of a buffer
09/03/1998	DE19807237A1 Semiconductor component test instrument for testing semiconductor component elements
09/03/1998	DE19732649A1 Semiconductor memory with collective write mode
09/03/1998	DE19708441A1 Read/write method for operating parameters for automobile air-conditioning control
09/02/1998	EP0467079B1 Disc array storage system
09/01/1998	US5802603 Method and apparatus for asymmetric/symmetric DRAM detection
09/01/1998	US5802561 Simultaneous, mirror write cache
09/01/1998	US5802553 File system configured to support variable density storage and data compression within a nonvolatile memory
09/01/1998	US5802551 Method and apparatus for controlling the writing and erasing of information in a memory device
09/01/1998	US5802264 Background data reconstruction in a storage device array system
09/01/1998	US5802070 Testing associative memory
09/01/1998	US5802007 Semiconductor device having redundancy controlling circuit for selectively connecting signal paths to pin
09/01/1998	US5802001 Burn-in checking apparatus for semiconductor memory device
09/01/1998	US5801999 Semiconductor memory
09/01/1998	US5801989 Method and apparatus for optimizing erase and program times for a non-volatile memory device
09/01/1998	US5801986 Semiconductor memory device having both redundancy and test capability and method of manufacturing the same
09/01/1998	US5801980 Testing of an analog memory using an on-chip digital input/output interface
09/01/1998	US5801715 Massively-parallel processor array with outputs from individual processors directly to an external device without involving other processors or a common physical carrier
09/01/1998	US5801574 Charge sharing detection circuit for anti-fuses
08/1998
08/27/1998	WO1998037428A1 Semiconductor tester with data serializer
08/26/1998	EP0860017A1 Loosely coupled mass storage computer cluster
08/26/1998	EP0860011A2 Method and device for automatic determination of the required high voltage for programming/erasing an eeprom
08/26/1998	CN1191370A 半导体存储器 Semiconductor memory
08/26/1998	CN1191346A Method for real-time measuring memory chip divided into unit field in running of computer
08/26/1998	CN1039606C Redundancy circuit for eliminating defects in memory device
08/25/1998	US5799021 In an integrated circuit
08/25/1998	US5798974 Semiconductor memory device realizing high speed access and low power consumption with redundant circuit
08/25/1998	US5798973 Semiconductor memory device having redundant memory cells
08/25/1998	US5798962 Memory schemes
08/25/1998	US5798742 Active matrix panel and method for fabricating the same
08/20/1998	WO1998036418A1 Method for minimizing the access time for semiconductor memories
08/20/1998	DE19731008A1 Read voltage control for matrix-type solid state memory
08/19/1998	EP0859317A1 Method for protecting information in printing apparatus
08/19/1998	EP0858630A1 Method, system and apparatus for efficiently generating binary numbers for testing storage devices
08/19/1998	EP0574002B1 Semiconductor memory device with voltage stress test mode
08/19/1998	CN1191019A Method and apparatus for probing, testing, burn-in, repairing and programming of integrated circuits in a closed environment using a single apparatus
08/19/1998	CN1190782A 半导体存储器 Semiconductor memory
08/18/1998	US5796993 Method and apparatus for semiconductor device optimization using on-chip verification
08/18/1998	US5796748 Pattern generator in semiconductor test system
08/18/1998	US5796746 Device and method for testing integrated circuit dice in an integrated circuit module
08/18/1998	US5796745 Memory array built-in self test circuit for testing multi-port memory arrays
08/18/1998	US5796664 Semiconductor memory device having divided word line
08/18/1998	US5796663 Address signal storage circuit of data repair controller
08/18/1998	US5796662 Integrated circuit chip with a wide I/O memory array and redundant data lines
08/18/1998	US5796655 Memory cell having programmed margin verification
08/18/1998	US5796653 Integrated circuit memory
08/18/1998	US5796390 Redundant shift registers for scanning circuits in liquid crystal display devices
08/18/1998	US5796287 Output driver circuit for suppressing noise generation and integrated circuit device for burn-in test
08/18/1998	US5796271 Memory array having redundant word line
08/18/1998	US5796246 Test board and process of testing wide word memory parts
08/18/1998	US5795797 Method of making memory chips using memory tester providing fast repair
08/12/1998	EP0858078A1 Circuit and method of measuring the negative threshold voltage of a non-volatile memory cell
08/12/1998	EP0858033A2 Circuit for repairing defective bit in semiconductor memory device and repairing method
08/12/1998	EP0858032A2 Circuit for repairing defective bit in semiconductor memory device and repairing method
08/12/1998	EP0765522B1 Memory test system
08/12/1998	EP0645713B1 Word line redundancy nonvolatile semiconductor memory
08/12/1998	CN1190262A Monobrid semiconductor integrated circuit device and checking method thereof
08/12/1998	CN1190240A 半导体存储器 Semiconductor memory
08/11/1998	US5794175 Low cost, highly parallel memory tester
08/11/1998	US5793945 Method and device for initial-diagnosing processors
08/11/1998	US5793943 System for a primary BIOS ROM recovery in a dual BIOS ROM computer system
08/11/1998	US5793942 Memory chip architecture and packaging method for increased production yield
08/11/1998	US5793776 Circuit test method
08/11/1998	US5793775 Low voltage test mode operation enable scheme with hardware safeguard
08/11/1998	US5793774 Flash memory controlling system
08/11/1998	US5793727 Array disk system and method of writing and reading data in array disk system
08/11/1998	US5793696 Non-volatile semiconductor memory device and memory system using the same
08/11/1998	US5793687 Micro ROM testing system using micro ROM timing circuitry for testing operations
08/11/1998	US5793686 Semiconductor memory device having data input/output circuit of small occupied area capable of high-speed data input/output
08/11/1998	US5793685 Semiconductor memory device capable of simultaneously designating multibit test mode and special test mode
08/11/1998	US5793684 Memory device having selectable redundancy for high endurance and reliability and method therefor
08/11/1998	US5793683 Wordline and bitline redundancy with no performance penalty
08/11/1998	US5793675 Method of evaluating the gate oxide of non-volatile EPROM, EEPROM and flash-EEPROM memories
08/11/1998	US5793674 Semiconductor integrated circuit device, manufacturing method thereof, and driving method for the same
08/11/1998	US5793249 System for providing tight program/erase speeds that are insensitive to process variations
08/11/1998	CA2112421C Management apparatus for volume-medium correspondence information for use in dual file system
08/06/1998	WO1998034220A2 Method and apparatus for verifying erasure of memory blocks within a non-volatile memory structure
08/06/1998	WO1998034206A1 Occupancy sensor and method of operating same
08/05/1998	EP0856793A2 Circuit for repairing defective bit in semiconductor memory device and repairing method
08/05/1998	EP0856188A2 A flash eeprom memory with separate reference array
08/05/1998	EP0668562B1 Method for programming redundancy registers in a column redundancy integrated circuitry for a semiconductor memory device
08/05/1998	EP0547919B1 A semiconductor memory with power-on reset control of disabled rows
08/04/1998	US5790564 Memory array built-in self-test circuit having a programmable pattern generator for allowing unique read/write operations to adjacent memory cells, and method therefor
08/04/1998	US5790559 Semiconductor memory testing apparatus
08/04/1998	US5790468 Refresh counter for synchronous dynamic random access memory and method of testing the same
08/04/1998	US5790465 Of a semiconductor memory device
08/04/1998	US5790464 Method for arranging a memory cell array in semiconductor memory device
08/04/1998	US5790463 Test circuit for an integrated circuit powered by a supply voltage
08/04/1998	US5790462 Redundancy control
08/04/1998	US5790459 Memory circuit for performing threshold voltage tests on cells of a memory array

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